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Topic: Surface Emitting Lasers
Results
2011 / IEEE
By: Sangster, T.C.; Norreys, P.A.; Maksimchuk, A.; Thomas, A.G.R.; Craxton, R.S.; Cobble, J.; Scott, R.H.H.; Nilson, P.M.; Willingale, L.; Krushelnick, K.; Zulick, C.; Stoeckl, C.;
By: Sangster, T.C.; Norreys, P.A.; Maksimchuk, A.; Thomas, A.G.R.; Craxton, R.S.; Cobble, J.; Scott, R.H.H.; Nilson, P.M.; Willingale, L.; Krushelnick, K.; Zulick, C.; Stoeckl, C.;
Tradeoffs in the Realization of Electrically Pumped Vertical External Cavity Surface Emitting Lasers
2011 / IEEEBy: Lin, L.C.; Childs, D.T.; Orchard, J.R.; Hogg, R.A.; Williams, D.M.; Stevens, B.J.;
2011 / IEEE
By: Preu, R.; Biro, D.; Wolf, A.; Clement, F.; Krieg, A.; Retzlaff, M.; Lohmuller, E.; Specht, J.; Mack, S.; Jager, U.; Pospischil, M.; Thaidigsmann, B.; Nekarda, J.;
By: Preu, R.; Biro, D.; Wolf, A.; Clement, F.; Krieg, A.; Retzlaff, M.; Lohmuller, E.; Specht, J.; Mack, S.; Jager, U.; Pospischil, M.; Thaidigsmann, B.; Nekarda, J.;
2011 / IEEE
By: Nian Qiang Li; Lei Yang; Ning Jiang; Xi Hua Zou; Shui Ying Xiang; Bin Luo; Wei Pan; Lian Shan Yan;
By: Nian Qiang Li; Lei Yang; Ning Jiang; Xi Hua Zou; Shui Ying Xiang; Bin Luo; Wei Pan; Lian Shan Yan;
2011 / IEEE
By: Hattori, S.; Yukawa, K.; Yanai, A.; Katayama, T.; Kawaguchi, H.; Koh, S.; Ikeda, K.;
By: Hattori, S.; Yukawa, K.; Yanai, A.; Katayama, T.; Kawaguchi, H.; Koh, S.; Ikeda, K.;
2011 / IEEE
By: Malcolm, G.; Maker, G.; Robertson, G.; Butkus, M.; Rafailov, E.U.; Hamilton, C.; Yang Qiu; Walther, T.; Hogg, R.A.; Stevens, B.J.; Krysa, A.B.;
By: Malcolm, G.; Maker, G.; Robertson, G.; Butkus, M.; Rafailov, E.U.; Hamilton, C.; Yang Qiu; Walther, T.; Hogg, R.A.; Stevens, B.J.; Krysa, A.B.;
2012 / IEEE
By: Gustavsson, J.S.; Baveja, P.P.; Westbergh, P.; Kogel, B.; Haglund, A.; Larsson, A.; Agrawal, G.P.; Maywar, D.N.;
By: Gustavsson, J.S.; Baveja, P.P.; Westbergh, P.; Kogel, B.; Haglund, A.; Larsson, A.; Agrawal, G.P.; Maywar, D.N.;
2012 / IEEE
By: Xing Zhang; Lijun Wang; Cunzhu Tong; Yun Liu; Li Qin; Xihong Fu; Jinlong Zhang; Yugang Zeng; Yongqiang Ning;
By: Xing Zhang; Lijun Wang; Cunzhu Tong; Yun Liu; Li Qin; Xihong Fu; Jinlong Zhang; Yugang Zeng; Yongqiang Ning;
2012 / IEEE
