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Topic: Uhf
Results
2011 / IEEE / 978-1-936968-19-0
By: Ollikainen, J.; Kallioinen, S.; Hui, P.; Vaarakangas, M.; Teikari, I.; Ryynanen, J.; Kosunen, M.; Turunen, V.; Parssinen, A.;
By: Ollikainen, J.; Kallioinen, S.; Hui, P.; Vaarakangas, M.; Teikari, I.; Ryynanen, J.; Kosunen, M.; Turunen, V.; Parssinen, A.;
2011 / IEEE / 978-1-936968-19-0
By: Kallioinen, S.; Vaarakangas, M.; Ryynanen, J.; Turunen, V.; Parssinen, A.;
By: Kallioinen, S.; Vaarakangas, M.; Ryynanen, J.; Turunen, V.; Parssinen, A.;
2011 / IEEE / 978-1-4244-6051-9
By: Siefring, C.L.; Bernhardt, P.A.; Voronka, N.; Miller, S.; Abrams, J.; Huba, J.D.;
By: Siefring, C.L.; Bernhardt, P.A.; Voronka, N.; Miller, S.; Abrams, J.; Huba, J.D.;
2011 / IEEE / 978-1-4577-2166-3
By: Aunchaleevarapan, K.; Phaebua, K.; Phongcharoenpanich, C.; Charoenchue, P.;
By: Aunchaleevarapan, K.; Phaebua, K.; Phongcharoenpanich, C.; Charoenchue, P.;
2011 / IEEE / 978-1-4577-0330-0
By: Yong Ho Kim; Soo Hyeok Kang; Dong Han Kim; Jinung An; Byung-Cheol Min; Soon-Geul Lee; Eun Jin Lee;
By: Yong Ho Kim; Soo Hyeok Kang; Dong Han Kim; Jinung An; Byung-Cheol Min; Soon-Geul Lee; Eun Jin Lee;
2011 / IEEE / 978-0-9568086-0-8
By: Bindel, A.; Viret, J.; West, A.; Lugo, H.; Justham, L.; Conway, P.;
By: Bindel, A.; Viret, J.; West, A.; Lugo, H.; Justham, L.; Conway, P.;
2012 / IEEE / 978-1-4673-0886-1
By: Zarim, Z.A.A.; Ghani, A.B.; Hock, G.C.; Chakrabarty, C.K.; Raymond, W.J.K.;
By: Zarim, Z.A.A.; Ghani, A.B.; Hock, G.C.; Chakrabarty, C.K.; Raymond, W.J.K.;
2012 / IEEE / 978-3-9812668-4-9
By: Mzyk, R.; Koelpin, A.; Weigel, R.; Fischer, G.; Hausknecht, F.; Dehm-Andone, G.;
By: Mzyk, R.; Koelpin, A.; Weigel, R.; Fischer, G.; Hausknecht, F.; Dehm-Andone, G.;
2012 / IEEE / 978-1-4673-0328-6
By: Weigel, R.; Fischer, G.; Heidrich, J.; Essel, J.; Brenk, D.; Ussmueller, T.;
By: Weigel, R.; Fischer, G.; Heidrich, J.; Essel, J.; Brenk, D.; Ussmueller, T.;
2011 / IEEE / 978-1-4577-1631-7
By: Misran, N.; Islam, M.T.; Tiang, J.J.; Choo, C.L.; Mandeep, J.S.;
By: Misran, N.; Islam, M.T.; Tiang, J.J.; Choo, C.L.; Mandeep, J.S.;
2011 / IEEE / 978-0-85825-974-4
By: Perret, E.; Chaabane, H.; Bolomey, J.C.; Tedjini, S.; Daiki, M.;
By: Perret, E.; Chaabane, H.; Bolomey, J.C.; Tedjini, S.; Daiki, M.;
2011 / IEEE / 978-1-4577-1664-5
By: Hernandez-Figueroa, H.E.; Moretti, A.; Malheiros-Silveira, G.N.; Bravo-Roger, L.L.; Bertuzzo, J.E.; Yoshioka, R.T.;
