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Topic: Zinc Compounds
Results
2011 / IEEE
By: Kuan, H.; Yang, J.R.; Li, W.C.; Sun, W.C.; Shiojiri, M.; Chen, M.J.; Huang, Y.H.; Chen, H.C.;
By: Kuan, H.; Yang, J.R.; Li, W.C.; Sun, W.C.; Shiojiri, M.; Chen, M.J.; Huang, Y.H.; Chen, H.C.;
2011 / IEEE
By: Jang-Sik Lee; Jae Chul Park; Kim, D.M.; Dongsik Kong; Byeong-Hyeok Sohn; Jaeman Jang; Dae Hwan Kim; Il Hwan Cho;
By: Jang-Sik Lee; Jae Chul Park; Kim, D.M.; Dongsik Kong; Byeong-Hyeok Sohn; Jaeman Jang; Dae Hwan Kim; Il Hwan Cho;
2011 / IEEE
By: Yao, C.; Yamaguchi, M.; Endo, Y.; Kitakami, O.; Shimada, Y.; Okamoto, S.; Pei, W.L.; Qin, G.W.;
By: Yao, C.; Yamaguchi, M.; Endo, Y.; Kitakami, O.; Shimada, Y.; Okamoto, S.; Pei, W.L.; Qin, G.W.;
2011 / IEEE
By: Le Guen, E.; Chevalier, A.; Mattei, J.-L.; Thakur, A.; Tarot, A.-C.; Queffelec, P.; Souriou, D.; Grisart, B.;
By: Le Guen, E.; Chevalier, A.; Mattei, J.-L.; Thakur, A.; Tarot, A.-C.; Queffelec, P.; Souriou, D.; Grisart, B.;
2011 / IEEE
By: Hee Sung Lee; Youn-Gyoung Chang; Dae-Hwan Kim; Tae-Woong Moon; Jae Hoon Kim; Seongil Im; Chang-Dong Kim; Kwon-shik Park;
By: Hee Sung Lee; Youn-Gyoung Chang; Dae-Hwan Kim; Tae-Woong Moon; Jae Hoon Kim; Seongil Im; Chang-Dong Kim; Kwon-shik Park;
2011 / IEEE
By: Dae Hwan Kim; Dongsik Kong; Yongsik Kim; Minkyung Bae; Hyun Kwang Jeong; Dong Myong Kim; Inseok Hur; Jaehyeong Kim; Woojoon Kim;
By: Dae Hwan Kim; Dongsik Kong; Yongsik Kim; Minkyung Bae; Hyun Kwang Jeong; Dong Myong Kim; Inseok Hur; Jaehyeong Kim; Woojoon Kim;
2011 / IEEE
By: Young-Su Kim; Seung-Dong Yang; Ho-Jin Yun; Yu-Mi Kim; Min-Ho Kang; Ga-Won Lee; Kwang-Seok Jeong; Hi-Deok Lee;
By: Young-Su Kim; Seung-Dong Yang; Ho-Jin Yun; Yu-Mi Kim; Min-Ho Kang; Ga-Won Lee; Kwang-Seok Jeong; Hi-Deok Lee;
2011 / IEEE
By: Zanotti, L.; Calestani, D.; Zambelli, N.; Benassi, G.; Mingzheng Zha; Marchini, L.; Gombia, E.; Caroli, E.; Auricchio, N.; Zappettini, A.; Pavesi, M.; Zanichelli, M.; Mosca, R.;
By: Zanotti, L.; Calestani, D.; Zambelli, N.; Benassi, G.; Mingzheng Zha; Marchini, L.; Gombia, E.; Caroli, E.; Auricchio, N.; Zappettini, A.; Pavesi, M.; Zanichelli, M.; Mosca, R.;
2011 / IEEE
By: Osada, H.; Kubota, K.; Sekino, N.; Namizaki, Y.; Dawson, F.P.; Uchidate, S.; Oka, H.; Lavers, J.D.;
