Your Search Results
Use materials about this topic in your textbook!
AcademicPub holds over eight million pieces of educational content - such as case studies and journal articles - for you to mix-and-match your way.
Experience the freedom of customizing your course pack with AcademicPub!

Topic: Sputtering
Results
2011 / IEEE
By: Nagata, M.; Sasaki, Y.; Yoshikawa, K.; Sasaki, Y.; Yamaguchi, M.; Endo, Y.; Kodate, W.; Muroga, S.;
By: Nagata, M.; Sasaki, Y.; Yoshikawa, K.; Sasaki, Y.; Yamaguchi, M.; Endo, Y.; Kodate, W.; Muroga, S.;
2011 / IEEE
By: Garcia-Garcia, J.; Nieto-Perez, M.; Gonzalez, J.J.; Pacheco-Pacheco, M.; Rivera-Rodriguez, C.; Valdivia-Barrientos, R.; Pacheco-Sotelo, J.;
By: Garcia-Garcia, J.; Nieto-Perez, M.; Gonzalez, J.J.; Pacheco-Pacheco, M.; Rivera-Rodriguez, C.; Valdivia-Barrientos, R.; Pacheco-Sotelo, J.;
2011 / IEEE
By: de Moraes Oliveira, R.; Kostov, K.G.; Ueda, M.; Bacci Fernandes, B.; Mello, C.B.; da Silva Savonov, G.;
By: de Moraes Oliveira, R.; Kostov, K.G.; Ueda, M.; Bacci Fernandes, B.; Mello, C.B.; da Silva Savonov, G.;
2011 / IEEE
By: Pinol, L.A.; Clatterbaugh, G.; Coles, G.; Deacon, R.; Lee, D.M.; Charles, H.K.; Melngailis, J.;
By: Pinol, L.A.; Clatterbaugh, G.; Coles, G.; Deacon, R.; Lee, D.M.; Charles, H.K.; Melngailis, J.;
2011 / IEEE
By: Chen, H.C.; Chen, J.S.C.; Jeng, E.S.; Kao, H.K.; Jian, S.J.; Liang, Y.L.; Chen, M.C.; Laksana, C.P.; Tzou, A.T.;
By: Chen, H.C.; Chen, J.S.C.; Jeng, E.S.; Kao, H.K.; Jian, S.J.; Liang, Y.L.; Chen, M.C.; Laksana, C.P.; Tzou, A.T.;
2011 / IEEE
By: Barquinha, P.; Goncalves, G.; Parthiban, S.; Saji, K.J.; Elangovan, E.; Fortunato, E.; Martins, R.;
By: Barquinha, P.; Goncalves, G.; Parthiban, S.; Saji, K.J.; Elangovan, E.; Fortunato, E.; Martins, R.;
2012 / IEEE
By: Eun Suk Hwang; Un Ki Kim; Yoon Jang Chung; Yoonsoo Jung; Jisim Jung; Byoung Keon Park; Cheol Seong Hwang; Sang Ho Rha; Jung-Hae Choi; Tae Joo Park;
By: Eun Suk Hwang; Un Ki Kim; Yoon Jang Chung; Yoonsoo Jung; Jisim Jung; Byoung Keon Park; Cheol Seong Hwang; Sang Ho Rha; Jung-Hae Choi; Tae Joo Park;
2012 / IEEE
By: Niemier, M.; Hu, X.S.; Csaba, G.; Sankar, V.K.; Peng Li; Bernstein, G.H.; Porod, W.;
By: Niemier, M.; Hu, X.S.; Csaba, G.; Sankar, V.K.; Peng Li; Bernstein, G.H.; Porod, W.;
Low-Temperature Fabrication and Characteristics of Lanthanum Indium Zinc Oxide Thin-Film Transistors
2012 / IEEEBy: Ho-Nyeon Lee; Chang Jung Kim; Sang Wook Kim; Jae Chul Park;
2012 / IEEE
By: Hong-Sik Shin; Min-Ho Kang; Jammy, R.; Hi-Deok Lee; Jung-Ho Yoo; Majhi, P.; Jung-Woo Oh; Ga-Won Lee;
By: Hong-Sik Shin; Min-Ho Kang; Jammy, R.; Hi-Deok Lee; Jung-Ho Yoo; Majhi, P.; Jung-Woo Oh; Ga-Won Lee;
