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Topic: Superconducting Microwave Devices
Results
2012 / IEEE
By: Bin Wei; Bisong Cao; Xubo Guo; Ying Zhang; Xiaoping Zhang; Guoyong Zhang; Guannan Suo; Xiaoke Song;
By: Bin Wei; Bisong Cao; Xubo Guo; Ying Zhang; Xiaoping Zhang; Guoyong Zhang; Guannan Suo; Xiaoke Song;
2012 / IEEE
By: Perrin, G.; Lazareff, B.; Maier, D.; Mahieu, S.; Navarrini, A.; Laslaz, F.; Geoffroy, D.; Chalain, J.; Celestin, G.;
By: Perrin, G.; Lazareff, B.; Maier, D.; Mahieu, S.; Navarrini, A.; Laslaz, F.; Geoffroy, D.; Chalain, J.; Celestin, G.;
2012 / IEEE
By: Wenlei Shan; Ji Yang; Jie Liu; Zhenqiang Li; Sheng Li; Aiqing Cao; Wenying Duan; Jiaqiang Zhong; Xuguo Zhang; Shanhuai Chen; Zhenhui Lin; Yingxi Zuo; Qijun Yao; Shengcai Shi;
By: Wenlei Shan; Ji Yang; Jie Liu; Zhenqiang Li; Sheng Li; Aiqing Cao; Wenying Duan; Jiaqiang Zhong; Xuguo Zhang; Shanhuai Chen; Zhenhui Lin; Yingxi Zuo; Qijun Yao; Shengcai Shi;
2012 / IEEE
By: Meledin, D.; Nystrom, O.; Billade, B.; Belitsky, V.; Pavolotsky, A.; Ferm, S.; Sundin, E.; Strandberg, M.; Rashid, H.; Desmaris, V.; Fredrixon, M.; Lapkin, I.;
By: Meledin, D.; Nystrom, O.; Billade, B.; Belitsky, V.; Pavolotsky, A.; Ferm, S.; Sundin, E.; Strandberg, M.; Rashid, H.; Desmaris, V.; Fredrixon, M.; Lapkin, I.;
2012 / IEEE / 978-1-4673-1088-8
By: Shiokawa, Noritsugu; Kawaguchi, Tamio; Kayano, Hiroyuki; Yamazaki, Mutsuki; Nakayama, Kohei;
By: Shiokawa, Noritsugu; Kawaguchi, Tamio; Kayano, Hiroyuki; Yamazaki, Mutsuki; Nakayama, Kohei;
2012 / IEEE / 978-1-4673-1088-8
By: Attar, Sara. S.; Gupta, Deep; Mansour, Raafat R.; Setoodeh, Sormeh;
By: Attar, Sara. S.; Gupta, Deep; Mansour, Raafat R.; Setoodeh, Sormeh;
2014 / IEEE
By: Wen, Fei; Gao, Xiang; Hao Qu; Han, Xiang; Wang, Yuming; Kong, Defeng; Zhang, Shoubiao; Zhang, Tao;
By: Wen, Fei; Gao, Xiang; Hao Qu; Han, Xiang; Wang, Yuming; Kong, Defeng; Zhang, Shoubiao; Zhang, Tao;
2015 / IEEE
By: Mates, J.A.B.; Bennett, D.A.; Ullom, J.N.; Vale, L.R.; Gard, J.D.; Reintsema, C.D.; Rabin, M.W.; Hoover, A.S.; Schmidt, D.R.;
By: Mates, J.A.B.; Bennett, D.A.; Ullom, J.N.; Vale, L.R.; Gard, J.D.; Reintsema, C.D.; Rabin, M.W.; Hoover, A.S.; Schmidt, D.R.;
2015 / IEEE
By: Wellstood, F.C.; Rolston, S.L.; Orozco, L.A.; Lobb, C.J.; Anderson, J.R.; Lee, J.; Voigt, K.D.; Budoyo, R.P.; Solano, P.; Grover, J.A.; Hoffman, J.E.; Hertzberg, J.B.; Ballard, C.;
By: Wellstood, F.C.; Rolston, S.L.; Orozco, L.A.; Lobb, C.J.; Anderson, J.R.; Lee, J.; Voigt, K.D.; Budoyo, R.P.; Solano, P.; Grover, J.A.; Hoffman, J.E.; Hertzberg, J.B.; Ballard, C.;
2014 / IEEE