By: Osada, H.; Kubota, K.; Sekino, N.; Namizaki, Y.; Dawson, F.P.; Uchidate, S.; Oka, H.; Lavers, J.D.;
2011 / IEEE
By: Zhao, X.; Luo, J.K.; Milne, W.I.; Ashley, G.M.; Lu, J.R.; Flewitt, A.J.; Al-Naimi, F.; Garcia-Gancedo, L.;
By: Zhao, X.; Luo, J.K.; Milne, W.I.; Ashley, G.M.; Lu, J.R.; Flewitt, A.J.; Al-Naimi, F.; Garcia-Gancedo, L.;
2011 / IEEE
By: Po-Yu Yang; Huang-Chung Cheng; Hung-Hsien Li; Cheng-Wei Chen; Jung-Chuan Chou; Po-Chun Chiu; Jyh-Liang Wang;
By: Po-Yu Yang; Huang-Chung Cheng; Hung-Hsien Li; Cheng-Wei Chen; Jung-Chuan Chou; Po-Chun Chiu; Jyh-Liang Wang;
2011 / IEEE
By: Dongsik Kong; Dae Hwan Kim; Dong Myong Kim; Sungchul Kim; Yong Woo Jeon; Minkyung Bae; Yongsik Kim; Hyun-Kwang Jung;
By: Dongsik Kong; Dae Hwan Kim; Dong Myong Kim; Sungchul Kim; Yong Woo Jeon; Minkyung Bae; Yongsik Kim; Hyun-Kwang Jung;
2011 / IEEE
By: Wei-Cheng Lien; Jr-Hau He; Pisano, A.P.; Maboudian, R.; Senesky, D.G.; Shu-Hsien Chiu; Dung-Sheng Tsai;
By: Wei-Cheng Lien; Jr-Hau He; Pisano, A.P.; Maboudian, R.; Senesky, D.G.; Shu-Hsien Chiu; Dung-Sheng Tsai;
2012 / IEEE
By: Jr-Hau He; Miin-Jang Chen; Der-Hsien Lien; Chia-Yang Hsu; Ming-Wei Chen; Cheng-Ying Chen;
By: Jr-Hau He; Miin-Jang Chen; Der-Hsien Lien; Chia-Yang Hsu; Ming-Wei Chen; Cheng-Ying Chen;
2012 / IEEE
By: Chih-Wei Chien; Chang-Yu Lin; Tzong-Ming Lee; Chyi-Ming Leu; Ming-Jiue Yu; Chih-Ming Lai; Chun-Cheng Cheng; Yung-Hui Yeh; Chung-Chih Wu;
By: Chih-Wei Chien; Chang-Yu Lin; Tzong-Ming Lee; Chyi-Ming Leu; Ming-Jiue Yu; Chih-Ming Lai; Chun-Cheng Cheng; Yung-Hui Yeh; Chung-Chih Wu;
2012 / IEEE
By: Chung-Chih Wu; Chih-Wei Chien; Hsing-Hung Hsieh; Cheng-Han Wu; Yung-Hui Yeh; Chang-Yu Lin; Ming-Jiue Yu; Chih-Ming Lai; Chun-Cheng Cheng;
By: Chung-Chih Wu; Chih-Wei Chien; Hsing-Hung Hsieh; Cheng-Han Wu; Yung-Hui Yeh; Chang-Yu Lin; Ming-Jiue Yu; Chih-Ming Lai; Chun-Cheng Cheng;
2012 / IEEE
By: Eun Suk Hwang; Un Ki Kim; Yoon Jang Chung; Yoonsoo Jung; Jisim Jung; Byoung Keon Park; Cheol Seong Hwang; Sang Ho Rha; Jung-Hae Choi; Tae Joo Park;
By: Eun Suk Hwang; Un Ki Kim; Yoon Jang Chung; Yoonsoo Jung; Jisim Jung; Byoung Keon Park; Cheol Seong Hwang; Sang Ho Rha; Jung-Hae Choi; Tae Joo Park;
2012 / IEEE
