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Topic: Wdm System
Results
2011 / IEEE / 978-0-8194-8961-6
By: Wang, Tingting; Ren, Xiaomin; Wang, Wei; Shang, Yufeng; Duan, Xiaofeng; Huang, Yongqing;
By: Wang, Tingting; Ren, Xiaomin; Wang, Wei; Shang, Yufeng; Duan, Xiaofeng; Huang, Yongqing;
2012 / IEEE / 978-1-55752-935-1
By: Sjodin, M.; Karlsson, M.; Andrekson, P.A.; Wada, N.; Shinada, S.; Johannisson, P.; Puttnam, B.J.;
By: Sjodin, M.; Karlsson, M.; Andrekson, P.A.; Wada, N.; Shinada, S.; Johannisson, P.; Puttnam, B.J.;
2012 / IEEE / 978-4-88552-263-5
By: Zhenning Tao; Weizhen Yan; Yinwen Cao; Rasmussen, J.C.; Hoshida, T.; Lei Li;
By: Zhenning Tao; Weizhen Yan; Yinwen Cao; Rasmussen, J.C.; Hoshida, T.; Lei Li;
1996 / IEEE
By: Yamamoto, S.; Takeda, N.; Taga, H.; Akiba, S.; Miyakawa, T.; Otani, T.; Kurata, Y.; Kawazawa, T.; Goto, K.;
By: Yamamoto, S.; Takeda, N.; Taga, H.; Akiba, S.; Miyakawa, T.; Otani, T.; Kurata, Y.; Kawazawa, T.; Goto, K.;
1997 / IEEE / 0-7803-3895-2
By: Johnson, F.G.; Dagenais, M.; Agrawala, S.; Whaley, R.; Stone, D.; Saini, S.S.; Bartolo, R.E.; Vusirikala, V.;
By: Johnson, F.G.; Dagenais, M.; Agrawala, S.; Whaley, R.; Stone, D.; Saini, S.S.; Bartolo, R.E.; Vusirikala, V.;
1998 / IEEE / 1-55752-521-8
By: Knox, W.H.; Collings, B.C.; Nuss, M.C.; Boivin, L.; Cundiff, S.T.; Evangelides, S.G., Jr.;
By: Knox, W.H.; Collings, B.C.; Nuss, M.C.; Boivin, L.; Cundiff, S.T.; Evangelides, S.G., Jr.;
1999 / IEEE / 1-55752-582-X
By: Onishi, M.; Tamano, K.; Okuno, T.; Ishikawa, S.; Kashiwada, T.; Makio, Y.;
By: Onishi, M.; Tamano, K.; Okuno, T.; Ishikawa, S.; Kashiwada, T.; Makio, Y.;
1999 / IEEE / 1-55752-582-X
By: Miyajima, Y.; Kurokawa, K.; Horiguchi, T.; Ohashi, M.; Nakajima, K.;
By: Miyajima, Y.; Kurokawa, K.; Horiguchi, T.; Ohashi, M.; Nakajima, K.;
1999 / IEEE / 0-7803-5634-9
By: Smyth, N.; Jackel, J.L.; Richards, D.H.; Anderson, W.T.; Goodman, M.;
By: Smyth, N.; Jackel, J.L.; Richards, D.H.; Anderson, W.T.; Goodman, M.;
Broadband 1.5 /spl mu/m emission of Er/sup 3+/ ions in bismuth-based oxide glasses for WDM amplifier
1999 / IEEE / 0-7803-5634-9By: Tanabe, S.; Ito, S.; Kuroiwa, Y.; Sugimoto, N.; Hanada, T.;
2000 / IEEE / 0-7803-6355-8
By: Ahmad, H.; Thirumeni, S.; Selvakennedy, S.; Poopalan, P.; Adikan, F.R.M.; Mahdi, M.A.;
By: Ahmad, H.; Thirumeni, S.; Selvakennedy, S.; Poopalan, P.; Adikan, F.R.M.; Mahdi, M.A.;
2000 / IEEE / 1-55752-634-6
By: Dong Hwan Kim; Seok Lee; Yoon Ho Park; Byung-Kwon Kang; Seung Han Park; An Goo Choo; Sun Ho Kim;
By: Dong Hwan Kim; Seok Lee; Yoon Ho Park; Byung-Kwon Kang; Seung Han Park; An Goo Choo; Sun Ho Kim;
1996 / IEEE / 1-55752-422-X
By: Smith, D.A.; Heston, M.L.; Zou, X.Y.; Huang, S.H.; Hwang, S.-M.; Willner, A.E.; Khaydarov, A.; Bao, Z.;
By: Smith, D.A.; Heston, M.L.; Zou, X.Y.; Huang, S.H.; Hwang, S.-M.; Willner, A.E.; Khaydarov, A.; Bao, Z.;
2001 / IEEE / 0-7803-6700-6
By: Kawaguchi, Y.; Ishii, H.; Shibata, Y.; Oohashi, H.; Tohmori, Y.; Yoshikuni, Y.; Kondo, Y.;
By: Kawaguchi, Y.; Ishii, H.; Shibata, Y.; Oohashi, H.; Tohmori, Y.; Yoshikuni, Y.; Kondo, Y.;
2001 / IEEE / 0-7803-7096-1
By: Unrau, U.B.; Kozak, M.M.; Baraniecki, T.P.; Abramski, K.M.; Pawlik, E.M.;
By: Unrau, U.B.; Kozak, M.M.; Baraniecki, T.P.; Abramski, K.M.; Pawlik, E.M.;
2002 / IEEE
By: Fish, G.A.; Larson, M.C.; Coldren, L.A.; Majewski, M.; Barton, J.; Cohen, D.; Hanxing Shi;
By: Fish, G.A.; Larson, M.C.; Coldren, L.A.; Majewski, M.; Barton, J.; Cohen, D.; Hanxing Shi;
2003 / IEEE / 0-7803-7888-1
By: Holzlohner, R.; Sinkin, O.V.; Menyuk, C.R.; Zweck, J.; Grigoryan, V.S.;
By: Holzlohner, R.; Sinkin, O.V.; Menyuk, C.R.; Zweck, J.; Grigoryan, V.S.;
2004 / IEEE / 1-55752-777-6
By: Jeppesen, P.; Peucheret, C.; Zsigri, B.; Andersen, P.A.; Nielsen, M.D.; Hansen, K.P.;
By: Jeppesen, P.; Peucheret, C.; Zsigri, B.; Andersen, P.A.; Nielsen, M.D.; Hansen, K.P.;
2005 / IEEE / 1-55752-783-0
By: Jansen, S.L.; Duthel, T.; Schaffer, C.G.; Otto, M.; Krummrich, P.M.;
By: Jansen, S.L.; Duthel, T.; Schaffer, C.G.; Otto, M.; Krummrich, P.M.;