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Topic: Threshold Current
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2011 / IEEE
By: Hamacher, M.; Syvridis, D.; Mesaritakis, C.; Stamataki, I.; Kapsalis, A.; Heidrich, H.;
By: Hamacher, M.; Syvridis, D.; Mesaritakis, C.; Stamataki, I.; Kapsalis, A.; Heidrich, H.;
2011 / IEEE
By: Hattori, S.; Yukawa, K.; Yanai, A.; Katayama, T.; Kawaguchi, H.; Koh, S.; Ikeda, K.;
By: Hattori, S.; Yukawa, K.; Yanai, A.; Katayama, T.; Kawaguchi, H.; Koh, S.; Ikeda, K.;
2012 / IEEE
By: Takahashi, D.; Arai, S.; Nishiyama, N.; Amemiya, T.; Shinno, K.; Shindo, T.; Shirao, M.; SeungHun Lee;
By: Takahashi, D.; Arai, S.; Nishiyama, N.; Amemiya, T.; Shinno, K.; Shindo, T.; Shirao, M.; SeungHun Lee;
2011 / IEEE / 978-3-8007-3356-9
By: Ramdane, A.; Lelarge, F.; Accard, A.; Martinez, A.; Merghem, K.; Rosales, R.;
By: Ramdane, A.; Lelarge, F.; Accard, A.; Martinez, A.; Merghem, K.; Rosales, R.;
2011 / IEEE / 978-3-8007-3356-9
By: Adachi, K.; Tsuji, S.; Sugawara, T.; Matsuoka, Y.; Kitatani, T.; Shinoda, K.;
By: Adachi, K.; Tsuji, S.; Sugawara, T.; Matsuoka, Y.; Kitatani, T.; Shinoda, K.;
2011 / IEEE / 978-3-8007-3356-9
By: Osabe, R.; Shindo, T.; Futami, M.; Okumura, T.; Ito, H.; Arai, S.; Nishiyama, N.; Amemiya, T.; Koguchi, T.;
By: Osabe, R.; Shindo, T.; Futami, M.; Okumura, T.; Ito, H.; Arai, S.; Nishiyama, N.; Amemiya, T.; Koguchi, T.;
2011 / IEEE / 978-986-02-8974-9
By: Arai, S.; Nishiyama, N.; Amemiya, T.; Koguchi, T.; Shindo, T.; Osabe, R.; Okumura, T.; Futami, M.;
By: Arai, S.; Nishiyama, N.; Amemiya, T.; Koguchi, T.; Shindo, T.; Osabe, R.; Okumura, T.; Futami, M.;
2011 / IEEE / 978-1-4577-0509-0
By: Linfield, E.H.; Davies, A.G.; Li, L.; Khanna, S.P.; Capasso, F.; Belkin, M.A.; Fan, J.; Wang, Q.J.; Vijayraghavan, K.; Adams, R.W.;
By: Linfield, E.H.; Davies, A.G.; Li, L.; Khanna, S.P.; Capasso, F.; Belkin, M.A.; Fan, J.; Wang, Q.J.; Vijayraghavan, K.; Adams, R.W.;
2011 / IEEE / 978-1-4244-8939-8
By: Lott, J.A.; Brown, S.N.; Kasten, A.M.; Choquette, K.D.; Ledentsov, N.N.; Shchukin, V.A.;
By: Lott, J.A.; Brown, S.N.; Kasten, A.M.; Choquette, K.D.; Ledentsov, N.N.; Shchukin, V.A.;
2011 / IEEE / 978-1-4244-8939-8
By: Katayama, T.; Kawaguchi, H.; Koh, S.; Ikeda, K.; Hattori, S.; Yukawa, K.; Yanai, A.;
By: Katayama, T.; Kawaguchi, H.; Koh, S.; Ikeda, K.; Hattori, S.; Yukawa, K.; Yanai, A.;
2011 / IEEE / 978-0-9775657-8-8
By: Shindo, T.; Amemiya, T.; Arai, S.; Nishiyama, N.; Myoga, S.; Takahashi, D.;
By: Shindo, T.; Amemiya, T.; Arai, S.; Nishiyama, N.; Myoga, S.; Takahashi, D.;
