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Topic: Vacuum Electron Device
Results
2001 / IEEE
By: Pobedonostsev, A.S.; Zaitsev, S.A.; Korolev, A.N.; Kargin, A.N.; Homich, V.B.; Poognin, V.I.; Golenitskij, I.I.; Negirev, A.A.; Gelvich, E.A.; Meleshkevich, P.M.; Lopin, M.I.; Zakurdayev, A.D.; Zhary, Y.V.;
By: Pobedonostsev, A.S.; Zaitsev, S.A.; Korolev, A.N.; Kargin, A.N.; Homich, V.B.; Poognin, V.I.; Golenitskij, I.I.; Negirev, A.A.; Gelvich, E.A.; Meleshkevich, P.M.; Lopin, M.I.; Zakurdayev, A.D.; Zhary, Y.V.;
2002 / IEEE / 0-7803-7357-X
By: Mulvaney, J.M.; Casey, J.A.; Brown, P.D.; Gaudreau, M.P.J.; Kempkes, M.A.; Hawkey, T.A.;
By: Mulvaney, J.M.; Casey, J.A.; Brown, P.D.; Gaudreau, M.P.J.; Kempkes, M.A.; Hawkey, T.A.;
2002 / IEEE / 0-7803-7239-5
By: Bhattacharjee, S.; Limbach, S.; van der Weide, D.W.; Gallagher, S.; Lee, W.-J.; Booske, J.H.; Kory, C.L.;
By: Bhattacharjee, S.; Limbach, S.; van der Weide, D.W.; Gallagher, S.; Lee, W.-J.; Booske, J.H.; Kory, C.L.;
2004 / IEEE / 0-7803-8331-1
By: Shapiro, M.A.; Temkin, R.J.; Smirnova, E.I.; Sirigiri, J.R.; Chen, C.;
By: Shapiro, M.A.; Temkin, R.J.; Smirnova, E.I.; Sirigiri, J.R.; Chen, C.;
2004 / IEEE / 0-7803-8334-6
By: Held, B.; Chernyakova, L.; Dionne, N.; Nelson, E.; Panagos, D.; Eppley, K.; Petillo, J.; Levush, B.; Nguyen, K.; True, R.; DeFord, J.; Cattelino, M.; Xiaoling Zhai; Burdette, J.;
By: Held, B.; Chernyakova, L.; Dionne, N.; Nelson, E.; Panagos, D.; Eppley, K.; Petillo, J.; Levush, B.; Nguyen, K.; True, R.; DeFord, J.; Cattelino, M.; Xiaoling Zhai; Burdette, J.;
2006 / IEEE / 1-4244-0108-9
By: Perle, A.; Duggal, R.; Tucker, G.; Schoemehl, T.; Hargreaves, T.A.; Armstrong, C.M.; Good, G.; True, R.B.;
By: Perle, A.; Duggal, R.; Tucker, G.; Schoemehl, T.; Hargreaves, T.A.; Armstrong, C.M.; Good, G.; True, R.B.;
2007 / IEEE / 978-1-4244-0915-0
By: Shin, Y.M.; Srivastava, A.; So, J.K.; Won, J.H.; Jang, K.H.; Park, G.S.; Baik, C.W.;
By: Shin, Y.M.; Srivastava, A.; So, J.K.; Won, J.H.; Jang, K.H.; Park, G.S.; Baik, C.W.;
2007 / IEEE / 978-1-4244-0915-0
By: Shin, Y.M.; So, J.K.; Chang, S.S.; Kim, J.H.; Jang, K.H.; Park, G.S.; Sattorov, M.A.; Srivastava, A.; Won, J.H.;
By: Shin, Y.M.; So, J.K.; Chang, S.S.; Kim, J.H.; Jang, K.H.; Park, G.S.; Sattorov, M.A.; Srivastava, A.; Won, J.H.;
2009 / IEEE
By: Holland, C.E.; Bellew, C.L.; Armstrong, C.M.; Duggal, R.; Whaley, D.R.; Spindt, C.A.;
By: Holland, C.E.; Bellew, C.L.; Armstrong, C.M.; Duggal, R.; Whaley, D.R.; Spindt, C.A.;
2009 / IEEE / 978-1-4244-5356-6
By: Zhurbenko, V.; Marchesin, R.; Durand, A.; Rubaek, T.; Kotiranta, M.; Krozer, V.;
By: Zhurbenko, V.; Marchesin, R.; Durand, A.; Rubaek, T.; Kotiranta, M.; Krozer, V.;
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