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Topic: Vna

Results

Compact Ka-Band One-Port Vector Reflectometer Using a Wideband Electronically Controlled Phase Shifter
2012 / IEEE
By: Ghasr, M.T.; Kothari, A.; Baumgartner, M.A.; Fallahpour, M.; Zoughi, R.; Pommerenke, D.;
Impedance analysis of EMI filter circuitry used for estimation of the spurious components and boundings
2011 / IEEE / 978-83-932075-2-7
By: Drinovsky, J.; Ruzek, V.; Kejik, Z.; Zachar, J.;
Evaluation of complex residual error in vector network analyzer measurement system in the range of millimeter-wave and submillimeter-wave frequencies
2011 / IEEE / 978-1-61284-961-4
By: Kishikawa, R.; Shida, M.; Horibe, M.;
An improved stability broadband/mm-wave VNA structure
2011 / IEEE / 978-1-61284-961-4
By: Martens, J.; Roberts, T.; Noujeim, K.;
attoF MOS varactor RF measurement VNA coupled with interferometer
2011 / IEEE / 978-1-61284-961-4
By: Gaquiere, C.; Tanbakuchi, H.; Theron, D.; Ducatteau, D.; Gloria, D.; Debroucke, R.;
Wide band stepped-frequency ground penetrating radar
2011 / IEEE / 978-1-4577-1005-6
By: Kido, T.; Sato, M.; Kawahara, F.; Yokota, Y.;
Vector network analyzer versus sixport comparison for ground penetrating radar
2011 / IEEE / 978-1-4577-1411-5
By: Urbanec, T.; Dvorak, R.;
Design and calibration of a test fixture for antennas fed by microstrip
2011 / IEEE / 978-1-4577-0321-8
By: Shu Yan; Caixia Wang;
Coaxial calibration metrics
2011 / IEEE / 978-966-335-357-9
By: Andronov, E.V.; Schurov, V.V.; Fateyev, A.V.; Semibratov, V.P.; Goshin, G.G.;
The Vector Network Analyzer - an essential tool in modern ate measurements
2011 / IEEE / 978-1-4244-9363-0
By: Estrada, A.;
Experimental characterization of a UWB channel model for body area networks
2011 / IEEE / 978-1-4577-2166-3
By: Arpasin, D.; Promwong, S.; Manositthichai, N.;
Design optimization and performance verification of multi-channel high-speed optical transceiver package
2011 / IEEE / 978-1-4577-1982-0
By: Fengman Liu; Fei Wan; Wei Gao; Lianmin Du; Baoxia Li; Jing Zhou; Lixi Wan;
Sub-THz technologies state-of-the-art
2012 / IEEE / 978-617-607-138-9
By: Godziszewski, K.; Urzedowska, A.; Yashchyshyn, Y.;
Dual frequency microstrip patch antenna for GPS and WiMAX application
2011 / IEEE / 978-1-4577-1631-7
By: Subahir, S.; Muhammad, W.N.W.; Binti Abd Wahab, N.;
On mm-wave heterodyne measurements and source/LO signal cleanliness
2011 / IEEE / 978-1-4673-0282-1
By: Martens, J.;
Traceability to national standards for S-parameter measurements in waveguide at frequencies from 220 GHz to 330 GHz
2011 / IEEE / 978-1-4673-0282-1
By: Clarke, R.; Ridler, N.; Wilson, A.; Salter, M.;
Design and measurement of WPT system for various load resistances using oscilloscope
2012 / IEEE / 978-1-4673-1780-1
By: Awai, I.; Ishizaki, T.; Sugiyama, I.; Ishida, T.;
Novel measurement technique of WPT circuits using VNA and its data transformation into 0-ohm system
2012 / IEEE / 978-1-4673-1780-1
By: Awai, I.; Ishizaki, T.; Yamaguchi, K.; Ishida, T.;
B14. Active millimeter-wave imaging system for hidden weapons detection
2012 / IEEE / 978-1-4673-1887-7
