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Topic: Tantalum Alloys
Results
2011 / IEEE / 978-606-544-078-4
By: Trunfio-Sfarghiu, A.-M.; Crisan, N.; Berthier, Y.; Stoica, G.; Gheorghiu, H.; Gordin, D.;
By: Trunfio-Sfarghiu, A.-M.; Crisan, N.; Berthier, Y.; Stoica, G.; Gheorghiu, H.; Gordin, D.;
1988 / IEEE
By: Sudou, R.; Koyama, E.; Ogihara, N.; Kirino, F.; Niihara, T.; Ohta, N.; Shigematsu, K.;
By: Sudou, R.; Koyama, E.; Ogihara, N.; Kirino, F.; Niihara, T.; Ohta, N.; Shigematsu, K.;
1990 / IEEE
By: Carson, J.; McInturff, A.D.; O'Larey, P.; McDonald, W.; Kanithi, H.; McKinnel, J.; Lee, P.; Larbalestier, D.;
By: Carson, J.; McInturff, A.D.; O'Larey, P.; McDonald, W.; Kanithi, H.; McKinnel, J.; Lee, P.; Larbalestier, D.;
1990 / IEEE
By: Pressesky, J.L.; Speliotis, D.E.; Coughlin, T.; Williams, D.; Heiman, N.; Lee, S.Y.;
By: Pressesky, J.L.; Speliotis, D.E.; Coughlin, T.; Williams, D.; Heiman, N.; Lee, S.Y.;
1990 / IEEE
By: Fisher, R.D.; Duan, S.L.; Williams, D.; Pressesky, J.L.; Lee, S.Y.; Scheinfein, M.R.; Heiman, N.; Speliotis, D.E.; Celotta, R.J.; Pierce, D.T.; Unguris, J.; Khan, M.R.;
By: Fisher, R.D.; Duan, S.L.; Williams, D.; Pressesky, J.L.; Lee, S.Y.; Scheinfein, M.R.; Heiman, N.; Speliotis, D.E.; Celotta, R.J.; Pierce, D.T.; Unguris, J.; Khan, M.R.;
Magnetic property and microstructure dependence of CoCrTa/Cr media on substrate temperature and bias
1992 / IEEEBy: Tang, L.; Haefele, J.E.; Khan, M.R.; Duan, S.; Thomas, G.;
1992 / IEEE
By: Suekane, M.; Shimatsu, T.; Takahashi, M.; Yamasaki, H.; Yamaguchi, K.; Miyamura, M.;
By: Suekane, M.; Shimatsu, T.; Takahashi, M.; Yamasaki, H.; Yamaguchi, K.; Miyamura, M.;
1993 / IEEE
By: Shinkai, S.; Makino, S.; Urai, H.; Tuboi, S.; Ishiwata, N.; Kitamura, M.; Yabuta, M.; Nakamura, T.; Takeshima, Y.;
By: Shinkai, S.; Makino, S.; Urai, H.; Tuboi, S.; Ishiwata, N.; Kitamura, M.; Yabuta, M.; Nakamura, T.; Takeshima, Y.;
1994 / IEEE
By: Sakaguchi, I.; Suwabe, S.; Tsuneda, F.; Yamazaki, M.; Kawai, T.; Goto, R.; Iwama, A.;
By: Sakaguchi, I.; Suwabe, S.; Tsuneda, F.; Yamazaki, M.; Kawai, T.; Goto, R.; Iwama, A.;
Effect of very thin Cr-underlayer on the magnetic and recording properties of CoCrTa thin-film media
1994 / IEEEBy: Tobise, M.; Lal, B.B.; Shinohara, T.;
1994 / IEEE
By: Kusumoto, E.; Nakai, J.; Itayama, K.; Yoshikawa, K.; Visokay, M.R.; Miyamoto, T.; Kuwabara, M.;
By: Kusumoto, E.; Nakai, J.; Itayama, K.; Yoshikawa, K.; Visokay, M.R.; Miyamoto, T.; Kuwabara, M.;
1995 / IEEE
By: Ishikawa, A.; Tsuchiyama, R.; Yahisa, Y.; Hosoe, Y.; Shiroishi, Y.; Igarashi, M.; Yoshida, K.;
By: Ishikawa, A.; Tsuchiyama, R.; Yahisa, Y.; Hosoe, Y.; Shiroishi, Y.; Igarashi, M.; Yoshida, K.;
1995 / IEEE
By: Yahisa, Y.; Narishige, S.; Furusawa, K.; Inagaki, J.; Matsuda, Y.; Usami, K.; Kimoto, K.;
By: Yahisa, Y.; Narishige, S.; Furusawa, K.; Inagaki, J.; Matsuda, Y.; Usami, K.; Kimoto, K.;