By: Schires, K.; Quirce, A.; Hurtado, A.; Cuesta, J.R.; Valle, A.; Adams, M.J.; Henning, I.D.; Pesquera, L.;
By: Schires, K.; Quirce, A.; Hurtado, A.; Cuesta, J.R.; Valle, A.; Adams, M.J.; Henning, I.D.; Pesquera, L.;
2012 / IEEE
By: Seet, H.L.; Liu, B.; Yu, S.K.; Zhao, J.M.; Ng, K.K.; Ma, Y.S.; Shi, J.Z.; Chen, X.Y.; Hu, J.F.;
By: Seet, H.L.; Liu, B.; Yu, S.K.; Zhao, J.M.; Ng, K.K.; Ma, Y.S.; Shi, J.Z.; Chen, X.Y.; Hu, J.F.;
Flat Broadband Chaos in Vertical-Cavity Surface-Emitting Lasers Subject to Chaotic Optical Injection
2012 / IEEEBy: Shore, K.A.; Spencer, P.S.; Yanhua Hong;
2012 / IEEE
By: Lunn, J.A.; Min Min; Xiaosong Li; Chen, W.R.; Adalsteinsson, O.; Ying Gu; Howard, E.; Wolf, R.F.; Nordquist, R.E.; Hode, T.; Nan Du;
By: Lunn, J.A.; Min Min; Xiaosong Li; Chen, W.R.; Adalsteinsson, O.; Ying Gu; Howard, E.; Wolf, R.F.; Nordquist, R.E.; Hode, T.; Nan Du;
2012 / IEEE
By: Haglund, E.; Haglund, A.; Westbergh, P.; Gustavsson, J.S.; Bengtsson, J.; Debernardi, P.; Kogel, B.; Larsson, A.;
By: Haglund, E.; Haglund, A.; Westbergh, P.; Gustavsson, J.S.; Bengtsson, J.; Debernardi, P.; Kogel, B.; Larsson, A.;
2012 / IEEE
By: Harduin, J.; Ben Bakir, B.; Letartre, X.; Seassal, C.; Olivier, N.; Sciancalepore, C.; Viktorovitch, P.; Fedeli, J.;
By: Harduin, J.; Ben Bakir, B.; Letartre, X.; Seassal, C.; Olivier, N.; Sciancalepore, C.; Viktorovitch, P.; Fedeli, J.;
2012 / IEEE
By: Andrekson, P.A.; Karlsson, M.; Gustavsson, J.S.; Haglund, A.; Agrell, E.; Karout, J.; Westbergh, P.; Szczerba, K.; Larsson, A.;
By: Andrekson, P.A.; Karlsson, M.; Gustavsson, J.S.; Haglund, A.; Agrell, E.; Karout, J.; Westbergh, P.; Szczerba, K.; Larsson, A.;
2012 / IEEE
By: Giddings, R.P.; Jin, X.Q.; Hugues-Salas, E.; Tang, J.M.; Villafranca, A.; Mansoor, S.; Hong, Y.;
By: Giddings, R.P.; Jin, X.Q.; Hugues-Salas, E.; Tang, J.M.; Villafranca, A.; Mansoor, S.; Hong, Y.;
2012 / IEEE
By: Orofino, C.; Kanibolotsky, A.L.; Chen, Y.; Herrnsdorf, J.; Skabara, P.J.; Guilhabert, B.; Laurand, N.; Dawson, M.D.;
By: Orofino, C.; Kanibolotsky, A.L.; Chen, Y.; Herrnsdorf, J.; Skabara, P.J.; Guilhabert, B.; Laurand, N.; Dawson, M.D.;
2012 / IEEE
By: Doany, F.E.; Kash, J.A.; Lee, B.G.; Budd, R.A.; Baks, C.W.; Tsang, C.K.; Knickerbocker, J.U.; Dangel, R.; Chan, B.; How Lin; Carver, C.; Jianzhuang Huang; Berry, J.; Bajkowski, D.; Libsch, F.; Schow, C.L.;