By: Elboushi, A.; Sebak, A.;
Planar material sample fixture characterization and application for EMI shielding effectiveness evaluations
2012 / IEEE / 978-1-4577-1557-0
By: Yueyan Shan; Ping Li; Junhong Deng;
Research on microwave properties of CVD graphene by using multiple-layer CPW resonator
2012 / IEEE / 978-1-4673-2185-3
By: Zongxi Tang; Ruimin Xu; Yuanfu Chen; Zegao Wang; Yuehang Xu; Yunqiu Wu; Biao Zhang;
Terahertz frequency-domain instrumentation for vector characterization of composite materials
2012 / IEEE / 978-1-4577-1438-2
By: Godziszewski, K.; Modelski, J.; Derzakowski, K.; Yashchyshyn, Y.;
System for electromagnetic characterization of ceramics
2012 / IEEE / 978-1-4673-0442-9
By: Lapuh, R.; Kokalj, M.; Svetik, Z.; Voljc, B.; Lindic, M.; Pinter, B.;
A look at the sensitivity of the Thru-Reflect-Line vector network analyzer calibration algorithm
2012 / IEEE / 978-1-4673-0442-9
By: Eio, C.;
Determination of RF source reflection coefficients using step attenuator measurement technique
2012 / IEEE / 978-1-4673-0442-9
By: Widarta, A.;
Influence of waveguide width errors on TRL and LRL calibrations
2012 / IEEE / 978-1-4673-1231-8
By: Stenarson, J.; Stake, J.; Sobis, P.; Zhao, H.; Do, T. N. T.; Yhland, K.;
Development of RF attenuation measurement standard using VNA
2014 / IEEE
By: Perangin-angin, Windi Kurnia; Widarta, Anton;
A consideration of traceability on the linearity of a millimeter wave VNA
2014 / IEEE
By: Horibe, Masahiro; Widarta, Anton;
Design of modified bow-tie antennas for partial discharge measurement
2014 / IEEE
By: Khayam, Umar; Suryandi, Asep Andi;
Residual error analysis of a calibrated vector network analyzer
2014 / IEEE
By: Mubarak, Faisal; Rietveld, Gert;
A calibration procedure for electronic calibration units
2014 / IEEE
By: Stenarson, J.; Yhland, K.; Eio, C.;
Rigorous one-port measurement method for the characterization of on-chip pad response
2015 / IEEE
By: Ye, Xiaoning; Lee, Beomtaek; Huang, Shaowu; Xiao, Kai;
Systematic characterization of Silicon IMPATT diode for Monolithic E-band amplifier design
2015 / IEEE
By: Kasper, Erich; Stefani, Viktor; Matthies, Klaus; Kostecki, Konrad; Oehme, Michael; Zhang, Wogong; Schulze, Joerg;
Novel and simplified passive intermodulation distortion measurement using vector network analyzer
2014 / IEEE
By: Lu, Juan; Xu, Fenghui; Sun, Tiquan; Liu, Kun; Xu, Yong;
The principle and simulation of the TDR test
2013 / IEEE
By: Xu Xiaowen; Gao Hongmin; Gao Junkai; Li Zonghui;
An embedded auto-calibration approach used in one-port calibration of VNA
2013 / IEEE
By: Qing, Yang; Wei, Zhu; Xiaodong, Han;
Research of balanced network measurement based on Vector Network Analyzer
2013 / IEEE
By: Chunqing, Xu;
Characterizing cable flexure effects in S-parameter measurements
2013 / IEEE
By: Rietveld, Gert; Mubarak, Faisal; Spirito, Marco; Hoogenboom, Dennis;
Thru-Short-Delay (TSD) calibration technique for one-port measurements
2013 / IEEE
By: Park, Jeong-Il; Kang, Jin-Seob; Kim, Jeong-Hwan; Kim, Dae-Chan;
A new technique for vector network analyzer calibration verification using a single reconfigurable device
