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Topic: Vacuum Microelectronics
Results
2011 / IEEE
By: Jaehun Park; Gun-Sik Park; Neil, G.R.; Kory, C.L.; Temkin, R.J.; Dobbs, R.J.; Booske, J.H.; Joye, C.D.;
By: Jaehun Park; Gun-Sik Park; Neil, G.R.; Kory, C.L.; Temkin, R.J.; Dobbs, R.J.; Booske, J.H.; Joye, C.D.;
2011 / IEEE / 978-1-4577-1997-4
By: Shufang Xu; Yang Zhang; Xiaoqing Zhang; Min Miao; Zhensong Li; Lei Liang;
By: Shufang Xu; Yang Zhang; Xiaoqing Zhang; Min Miao; Zhensong Li; Lei Liang;
2014 / IEEE
By: Gilchrist, Kristin H.; Piascik, Jeffrey R.; Stoner, Brian R.; Radauscher, Erich J.; Amsden, Jason J.; Parker, Charles B.; Glass, Jeffrey T.;
By: Gilchrist, Kristin H.; Piascik, Jeffrey R.; Stoner, Brian R.; Radauscher, Erich J.; Amsden, Jason J.; Parker, Charles B.; Glass, Jeffrey T.;
1989 / IEEE
By: Popovic, Z.B.; Lam, W.W.; Kim, M.; Luhmann, N.C., Jr.; Jou, C.F.; Hwu, R.J.; Rutledge, D.B.;
By: Popovic, Z.B.; Lam, W.W.; Kim, M.; Luhmann, N.C., Jr.; Jou, C.F.; Hwu, R.J.; Rutledge, D.B.;
1989 / IEEE / 0-7803-0817-4
By: Liu, D.; Chin, K.; Gmitter, T.; Ravi, T.S.; Orvis, W.J.; Trujillo, J.; Marcus, R.B.; Hunt, C.E.; Ciarlo, D.R.;
By: Liu, D.; Chin, K.; Gmitter, T.; Ravi, T.S.; Orvis, W.J.; Trujillo, J.; Marcus, R.B.; Hunt, C.E.; Ciarlo, D.R.;
1989 / IEEE / 0-7803-0817-4
By: Orvis, W.J.; Trujillo, J.; Hunt, C.; Hee, E.; Yee, J.H.; McConaghy, C.F.; Ciarlo, D.R.;
By: Orvis, W.J.; Trujillo, J.; Hunt, C.; Hee, E.; Yee, J.H.; McConaghy, C.F.; Ciarlo, D.R.;
Theoretical structural optimization of a GaAs pn or pin structured avalanche electron emitting diode
1989 / IEEE / 0-7803-0817-4By: van Zutphen, T.;
1991 / IEEE
By: Gmitter, T.; Ravi, T.S.; Marcus, R.B.; Liu, D.; Chin, K.K.; Niccum, J.T.; Busta, H.H.;
By: Gmitter, T.; Ravi, T.S.; Marcus, R.B.; Liu, D.; Chin, K.K.; Niccum, J.T.; Busta, H.H.;
1991 / IEEE
By: Schoen, P.E.; Kirkpatrick, D.A.; Ditchek, B.M.; Levinson, M.; Schnur, J.M.; Kahn, B.E.; Baral, S.; Price, R.; Stockton, W.B.;
By: Schoen, P.E.; Kirkpatrick, D.A.; Ditchek, B.M.; Levinson, M.; Schnur, J.M.; Kahn, B.E.; Baral, S.; Price, R.; Stockton, W.B.;
1991 / IEEE / 0-7803-0135-8
By: Demroff, H.P.; McIntyre, P.M.; Yue, W.K.; Yu, W.; Wiechold, M.H.; Lee, B.; Elliott, S.M.; Popovic, M.; Parker, D.L.; Pang, Y.; Legg, J.D.; Stewart, M.D.;
By: Demroff, H.P.; McIntyre, P.M.; Yue, W.K.; Yu, W.; Wiechold, M.H.; Lee, B.; Elliott, S.M.; Popovic, M.; Parker, D.L.; Pang, Y.; Legg, J.D.; Stewart, M.D.;