By: Doany, F.E.; Kash, J.A.; Lee, B.G.; Budd, R.A.; Baks, C.W.; Tsang, C.K.; Knickerbocker, J.U.; Dangel, R.; Chan, B.; How Lin; Carver, C.; Jianzhuang Huang; Berry, J.; Bajkowski, D.; Libsch, F.; Schow, C.L.;
2012 / IEEE
By: Kuchta, D.M.; Lee, B.G.; Neinyi Li; Wenlin Luo; Vaidya, D.S.; Oulundsen, G.; Yan, M.F.; Benyuan Zhu; Taunay, T.F.; Baks, C.; Pepeljugoski, P.; Schow, C.L.; Doany, F.E.;
By: Kuchta, D.M.; Lee, B.G.; Neinyi Li; Wenlin Luo; Vaidya, D.S.; Oulundsen, G.; Yan, M.F.; Benyuan Zhu; Taunay, T.F.; Baks, C.; Pepeljugoski, P.; Schow, C.L.; Doany, F.E.;
2012 / IEEE
By: Olivier, N.; Bakir, B.B.; Harduin, J.; Letartre, X.; Seassal, C.; Sciancalepore, C.; Viktorovitch, P.; Fedeli, J.;
By: Olivier, N.; Bakir, B.B.; Harduin, J.; Letartre, X.; Seassal, C.; Sciancalepore, C.; Viktorovitch, P.; Fedeli, J.;
2012 / IEEE
By: Quarterman, A.H.; Kbashi, H.J.; Wilcox, K.G.; Tropper, A.C.; Henini, M.; Apostolopoulos, V.; Morris, O.J.;
By: Quarterman, A.H.; Kbashi, H.J.; Wilcox, K.G.; Tropper, A.C.; Henini, M.; Apostolopoulos, V.; Morris, O.J.;
2012 / IEEE
By: John, W.; Ginolas, A.; Brox, O.P.; Bugge, F.; Ressel, P.; Fricke, J.; Erbert, G.; Wenzel, H.; Weixelbaum, L.;
By: John, W.; Ginolas, A.; Brox, O.P.; Bugge, F.; Ressel, P.; Fricke, J.; Erbert, G.; Wenzel, H.; Weixelbaum, L.;
2012 / IEEE
By: Koch, S.W.; Moloney, J.V.; Yarborough, M.J.; Hader, J.; Kunert, B.; Tsuei-Lian Wang; Laurain, A.; Stolz, W.;
By: Koch, S.W.; Moloney, J.V.; Yarborough, M.J.; Hader, J.; Kunert, B.; Tsuei-Lian Wang; Laurain, A.; Stolz, W.;
2012 / IEEE
By: Jianyan Chen; Zhanguo Wang; Fengqi Liu; Lijun Wang; Lu Li; Jinchuan Zhang; Tao Wang; Wanhong Guo; Junqi Liu;
By: Jianyan Chen; Zhanguo Wang; Fengqi Liu; Lijun Wang; Lu Li; Jinchuan Zhang; Tao Wang; Wanhong Guo; Junqi Liu;
2012 / IEEE
By: Xi Hua Zou; Lian Shan Yan; Bin Luo; Wei Pan; Ning Jiang; Hong Na Zhu; Shui Ying Xiang; Nian Qiang Li;
By: Xi Hua Zou; Lian Shan Yan; Bin Luo; Wei Pan; Ning Jiang; Hong Na Zhu; Shui Ying Xiang; Nian Qiang Li;
2012 / IEEE
By: Bosman, E.; Van Hoe, B.; Van Steenberge, G.; Van Daele, P.; Godier, G.; De Geyter, T.; Melpignano, G.; Kalathimekkad, S.; Missinne, J.;
By: Bosman, E.; Van Hoe, B.; Van Steenberge, G.; Van Daele, P.; Godier, G.; De Geyter, T.; Melpignano, G.; Kalathimekkad, S.; Missinne, J.;