2013 / IEEE
By: Lucyszyn, Stepan; Ridler, Nick M.; Papantonis, Stergios;
Improving VNA measurement accuracy by including connector effects in the models of calibration standards
2013 / IEEE
By: Wong, Ken; Hoffmann, Johannes;
A method for de-embedding cable flexure errors in S-parameter measurements
2014 / IEEE
By: Rietveld, Gert; Mubarak, Faisal; Spirito, Marco;
High frequency performance of GE high density interconnect modules
1993 / IEEE
By: Whitmore, B.S.; Haller, T.R.; Gilbert, B.K.; Zabinski, P.J.;
A W-band wafer probe
1993 / IEEE / 0-7803-1209-0
By: Godshalk, E.M.;
Full two-port on-wafer vector network analysis to 120 GHz using active probes
1993 / IEEE / 0-7803-1209-0
By: Allen, S.; Pusl, J.; Reddy, M.; Yu, R.; Rodwell, M.; Case, M.;
Development of broadband coaxial components for a 0.04 to 110 GHz measurement system
1995 / IEEE / 0-7803-2581-8
By: Oldfield, B.;
Applying a conventional VNA to nonlinear measurements without using frequency converting standards
1994 / IEEE / 0-7803-2409-9
By: Sporkmann, T.; Coady, M.; Kother, D.; Roth, B.; Sattler, C.;
Measurement, modeling and simulation of a high speed digital system using VNA and HSPICE
1996 / IEEE / 0-7803-3277-6
By: Nimmagadda, S.; Dillon, J.; Moncayo, A.;
Simultaneous noise and vector network analysis using radiometer systems
1998 / IEEE / 83-906662-0-0
By: Nosal, Z.; Wiatr, W.;
Analysis and reduction of the distortions induced by time-domain filtering techniques in network analyzers
1998 / IEEE
By: De Porrata-Doria i Yague, R.; Martinez, L.F.; Ibars, A.B.;
Measuring and modeling package interconnects using vector network analyzers and time domain transforms
1998 / IEEE / 0-7803-5686-1
By: Dunsmore, J.;
Towards a system for simulating DNA computing with whiplash PCR
1999 / IEEE / 0-7803-5536-9
By: Nishikawa, A.; Hagiya, M.;
Precise measurements on dielectric reference liquids over the temperature range 5-50/spl deg/C using coaxial line methods
2000 / IEEE / 0-7803-5744-2
By: Etzel, S.; Gregory, A.P.; Clarke, R.N.;
An active pulsed RF and pulsed DC load-pull system for the characterization of HBT power amplifiers used in coherent radar and communication systems
2000 / IEEE
By: Basataud, D.; Arnaud, C.; Floriot, D.; Villotte, J.; Teyssier, J.; Nebus, J.;
Extraction of accurate package models from VNA measurements
2000 / IEEE / 0-7803-6482-1
By: Ching-Chao Huang; Fox, M.J.; Sarfaraz, A.; Chia, B.;
Efficient broadband method for equivalent source reflection coefficient measurements
2001 / IEEE
By: Stumpe, D.; Peinelt, W.; Janik, D.; Torok, A.; Stumper, U.;
Extended cross-ratio reflection correction at microwave frequencies using waveguide air-lines
2001 / IEEE
By: Stumper, U.;
Some measurement results for frequency-dependent inductance of IC interconnects on a lossy silicon substrate
2002 / IEEE
By: Schreurs, D.; Stucchi, M.; Vandenberghe, S.; Ymeri, H.; De Roest, D.; Nauwelaers, B.; Maex, K.;
Circuit modeling technique of electronic package considering S-parameters measurement environments
2001 / IEEE / 0-7803-7157-7
By: Young-Suk Suh; Kwang-Seong Choi; Yong-Ju Kim; Hwa-jung Kim;