2012 / IEEE
By: Mangeney, J.; Monteagudo-Lerma, L.; Valdueza-Felip, S.; Naranjo, F.B.; Julien, F.H.; Gonzalez-Herraez, M.;
By: Mangeney, J.; Monteagudo-Lerma, L.; Valdueza-Felip, S.; Naranjo, F.B.; Julien, F.H.; Gonzalez-Herraez, M.;
2012 / IEEE
By: Wasa, K.; Kotera, H.; Kanno, I.; Matsushima, T.; Yamamoto, T.; Nishida, K.; Adachi, H.;
By: Wasa, K.; Kotera, H.; Kanno, I.; Matsushima, T.; Yamamoto, T.; Nishida, K.; Adachi, H.;
1992 / IEEE / 000-0-0000-0000-0
By: Coffield, F.; Deadrick, F.; Barnard, J.J.; Shay, H.D.; Judd, D.L.; Yu, S.S.; Wilson, J.; Sharp, W.M.; Reginato, L.L.; Brooks, A.L.; Paul, A.C.; Newton, M.A.; Neil, V.K.; Kirbie, H.C.; Griffith, L.V.;
By: Coffield, F.; Deadrick, F.; Barnard, J.J.; Shay, H.D.; Judd, D.L.; Yu, S.S.; Wilson, J.; Sharp, W.M.; Reginato, L.L.; Brooks, A.L.; Paul, A.C.; Newton, M.A.; Neil, V.K.; Kirbie, H.C.; Griffith, L.V.;
2011 / IEEE / 978-1-4244-9312-8
By: Zyskowski, L.; Sobczuk, D.; Gedroyc, K.; Jasinski, M.; Zelechowski, M.;
By: Zyskowski, L.; Sobczuk, D.; Gedroyc, K.; Jasinski, M.; Zelechowski, M.;
2011 / IEEE / 978-3-00-035081-8
By: Mustonen, A.; Kirk, A.E.; Tsujino, S.; Gobrecht, J.; Ritter, S.; Pomjakushina, E.;
By: Mustonen, A.; Kirk, A.E.; Tsujino, S.; Gobrecht, J.; Ritter, S.; Pomjakushina, E.;
2011 / IEEE / 978-1-4577-0378-2
By: Ho Chang; Chin-Guo Kuo; Cheng-Fu Yang; Ya-Chieh Tung; Wen-Ray Chen;
By: Ho Chang; Chin-Guo Kuo; Cheng-Fu Yang; Ya-Chieh Tung; Wen-Ray Chen;
2011 / IEEE / 978-1-61284-795-5
By: Khasanov, T.; Atuchin, V.V.; Senchenko, E.S.; Pokrovsky, L.D.; Kochubey, V.A.;
By: Khasanov, T.; Atuchin, V.V.; Senchenko, E.S.; Pokrovsky, L.D.; Kochubey, V.A.;
2011 / IEEE / 978-1-4577-0378-2
By: Hsu, H.W.; Liu, C.H.; Cheng, C.P.; Lin, J.Y.; Chen, H.W.; Juan, P.C.; Chien, Y.S.; Huang, H.S.;
By: Hsu, H.W.; Liu, C.H.; Cheng, C.P.; Lin, J.Y.; Chen, H.W.; Juan, P.C.; Chien, Y.S.; Huang, H.S.;
2011 / IEEE / 978-1-4577-0378-2
By: Hsiao, C.H.; Kuo, P.C.; Ou, S.L.; Lee, C.T.; Tsai, T.L.; Chang, H.F.; Yeh, C.Y.; Chen, S.C.;
By: Hsiao, C.H.; Kuo, P.C.; Ou, S.L.; Lee, C.T.; Tsai, T.L.; Chang, H.F.; Yeh, C.Y.; Chen, S.C.;
2011 / IEEE / 978-1-4577-0378-2
By: Tzung-Chen Wu; Chao-Te Lee; Sin-Liang Ou; Chien-Nan Hsiao; Chi-Chung Kei; Wen-Hao Cho;
By: Tzung-Chen Wu; Chao-Te Lee; Sin-Liang Ou; Chien-Nan Hsiao; Chi-Chung Kei; Wen-Hao Cho;
2011 / IEEE / 978-1-61284-088-8
By: Yangan Yan; Jing Wang; Huawa Yu; Yali Du; Hanchen Liu; Bin Gao; Xin Wang;
By: Yangan Yan; Jing Wang; Huawa Yu; Yali Du; Hanchen Liu; Bin Gao; Xin Wang;
2011 / IEEE / 978-1-4577-1163-3
By: Nakashima, S.; Okuyama, M.; Kanashima, T.; JungMin Park; Shimizu, M.; Tsujita, Y.; Kobune, M.; Nishioka, H.; Fujisawa, H.; Seto, S.;
