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Topic: Testing

Results

Tube reliability in TV receivers

1964 / IEEE
By: Herrold, G. V.;

LSI microprocessing workshop summary

1974 / IEEE
By: Waaben, S.; Feth, G. C.;

Data networks: Analysis and design

1974 / IEEE

Toward a theory of test data selection

1975 / IEEE
By: Goodenough, J.B.; Gerhart, S.L.;

A system for reliable engineering software

1975 / IEEE
By: Culpepper, L.M.;

A theory of software reliability and its application

1975 / IEEE
By: Musa, J.D.;

An experimental program-testing facility

1975 / IEEE
By: Fairley, R.E.;

Optimal placement of software monitors aiding systematic testing

1975 / IEEE
By: Ramamoorthy, C.V.; Chen, W.T.; Kim, K.H.;

Testing large software with automated software evaluation systems

1975 / IEEE
By: Siu-Bun F Ho; Ramamoorthy, C.V.;

Specification techniques for data abstractions

1975 / IEEE
By: Liskov, B.H.; Zilles, S.;

A synthesizer of inductive assertions

1975 / IEEE
By: German, S.M.; Wegbreit, B.;

Automated database-driven digital testing

1974 / IEEE
By: Toth, Attila; Holt, Chip;

New precise comparison methods of testing watthour meters

1976 / IEEE
By: Ludmer, J.;

An improved automatic test system for VLSI parametric testing

1982 / IEEE
By: Rung, R.D.; Fang, R.C.Y.; Cham, K.M.;

Consumer telephone I: A switch to electronics: Telephone systems will go completely electronic as reed relays are displaced by digital electronic switching

1980 / IEEE
By: Lucas, Pierre M.;

On structured digraphs and program testing

1981 / IEEE
By: Ntafos, S.C.; Hakimi, S.L.;

Design for automated testing of analog data channels in a PCM switching system

1981 / IEEE
By: Priester, R.W.;

Random testing of integrated circuits

1981 / IEEE
By: Thevenod-Fosse, P.; David, R.;

Counting sequences

1981 / IEEE
By: Cohn, M.; Robinson, J.P.;

A fault diagnosis algorithm for asymmetric modular architectures

1981 / IEEE
By: Meyer, G.G.L.;

IMAP: An interactive computer package for the assessment of multiattribute value functions

1983 / IEEE
By: Deutsch, S.J.; Malmborg, C.J.;

Analysis and classification of human error

1983 / IEEE
By: Rouse, William B.; Rouse, Sandra H.;

Fuzzy subsets with uncertain membership grades

1984 / IEEE
By: Yager, R.R.;

A directed graph representation based on a statistical hypothesis testing and application to citation and association structures

1984 / IEEE
By: Nakayama, K.; Miyamoto, S.;

Microwave short-pulse generator for bed-level detection

1982 / IEEE
By: Balanis, C.A.; DeLauder, D.M.;

Intrinsic considerations for testing floppy disk and rigid disk drives used in computers

1986 / IEEE
By: Anjard, R.P.;

Fault location techniques for distributed control interconnection networks

1985 / IEEE
By: Davis, N.J.; Siegel, H.J.; Hsu, W.T.-Y.;

On testing isomorphism of permutation networks

1985 / IEEE
By: Oruc, A.Y.; Oruc, M.Y.;

A programmable function generator for dynamic analysis testing

1987 / IEEE
By: Vanherck, P.; van der Auweraer, H.; Snoeys, R.;

A versatile cardiac arrhythmia simulator

1987 / IEEE
By: Yvroud, Edouard; Le-Huy, Phieu; Dion, Jean-Luc;

The impact on software development costs of using HOL's

1986 / IEEE
By: Gaffney, J.E.;

Building reliable interactive information systems

1986 / IEEE
By: Piercher, P.A.; Wasserman, A.I.; Shewmake, D.T.;

Axiomatizing software test data adequacy

1986 / IEEE
By: Weyuker, E.J.;

A functional approach to program testing and analysis

1986 / IEEE
By: Howden, W.E.;