By: Huby, N.; Scarpa, G.; Tallarida, G.; Lugli, P.; Guziewicz, E.; Arcari, M.; Godlewski, M.; Krajewski, T.A.;
By: Huby, N.; Scarpa, G.; Tallarida, G.; Lugli, P.; Guziewicz, E.; Arcari, M.; Godlewski, M.; Krajewski, T.A.;
2012 / IEEE
By: Yabashi, M.; Kimura, H.; Tono, K.; Matsubara, S.; Togashi, T.; Nagasono, M.; Fukuda, T.; Higashiya, A.; Wakamiya, A.; Kano, M.; Sarukura, N.; Shimizu, T.; Nakazato, T.; Cadatal-Raduban, M.; Sakai, K.; Yamanoi, K.; Ishikawa, T.; Ohashi, H.;
By: Yabashi, M.; Kimura, H.; Tono, K.; Matsubara, S.; Togashi, T.; Nagasono, M.; Fukuda, T.; Higashiya, A.; Wakamiya, A.; Kano, M.; Sarukura, N.; Shimizu, T.; Nakazato, T.; Cadatal-Raduban, M.; Sakai, K.; Yamanoi, K.; Ishikawa, T.; Ohashi, H.;
2012 / IEEE
By: Shimizu, T.; Nakazato, T.; Cadatal-Raduban, M.; Takeda, K.; Sakai, K.; Sarukura, N.; Wakamiya, A.; Kano, M.; Yamanoi, K.; Fukuda, T.;
By: Shimizu, T.; Nakazato, T.; Cadatal-Raduban, M.; Takeda, K.; Sakai, K.; Sarukura, N.; Wakamiya, A.; Kano, M.; Yamanoi, K.; Fukuda, T.;
2012 / IEEE
By: Nishikino, M.; Kawachi, T.; Fukuda, T.; Ehrentraut, D.; Azechi, H.; Nishimura, H.; Sarukura, N.; Tanaka, M.; Cadatal-Raduban, M.; Minami, Y.; Nishi, R.; Takeda, K.; Sakai, K.; Yamanoi, K.; Shimizu, T.; Nakazato, T.;
By: Nishikino, M.; Kawachi, T.; Fukuda, T.; Ehrentraut, D.; Azechi, H.; Nishimura, H.; Sarukura, N.; Tanaka, M.; Cadatal-Raduban, M.; Minami, Y.; Nishi, R.; Takeda, K.; Sakai, K.; Yamanoi, K.; Shimizu, T.; Nakazato, T.;
2012 / IEEE
By: Urban, B.E.; Neogi, P.; Senthilkumar, K.; Rajpurohit, S.K.; Jagadeeshwaran, P.; Seongcheol Kim; Fujita, Y.; Neogi, A.;
By: Urban, B.E.; Neogi, P.; Senthilkumar, K.; Rajpurohit, S.K.; Jagadeeshwaran, P.; Seongcheol Kim; Fujita, Y.; Neogi, A.;
2012 / IEEE
By: Sekiwa, H.; Miyamoto, M.; Kikuchi, M.; Futami, Y.; Wakahara, S.; Sugiyama, M.; Nikl, M.; Yokota, Y.; Kurosawa, S.; Fujimoto, Y.; Yanagida, T.; Yoshikawa, A.; Yamaji, A.;
By: Sekiwa, H.; Miyamoto, M.; Kikuchi, M.; Futami, Y.; Wakahara, S.; Sugiyama, M.; Nikl, M.; Yokota, Y.; Kurosawa, S.; Fujimoto, Y.; Yanagida, T.; Yoshikawa, A.; Yamaji, A.;
Solution-Processed Zinc Oxide Thin-Film Transistors With a Low-Temperature Polymer Passivation Layer
2012 / IEEEBy: Xiaoli Xu; Xiaojun Guo; Yizheng Jin; Shasha He; Linrun Feng;