2012 / IEEE / 978-1-55752-935-1
By: Yiyang Xie; Guangdi Shen; Hongda Chen; Chunxia Wang; Qiang Kan; Chen Xu;
By: Yiyang Xie; Guangdi Shen; Hongda Chen; Chunxia Wang; Qiang Kan; Chen Xu;
2012 / IEEE / 978-1-4577-1619-5
By: Arai, S.; Nishiyama, N.; Amemiya, T.; Doi, K.; Shindo, T.; Shinno, K.; Futami, M.;
By: Arai, S.; Nishiyama, N.; Amemiya, T.; Doi, K.; Shindo, T.; Shinno, K.; Futami, M.;
2012 / IEEE / 978-1-4577-1865-6
By: Donguk Nam; Saraswat, K.; Nishi, Y.; Brongersma, M.; Huang, K.C.; Szu-Lin Cheng; Sukhdeo, D.;
By: Donguk Nam; Saraswat, K.; Nishi, Y.; Brongersma, M.; Huang, K.C.; Szu-Lin Cheng; Sukhdeo, D.;
2012 / IEEE / 978-1-4673-0219-7
By: Jang, Kyounghoon; Kang, Bongsoon; Kang, Hyunjung; Yuk, Jihong; Jo, Hosang;
By: Jang, Kyounghoon; Kang, Bongsoon; Kang, Hyunjung; Yuk, Jihong; Jo, Hosang;
2011 / IEEE
By: Ling-Xiu Zou; Xiao-Meng Lv; Jian-Dong Lin; Qi-Feng Yao; Jin-Long Xiao; Yue-De Yang; Yong-Zhen Huang;
By: Ling-Xiu Zou; Xiao-Meng Lv; Jian-Dong Lin; Qi-Feng Yao; Jin-Long Xiao; Yue-De Yang; Yong-Zhen Huang;
2011 / IEEE
By: Min Hwan Kwak; Sungil Kim; Taeyong Kim; Sang-Bae Kim; Kwang-Yong Kang; Seung Beom Kang;
By: Min Hwan Kwak; Sungil Kim; Taeyong Kim; Sang-Bae Kim; Kwang-Yong Kang; Seung Beom Kang;
2013 / IEEE
By: Futami, Mitsuaki; Shindo, Takahiko; Doi, Kyohei; Arai, Shigehisa; Lee, Jieun; Amemiya, Tomohiro; Yang, Shu; Inoue, Daisuke; Hiratani, Takuo; Nishiyama, Nobuhiko;
By: Futami, Mitsuaki; Shindo, Takahiko; Doi, Kyohei; Arai, Shigehisa; Lee, Jieun; Amemiya, Tomohiro; Yang, Shu; Inoue, Daisuke; Hiratani, Takuo; Nishiyama, Nobuhiko;
2015 / IEEE
By: Mukherjee, J.; Marko, I.P.; Adams, A.R.; Corbett, B.; Stolojan, V.; Pelucchi, E.; Gocalinska, A.; Sweeney, S.J.; Thomas, K.;
By: Mukherjee, J.; Marko, I.P.; Adams, A.R.; Corbett, B.; Stolojan, V.; Pelucchi, E.; Gocalinska, A.; Sweeney, S.J.; Thomas, K.;
2015 / IEEE
By: Taylor, R.J.E.; Childs, D.T.D.; Hogg, R.A.; Zhou, H.; Thoms, S.; Ternent, G.; Li, G.; Crombie, A.J.; Khamas, S.; Sarma, J.; Babazadeh, N.; Ivanov, P.; Stevens, B.J.;
By: Taylor, R.J.E.; Childs, D.T.D.; Hogg, R.A.; Zhou, H.; Thoms, S.; Ternent, G.; Li, G.; Crombie, A.J.; Khamas, S.; Sarma, J.; Babazadeh, N.; Ivanov, P.; Stevens, B.J.;
2015 / IEEE
By: Kan, Q.; Yu, H.; Chen, W.; Ding, Y.; Li, S.; Li, M.; Pan, J.; Wang, W.; Mi, J.; Zhou, X.;
By: Kan, Q.; Yu, H.; Chen, W.; Ding, Y.; Li, S.; Li, M.; Pan, J.; Wang, W.; Mi, J.; Zhou, X.;
2015 / IEEE
By: Hadjinicolaou, A. E.; O'Brien, B. J.; Ibbotson, M. R.; Cloherty, S. L.; Garrett, D. J.; Apollo, N. V.; Savage, C. O.;
