Your Search Results

Use materials about this topic in your textbook!

AcademicPub holds over eight million pieces of educational content - such as case studies and journal articles - for you to mix-and-match your way.

Experience the freedom of customizing your course pack with AcademicPub!
Not an educator but still interested in using this content? No problem! Visit our provider's page to contact the publisher and get permission directly.

Topic: Transmission Electron Microscope Examination Of Materials

Results

Effects of agglomeration of carbon particles in the semiconducting material on the dielectric strength of XLPE insulation
1988 / IEEE
By: Ishida, M.; Okamoto, T.; Hozumi, N.;
Effect of Zr additions on the microstructural and magnetic properties of NdFeB based magnets
1988 / IEEE
By: Pollard, R.J.; Lord, D.G.; Parker, S.F.H.; Grundy, P.J.;
The preparation of Co/Fe alloy fine particles from HFeCo/sub 3/(CO)/sub 12/
1988 / IEEE
By: Chapman, J.N.; Kilner, M.; Hoon, S.R.; Mason, N.; Lambrick, D.B.;
A study of the stability of Co-rich TbFeCo thin films
1988 / IEEE
By: Vitton, J.P.; Urban, A.; Gimenez, C.;
Magnetic structure determination in small regularly shaped particle using transmission electron microscopy
1988 / IEEE
By: Chapman, J.N.; McVitie, S.;
Low temperature synthesis and characterization of gamma -Fe/sub 2/O/sub 3/ particles
1988 / IEEE
By: Pernet, M.; Obradors, X.; Vallet, M.; Medarde, M.; Rodriguez, J.;
Synthesis and characterization of new substituted barium-ferrite particles for magnetic recording
1988 / IEEE
By: Obradors, X.; Pernet, M.; Germi, P.; Hernandez, T.; Vallet, M.;
Diffractometric investigation of the modulated structure in Alnico-type permanent magnets
1988 / IEEE
By: Klodas, K.; Wojcik, M.; Gaca, J.; Sass, J.; Dymkowski, T.;
TEM-study of the precipitation of iron in Nd-Fe-B sintered magnets
1988 / IEEE
By: Tawara, Y.; Fidler, J.;
TEM observation of electrical tree paths and micro-structures in polyethylene
1988 / IEEE
By: Okamoto, T.; Hozumi, N.; Fukagawa, H.;
Effects of Ti-containing underlayers on planarization and microstructure of magnetron sputtered Al-Cu thin films
1988 / IEEE
By: Ahn, K.Y.; Lin, T.; Chaloux, P.N.; Harper, J.M.E.;
Direct TEM observation of the welding of asperities between two single crystal gold films
1988 / IEEE
By: Chan Siu-Wai;
Direct TEM observation of the welding of asperities between two single-crystal gold films
1989 / IEEE
By: Chan, S.-W.;
IrSi Schottky-barrier infrared detectors with 10- mu m cutoff wavelength
1988 / IEEE
By: Tsaur, B.-Y.; Yew, T.-R.; Pellegrini, P.W.; Trubiano, R.; Weeks, M.M.;
Preferred crystallographic directions of pore propagation in porous silicon layers
1988 / IEEE
By: Chaung, S.; Smith, R.L.;
Numerical simulation of stress-dependent oxide growth at convex and concave corners of trench structures
1989 / IEEE
By: Odanaka, S.; Umimoto, H.; Nakao, I.;
Electrical and material quality of Si/sub 1-x/Ge/sub x//Si p-N heterojunctions produced by limited reaction processing
1989 / IEEE
By: Laderman, S.S.; Kamins, T.I.; Scott, M.P.; Gibbons, J.F.; King, C.A.; Gronet, C.M.; Noble, D.B.; Hoyt, J.L.;
Some microstructural characteristics of relaxor ferroelectrics
1988 / IEEE
By: Baba-Kishi, K.Z.; Hilton, A.D.; Barber, D.J.;
Surface crystallization of amorphous alloy Metglas 2826
