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Topic: Uwb Technology
Results
2011 / IEEE / 978-1-4577-1764-2
By: Nicoli, M.; Fontanella, D.; Goratti, L.; Savazzi, S.; Spagnolini, U.;
By: Nicoli, M.; Fontanella, D.; Goratti, L.; Savazzi, S.; Spagnolini, U.;
2012 / IEEE / 978-1-4577-0231-0
By: Sangjae Lee; Kyoung-Rok Cho; Man Soo Han; Sangsung Choi; Young-Ae Jeon;
By: Sangjae Lee; Kyoung-Rok Cho; Man Soo Han; Sangsung Choi; Young-Ae Jeon;
2013 / IEEE
By: Sheta, Abdel-Fattah; Elshafiey, Ibrahim; Siddiqui, Zeeshan; Alzabidi, Mohammed; Aldhaeebi, Maged;
By: Sheta, Abdel-Fattah; Elshafiey, Ibrahim; Siddiqui, Zeeshan; Alzabidi, Mohammed; Aldhaeebi, Maged;
2002 / IEEE / 0-7803-7496-7
By: Fontana, R.J.; Knight, E.J.; Mulloy, R.W.T.; Beard, L.C.; Marzullo, A.J.; Richley, E.A.;
By: Fontana, R.J.; Knight, E.J.; Mulloy, R.W.T.; Beard, L.C.; Marzullo, A.J.; Richley, E.A.;
2004 / IEEE / 0-7803-8523-3
By: Shkunov, V.I.; Pluzhnikov, A.A.; Levchenko, R.A.; Krylov, V.V.; Kalinin, A.V.; Gainulin, A.G.; Aristarhov, V.U.;
By: Shkunov, V.I.; Pluzhnikov, A.A.; Levchenko, R.A.; Krylov, V.V.; Kalinin, A.V.; Gainulin, A.G.; Aristarhov, V.U.;
2005 / IEEE
By: Giannakis, G.B.; Zhi Tian; Gezici, S.; Sahinoglu, Z.; Poor, H.V.; Molisch, A.F.; Kobayashi, H.;
By: Giannakis, G.B.; Zhi Tian; Gezici, S.; Sahinoglu, Z.; Poor, H.V.; Molisch, A.F.; Kobayashi, H.;
2008 / IEEE / 978-1-4244-2041-4
By: Geise, R.; Schmidt, I.; Piesiewicz, R.; Jemai, J.; Schwark, M.; Thielker, P.; Schirrmacher, M.; Kurner, T.;
By: Geise, R.; Schmidt, I.; Piesiewicz, R.; Jemai, J.; Schwark, M.; Thielker, P.; Schirrmacher, M.; Kurner, T.;
2009 / IEEE / 978-1-4244-3301-8
By: Kocks, C.; Zeisberg, S.; Jung, P.; Bruck, G.H.; Dong Xu; Scheiber, E.; Shangbo Wang; Viessmann, A.;
By: Kocks, C.; Zeisberg, S.; Jung, P.; Bruck, G.H.; Dong Xu; Scheiber, E.; Shangbo Wang; Viessmann, A.;
2009 / IEEE / 978-1-4244-2801-4
By: Law, C.L.; Shen, Y.; Hu, S.; Tian, H.; Zhao, C.; Xia, J.; Koh, K.S.; Xu, J.; Xu, C.;
By: Law, C.L.; Shen, Y.; Hu, S.; Tian, H.; Zhao, C.; Xia, J.; Koh, K.S.; Xu, J.; Xu, C.;
2009 / IEEE / 978-1-4244-5346-7
By: Sakkila, L.; Rouvaen, J.-M.; El Hillali, Y.; Tatkeu, C.; Boukour, F.; Rivenq, A.;
By: Sakkila, L.; Rouvaen, J.-M.; El Hillali, Y.; Tatkeu, C.; Boukour, F.; Rivenq, A.;
2010 / IEEE / 978-1-4244-7868-2
By: Tatkeu, C.; Rivenq, A.; Sakkila, L.; Rouvaen, J.-M.; Ghys, J.-P.; El Hillali, Y.;
By: Tatkeu, C.; Rivenq, A.; Sakkila, L.; Rouvaen, J.-M.; Ghys, J.-P.; El Hillali, Y.;
2011 / IEEE / 978-1-4244-8712-7
By: Seung-Sik Lee; Sangjae Lee; Kyoung-Rok Cho; Sangsung Choi; Youngae Jeon;
By: Seung-Sik Lee; Sangjae Lee; Kyoung-Rok Cho; Sangsung Choi; Youngae Jeon;