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Topic: Tunable Circuits And Devices
Results
2011 / IEEE / 978-2-87487-022-4
By: Schoenlinner, B.; Ziegler, V.; Schulte, B.; Schumacher, H.; Prechtel, U.;
By: Schoenlinner, B.; Ziegler, V.; Schulte, B.; Schumacher, H.; Prechtel, U.;
2011 / IEEE / 978-2-87487-023-1
By: Schulte, B.; Ziegler, V.; Schoenlinner, B.; Prechtel, U.; Schumacher, H.;
By: Schulte, B.; Ziegler, V.; Schoenlinner, B.; Prechtel, U.; Schumacher, H.;
2012 / IEEE / 978-1-4577-1155-8
By: Bormann, D.; Kaehlert, S.; Heinen, S.; Lei Liao; Muh-Dey Wei; Werth, T.D.;
By: Bormann, D.; Kaehlert, S.; Heinen, S.; Lei Liao; Muh-Dey Wei; Werth, T.D.;
2012 / IEEE / 978-1-4673-1088-8
By: Shiokawa, Noritsugu; Kawaguchi, Tamio; Kayano, Hiroyuki; Yamazaki, Mutsuki; Nakayama, Kohei;
By: Shiokawa, Noritsugu; Kawaguchi, Tamio; Kayano, Hiroyuki; Yamazaki, Mutsuki; Nakayama, Kohei;
2014 / IEEE
By: Jiang, Zhenguo; Liu, Lei; Hesler, Jeffrey L.; Fay, Patrick; Shams, Md I.; Rahman, Syed M.;
By: Jiang, Zhenguo; Liu, Lei; Hesler, Jeffrey L.; Fay, Patrick; Shams, Md I.; Rahman, Syed M.;
1988 / IEEE
By: Moncorge, R.; Gagnard, R.; Djevahirdjian, K.; Djevahirdjian, V.; Collongues, R.; Lejus, A.M.; Vivien, D.; Boulon, G.;
By: Moncorge, R.; Gagnard, R.; Djevahirdjian, K.; Djevahirdjian, V.; Collongues, R.; Lejus, A.M.; Vivien, D.; Boulon, G.;
1988 / IEEE
By: Asami, T.; Narita, K.; Morita, S.; Kakuma, M.; Shirotori, T.; Sato, K.; Nogami, K.; Sakurai, T.; Sawada, K.; Iizuka, T.; Isobe, M.; Kinugawa, M.; Higuchi, A.; Matsunaga, J.;
By: Asami, T.; Narita, K.; Morita, S.; Kakuma, M.; Shirotori, T.; Sato, K.; Nogami, K.; Sakurai, T.; Sawada, K.; Iizuka, T.; Isobe, M.; Kinugawa, M.; Higuchi, A.; Matsunaga, J.;
1989 / IEEE
By: Koga, Y.; Maeda, M.W.; Sessa, W.B.; Welter, R.; Barry, J.R.; Wagner, R.E.; Kodera, H.; Nanduri, K.; Lee, T.P.; Young, J.; Curtis, L.;
By: Koga, Y.; Maeda, M.W.; Sessa, W.B.; Welter, R.; Barry, J.R.; Wagner, R.E.; Kodera, H.; Nanduri, K.; Lee, T.P.; Young, J.; Curtis, L.;
1989 / IEEE
By: Bar-Joseph, I.; Soccolich, C.E.; Sunderman, E.R.; Islam, M.N.; Miller, B.I.; Chang, T.Y.; Sauer, N.;
By: Bar-Joseph, I.; Soccolich, C.E.; Sunderman, E.R.; Islam, M.N.; Miller, B.I.; Chang, T.Y.; Sauer, N.;
1989 / IEEE
By: Kaminow, I.P.; Kuznetsov, M.; Willner, A.E.; Raybon, G.; Burrus, C.A.; Koch, T.L.; Koren, U.;
By: Kaminow, I.P.; Kuznetsov, M.; Willner, A.E.; Raybon, G.; Burrus, C.A.; Koch, T.L.; Koren, U.;