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Topic: Tuning
Results
2011 / IEEE
By: Raychowdhury, A.; De, V.; Karnik, T.; Wilkerson, C.; Tokunaga, C.; Bowman, K.; Geuskens, B.; Khellah, M.; Aseron, P.; Shih-Lien Lu; Tschanz, J.;
By: Raychowdhury, A.; De, V.; Karnik, T.; Wilkerson, C.; Tokunaga, C.; Bowman, K.; Geuskens, B.; Khellah, M.; Aseron, P.; Shih-Lien Lu; Tschanz, J.;
2011 / IEEE
By: Kwang-Ting Cheng; Someya, T.; Yamamoto, T.; Kuwabara, H.; Ikeda, M.; Klauk, H.; Takimiya, K.; Zschieschang, U.; Sakurai, T.; Huang, T.; Kuribara, K.; Yokota, T.; Sekitani, T.; Fukuda, K.;
By: Kwang-Ting Cheng; Someya, T.; Yamamoto, T.; Kuwabara, H.; Ikeda, M.; Klauk, H.; Takimiya, K.; Zschieschang, U.; Sakurai, T.; Huang, T.; Kuribara, K.; Yokota, T.; Sekitani, T.; Fukuda, K.;
2011 / IEEE
By: Bawamia, A.I.; Erbert, G.; Sumpf, B.; Thomas, M.; Spiesserger, S.; Ginolas, A.; Eppich, B.; Blume, G.;
By: Bawamia, A.I.; Erbert, G.; Sumpf, B.; Thomas, M.; Spiesserger, S.; Ginolas, A.; Eppich, B.; Blume, G.;
2011 / IEEE
By: Salvia, J.C.; Hopcroft, M.A.; Bongsang Kim; Melamud, R.; Hyung Kyu Lee; Kenny, T.W.;
By: Salvia, J.C.; Hopcroft, M.A.; Bongsang Kim; Melamud, R.; Hyung Kyu Lee; Kenny, T.W.;
2012 / IEEE
By: Kliewer, J.; Graell i Amat, A.; Koller, C.; Costello, D.J.; Zigangirov, K.Sh.; Vatta, F.;
By: Kliewer, J.; Graell i Amat, A.; Koller, C.; Costello, D.J.; Zigangirov, K.Sh.; Vatta, F.;
2012 / IEEE
By: Youngchang Yoon; Kenney, J.S.; Chang-Ho Lee; Ockgoo Lee; Kyu Hwan An; Hyungwook Kim; Jihwan Kim;
By: Youngchang Yoon; Kenney, J.S.; Chang-Ho Lee; Ockgoo Lee; Kyu Hwan An; Hyungwook Kim; Jihwan Kim;
2012 / IEEE
By: Kaul, H.; Anders, M.A.; Srinivasan, S.; Mathew, S.K.; Hsu, S.K.; Krishnamurthy, R.K.; Satpathy, S.; Agarwal, A.; Sheikh, F.;
By: Kaul, H.; Anders, M.A.; Srinivasan, S.; Mathew, S.K.; Hsu, S.K.; Krishnamurthy, R.K.; Satpathy, S.; Agarwal, A.; Sheikh, F.;
2012 / IEEE
By: Ping Wang; Hung-Jen Liao; Wei-Min Chan; Sun, D.; Meng-Fan Chang; Li, Q.; Shao-Yu Chou; Yen-Huei Chen; Yamauchi, H.;
By: Ping Wang; Hung-Jen Liao; Wei-Min Chan; Sun, D.; Meng-Fan Chang; Li, Q.; Shao-Yu Chou; Yen-Huei Chen; Yamauchi, H.;
2012 / IEEE
By: Brumos, M.; Cogollos, S.; Guglielmi, M.; Gimeno, B.; Gil, J.; Vicente, C.; Boria, V.E.;
By: Brumos, M.; Cogollos, S.; Guglielmi, M.; Gimeno, B.; Gil, J.; Vicente, C.; Boria, V.E.;
2012 / IEEE
By: Kenney, J.S.; Chang-Ho Lee; Wangmyong Woo; Youngchang Yoon; Hamhee Jeon; Yan-Yu Huang;
By: Kenney, J.S.; Chang-Ho Lee; Wangmyong Woo; Youngchang Yoon; Hamhee Jeon; Yan-Yu Huang;
2012 / IEEE
By: Ruijiang Li; Changzhan Gu; Changzhi Li; Jiang, S.B.; Torres, C.; Fung, A.Y.C.; Hualiang Zhang;
By: Ruijiang Li; Changzhan Gu; Changzhi Li; Jiang, S.B.; Torres, C.; Fung, A.Y.C.; Hualiang Zhang;
2012 / IEEE
By: Warnock, J.; Huott, W.; Carey, S.; Huajun Wen; Meaney, P.; Gerwig, G.; Smith, H.H.; Yuen Chan; Davis, J.; Bunce, P.; Pelella, A.; Rodko, D.; Patel, P.; Strach, T.; Malone, D.; Malgioglio, F.; Neves, J.; Rude, D.L.; Yiu-Hing Chan;
By: Warnock, J.; Huott, W.; Carey, S.; Huajun Wen; Meaney, P.; Gerwig, G.; Smith, H.H.; Yuen Chan; Davis, J.; Bunce, P.; Pelella, A.; Rodko, D.; Patel, P.; Strach, T.; Malone, D.; Malgioglio, F.; Neves, J.; Rude, D.L.; Yiu-Hing Chan;
2012 / IEEE
By: Abril, E.J.; Lorenzo, R.M.; de Miguel, I.; Duran, R.J.; Fernandez, P.; Merayo, N.; Jimenez, T.;
By: Abril, E.J.; Lorenzo, R.M.; de Miguel, I.; Duran, R.J.; Fernandez, P.; Merayo, N.; Jimenez, T.;
2012 / IEEE
By: Ming Gao; Lisherness, P.; Yan Zheng; Shiyuan Yang; Hong Wang; Kwang-Ting Cheng; Bovington, J.;
By: Ming Gao; Lisherness, P.; Yan Zheng; Shiyuan Yang; Hong Wang; Kwang-Ting Cheng; Bovington, J.;
2012 / IEEE
By: Hamdi, R.; Benkelfat, B.; Bendimerad, D.F.; Vinouze, B.; Seddiki, O.; Gottesman, Y.;
By: Hamdi, R.; Benkelfat, B.; Bendimerad, D.F.; Vinouze, B.; Seddiki, O.; Gottesman, Y.;