By: Nakashima, S.; Okuyama, M.; Kanashima, T.; JungMin Park; Shimizu, M.; Tsujita, Y.; Kobune, M.; Nishioka, H.; Fujisawa, H.; Seto, S.;
2011 / IEEE / 978-1-4577-1163-3
By: Karakaya, K.; Jambunathan, M.; Van Schaijk, R.; Vullers, R.; Elfrink, R.;
By: Karakaya, K.; Jambunathan, M.; Van Schaijk, R.; Vullers, R.; Elfrink, R.;
2011 / IEEE / 978-1-4577-1163-3
By: Xiaolong Chen; Xuedong Li; Dongxu Yan; Jianguo Zhu; Dingquan Xiao; Hong Liu;
By: Xiaolong Chen; Xuedong Li; Dongxu Yan; Jianguo Zhu; Dingquan Xiao; Hong Liu;
2011 / IEEE / 978-1-61284-651-4
By: Street, J.; Bitner, T.; Starman, V.; Crandall, E.R.; Zhao, Z.; Rodekohr, C.L.; Jackson, R.; Bozack, M.J.; Flowers, G.T.; Martens, R.;
By: Street, J.; Bitner, T.; Starman, V.; Crandall, E.R.; Zhao, Z.; Rodekohr, C.L.; Jackson, R.; Bozack, M.J.; Flowers, G.T.; Martens, R.;
2011 / IEEE / 978-1-4577-1589-1
By: Qian, K.; Van Hoof, C.; de Beeck, M.O.; Velenis, D.; Fiorini, P.; Malachowski, K.;
By: Qian, K.; Van Hoof, C.; de Beeck, M.O.; Velenis, D.; Fiorini, P.; Malachowski, K.;
2011 / IEEE / 978-1-61284-172-4
By: Chaillet, N.; Lutz, P.; Rakotondrabe, M.; Agnus, J.; Ivan, I.A.;
By: Chaillet, N.; Lutz, P.; Rakotondrabe, M.; Agnus, J.; Ivan, I.A.;
2011 / IEEE / 978-1-61284-172-4
By: Park, S.; Chai, G.; Chow, L.; Tiginyanu, I.; Schulte, A.; Ursaki, V.; Popescu, S.; Lupan, O.; Ghimpu, L.;
By: Park, S.; Chai, G.; Chow, L.; Tiginyanu, I.; Schulte, A.; Ursaki, V.; Popescu, S.; Lupan, O.; Ghimpu, L.;
2011 / IEEE / 978-1-4244-8939-8
By: Dong-Kil Yim; Yan Ye; Hosokawa, A.; Graw, O.; Gaur, A.; You, H.; Scheer, E.; Lim, R.;
By: Dong-Kil Yim; Yan Ye; Hosokawa, A.; Graw, O.; Gaur, A.; You, H.; Scheer, E.; Lim, R.;
2011 / IEEE / 978-1-4577-1997-4
By: Yi-Men Zhang; Hui Guo; Da-Qing Xu; Yu-Ming Zhang; Yong-Le Lou; Yang Zhao; Ren-Xu Jia;
By: Yi-Men Zhang; Hui Guo; Da-Qing Xu; Yu-Ming Zhang; Yong-Le Lou; Yang Zhao; Ren-Xu Jia;
2011 / IEEE / 978-1-4577-1997-4
By: Yi Wang; Lei Sun; Dedong Han; Shaojuan Li; Shengdong Zhang; Quqi Han;
By: Yi Wang; Lei Sun; Dedong Han; Shaojuan Li; Shengdong Zhang; Quqi Han;
2011 / IEEE / 978-1-4577-1516-7
By: Hauri, K.; Fu, R.; Meissner, G.; Kilpatrick, S.; Nichols, B.M.; Zakar, E.;
By: Hauri, K.; Fu, R.; Meissner, G.; Kilpatrick, S.; Nichols, B.M.; Zakar, E.;
2011 / IEEE / 978-1-4577-0167-2
By: Del Villar, I.; Hernaez, M.; Zamarreno, C.R.; Lopez, S.; Matias, I.R.; Arregui, F.J.;
By: Del Villar, I.; Hernaez, M.; Zamarreno, C.R.; Lopez, S.; Matias, I.R.; Arregui, F.J.;
2011 / IEEE / 978-1-4577-1756-7
By: Olyaei, M.; Malm, B.G.; Litta, E.D.; Hellstrom, P.-E.; Ostling, M.;
By: Olyaei, M.; Malm, B.G.; Litta, E.D.; Hellstrom, P.-E.; Ostling, M.;