1989 / IEEE
By: Kramer, J.J.; Pregger, B.A.;
Exchange anisotropy in 'amorphous' Co-Gd films. II
1989 / IEEE
By: Hagstrom, S.B.; Hopkins, A.; Toxen, A.M.; White, R.M.;
Magnetization distribution in nearly isotropic, ultra-soft magnetic CoB amorphous thin films
1989 / IEEE
By: Walser, R.M.; Jeong, I.S.;
Al-doped Nd-Fe-B permanent magnets: wetting and microstructural investigations
1989 / IEEE
By: Henig, E.T.; Fidler, J.; Schneider, G.; Knoch, K.G.; Kronmuller, H.;
Growth of chiton teeth evidenced from magnetic measurement and microstructure characterization
1989 / IEEE
By: Chin, T.S.; Li, C.-W.; Huang, S.H.; Li, J.S.;
The temperature dependence of coercivity in cobalt-aluminum fine-particle ferromagnets
1989 / IEEE
By: Soffa, W.A.; Zeltser, A.M.;
Magneto-optical properties of highly Al-substituted (Y,Bi)/sub 3/(Fe,Al)/sub 5/O/sub 12/ sputtered films in short wavelength region
1989 / IEEE
By: Yasuda, K.; Yamazaki, Y.; Namikawa, T.;
Effect of bias sputtering on magnetic properties and structure of compositionally modulated Tb/sub 32/Fe/sub 68/ films
1989 / IEEE
By: Choe, G.; Walser, R.M.;
Properties of rapidly solidified Nd-Fe-Ga-Co-B alloys
1989 / IEEE
By: Croat, J.J.; Panchanathan, V.;
Effect of bulk recombination current on the current gain of GaAs/AlGaAs heterojunction bipolar transistors in GaAs-on-Si
1989 / IEEE
By: Adkisson, J.W.; Lee, W.-S.; Ma, T.; Harris, J.S., Jr.;
A selective LPCVD tungsten process using silane reduction for VLSI applications
1990 / IEEE
By: Komori, J.; Kotani, H.; Tsutsumi, T.; Nagao, S.;
High coercivity of CoCrTa on a very thin Cr underlayer
1990 / IEEE
By: Wu, C.D.; Lin, J.C.; Sivertsen, J.M.;
Structural analysis of the stabilization layer of chromium dioxide particles
1990 / IEEE
By: Schwab, E.; Muller, M.W.; Essig, M.;
Observation of aggregates in magnetic particle lacquers
1990 / IEEE
By: Felius, J.A.P.; Scholten, P.C.; Slob, C.;
A transmission electron microscopy study of ultrasonic wire bonding
1990 / IEEE
By: Krzanowski, J.E.;
Multiple-wavelength diode laser superarray
1990 / IEEE
By: Paoli, T.L.; Nelson, S.E.; Treat, D.W.; Epler, J.E.;
GaAs MESFETs on InP substrates grown using chloride close-proximity reactor system
1990 / IEEE
By: Chu, S.N.G.; Smith, P.R.; Vella-Coleiro, G.P.; Yee, C.M.L.; Jeong, J.; Paczkowski, J.P.; Davisson, P.S.;
Inversion layer mobility under high normal field in nitrided-oxide MOSFETs
1990 / IEEE
By: Hori, T.;
Growth and characterization of continuously graded index separate confinement heterostructure (GRIN-SCH) InGaAs-InP long wavelength strained layer quantum-well lasers by metalorganic vapor phase epitaxy
1990 / IEEE
By: Chu, S.N.G.; Temkin, H.; Logan, R.A.; Tanbun-Ek, T.; Wecht, K.W.; Sergent, A.M.; Olsson, N.A.;
Effects of polymer/metal interaction in thin-film multichip module applications
1990 / IEEE
By: Rinne, G.A.; Hwang, L.-T.; Turlick, I.; Adema, G.M.; Berry, M.J.;
TEM analysis of failed bits and improvement of data retention properties in megabit-DRAMS
1990 / IEEE
By: Ayukawa, A.; Onishi, S.; Sakiyama, K.; Tanaka, K.;
Lattice defects in lithium tantalate
1989 / IEEE
By: Doukhan, J.C.; Aubry, J.P.; Fragneau, M.; Doukhan, N.; Cordier, P.;
Poly Si-Si interfacial oxide ball-up mechanism and its control for 0.8 mu m BiCMOS VLSIs
1989 / IEEE
By: Momose, H.; Higashizono, M.; Maeda, T.; Matsunaga, J.;