Experimentation in software engineering

1986 / IEEE
By: Hutchens, D.H.; Selby, R.W.; Basili, V.R.;

Advances in software inspections

1986 / IEEE
By: Fagan, M.E.;

Nuclear radiation test of a D flip-flop IC using a single-board microcomputer

1987 / IEEE
By: Martin, R.L.; Lim, T.S.; Hughes, H.L.;

Test-point selection and testability measures via QR factorization of linear models

1987 / IEEE
By: Souders, T. Michael; Stenbakken, Gerard N.;

The cloze procedure and software comprehensibility measurement

1986 / IEEE
By: Zweben, S.H.; Hall, W.E.;

On the properties of extended inclusion dependences

1986 / IEEE
By: Miura, T.; Arisawa, H.;

Direct implementation of abstract data types from abstract specifications

1986 / IEEE
By: Urban, J.E.; Belkhouche, B.;

Specification directed module testing

1986 / IEEE
By: Hayes, I.J.;

Certifying the reliability of software

1986 / IEEE
By: Mills, H.D.; Dyer, M.; Currit, P.A.;

On Optimal Data Compression in Multiterminal Statistical Inference

2011 / IEEE
By: Amari, S.;

Distilled Sensing: Adaptive Sampling for Sparse Detection and Estimation

2011 / IEEE
By: Haupt, J.; Nowak, R.; Castro, R.M.;

Resolving test ambiguity with IEEE1641: Part 34 in a series of tutorials on instrumentation and measurement

2011 / IEEE
By: Hulme, A.;

Testing Software Product Lines

2011 / IEEE
By: Engstrom, E.; de Lemos Meira, S.R.; de Almeida, E.S.; do Carmo Machado, I.; Runeson, P.; da Mota Silveira Neto, P.A.;

Test Management

2011 / IEEE
By: Louridas, P.;

Network testing series [Series Editorial]

2011 / IEEE
By: Ying-Dar Lin; Joo, E.; Johnson, E.;

Design and implementation of IP multimedia subsystem applications: An enabler-oriented approach

2011 / IEEE
By: Poorter, A.D.; Gonzalez, F.; Vazquez, E.; Capelastegui, P.; Hernandez, A.;

A New Code Pattern of Triple Harmonic Method for Precise In-Situ FH Measurement in Perpendicular Recording

2011 / IEEE
By: Bo Liu; Zhi-Min Yuan; Santoso, B.; Chun Lian Ong;

In Flight SEU/MCU Sensitivity of Commercial Nanometric SRAMs: Operational Estimations

2011 / IEEE
By: Bezerra, F.; Pancher, F.; Mansour, W.; Peronnard, P.; Guerard, B.; Artola, L.; Duzellier, S.; Hubert, G.; Velazco, R.; Nuns, T.;

Efficient Data Structures and Methodologies for SAT-Based ATPG Providing High Fault Coverage in Industrial Application

2011 / IEEE
By: Eggersgluss, S.; Drechsler, R.;

Developing an Advanced Module for Back-Contact Solar Cells

2011 / IEEE
By: Bossuyt, F.; De Wolf, I.; Baert, K.; Gordon, I.; Van Put, S.; Robbelein, J.; Govaerts, J.; Gonzalez, M.; Vanfleteren, J.;

A Parallel Test Pattern Generation Algorithm to Meet Multiple Quality Objectives

2011 / IEEE
By: Li, J.C.-M.; Chia-Yuan Chang; Kuan-Yu Liao;

Unified 2-D X-Alignment for Improving the Observability of Response Compactors

2011 / IEEE
By: Sinanoglu, O.; Almukhaizim, S.;

Witness Testing

2011 / IEEE
By: Dunn, D.G.; Bogh, D.L.; Stranges, N.; Stranges, M.K.;

Materials, Processing, and Testing of Flexible Image Sensor Arrays

2011 / IEEE
By: Ng, T.N.; Wong, W.; Chabinyc, M.; Sambandan, S.;

Investigation on the SEL Sensitive Depth of an SRAM Using Linear and Two-Photon Absorption Laser Testing