By: Hernandez-Figueroa, H.E.; Moretti, A.; Malheiros-Silveira, G.N.; Bravo-Roger, L.L.; Bertuzzo, J.E.; Yoshioka, R.T.;
2012 / IEEE / 978-1-4673-1088-8
By: Garcia, Jose A.; Cabria, Lorena; Rizo, Leysi; Ruiz, M. Nieves; Marante, Reinel;
By: Garcia, Jose A.; Cabria, Lorena; Rizo, Leysi; Ruiz, M. Nieves; Marante, Reinel;
2012 / IEEE / 978-1-4673-0189-3
By: Atkinson, John; Stockwell, Brad; Begum, Rasheda; Aymar, Galen; Eisen, Edward; Lenci, Stephan;
By: Atkinson, John; Stockwell, Brad; Begum, Rasheda; Aymar, Galen; Eisen, Edward; Lenci, Stephan;
2013 / IEEE
By: Aliane, Abdelkader; Pannier, Philippe; Bergeret, Emmanuel; Marques, Daniel; Coppard, Romain;
By: Aliane, Abdelkader; Pannier, Philippe; Bergeret, Emmanuel; Marques, Daniel; Coppard, Romain;
2014 / IEEE
By: Samsuri, NoorAsmawati; A Rahim, Mohamad Kamal; Ramly, Nurul Jannah; Dewan, Raimi; Elias, NorFatin Akma; Abdul Majid, Mohamad Afiq; Jalil, Mohd Ezwan;
By: Samsuri, NoorAsmawati; A Rahim, Mohamad Kamal; Ramly, Nurul Jannah; Dewan, Raimi; Elias, NorFatin Akma; Abdul Majid, Mohamad Afiq; Jalil, Mohd Ezwan;
2015 / IEEE
By: Kumar, Vijay; Rajesh, Galaba Sai; Kishore, K Venkata; Kotamraju, Sarat K; Kavya, K. Ch. Sri; Srinivasulu, P.;
By: Kumar, Vijay; Rajesh, Galaba Sai; Kishore, K Venkata; Kotamraju, Sarat K; Kavya, K. Ch. Sri; Srinivasulu, P.;
2013 / IEEE
By: Grahn, Fredrik; Eugensson, Lars; Kvick, Ake; Grenvall, Magnus; Karlsson, Stefan; Pettersson, Lars;
By: Grahn, Fredrik; Eugensson, Lars; Kvick, Ake; Grenvall, Magnus; Karlsson, Stefan; Pettersson, Lars;
2014 / IEEE
By: Bentum, Mark J.; van Maanen, Erik; Witvliet, Ben A.; Schiphorst, Roel; Slump, Cornelis H.;
By: Bentum, Mark J.; van Maanen, Erik; Witvliet, Ben A.; Schiphorst, Roel; Slump, Cornelis H.;
1988 / IEEE
By: Bohlander, R.A.; Schoenfeld, W.P.; Priestly, J.T.; Hill, R.J.; Clifford, S.F.; Patterson, E.M.; McMillan, R.W.;
By: Bohlander, R.A.; Schoenfeld, W.P.; Priestly, J.T.; Hill, R.J.; Clifford, S.F.; Patterson, E.M.; McMillan, R.W.;
1988 / IEEE
By: Yukawa, K.; Shigeta, K.; Shimizu, Y.; Sato, R.; Nagasawa, Y.; Mikkaichi, M.; Nakamura, T.;
By: Yukawa, K.; Shigeta, K.; Shimizu, Y.; Sato, R.; Nagasawa, Y.; Mikkaichi, M.; Nakamura, T.;
1988 / IEEE
By: Nichols, A.D.; Sullivan, R.J.; Schanne, J., Jr.; Darreff, F.P.; Haney, C.W.; Rawson, R.F.;
By: Nichols, A.D.; Sullivan, R.J.; Schanne, J., Jr.; Darreff, F.P.; Haney, C.W.; Rawson, R.F.;