Physical characterization of low defect SIMOX materials
1989 / IEEE
By: Yue, J.; Gardner, G.; Fechner, P.S.; Cordts, B.; Liu, S.T.;
Effect of annealing conditions on precipitate and defect evolution in oxygen implanted SOI material
1989 / IEEE
By: Visitserngtrakul, S.; Krause, S.J.; Roitman, P.; Cordts, B.F.;
Electrochemical method for defect delineation in thin-film SOI wafers
1989 / IEEE
By: Jones, H.D.T.; Stevenson, J.O.; Tsao, S.S.; Medernach, J.W.; Kelly, M.J.; Guilinger, T.R.;
Reassessment of defect models in graphite strip heater zone-melt recrystallized material by non-destructive thin film diagnostics
1989 / IEEE
By: de Kock, A.J.R.; Goemans, A.H.; Theunissen, M.J.J.; Baumgart, H.; Geijselaers, M.L.J.;
Highly reliable ultra-thin SiO/sub 2/ films formed by rapid thermal processing
1989 / IEEE / 0-7803-0817-4
By: Fukuda, H.; Ohno, S.; Arakawa, T.;
Characteristics of LPCVD WSi/sub 2//n-Si Schottky contacts
1991 / IEEE
By: Shenai, K.;
A transmission electron microscopy study of ultrasonic wire bonding
1989 / IEEE
By: Krzanowski, J.E.;
A fine process control on the via hole of multilevel interconnection
1989 / IEEE
By: Miki, K.; Ayukawa, A.; Ohnishi, S.; Takenaka, N.; Saito, S.; Sakiyama, K.;
Possible three-terminal device with YBCO angle grain boundary
1991 / IEEE
By: Sasahara, H.; Yamashita, T.; Chen, J.; Hirotsu, Y.; Kurosawa, H.; Suzuki, H.;
Sputtered ZrO/sub 2/ overcoat with superior corrosion protection and mechanical performance in thin film rigid disk application
1988 / IEEE
By: Chen, T.; Shir, J.; Chen, G.L.; Yamashita, T.;
Carbon overcoat and the process dependence on its microstructure and wear characteristics
1988 / IEEE
By: Siekhaus, W.; Salmeron, M.; Ogletree, D.F.; Marchon, B.; Veirs, K.; Khan, M.R.; Smallen, M.; Smith, S.; Fisher, R.D.; Heiman, N.; Hughes, G.F.;
SEMPA domain observation compared to three other methods
1988 / IEEE
By: Judy, J.H.; Cameron, G.P.;
Microstructure control in high Ti NbTi alloys
1989 / IEEE
By: McKinnell, J.C.; Lee, P.J.; Larbalestier, D.C.;
Measurement and correlation of optical and TEM twins in Y/sub 1/Ba/sub 2/Cu/sub 3/O/sub 7- delta /
1989 / IEEE
By: Kim, M.R.; Verhoeven, J.D.; Chumbley, L.S.; Kramer, M.J.; Cornelius, A.L.;
Bi-Ca-Sr-Cu-O superconductors: the connectivity issue
1989 / IEEE
By: Luo, H.L.; Mei, Y.; Rudee, M.L.; Green, S.M.; Thomas, G.; Ramesh, R.;
Fabrication and properties of Bi-Sr-Ca-Cu-O thin films made using pulsed laser deposition
1989 / IEEE
By: Ponce, F.A.; Boyce, J.B.; Geballe, T.H.; Fork, D.K.; Johnson, R.I.;
Properties of in-situ superconducting thin films of Y-Ba-Cu-O on Si, Al/sub 2/O/sub 3/, and SrTiO/sub 3/ substrates
1989 / IEEE
By: Ogawa, E.; Berezin, A.B.; Silver, R.M.; de Lozanne, A.L.;
New Tl-Ba-Ca-Cu-O (1234 and 1245) superconductors with T/sub c/>117 K
1989 / IEEE
By: Jo, M.; Ohashi, S.; Terada, N.; Hirabayashi, M.; Ihara, H.; Hayashi, K.; Shimomura, T.; Sugise, R.; Kimura, Y.; Tokumoto, M.;
Superconductivity and crystal structure in the Bi-Pb-Sr-Ca-Cu-O system
1989 / IEEE
By: Zizhao Gan; Jian Zhang; Sungi Feng; Xing Zhu;
Comparison of YBa/sub 2/Cu/sub 3/O/sub 7/ films grown by solid-state and vapor-phase epitaxy
1989 / IEEE
By: Gavaler, J.R.; Talvacchio, J.; Braginski, A.I.; Forrester, M.G.; Greggi, J.;
Are there two distinct morphologies in human and bovine bone mineral?