A comparison among different setups for measuring on-wafer integrated inductors in RF applications
2002 / IEEE
By: de No, J.; Matias, G.; Aguilera, J.; Berenguer, R.; Garcia-Alonso, A.;
Influence of calibration uncertainties on VNA S-parameter measurements
2002 / IEEE / 0-7803-7242-5
By: Stumper, U.;
Vector network analyzer for the millimeter wavelength based on quadrature mixers
2001 / IEEE / 966-7968-00-6
By: Kostrikin, A.M.; Gusinskiy, A.V.; Khrushch, P.S.; Dzisiak, A.B.;
Uncertainty estimation of measurement using a vector network analyzer
2002 / IEEE / 0-7803-7490-8
By: Chong-baek Park; Jang-won Moon; Sung-kyo Park; Jun-young Park;
LRR-a self-calibration technique for the calibration of vector network analyzers
2003 / IEEE
By: Rolfes, I.; Schiek, B.;
Microwave non-destructive testing of semiconductor wafers in the frequency range 8-12.5 GHz
2002 / IEEE / 0-7803-7578-5
By: Awang, Z.; Baba, N.H.; Muhamad, F.; Ghodgaonkar, D.K.;
Innovative measurement technique for characterizing electro-optical components
2002 / IEEE / 0-7803-8124-6
By: Standen, A.; Ganwani, A.; Pettai, A.; Yeou-Song Lee;
Multiline TRL revealed
2002 / IEEE / 0-7803-8124-6
By: DeGroot, D.C.; Marks, R.B.; Jargon, J.A.;
RF ATE equipment benefit from advanced network analyzer technology
2003 / IEEE / 0-7695-1908-3
By: Seth, M.;
A free-space method for measurement of complex permittivity of silicon wafers at microwave frequencies
2003 / IEEE / 0-7803-8129-7
By: Awang, Z.; Baba, N.H.; Ghodgaonkar, D.K.;
Time-domain pulsed large-signal non-linear characterization of microwave transistors
2003 / IEEE / 1-58053-834-7
By: Charbonniaud, C.; Quere, R.; Teyssier, J.P.;
Estimation of f/sub max/ by the common-intercept method
2003 / IEEE / 0-7803-7800-8
By: Seebacher, E.; Molnar, K.; Huszka, Z.;
Traceable correction method for complex reflection coefficient using calculable air line impedance standards
2004 / IEEE
By: Leuchtmann, P.; Kossel, M.; Rufenacht, J.;
An accurate electromagnetic modeling of the die-to-die interconnect link for gigabit systems applications
2004 / IEEE / 0-7803-8365-6
By: Prokofiev, V.; Hill, M.; Shrivastava, U.A.;
Errors in on-wafer measurements due to multimode propagation
2004 / IEEE / 83-906662-7-8
By: Lewandowski, A.; Wiatr, W.;
A robust physical model extraction method for a memory device with differential routed package traces
2004 / IEEE / 0-7803-8667-1
By: Shi, H.; Yuan, X.; Beyene, W.;
PC-based reflectometer for microwave applications using three probe algorithm
2004 / IEEE / 0-7803-8671-X
By: Kadir, E.A.; Awang, Z.; Ghodgaonkar, D.K.;
Nondestructive and noncontact dielectric measurement method for high-loss liquids using free space microwave measurement system in 8 - 12.5 GHz frequency range
2004 / IEEE / 0-7803-8671-X
By: Ghodgaonkar, D.K.; Aris, M.A.B.;
A novel silicon Schottky diode for NLTL applications
2005 / IEEE
By: Fusco, V.F.; Gamble, H.S.; Linton, D.; Ruddell, F.H.; Bain, M.F.; Mohammed, F.;
Survey of characterization techniques for nonlinear communication components and systems
2005 / IEEE / 0-7803-8870-4
By: Moulthrop, A.A.; Clark, C.J.; Silva, C.P.; Muha, M.S.;