2012 / IEEE
By: Liyue Zhang; Nianqiang Li; Shuiying Xiang; Xihua Zou; Bin Luo; Lianshan Yan; Wei Pan;
By: Liyue Zhang; Nianqiang Li; Shuiying Xiang; Xihua Zou; Bin Luo; Lianshan Yan; Wei Pan;
2012 / IEEE
By: Sugimoto, Y.; Ikeda, N.; Hogg, R.A.; Khamas, S.; Williams, D.M.; Childs, D.T.D.; Stevens, B.J.; Groom, K.M.; Taylor, R.J.E.;
By: Sugimoto, Y.; Ikeda, N.; Hogg, R.A.; Khamas, S.; Williams, D.M.; Childs, D.T.D.; Stevens, B.J.; Groom, K.M.; Taylor, R.J.E.;
2012 / IEEE
By: d'Aubigny, C.Y.D.; Koch, S.W.; Moloney, J.V.; Yarborough, J.M.; Young, A.G.; Scheller, M.; Walker, C.K.;
By: d'Aubigny, C.Y.D.; Koch, S.W.; Moloney, J.V.; Yarborough, J.M.; Young, A.G.; Scheller, M.; Walker, C.K.;
2012 / IEEE
By: Jing-Jie Dai; Kuei-Ting Chen; Peng-Han Tsai; Sih-Han Chen; Tzong-Liang Tsai; Bing-Cheng Shieh; Chia-Feng Lin; Chun-Min Lin; Tzu-Yun Yu;
By: Jing-Jie Dai; Kuei-Ting Chen; Peng-Han Tsai; Sih-Han Chen; Tzong-Liang Tsai; Bing-Cheng Shieh; Chia-Feng Lin; Chun-Min Lin; Tzu-Yun Yu;
2011 / IEEE / 978-1-61284-385-8
By: Chavez, C.A.; Gonzalez-Galvan, E.J.; Biao Zhang; Loredo-Flores, A.; Raygoza, L.A.; Mendoza, M.; Bonilla, I.;
By: Chavez, C.A.; Gonzalez-Galvan, E.J.; Biao Zhang; Loredo-Flores, A.; Raygoza, L.A.; Mendoza, M.; Bonilla, I.;
2011 / IEEE / 978-1-4577-0279-2
By: Kempke, R.C.; Rigby, S.J.; Chao Zhang; Xiaoyi Shen; Mason, M.J.; Fellers, C.L.;
By: Kempke, R.C.; Rigby, S.J.; Chao Zhang; Xiaoyi Shen; Mason, M.J.; Fellers, C.L.;
2011 / IEEE / 978-3-00-035081-8
By: Bornmann, B.; Schreiner, R.; Dams, F.; Muller, G.; Lutzenkirchen-Hecht, D.; Mingels, S.;
By: Bornmann, B.; Schreiner, R.; Dams, F.; Muller, G.; Lutzenkirchen-Hecht, D.; Mingels, S.;
2011 / IEEE / 978-3-00-035081-8
By: Abo, S.; Nakahama, K.; Kisa, T.; Kaga, E.; Takai, M.; Wakaya, F.;
By: Abo, S.; Nakahama, K.; Kisa, T.; Kaga, E.; Takai, M.; Wakaya, F.;
2011 / IEEE / 978-3-8007-3356-9
By: Uusimaa, P.; Melanen, P.; Kamp, M.; Reithmaier, J.-P.; Afzal, S.; Laakso, A.; Gready, D.; Karinen, J.; Telkkala, J.; Dumitrescu, M.; Viheriala, J.; Eisenstein, G.;
By: Uusimaa, P.; Melanen, P.; Kamp, M.; Reithmaier, J.-P.; Afzal, S.; Laakso, A.; Gready, D.; Karinen, J.; Telkkala, J.; Dumitrescu, M.; Viheriala, J.; Eisenstein, G.;