2011 / IEEE
By: Lorfevre, E.; Bezerra, F.; Samaras, A.; Lewis, D.; Darracq, F.; Ecoffet, R.; Larue, C.; Shao, K.; Pouget, V.; Faraud, E.;

Layout-Aware Multi-Cell Upsets Effects Analysis on TMR Circuits Implemented on SRAM-Based FPGAs

2011 / IEEE
By: Bocquillon, A.; Panariti, A.; Violante, M.; Sterpone, L.; Miller, F.; Gerardin, S.; Paccagnella, A.; Manuzzato, A.; Buard, N.;

Correlation of Human Metal Model and Transmission Line Pulsing Testing

2011 / IEEE
By: Hajjar, J.; Righter, A.W.; Salcedo, J.A.; Malobabic, S.; Liou, J.J.;

Automatic contrast enhancement using ensemble empirical mode decomposition

2011 / IEEE
By: Pai-Chi Li; Shang-Ching Lin;

Piezoelectric properties and unipolar fatigue behavior of KNN-based Pb-free piezoceramics

2011 / IEEE
By: Cann, D.P.; Patterson, E.A.;

Fast direct solution of 3-D scattering problems via nonuniform grid-based matrix compression

2011 / IEEE
By: Brick, Y.; Boag, A.;

Guest Editorial Special Section on IMEKO 2011 International Workshop on ADC Modeling, Testing and Data Converter Analysis and Design and the IEEE 2011 ADC Forum

2012 / IEEE
By: Carbone, P.;

Stirred-Mode Operation of Reverberation Chambers for EMC Testing

2012 / IEEE
By: Rajamani, V.; West, J.C.; Bunting, C.F.;

Testing ADC Spectral Performance Without Dedicated Data Acquisition

2012 / IEEE
By: Le Jin; Jingbo Duan; Degang Chen;

Quantifying Local Stiffness Variations in Radiofrequency Ablations With Dynamic Indentation

2012 / IEEE
By: DeWall, R.J.; Brace, C.L.; Varghese, T.;

Quantitative Non-Destructive Testing of Metallic Foam Based on Direct Current Potential Drop Method

2012 / IEEE
By: Yong Li; Xiaojuan Wang; Shejuan Xie; Jing Zhang; Zhenmao Chen;

Variation of Respiratory Resistance Suggests Optimization of Airway Caliber

2012 / IEEE
By: Johnson, A.T.; Vossoughi, J.; Pan, J.J.; Jones, S.C.;

Measurement of Flat Samples With Rough Surfaces by Magnetic Adaptive Testing

2012 / IEEE
By: Tomas, I.; Vertesy, G.; Kadlecova, J.;

Evaluation of Iron Core Quality for Resistance Spot Welding Transformers Using Current Controlled Supply

2012 / IEEE
By: Dolinar, D.; Polajzer, B.; Klopcic, B.; Petrun, M.;

On Statistical Tests for Randomness Included in the NIST SP800-22 Test Suite and Based on the Binomial Distribution

2012 / IEEE
By: Setti, G.; Rovatti, R.; Pareschi, F.;

Evaluating Dynamic Software Update Safety Using Systematic Testing

2012 / IEEE
By: Foster, J.S.; Hicks, M.; Hardisty, E.A.; Smith, E.K.; Hayden, C.M.;

Performance and Simulation Verification of a Mobile Solid State Pulsed Ring Down Array

2012 / IEEE
By: Holt, S.; Mankowksi, J.; Reale, D.V.; Gonsalves, N.; Dickens, J.; Walter, J.;

A General Automatic Test System for Instruments in IC Equipment

2012 / IEEE
By: Ling Tian; Xiaoshan Su;

Mutation-Driven Generation of Unit Tests and Oracles

2012 / IEEE
By: Fraser, G.; Zeller, A.;

A closer look at thin-client connections: statistical application identification for QoE detection

2012 / IEEE
By: Longo, S.; Niccolini, S.; Napolitano, S.; Dusi, M.;

