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Topic: Uncertainty
Results
A reflectometer and power-ratio technique for the measurement of low values of waveguide attenuation
1976 / IEEEBy: Skilton, Peter J.;
1987 / IEEE
By: Buhlmann, Hans-Jorg; Bauder, Lucien; Schwitz, Wolfgang; Ilegems, Marc; Py, Marcel A.;
By: Buhlmann, Hans-Jorg; Bauder, Lucien; Schwitz, Wolfgang; Ilegems, Marc; Py, Marcel A.;
1987 / IEEE
By: Shida, Katsunori; Nemoto, Toshio; Igarashi, Takashi; Yonezaki, Genta; Kobayashi, Minoru; Nishinaka, Hidefumi; Wada, Toshimi;
By: Shida, Katsunori; Nemoto, Toshio; Igarashi, Takashi; Yonezaki, Genta; Kobayashi, Minoru; Nishinaka, Hidefumi; Wada, Toshimi;
1987 / IEEE
By: Field, Bruce F.; Dziuba, Ronald F.; Cage, Marvin E.; Van Degrift, Craig T.; Kiess, Thomas E.;
By: Field, Bruce F.; Dziuba, Ronald F.; Cage, Marvin E.; Van Degrift, Craig T.; Kiess, Thomas E.;
2011 / IEEE
By: Weber, B.; Hege, H.; Moller, T.; Saad, A.; Torsney-Weir, T.; Bergner, S.; Verbavatz, J.;
By: Weber, B.; Hege, H.; Moller, T.; Saad, A.; Torsney-Weir, T.; Bergner, S.; Verbavatz, J.;
2011 / IEEE
By: Adachi, Y.; Oyama, D.; Uehara, G.; Hashimoto, I.; Yumoto, M.; Kasahara, T.; Hatsusaka, N.;
By: Adachi, Y.; Oyama, D.; Uehara, G.; Hashimoto, I.; Yumoto, M.; Kasahara, T.; Hatsusaka, N.;
2012 / IEEE
By: Rezac, K.; Paduch, M.; Klir, D.; Kubes, P.; Zielinska, E.; Tomaszewski, K.; Sadowski, M.J.; Karpinski, L.; Kravarik, J.; Ivanova-Stanik, I.; Bienkowska, B.; Chodukowski, T.; Scholz, M.; Pisarczyk, T.;
By: Rezac, K.; Paduch, M.; Klir, D.; Kubes, P.; Zielinska, E.; Tomaszewski, K.; Sadowski, M.J.; Karpinski, L.; Kravarik, J.; Ivanova-Stanik, I.; Bienkowska, B.; Chodukowski, T.; Scholz, M.; Pisarczyk, T.;
2012 / IEEE
By: Thornton, A.; Spiezia, G.; Pignard, C.; Peronnard, P.; Kramer, D.; Brugger, M.; Roeed, K.;
By: Thornton, A.; Spiezia, G.; Pignard, C.; Peronnard, P.; Kramer, D.; Brugger, M.; Roeed, K.;