2012 / IEEE
By: Hyungcheol Shin; Ju-Wan Lee; In-Tak Cho; Jong-Ho Lee; Byung-Gook Park; Jun-Mo Park; Hyuck-In Kwon; Il-Hwan Cho; Joon-Seop Kwak; Chi-Sun Hwang; Woo-Seok Cheong;
By: Hyungcheol Shin; Ju-Wan Lee; In-Tak Cho; Jong-Ho Lee; Byung-Gook Park; Jun-Mo Park; Hyuck-In Kwon; Il-Hwan Cho; Joon-Seop Kwak; Chi-Sun Hwang; Woo-Seok Cheong;
2012 / IEEE
By: Yong-Kee Hwang; Myungchul Jun; Soo Young Yoon; Juhn-Suk Yoo; Min-Koo Han; Woo Seok Choi; Hyung Nyuck Cho; Binn Kim; Seung-Hee Kuk;
By: Yong-Kee Hwang; Myungchul Jun; Soo Young Yoon; Juhn-Suk Yoo; Min-Koo Han; Woo Seok Choi; Hyung Nyuck Cho; Binn Kim; Seung-Hee Kuk;
2012 / IEEE
By: Hung-Che Ting; Yi-Chen Chung; Ann-Kuo Chu; Ming-Yen Tsai; Chia-Yu Chen; Te-Chih Chen; Ting-Chang Chang; Tien-Yu Hsieh; Yu-Te Chen;
By: Hung-Che Ting; Yi-Chen Chung; Ann-Kuo Chu; Ming-Yen Tsai; Chia-Yu Chen; Te-Chih Chen; Ting-Chang Chang; Tien-Yu Hsieh; Yu-Te Chen;
2012 / IEEE
By: Marchini, L.; James, R.B.; Camarda, G.S.; Bolotnikov, A.E.; Zambelli, N.; Zha, M.; Zappettini, A.;
By: Marchini, L.; James, R.B.; Camarda, G.S.; Bolotnikov, A.E.; Zambelli, N.; Zha, M.; Zappettini, A.;
2012 / IEEE
By: Hao-Chung Kuo; Chien-Chung Lin; Yi-Chun Yang; Ming-Yen Kuo; Kuo-Ju Chen; Chao-Hsun Wang; Min-Hsiung Shih; Hsin-Chu Chen;
By: Hao-Chung Kuo; Chien-Chung Lin; Yi-Chun Yang; Ming-Yen Kuo; Kuo-Ju Chen; Chao-Hsun Wang; Min-Hsiung Shih; Hsin-Chu Chen;
2012 / IEEE
By: Horng-Shyang Chen; Shao-Ying Ting; Chih-Chung Yang; Yean-Woei Kiang; Hao-Tsung Chen; Yu-Feng Yao; Chieh Hsieh; Chih-Yen Chen; Che-Hao Liao; Jeng-Jie Huang; Wen-Ming Chang;
By: Horng-Shyang Chen; Shao-Ying Ting; Chih-Chung Yang; Yean-Woei Kiang; Hao-Tsung Chen; Yu-Feng Yao; Chieh Hsieh; Chih-Yen Chen; Che-Hao Liao; Jeng-Jie Huang; Wen-Ming Chang;
2012 / IEEE
By: Tai-You Chen; Wen-Chau Liu; Po-Cheng Chou; Jian-Sheng Wu; Chien-Chang Huang; Chi-Shiang Hsu; Huey-Ing Chen;
By: Tai-You Chen; Wen-Chau Liu; Po-Cheng Chou; Jian-Sheng Wu; Chien-Chang Huang; Chi-Shiang Hsu; Huey-Ing Chen;
2012 / IEEE
By: Chien-Hua Chiu; Kuo-Yi Yen; Jyh-Rong Gong; Tai-Yuan Lin; Tzu-Pei Chen; Pei-Shin Lin; Chien-Hua Chou; Chun-Wei Li;
By: Chien-Hua Chiu; Kuo-Yi Yen; Jyh-Rong Gong; Tai-Yuan Lin; Tzu-Pei Chen; Pei-Shin Lin; Chien-Hua Chou; Chun-Wei Li;