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Topic: Time-domain Measurement
Results
1991 / IEEE / 0-8186-2485-X
By: Xia, R.; Malik, M.; Camm, A.J.; Staunton, A.; Farrell, T.; Odemuyiwa, O.; Poloniecki, J.;
By: Xia, R.; Malik, M.; Camm, A.J.; Staunton, A.; Farrell, T.; Odemuyiwa, O.; Poloniecki, J.;
1999 / IEEE / 0-7803-5057-X
By: Holloway, C.L.; Novotny, D.R.; Johnk, R.T.; Kuester, E.F.; Johansson, M.;
By: Holloway, C.L.; Novotny, D.R.; Johnk, R.T.; Kuester, E.F.; Johansson, M.;
2004 / IEEE
By: Jenkins, K.A.; Singh, D.V.; Wong, H.-S.P.; Grill, A.; Neumayer, D.; Appenzeller, J.;
By: Jenkins, K.A.; Singh, D.V.; Wong, H.-S.P.; Grill, A.; Neumayer, D.; Appenzeller, J.;
2006 / IEEE
By: Youchul Jeong; Hyungsoo Kim; Jongbae Park; Joungho Kim; Dong Gun Kam; Jun So Pak; Jingook Kim;
By: Youchul Jeong; Hyungsoo Kim; Jongbae Park; Joungho Kim; Dong Gun Kam; Jun So Pak; Jingook Kim;
Experimental Observation of Inflection-Point Slow Light Modes in Photonic Crystal Coupled Waveguides
2007 / IEEE / 978-1-55752-834-6By: Shih-Chieh Huang; Notomi, M.; Chien-Ping Lee; Kuramochi, E.; Kato, M.;
2008 / IEEE / 978-1-4244-2656-0
By: Watanabe, H.; Saitou, Y.; Saitou, Y.; Baba, T.; Watanabe, H.; Baba, T.; Nozaki, K.; Nozaki, K.;
By: Watanabe, H.; Saitou, Y.; Saitou, Y.; Baba, T.; Watanabe, H.; Baba, T.; Nozaki, K.; Nozaki, K.;
2009 / IEEE / 978-1-4244-4266-9
By: Papazian, P.; Johnk, R.T.; Ottke, H.; Sanders, G.; DeMinco, N.; McKenna, P.;
By: Papazian, P.; Johnk, R.T.; Ottke, H.; Sanders, G.; DeMinco, N.; McKenna, P.;
2010 / IEEE / 978-1-4244-5623-9
By: Fan Zhou; Jun Fan; Tan, K.; Inoue, H.; Kayano, Y.; Pommerenke, D.; Songping Wu;
By: Fan Zhou; Jun Fan; Tan, K.; Inoue, H.; Kayano, Y.; Pommerenke, D.; Songping Wu;
2010 / IEEE / 978-2-87487-016-3
By: Schwartz, J.D.; Lujambio, A.; Arregui, I.; Chudzik, M.; Plant, D.V.; Arnedo, I.; Laso, M.A.G.; Lopetegi, T.; Aza�J.;
By: Schwartz, J.D.; Lujambio, A.; Arregui, I.; Chudzik, M.; Plant, D.V.; Arnedo, I.; Laso, M.A.G.; Lopetegi, T.; Aza�J.;
2011 / IEEE / 978-1-61284-757-3
By: Saad El Dine, M.; Ahmed, S.; Nebus, J.M.; Barataud, D.; Neveux, G.; Reveyrand, T.;
By: Saad El Dine, M.; Ahmed, S.; Nebus, J.M.; Barataud, D.; Neveux, G.; Reveyrand, T.;