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Topic: Sputter Deposition
Results
2011 / IEEE
By: Cheng-Wei Lin; Wen-Chau Liu; Chi-Shiang Hsu; Chien-Chang Huang; Tai-You Chen; Huey-Ing Chen;
By: Cheng-Wei Lin; Wen-Chau Liu; Chi-Shiang Hsu; Chien-Chang Huang; Tai-You Chen; Huey-Ing Chen;
2011 / IEEE
By: Garcia-Garcia, J.; Nieto-Perez, M.; Gonzalez, J.J.; Pacheco-Pacheco, M.; Rivera-Rodriguez, C.; Valdivia-Barrientos, R.; Pacheco-Sotelo, J.;
By: Garcia-Garcia, J.; Nieto-Perez, M.; Gonzalez, J.J.; Pacheco-Pacheco, M.; Rivera-Rodriguez, C.; Valdivia-Barrientos, R.; Pacheco-Sotelo, J.;
2011 / IEEE
By: Pinol, L.A.; Clatterbaugh, G.; Coles, G.; Deacon, R.; Lee, D.M.; Charles, H.K.; Melngailis, J.;
By: Pinol, L.A.; Clatterbaugh, G.; Coles, G.; Deacon, R.; Lee, D.M.; Charles, H.K.; Melngailis, J.;
2011 / IEEE
By: Cihan Kuru; Chulmin Choi; Young Oh; Kunbae Noh; Daehoon Hong; Sungho Jin; Tae-Yeon Seong; Sy-Hwang Liou; Li-Han Chen;
By: Cihan Kuru; Chulmin Choi; Young Oh; Kunbae Noh; Daehoon Hong; Sungho Jin; Tae-Yeon Seong; Sy-Hwang Liou; Li-Han Chen;
2011 / IEEE
By: Barquinha, P.; Goncalves, G.; Parthiban, S.; Saji, K.J.; Elangovan, E.; Fortunato, E.; Martins, R.;
By: Barquinha, P.; Goncalves, G.; Parthiban, S.; Saji, K.J.; Elangovan, E.; Fortunato, E.; Martins, R.;
2011 / IEEE
By: Matsumoto, Y.; Kato, T.; Iwata, S.; Tsunashima, S.; Okamoto, S.; Nishizawa, N.; Kitakami, O.; Kikuchi, N.;
By: Matsumoto, Y.; Kato, T.; Iwata, S.; Tsunashima, S.; Okamoto, S.; Nishizawa, N.; Kitakami, O.; Kikuchi, N.;
2012 / IEEE
By: Garcfa-Arribas, A.; Fernandez, E.; Barrainkua, A.; Svalov, A.V.; Kurlyandskaya, G.V.; Barandiaran, J.M.;
By: Garcfa-Arribas, A.; Fernandez, E.; Barrainkua, A.; Svalov, A.V.; Kurlyandskaya, G.V.; Barandiaran, J.M.;
2012 / IEEE
By: Sungho Jin; Li-han Chen; Daehoon Hong; Chin-Hung Liu; Chulmin Choi; Khamwannah, J.; Duyoung Choi; Kunbae Noh;
By: Sungho Jin; Li-han Chen; Daehoon Hong; Chin-Hung Liu; Chulmin Choi; Khamwannah, J.; Duyoung Choi; Kunbae Noh;
2012 / IEEE
By: Tsunashima, S.; Kashima, S.; Matsumoto, Y.; Kato, T.; Okamoto, S.; Kitakami, O.; Iwata, S.; Kikuchi, N.;
By: Tsunashima, S.; Kashima, S.; Matsumoto, Y.; Kato, T.; Okamoto, S.; Kitakami, O.; Iwata, S.; Kikuchi, N.;
2012 / IEEE
By: Tai-Fa Young; Bae-Heng Tseng; Der-Shin Gan; Ya-Hsiang Tai; Shih-Kun Liu; Hui-Chun Huang; Ya-Liang Yang; Min-Chen Chen; Guan-Ru Liu; Geng-Wei Chang; Siang-Lan Chuang; Yong-En Syu; Ting-Chang Chang; Kuan-Chang Chang; Tsung-Ming Tsai; Sze, S.M.; Hao Wang; Cong Ye; Ming-Jinn Tsai; Kai-Huang Chen;