1988 / IEEE / 0-7803-0785-2
By: Isaac, D.H.; Green, M.; Mackie, I.G.;
Enhanced elimination of extended defects associated with P/sup +/ and Ga/sup +/ implantation of SIMOX
1988 / IEEE
By: Venables, D.; Jones, K.S.; Davis, G.; Horne, C.R.;
Study of CoNbFe films deposited by DC magnetron sputtering
1991 / IEEE
By: Pan, G.; Spencer, A.G.; Howson, R.P.;
Magnetic properties of melt spun SmFe/sub 11/Ti-Sm/sub 2/TM/sub 17/ pseudobinary alloys
1990 / IEEE
By: Lin, C.H.; Chen, S.K.; Chen, Y.S.; Chin, T.S.; Huang, S.H.; Lee, P.Y.;
Possible mechanism of biomagnetic sense organ extracted from sockeye salmon
1990 / IEEE
By: Kato, M.; Motomiya, T.; Sakaki, Y.; Ogura, M.;
Texture formation and magnetic properties of RF sputtered CoCrTa/Cr longitudinal thin films
1990 / IEEE
By: Judy, J.H.; Sivertsen, J.M.; Hsu, Y.;
Transmission electron microscope studies of Pr-Fe-B alloy prepared by melt spinning
1990 / IEEE
By: Kostikas, A.; Jakubovics, J.P.; Meekison, C.D.; Papaefthymiou, V.; Niarchos, D.;
High coercivity Nd-Fe-B sintered magnet containing vanadium with new microstructure
1990 / IEEE
By: Hiraga, K.; Vial, F.; Tenaud, P.; Sagawa, M.;
Magnetization versus heat treatment in rapidly solidified NdFeB alloys
1990 / IEEE
By: Baro, M.D.; Clavaguera-Mora, M.T.; Clavaguera, N.; Diego, J.A.; Surinch, S.;
On the oxygen stabilized Nd-rich phase in the Nd-Fe-B (-O) permanent magnet system
1990 / IEEE
By: Vigier, P.; Lemarchand, D.; Labulle, B.;
Magnetic and recording characteristics of multilayer CoNiCr thin film media
1990 / IEEE
By: Hata, H.; Shibata, H.; Umesaki, M.; Yabushita, K.; Fukuichi, T.; Hyohno, T.;
Magnetic properties and microstructures of Fe/sub 3/O/sub 4/- gamma Fe/sub 2/O/sub 3/ intermediate state
1990 / IEEE
By: Namikawa, T.; Nakajima, G.; Sato, M.; Yamazaki, Y.;
Magnetic properties of Co/sub 70.4/Fe/sub 4.6/Si/sub 15/B/sub 10/ surfactant assisted ball milled amorphous powders
1990 / IEEE
By: Ninham, B.W.; Calka, A.; Bramley, R.; Kaczmarek, W.A.;
The influence of Ga-substitution on the coercivity of Nd-(Fe,Co)-B sintered permanent magnets
1990 / IEEE
By: Fidler, J.; Tokunaga, M.; Groiss, C.;
Upgraded Nd-Fe-B-AD (AD=Al,Ga) magnets: wettability and microstructure
1990 / IEEE
By: Petzow, G.; Kronmuller, H.; Henig, E.T.; Grieb, B.; Knoch, K.G.;
Preparation of high quality and tunable band gap hydrogenated amorphous silicon by homogeneous-CVD (HOMOCVD)
1988 / IEEE
By: Mertens, R.; Nijs, J.; Van Ammel, A.; Michiel, H.; Qian, Z.M.;
Minority carrier lifetime of GaAs on silicon
1988 / IEEE
By: Al-Jassim, M.M.; Ahrenkiel, R.K.; Haven, V.E.; Tobin, S.P.; Vernon, S.M.; Jones, K.M.; Dunlavy, D.J.;
Epitaxial growth of beta -SiC on Si by RTCVD with C/sub 3/H/sub 8/ and SiH/sub 4/
1992 / IEEE
By: Steckl, A.J.; Li, J.P.;
The effects of point defects on the electrical activation of Si-implanted GaAs during rapid thermal annealing
1992 / IEEE
By: Ohta, K.; Nakagawa, T.; Tanigawa, S.; Wei, L.; Lee, J.-L.; Lee, J.Y.;
Epitaxial growth of PbTiO/sub 3/ films on SrTiO/sub 3/ by RF magnetron sputtering
1991 / IEEE
By: Takeuchi, H.; Kushida, K.;
