Your Search Results
Use materials about this topic in your textbook!
AcademicPub holds over eight million pieces of educational content - such as case studies and journal articles - for you to mix-and-match your way.
Experience the freedom of customizing your course pack with AcademicPub!

Topic: Time-of-arrival Estimation
Results
2012 / IEEE
By: Habets, E.A.P.; Thomas, M.R.P.; Filos, J.; Antonacci, F.; Tubaro, S.; Naylor, P.A.; Sarti, A.;
By: Habets, E.A.P.; Thomas, M.R.P.; Filos, J.; Antonacci, F.; Tubaro, S.; Naylor, P.A.; Sarti, A.;
2011 / IEEE / 978-1-61284-795-5
By: Korotkov, D.A.; Rogozhnikov, E.V.; Voroshilin, E.P.; Vershinin, A.S.; Maikov, D.Y.;
By: Korotkov, D.A.; Rogozhnikov, E.V.; Voroshilin, E.P.; Vershinin, A.S.; Maikov, D.Y.;
2011 / IEEE / 978-1-4577-0088-0
By: Pan-Mook Lee; Sea-Moon Kim; Sung-Hoon Byun; Woojae Seong; Yong-Kon Lim;
By: Pan-Mook Lee; Sea-Moon Kim; Sung-Hoon Byun; Woojae Seong; Yong-Kon Lim;
2011 / IEEE / 978-1-4244-9827-7
By: Rajagopalan, V.; Bhattacharya, A.; Badami, V.; Naithani, N.; Prabhu, R.; Behera, A.;
By: Rajagopalan, V.; Bhattacharya, A.; Badami, V.; Naithani, N.; Prabhu, R.; Behera, A.;
Joint anchor-less tracking and room dimensions estimation through IR-UWB peer-to-peer communications
2011 / IEEE / 978-1-4577-1764-2By: La Tosa, V.; Uguen, B.; Denis, B.;
2011 / IEEE / 978-1-4577-1764-2
By: Heiries, V.; D'Errico, R.; Ouvry, L.; Denis, B.; Dehmas, F.; Belmkaddem, K.;
By: Heiries, V.; D'Errico, R.; Ouvry, L.; Denis, B.; Dehmas, F.; Belmkaddem, K.;
2011 / IEEE / 978-88-903482-3-5
By: Balbastre-T, J.V.; Mantilla-G, I.A.; Galati, G.; Leonardi, M.; de los Reyes, E.;
By: Balbastre-T, J.V.; Mantilla-G, I.A.; Galati, G.; Leonardi, M.; de los Reyes, E.;
2011 / IEEE / 978-88-903482-3-5
By: De Los Reyes-Davo, E.; Balbastre-Tejedor, J.V.; Gomez-Perez, E.J.; Mantilla-Gaviria, I.A.; Ruiz-Mojica, R.F.;
By: De Los Reyes-Davo, E.; Balbastre-Tejedor, J.V.; Gomez-Perez, E.J.; Mantilla-Gaviria, I.A.; Ruiz-Mojica, R.F.;
2011 / IEEE / 978-88-903482-3-5
By: Johansson, A.; Tengstrand, G.; Bosser, L.; Grandin, J.; Andersson, V.; Andersson, B.; Benvenuti, D.; Hultman, P.;
By: Johansson, A.; Tengstrand, G.; Bosser, L.; Grandin, J.; Andersson, V.; Andersson, B.; Benvenuti, D.; Hultman, P.;
2011 / IEEE / 978-1-4577-0894-7
By: Li Wei-sheng; Zhu Jian-hui; Hu Shi-guo; Fang Yang-wang; Gao Xiang;
By: Li Wei-sheng; Zhu Jian-hui; Hu Shi-guo; Fang Yang-wang; Gao Xiang;
2011 / IEEE / 978-88-903482-3-5
By: Bosser, L.; Grandin, J.-F.; Hultman, P.; Benvenuti, D.; Andersson, B.; Andersson, V.; Tengstrand, G.; Johansson, A.;
By: Bosser, L.; Grandin, J.-F.; Hultman, P.; Benvenuti, D.; Andersson, B.; Andersson, V.; Tengstrand, G.; Johansson, A.;
2011 / IEEE / 978-1-61284-893-8
By: Rinaldi, S.; Flammini, A.; De Dominicis, C.M.; Carbone, P.; Moschitta, A.; Cazzorla, A.; Sisinni, E.;
By: Rinaldi, S.; Flammini, A.; De Dominicis, C.M.; Carbone, P.; Moschitta, A.; Cazzorla, A.; Sisinni, E.;
2011 / IEEE / 978-1-4577-0693-6
By: Antonacci, F.; Canclini, A.; Tubaro, S.; Naylor, P.A.; Sarti, A.; Filos, J.; Thomas, M.R.P.;
By: Antonacci, F.; Canclini, A.; Tubaro, S.; Naylor, P.A.; Sarti, A.; Filos, J.; Thomas, M.R.P.;
2011 / IEEE / 978-1-4577-1702-4
By: Costabeber, A.; Tomasin, S.; Lorenzon, F.; Erseghe, T.; Tenti, P.;
By: Costabeber, A.; Tomasin, S.; Lorenzon, F.; Erseghe, T.; Tenti, P.;
2011 / IEEE / 978-89-93215-03-8
By: Se Phil Song; Chansik Park; Sang Jeong Lee; Young-Baek Kim; Heon Ho Choi;
By: Se Phil Song; Chansik Park; Sang Jeong Lee; Young-Baek Kim; Heon Ho Choi;