Random Testing: Theoretical Results and Practical Implications

2012 / IEEE
By: Arcuri, A.; Briand, L.; Iqbal, M.Z.;

Network testing series [Series Editorial]

2012 / IEEE
By: Joo, E.; Johnson, E.; Lin, Y.-D.;

Preventing DoS attacks in NGN networks with proactive specification-based fuzzing

2012 / IEEE
By: Rontti, T.; Takanen, A.; Juuso, A.-M.;

Hybrid microwave radios assessment

2012 / IEEE
By: Asif, S.Z.;

SIEPON conformance testing and certification

2012 / IEEE
By: Yang Lu; Lamb, L.D.; Takizawa, M.; Tadokoro, M.; Kusano, T.; Subramaniam, R.; Qian Liu;

Mechanical Stress Reduction of Rotor Core of Interior Permanent Magnet Synchronous Motor

2012 / IEEE
By: Jung-Pyo Hong; Do-Jin Kim; Byeong-Hwa Lee; Jae-Woo Jung; Do-Hoon Song; Seong-Min Jeon; Jae-Young Kim;

Characterization of Piezoresistive-Si-Nanowire-Based Pressure Sensors by Dynamic Cycling Test With Extralarge Compressive Strain

2012 / IEEE
By: Chengkuo Lee; Dim-Lee Kwong; Woo-Tae Park; Hongkang Yan; Liang Lou;

A Dependent Model for Fault Tolerant Software Systems During Debugging

2012 / IEEE
By: Rong-Tsorng Wang;

Two Dimensional Multi-Release Software Reliability Modeling and Optimal Release Planning

2012 / IEEE
By: Kapur, P.K.; Kaur, G.; Aggarwal, A.G.; Pham, H.;

Intermittent Failure Dynamics Characterization

2012 / IEEE
By: Morant, F.; Garcia, E.; Correcher, A.; Rodriguez, L.; Quiles, E.;

Explicit Low-Weight Bases for BCH Codes

2012 / IEEE
By: Kaufman, T.; Grigorescu, E.;

Comparison Analysis of Efficiency for Step-Down and Step-Up Stress Accelerated Life Testing

2012 / IEEE
By: Beiqing Gu; Naijun Sha; Ronghua Wang; Xiaoling Xu;

Methods of Reliability Demonstration Testing and Their Relationships

2012 / IEEE
By: Haitao Liao; Huairui Guo;

Overview of Reliability Testing

2012 / IEEE
By: Elsayed, E.A.;

Soft Error Susceptibilities of 22 nm Tri-Gate Devices

2012 / IEEE
By: Seifert, N.; Gill, B.; Jahinuzzaman, S.; Basile, J.; Ambrose, V.; Quan Shi; Allmon, R.; Bramnik, A.;

Determinants of Differential Item Functioning in an Elementary Mathematics Test With Accommodations

2012 / IEEE
By: Soo Eun Chae; Jae-Ho Han; Doyoung Kim;

Applying IEC 60909, Fault Current Calculations

2012 / IEEE
By: Sweeting, D.;

User-driven automatic test-case generation for DTV/STB reliable functional verification

2012 / IEEE
By: Teslic, N.; Pekovic, V.; Zlokolica, V.; Tekcan, T.; Gunduzalp, M.;

Medium-Voltage Arc Flash in Open Air and Padmounted Equipment

2012 / IEEE
By: Eblen, M.L.; Short, T.A.;

Maximum Power Point Tracking for Ocean Wave Energy Conversion

2012 / IEEE
By: Amon, E.A.; Schacher, A.A.; Brekken, T.K.A.;

Solid-State Solar Simulator

2012 / IEEE
By: Krein, P.T.; Shenoy, P.S.; Kroeger, K.P.; Sweeney, M.; Klein, Z.; Bazzi, A.M.;

Eccentric Bus-Bar Testing Method of the Shielding Effect of a Heavy Current Transformer With Shielding Coils

2012 / IEEE
By: Bo Jiang; Wei Zhao; Kaifeng Qu; Zhifang Liu; Haiming Shao;

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