By: Hadjinicolaou, A. E.; O'Brien, B. J.; Ibbotson, M. R.; Cloherty, S. L.; Garrett, D. J.; Apollo, N. V.; Savage, C. O.;
2014 / IEEE
By: Hiratani, Takuo; Atsumi, Yuki; Lee, Jieun; Doi, Kyohei; Inoue, Daisuke; Arai, Shigehisa; Nishiyama, Nobuhiko; Amemiya, Tomohiro; Atsuji, Yuki;
By: Hiratani, Takuo; Atsumi, Yuki; Lee, Jieun; Doi, Kyohei; Inoue, Daisuke; Arai, Shigehisa; Nishiyama, Nobuhiko; Amemiya, Tomohiro; Atsuji, Yuki;
2014 / IEEE
By: Hiratani, Takuo; Arai, Shigehisa; Nishiyama, Nobuhiko; Amemiya, Tomohiro; Atsuji, Yuki; Doi, Kyohei;
By: Hiratani, Takuo; Arai, Shigehisa; Nishiyama, Nobuhiko; Amemiya, Tomohiro; Atsuji, Yuki; Doi, Kyohei;
2013 / IEEE
By: Vijayraghavan, Karun; Jiang, Aiting; Belkin, Mikhail A.; Wasilewski, Zbig R.; Jirauschek, Christian; Matyas, Alpar;
By: Vijayraghavan, Karun; Jiang, Aiting; Belkin, Mikhail A.; Wasilewski, Zbig R.; Jirauschek, Christian; Matyas, Alpar;
2013 / IEEE
By: Trankle, G.; Kneissl, M.; Schwarz, U. T.; Einfeldt, S.; Lukens, G.; Weig, T.; Wenzel, H.; Redaelli, L.;
By: Trankle, G.; Kneissl, M.; Schwarz, U. T.; Einfeldt, S.; Lukens, G.; Weig, T.; Wenzel, H.; Redaelli, L.;
1988 / IEEE
By: Yamamoto, Y.; Higuchi, H.; Namizaki, H.; Fujiwara, M.; Kakimoto, S.; Sakakibara, Y.; Takemoto, A.; Nakajima, Y.;
By: Yamamoto, Y.; Higuchi, H.; Namizaki, H.; Fujiwara, M.; Kakimoto, S.; Sakakibara, Y.; Takemoto, A.; Nakajima, Y.;
1988 / IEEE
By: Fliflet, A.W.; Gold, S.H.; Sucy, M.; Kinkead, A.K.; Manheimer, W.M.; Hardesty, D.L.; Granatstein, V.L.; Lee, R.C.; McCowan, R.B.;
By: Fliflet, A.W.; Gold, S.H.; Sucy, M.; Kinkead, A.K.; Manheimer, W.M.; Hardesty, D.L.; Granatstein, V.L.; Lee, R.C.; McCowan, R.B.;
Monolithic waveguide coupled cavity lasers and modulators fabricated by impurity induced disordering
1988 / IEEEBy: Paoli, T.L.; Mosby, W.J.; Thornton, R.L.;
1989 / IEEE
By: Richinn, P.; Maillot, P.; D'Auria, L.; de Gremoux, B.; Blondeau, R.; Deborgies, F.; Chevalier, G.; Combemale, Y.; Talneau, A.; Rondi, D.; Krakowski, M.;
By: Richinn, P.; Maillot, P.; D'Auria, L.; de Gremoux, B.; Blondeau, R.; Deborgies, F.; Chevalier, G.; Combemale, Y.; Talneau, A.; Rondi, D.; Krakowski, M.;
1989 / IEEE
By: Huang, S.Y.; Cheng, W.-H.; Zehr, S.W.; Hess, K.L.; Pooladdej, J.; Renner, D.S.; Wolf, D.; Buehring, K.D.; Appelbaum, A.;
By: Huang, S.Y.; Cheng, W.-H.; Zehr, S.W.; Hess, K.L.; Pooladdej, J.; Renner, D.S.; Wolf, D.; Buehring, K.D.; Appelbaum, A.;
1988 / IEEE
By: Mizuguchi, K.; Kimura, T.; Yoshida, N.; Kawagishi, A.; Murotani, T.; Ohkura, Y.; Takemoto, A.;
By: Mizuguchi, K.; Kimura, T.; Yoshida, N.; Kawagishi, A.; Murotani, T.; Ohkura, Y.; Takemoto, A.;