By: Lindstrom, T.; Zorin, A.B.; Enrico, E.; Kemppinen, A.; Manninen, A.J.; Astafiev, O.V.; Meeson, P.J.; Pashkin, Yu.A.; Pekola, J.P.; Govenius, J.; Lake, R.E.; Mottonen, M.; Khabipov, M.; Lotkhov, S.V.; Kataoka, M.;
By: Lindstrom, T.; Zorin, A.B.; Enrico, E.; Kemppinen, A.; Manninen, A.J.; Astafiev, O.V.; Meeson, P.J.; Pashkin, Yu.A.; Pekola, J.P.; Govenius, J.; Lake, R.E.; Mottonen, M.; Khabipov, M.; Lotkhov, S.V.; Kataoka, M.;
2014 / IEEE
By: Im, Hyunsik; Lee, Soon Gul; Song, Woon; Park, Jung Hwan; Kim, Hyungsang; Park, Gwan Yeol; Ha, Dong-Gwang; Kim, Seon Hoo; Chong, Yonuk; Choi, Jiman;
By: Im, Hyunsik; Lee, Soon Gul; Song, Woon; Park, Jung Hwan; Kim, Hyungsang; Park, Gwan Yeol; Ha, Dong-Gwang; Kim, Seon Hoo; Chong, Yonuk; Choi, Jiman;
2014 / IEEE
By: Kayano, Hiroyuki; Shinonaga, Mitsuyoshi; Nakayama, Kohei; Kawaguchi, Tamio; Shiokawa, Noritsugu; Kumamoto, Tsuyoshi;
By: Kayano, Hiroyuki; Shinonaga, Mitsuyoshi; Nakayama, Kohei; Kawaguchi, Tamio; Shiokawa, Noritsugu; Kumamoto, Tsuyoshi;
1989 / IEEE
By: Kula, W.; Jung, G.; Sobolewski, R.; Konopka, J.; Lewandowski, J.; Gierlowski, P.; Konopka, A.;
By: Kula, W.; Jung, G.; Sobolewski, R.; Konopka, J.; Lewandowski, J.; Gierlowski, P.; Konopka, A.;
1990 / IEEE
By: Kula, W.; Jung, G.; Sobolewski, R.; Konopka, J.; Lewandowski, S.J.; Konopka, A.; Gierlowski, P.;
By: Kula, W.; Jung, G.; Sobolewski, R.; Konopka, J.; Lewandowski, S.J.; Konopka, A.; Gierlowski, P.;
1989 / IEEE
By: Kirchgessner, J.; Green, K.; Moffat, D.; Shu, Q.S.; Sears, J.; Rubin, D.; Padamsee, H.;
By: Kirchgessner, J.; Green, K.; Moffat, D.; Shu, Q.S.; Sears, J.; Rubin, D.; Padamsee, H.;
1991 / IEEE
By: Martens, J.S.; Hietala, V.M.; Plut, T.A.; Housel, M.S.; Tigges, C.P.; Zipperian, T.E.; Ginley, D.S.;
By: Martens, J.S.; Hietala, V.M.; Plut, T.A.; Housel, M.S.; Tigges, C.P.; Zipperian, T.E.; Ginley, D.S.;
1991 / IEEE
By: Talisa, S.H.; Watt, D.H.; Wagner, G.R.; McAvoy, B.R.; Jones, C.K.; Buck, D.C.; Brown, R.; Billing, J.F.; Talvacchio, J.; Moskowitz, C.; Janocko, M.A.;
By: Talisa, S.H.; Watt, D.H.; Wagner, G.R.; McAvoy, B.R.; Jones, C.K.; Buck, D.C.; Brown, R.; Billing, J.F.; Talvacchio, J.; Moskowitz, C.; Janocko, M.A.;
1989 / IEEE
By: Yang, S.Z.; Song, J.; Cheng, Q.H.; Wu, P.H.; Chen, J.; Kui, J.S.; Luo, H.X.; Jin, D.;
By: Yang, S.Z.; Song, J.; Cheng, Q.H.; Wu, P.H.; Chen, J.; Kui, J.S.; Luo, H.X.; Jin, D.;
1989 / IEEE
By: Pashkin, Y.A.; Maslennikov, Y.V.; Kuzmin, L.S.; Likharev, K.K.; Pechen, E.V.; Krasnosvobodtsev, S.I.; Gudkov, A.L.; Golovashkin, A.I.; Snigirev, O.V.;
By: Pashkin, Y.A.; Maslennikov, Y.V.; Kuzmin, L.S.; Likharev, K.K.; Pechen, E.V.; Krasnosvobodtsev, S.I.; Gudkov, A.L.; Golovashkin, A.I.; Snigirev, O.V.;