A single-layer folded substrate integrated waveguide (SIW) filter
2005 / IEEE / 0-7803-9433-X
By: Ke Wu; Ji-Xin Chen; Xiao-Ping Chen; Wei Hong; Zhang-Cheng Hao;
Novel microcontacts in microwave chip carriers developed by UV-liga process part II
2006 / IEEE
By: Videkov, V.; Kostov, A.; Avdjiiski, B.; Arnaudov, R.; Yordanov, N.; Andreev, S.;
Investigation of Ultra-Wideband Pulse Distortion Due to the Body Shadowing
2005 / IEEE / 0-7803-9283-3
By: Supanakoon, P.; Chamchoy, M.; Doungdeun, W.; Pradabphon, A.; Promwong, S.;
A Self-Calibrating Low-Cost Sensor System for Moisture Monitoring of Buildings
2006 / IEEE / 0-7803-9541-7
By: Jacob, A.F.; Sokoll, T.;
The Application of SIW in LTCC
2006 / IEEE / 1-4244-0619-6
By: Cheng Jixin; Wang Ziliang; Cheng Kai; Dai Lei;
Characterization of Co-Planar Silicon Transmission Lines With and Without Slow-Wave Effect
2007 / IEEE
By: Woopoung Kim; Swaminathan, M.;
Virtual Auxiliary Termination for Multiport Scattering Matrix Measurement Using Two-Port Network Analyzer
2007 / IEEE
By: Chih-Jung Chen; Tah-Hsiung Chu;
Measurement and Analysis of the Radio Channel in the Frequency Domain in the Standard IEEE802.11a's Band.
2007 / IEEE / 0-7695-2974-7
By: Araque, E.R.; Miller, R.B.;
Microwave bytes - VNA Tales
2007 / IEEE
By: Cripps, S.C.;
Electromagnetic Parameters Test System Based on A Refined NRW Transmission/Reflection Algorithm
2007 / IEEE / 978-1-4244-1044-6
By: Wang Huashen; Xu Ke; Wang Guodong; Jiang Shan;
How to build an optimal broadband channel sounder
2007 / IEEE / 978-1-4244-0877-1
By: Pirkl, R.J.; Durgin, G.D.;
Measurement of the Electromagnetic Properties of Materials Based on A Refined Transmission-Reflection Algorithm
2007 / IEEE / 978-1-4244-1371-3
By: Jiang Shan; Xu Ke;
Experimental study of transmission loss for ultra wideband impulse radio
2007 / IEEE / 978-1-4244-1373-7
By: Manositthichai, N.; Promwong, S.;
A De-Embedding Technique for On-Wafer Simultaneous Impedance and Power Flow Measurements
2008 / IEEE / 978-1-4244-1540-3
By: Bensmida, S.; El-Deeb, W.S.; Ghannouchi, F.M.;
Wideband VNA Design with Bandwidth 1:53 by Multisixport Principle
2008 / IEEE / 978-1-4244-2137-4
By: Urbanec, T.;
Evaluation and Correction of Cable Phase Stability in High Frequency Near-Field Measurement
2008 / IEEE / 978-1-4244-2137-4
By: Cerny, P.; Vancl, J.; Mazanek, M.; Skvor, Z.;
Compact extended port capable of full 2-port calibrations using optical techniques
2008 / IEEE / 978-1-4244-2399-6
By: Kurokawa, S.; Hirose, M.;
3D simulation and measurements of free space characterization for silicon wafers at K-band
2007 / IEEE / 978-1-4244-1434-5
By: Khalid, M.; Baba, N.H.; Awang, R.A.;
Low-cost high-resolution handheld VNA using RF interferometry
2008 / IEEE / 978-1-4244-1780-3
By: Meyer, Tobias; Will, Karl; Omar, Abbas;
An enhanced Line-Reflect-Reflect-Match calibration
2006 / IEEE / 978-0-7803-9529-9
By: Hayden, L.;
Electrical characterization of a 64 Ball Grid Array package
2008 / IEEE / 978-1-4244-2737-6
By: Boyer, A.; Courau, L.; Fer, M.; Sicard, E.;

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