By: Tai-Fa Young; Bae-Heng Tseng; Der-Shin Gan; Ya-Hsiang Tai; Shih-Kun Liu; Hui-Chun Huang; Ya-Liang Yang; Min-Chen Chen; Guan-Ru Liu; Geng-Wei Chang; Siang-Lan Chuang; Yong-En Syu; Ting-Chang Chang; Kuan-Chang Chang; Tsung-Ming Tsai; Sze, S.M.; Hao Wang; Cong Ye; Ming-Jinn Tsai; Kai-Huang Chen;
2012 / IEEE
By: Wei-Chih Lai; Cheng-Hsiung Yen; Shoou-Jinn Chang; Schang-Jing Hon; Tsun-Kai Ko; Chun-Kai Wang; Ya-Yu Yang;
By: Wei-Chih Lai; Cheng-Hsiung Yen; Shoou-Jinn Chang; Schang-Jing Hon; Tsun-Kai Ko; Chun-Kai Wang; Ya-Yu Yang;
Amorphous InGaZnO Thin-Film Transistors Compatible With Roll-to-Roll Fabrication at Room Temperature
2012 / IEEEBy: Yi-Jen Chan; Tuo-Hung Hou; Chyi-Ming Leu; Lai, B.C.-M.; Ming-Jiue Yu; Chang-Yu Lin; Chun-Cheng Cheng; Yung-Hui Yeh; Geng-Tai Ho;
2012 / IEEE
By: Wasa, K.; Kotera, H.; Kanno, I.; Matsushima, T.; Yamamoto, T.; Nishida, K.; Adachi, H.;
By: Wasa, K.; Kotera, H.; Kanno, I.; Matsushima, T.; Yamamoto, T.; Nishida, K.; Adachi, H.;
2011 / IEEE / 978-1-4577-0378-2
By: Chi, D.Z.; Wang, B.Z.; Gao, H.; Chia, C.K.; Wong, T.K.S.; Dalapati, G.; Li, Y.; Kumar, M.K.;
By: Chi, D.Z.; Wang, B.Z.; Gao, H.; Chia, C.K.; Wong, T.K.S.; Dalapati, G.; Li, Y.; Kumar, M.K.;
2011 / IEEE / 978-1-4244-9439-2
By: Huibin Qin; Jiangxia Deng; Liang Zheng; Jun Wu; Weiguang Xiang; Zhihua Ying;
By: Huibin Qin; Jiangxia Deng; Liang Zheng; Jun Wu; Weiguang Xiang; Zhihua Ying;
2011 / IEEE / 978-1-4577-0378-2
By: Tai-Ping Sun; Chin-Guo Kuo; Cheng-Fu Yang; Wen-Ray Chen; Sung-Mao Wu;
By: Tai-Ping Sun; Chin-Guo Kuo; Cheng-Fu Yang; Wen-Ray Chen; Sung-Mao Wu;
2011 / IEEE / 978-1-61284-795-5
By: Khasanov, T.; Atuchin, V.V.; Senchenko, E.S.; Pokrovsky, L.D.; Kochubey, V.A.;
By: Khasanov, T.; Atuchin, V.V.; Senchenko, E.S.; Pokrovsky, L.D.; Kochubey, V.A.;
2011 / IEEE / 978-1-4577-0378-2
By: Kuo, P.C.; Ou, S.L.; Chiang, D.; Lee, C.T.; Chang, H.F.; Yeh, C.Y.; Cheng, C.P.; Shen, C.L.; Tsai, T.L.;
By: Kuo, P.C.; Ou, S.L.; Chiang, D.; Lee, C.T.; Chang, H.F.; Yeh, C.Y.; Cheng, C.P.; Shen, C.L.; Tsai, T.L.;
2011 / IEEE / 978-1-4577-0158-0
By: Youn-Seoung Lee; Sa-Kyun Rha; Eun-Hey Choi; Sang-Soo Nho; Yong-Hyuk Lee; Hyun-jin Ju;
By: Youn-Seoung Lee; Sa-Kyun Rha; Eun-Hey Choi; Sang-Soo Nho; Yong-Hyuk Lee; Hyun-jin Ju;
2011 / IEEE / 978-1-61284-088-8
By: Yangan Yan; Jing Wang; Huawa Yu; Yali Du; Hanchen Liu; Bin Gao; Xin Wang;