Growth and the microstructural and ferroelectric characterization of oriented BaMgF/sub 4/ thin films
1991 / IEEE
By: Buhay, H.; Sinharoy, S.; Pollak, T.M.; Lampe, D.R.; Burke, M.G.;
CdS/CdTe solar cells by the screen-printing-sintering technique
1990 / IEEE
By: Suyama, N.; Murozono, M.; Kitamura, S.; Ueno, N.; Nishiyama, Y.; Arita, T.;
Secondary and polymorphic phase behavior of thin film CuInSe/sub 2/: ramifications on the device performance
1990 / IEEE
By: Noufi, R.; Goral, J.P.; Albin, D.S.; Tuttle, J.R.;
Deposition of CuInSe/sub 2/ by the hybrid sputtering and evaporation method
1990 / IEEE
By: Talieh, H.; Kiely, C.J.; Kenshole, G.; Banda, E.; Yang, L.C.; Agarwal, A.; Rockett, A.;
Domains and domain nucleation in magnetron-sputtered CoCr thin films
1992 / IEEE
By: Demczyk, B.G.;
Stress and TEM measurements as a function of temperature for aluminum alloys
1990 / IEEE
By: Flinn, P.A.; Longworth, H.P.; Gardner, D.S.;
In-situ stress changes of WSi/sub x/ film during polycide process sequence
1990 / IEEE
By: Pramanik, D.; Jain, V.;
Issues associated with the use of electroless copper films for submicron multilevel interconnections
1990 / IEEE
By: Myers, S.A.; Sekigahama, S.; Thomas, M.E.;
Characterization of polysilicon-encapsulated local oxidation
1992 / IEEE
By: Ray, W.J.; Roth, S.S.; Ko, J.; Gunderson, C.D.; Kirsch, H.C.; Cooper, K.; Mazure, C.;
Structural characteristics of grain boundaries in superconducting Bi/sub 2/Sr/sub 2/Ca/sub 1/Cu/sub 2/O/sub x/ fibers
1991 / IEEE
By: Sanders, S.C.; Chumbley, L.S.; Kramer, M.J.; Miller, T.A.;
Microscopic observation of interface structures of YBaCuO/MgO/YBaCuO double-heteroepitaxial thin films by TEM
1991 / IEEE
By: Matsui, M.; Kobayashi, T.; Iyori, M.; Sakuta, K.; Nakajima, M.;
LaAlO/sub 3/-YBCO multilayers
1991 / IEEE
By: Hu, R.; Luine, J.A.; Simon, R.W.; Burch, J.F.; Lee, A.E.; Schwarzbek, S.M.;
Properties of epitaxially grown A-axis oriented YBa/sub 2/Cu/sub 3/O/sub 7-x/-PrBa/sub 2/Cu/sub 3/O/sub 7-y/ heterostructures
1991 / IEEE
By: Barner, J.; Hart, D.; Remschnig, K.; Wilkens, B.; Rogers, C.T.; Ramesh, R.; Inam, A.;
Epitaxial growth of YBCO/MgO/YBCO structures
1991 / IEEE
By: Higaki, K.; Matsuura, T.; Nakanishi, H.; Tanaka, S.; Yazu, S.; Itozaki, H.;
Barrier technology for DyBa/sub 2/Cu/sub 3/O/sub 7-x/ junctions and related structures
1991 / IEEE
By: Wang, T.; Tsen, M.; Spalding, G.C.; Schultz, R.K.; Johnson, B.R.; Evans, J.F.; Beauchamp, K.M.; Goldman, A.M.; Zhang, Y.-J.; Mecartney, M.L.;
Cross-sectional TEM observation of Nb/AlO/sub x/-Al/Nb junction structures
1991 / IEEE
By: Imamura, T.; Hasuo, S.;
Josephson effect and small-angle grain boundary in YBCO thin film bridge
1991 / IEEE
By: Miyagawa, K.; Kurosawa, H.; Suzuki, H.; Hirai, T.; Hirotsu, Y.; Yamane, H.; Yamashita, T.; Era, M.;
Electrical tree and deteriorated region in polyethylene
1992 / IEEE
By: Uchida, K.; Shimizu, N.; Rasikawan, S.;
Electrical and structural properties of diodes fabricated in thick, selectively deposited Si/Si/sub 1-x/Ge/sub x/ epitaxial layers
1992 / IEEE
By: Gibbons, J.F.; Noble, D.B.; Hoyt, I.L.; Jacowitz, R.D.; Nauka, K.; Kamins, T.I.;

Next Page
Return To Top