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Topic: Terrorism
Results
2012 / IEEE
By: Rogers, Marc; Pfleeger, Shari Lawrence; Stolfo, Sal; Losavio, Michael; Caputo, Deanna; Caine, Kelly; Bashir, Masooda;
By: Rogers, Marc; Pfleeger, Shari Lawrence; Stolfo, Sal; Losavio, Michael; Caputo, Deanna; Caine, Kelly; Bashir, Masooda;
2011 / IEEE / 978-1-4577-0681-3
By: Ibrahim, S.; Sharma, D.; Wang, Q.; Lownes, N.; Rajasekaran, S.; Ammar, R.;
By: Ibrahim, S.; Sharma, D.; Wang, Q.; Lownes, N.; Rajasekaran, S.; Ammar, R.;
2011 / IEEE / 978-1-4577-0085-9
By: Larson, C.A.; Hsinchun Chen; Ware, D.; Zimbra, D.; Elhourani, T.;
By: Larson, C.A.; Hsinchun Chen; Ware, D.; Zimbra, D.; Elhourani, T.;
2011 / IEEE / 978-1-4577-1051-3
By: Gregory, M.; Chappell, A.; Rust, S.; Morara, M.; McGrath, L.; Burk, R.; Davis, M.; Joslyn, C.;
By: Gregory, M.; Chappell, A.; Rust, S.; Morara, M.; McGrath, L.; Burk, R.; Davis, M.; Joslyn, C.;
2011 / IEEE / 978-1-4577-0609-7
By: Cao, M.; Garcia, J.; Dominguez-Gonzalez, M.C.; Collantes, L.; Alvarez-Campana, M.; Navarro, J.;
By: Cao, M.; Garcia, J.; Dominguez-Gonzalez, M.C.; Collantes, L.; Alvarez-Campana, M.; Navarro, J.;
2011 / IEEE / 978-1-61284-965-2
By: Pinhasi, Y.; Kapilevich, B.; Hardon, D.; Litvak, B.; Anisimov, M.;
By: Pinhasi, Y.; Kapilevich, B.; Hardon, D.; Litvak, B.; Anisimov, M.;
2011 / IEEE / 978-1-4577-1891-5
By: D'Antonio, S.; Coppolino, L.; Romano, L.; Oliviero, F.; Formicola, V.;
By: D'Antonio, S.; Coppolino, L.; Romano, L.; Oliviero, F.; Formicola, V.;
2011 / IEEE / 978-1-4577-1376-7
By: Fiondella, L.; Qixing Wang; Tolba, S.; Rajasekaran, S.; Ammar, R.; Ivan, J.; Lownes, N.;
By: Fiondella, L.; Qixing Wang; Tolba, S.; Rajasekaran, S.; Ammar, R.; Ivan, J.; Lownes, N.;
2011 / IEEE / 978-1-4577-1376-7
By: Serio, M.A.; Wojtowicz, M.A.; Solomon, P.R.; Rubenstein, E.P.; Drukier, G.A.;
By: Serio, M.A.; Wojtowicz, M.A.; Solomon, P.R.; Rubenstein, E.P.; Drukier, G.A.;
2011 / IEEE / 978-1-4577-1376-7
By: Fiondella, L.; Tolba, S.; Qixing Wang; Ivan, J.; Rajasekaran, S.; Lownes, N.; Ammar, R.;
By: Fiondella, L.; Tolba, S.; Qixing Wang; Ivan, J.; Rajasekaran, S.; Lownes, N.; Ammar, R.;
Probabilistic Effectiveness Methodology: A holistic approach on risk assessment of nuclear smuggling
2011 / IEEE / 978-1-4577-1376-7By: Stroud, P.; Roberts, R.; Roach, F.; Mathis, M.; Kelton, T.; Saeger, K.J.; Cleland, T.; Cuellar, L.; Kubicek, D.; Smith, J.P.;
2011 / IEEE / 978-1-4673-0014-8
By: Regenscheit, M.; Rohrdantz, C.; Mansmann, F.; Maass, F.; Ramm, T.; Lindemeier, T.; Huber, S.; Fischer, F.; Buchmuller, J.; Bertini, E.; Keim, D.A.; Zieker, M.; Tautzenberger, M.; Stoffel, F.; Sellien, S.; Schreck, T.; Scheible, C.;
By: Regenscheit, M.; Rohrdantz, C.; Mansmann, F.; Maass, F.; Ramm, T.; Lindemeier, T.; Huber, S.; Fischer, F.; Buchmuller, J.; Bertini, E.; Keim, D.A.; Zieker, M.; Tautzenberger, M.; Stoffel, F.; Sellien, S.; Schreck, T.; Scheible, C.;
2011 / IEEE / 978-1-4673-0206-7
By: Sung Bum Pan; Yongwha Chung; Chulho Won; Hae-Min Moon; Min-Gu Kim;
By: Sung Bum Pan; Yongwha Chung; Chulho Won; Hae-Min Moon; Min-Gu Kim;
2011 / IEEE / 978-1-4673-0120-6
By: Chivers, D.H.; Aucott, T.; Bandstra, M.S.; Vetter, K.; Siegrist, J.;
By: Chivers, D.H.; Aucott, T.; Bandstra, M.S.; Vetter, K.; Siegrist, J.;
2011 / IEEE / 978-1-4577-0927-2
By: Woo, R.; Schoepff, V.; Ravet, A.; Poli, J.-P.; Boudergui, K.; Domenech, T.; Carrel, F.; Guenard, N.;
By: Woo, R.; Schoepff, V.; Ravet, A.; Poli, J.-P.; Boudergui, K.; Domenech, T.; Carrel, F.; Guenard, N.;
2011 / IEEE / 978-1-4577-0927-2
By: Normand, S.; Ferragut, A.; Bourbotte, J.-M.; Corre, G.; Kondrasovs, V.;
By: Normand, S.; Ferragut, A.; Bourbotte, J.-M.; Corre, G.; Kondrasovs, V.;
2012 / IEEE / 978-1-4673-1286-8
By: McGrath, J.T.; Kampmann, M.E.; Del Rosario, T.K.; Lambert, J.H.; Gomes, J.O.; Connelly, E.B.;
By: McGrath, J.T.; Kampmann, M.E.; Del Rosario, T.K.; Lambert, J.H.; Gomes, J.O.; Connelly, E.B.;