By: Yangan Yan; Jing Wang; Huawa Yu; Yali Du; Hanchen Liu; Bin Gao; Xin Wang;
2011 / IEEE / 978-1-4577-1163-3
By: Nakashima, S.; Okuyama, M.; Kanashima, T.; JungMin Park; Shimizu, M.; Tsujita, Y.; Kobune, M.; Nishioka, H.; Fujisawa, H.; Seto, S.;
By: Nakashima, S.; Okuyama, M.; Kanashima, T.; JungMin Park; Shimizu, M.; Tsujita, Y.; Kobune, M.; Nishioka, H.; Fujisawa, H.; Seto, S.;
2011 / IEEE / 978-1-4577-1163-3
By: Karakaya, K.; Jambunathan, M.; Van Schaijk, R.; Vullers, R.; Elfrink, R.;
By: Karakaya, K.; Jambunathan, M.; Van Schaijk, R.; Vullers, R.; Elfrink, R.;
2011 / IEEE / 978-1-4577-1163-3
By: Xiaolong Chen; Xuedong Li; Dongxu Yan; Jianguo Zhu; Dingquan Xiao; Hong Liu;
By: Xiaolong Chen; Xuedong Li; Dongxu Yan; Jianguo Zhu; Dingquan Xiao; Hong Liu;
2011 / IEEE / 978-1-4577-1163-3
By: Dingquan Xiao; Hong Liu; Dongxu Yan; Hongli Guo; Xiaolong Chen; Jianguo Zhu;
By: Dingquan Xiao; Hong Liu; Dongxu Yan; Hongli Guo; Xiaolong Chen; Jianguo Zhu;
2011 / IEEE / 978-986-02-8974-9
By: Shih-Kun Liu; Po-Wei Chen; Yen-Sheng Lin; Yung-Hao Huang; Kun-Cheng Chen; Wei-Chih Tseng;
By: Shih-Kun Liu; Po-Wei Chen; Yen-Sheng Lin; Yung-Hao Huang; Kun-Cheng Chen; Wei-Chih Tseng;
2011 / IEEE / 978-1-61284-651-4
By: Jackson, R.; Flowers, G.T.; Crandall, E.R.; Bozack, M.J.; Lall, P.;
By: Jackson, R.; Flowers, G.T.; Crandall, E.R.; Bozack, M.J.; Lall, P.;
2011 / IEEE / 978-1-4577-2112-0
By: Kruszka, R.; Sidor, Z.; Borysiewicz, M.; Guziewicz, M.; Grochowski, J.; Piotrowska, A.;
By: Kruszka, R.; Sidor, Z.; Borysiewicz, M.; Guziewicz, M.; Grochowski, J.; Piotrowska, A.;
2011 / IEEE / 978-1-4577-1589-1
By: Qian, K.; Van Hoof, C.; de Beeck, M.O.; Velenis, D.; Fiorini, P.; Malachowski, K.;
By: Qian, K.; Van Hoof, C.; de Beeck, M.O.; Velenis, D.; Fiorini, P.; Malachowski, K.;
2011 / IEEE / 978-1-61284-172-4
By: Chaillet, N.; Lutz, P.; Rakotondrabe, M.; Agnus, J.; Ivan, I.A.;
By: Chaillet, N.; Lutz, P.; Rakotondrabe, M.; Agnus, J.; Ivan, I.A.;
2011 / IEEE / 978-1-61284-172-4
By: Park, S.; Chai, G.; Chow, L.; Tiginyanu, I.; Schulte, A.; Ursaki, V.; Popescu, S.; Lupan, O.; Ghimpu, L.;
By: Park, S.; Chai, G.; Chow, L.; Tiginyanu, I.; Schulte, A.; Ursaki, V.; Popescu, S.; Lupan, O.; Ghimpu, L.;
2011 / IEEE / 978-1-61284-172-4
By: Aperathitis, E.; Modreanu, M.; Tsagaraki, K.; Androulidaki, M.; Kostopoulos, A.; Kampylafka, V.;
By: Aperathitis, E.; Modreanu, M.; Tsagaraki, K.; Androulidaki, M.; Kostopoulos, A.; Kampylafka, V.;