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Topic: Spectral Reflectance
Results
2011 / IEEE / 978-1-61284-848-8
By: Wenji Zhao; Xiaoyu Guo; Jingmeng Wang; Ke Liu; Juan Long; Zhaoning Gong;
By: Wenji Zhao; Xiaoyu Guo; Jingmeng Wang; Ke Liu; Juan Long; Zhaoning Gong;
2011 / IEEE / 978-1-4244-9965-6
By: Podraza, N.J.; Haoting Shen; Yuwen, Y.A.; Yoon, H.P.; Mallouk, T.E.; Wronski, C.R.; Mayer, T.S.; Redwing, J.A.; Dickey, E.C.;
By: Podraza, N.J.; Haoting Shen; Yuwen, Y.A.; Yoon, H.P.; Mallouk, T.E.; Wronski, C.R.; Mayer, T.S.; Redwing, J.A.; Dickey, E.C.;
2014 / IEEE
By: Patel, Rahi; Mishra, Prakash; Ferguson, Ian T.; Lu, Na; Raja, M. Yasin; Kucukgok, Bahadir; Stansell, Justin; Hussain, Babar;
By: Patel, Rahi; Mishra, Prakash; Ferguson, Ian T.; Lu, Na; Raja, M. Yasin; Kucukgok, Bahadir; Stansell, Justin; Hussain, Babar;
2015 / IEEE
By: Takayanagi, Aki; Tanaka, Shiro; Tanaka, Hiromi T.; Sakaguchi, Yoshiyuki; Tsuchida, Masaru;
By: Takayanagi, Aki; Tanaka, Shiro; Tanaka, Hiromi T.; Sakaguchi, Yoshiyuki; Tsuchida, Masaru;
2013 / IEEE
By: Tanimoto, Tetsushi; Hirai, Keita; Tominaga, Shoji; Horiuchi, Takahiko; Yamamoto, Kazuya;
By: Tanimoto, Tetsushi; Hirai, Keita; Tominaga, Shoji; Horiuchi, Takahiko; Yamamoto, Kazuya;
1995 / IEEE / 0-7803-2567-2
By: Vourlitis, G.; Fleming, J.B.; Stow, D.A.; McMichael, C.E.; Hope, A.S.; Hastings, S.J.; Oechel, W.C.;
By: Vourlitis, G.; Fleming, J.B.; Stow, D.A.; McMichael, C.E.; Hope, A.S.; Hastings, S.J.; Oechel, W.C.;
Radiometric estimates of grain yields related to crop Aboveground Net Production (ANP) in paddy rice
1997 / IEEE / 0-7803-3836-7By: Jaesung Shin; Sangkyu Rim; Jeongtaek Lee; Sukyoung Hong;
1997 / IEEE / 0-7803-3836-7
By: Watanabe, M.; Inanaga, A.; Micosa, A.G.; Ohkura, T.; Yoshida, M.; Rondal, J.D.;
By: Watanabe, M.; Inanaga, A.; Micosa, A.G.; Ohkura, T.; Yoshida, M.; Rondal, J.D.;
Deconvolution of measured spectra based on principal components analysis and derivative spectroscopy
1998 / IEEE / 0-7803-4403-0By: Holden, H.; LeDrew, E.;
1998 / IEEE / 0-7803-4778-1
By: Maeng-Sub Cho; Chang-Rak Yoon; Jin-Seo Kim; Gyu-Seo Han; Byoung-Ho Kang; Hong-Kee Kim;
By: Maeng-Sub Cho; Chang-Rak Yoon; Jin-Seo Kim; Gyu-Seo Han; Byoung-Ho Kang; Hong-Kee Kim;
1998 / IEEE / 0-8186-8667-7
By: Ohyama, N.; Yamaguchi, M.; Obi, T.; Ohya, Y.; Komiya, Y.; Ishii, K.;
By: Ohyama, N.; Yamaguchi, M.; Obi, T.; Ohya, Y.; Komiya, Y.; Ishii, K.;
2000 / IEEE / 0-7803-6465-1
By: Gono, K.; Yoshida, S.; Sano, Y.; Kobayashi, M.; Sambongi, M.; Oyama, N.; Yamaguchi, M.; Obi, T.; Igarashi, M.;
By: Gono, K.; Yoshida, S.; Sano, Y.; Kobayashi, M.; Sambongi, M.; Oyama, N.; Yamaguchi, M.; Obi, T.; Igarashi, M.;
Consideration and experiments on object spectral reflectance for color sensor evaluation/calibration
2000 / IEEE / 0-7695-0750-6By: Tajima, J.;
2001 / IEEE / 0-7803-7031-7
By: Shunlin Liang; Pearlman, J.; Daughtry, C.; Walthall, C.; Kaul, M.; Campbell, S.; McVicar, T.; Van Niel, T.; Hongliang Fang;
By: Shunlin Liang; Pearlman, J.; Daughtry, C.; Walthall, C.; Kaul, M.; Campbell, S.; McVicar, T.; Van Niel, T.; Hongliang Fang;
2003 / IEEE / 0-7803-7830-X
By: Lovhaugen, O.; Johansen, I.-R.; Lacolle, M.; Sagberg, H.; Sudbo, A.S.; Solgaard, O.;
By: Lovhaugen, O.; Johansen, I.-R.; Lacolle, M.; Sagberg, H.; Sudbo, A.S.; Solgaard, O.;
2003 / IEEE / 0-7803-7929-2
By: Gascon, F.; Martin, E.; Gastellu-Etchegorry, J.P.; Torruella, P.; Chourak, K.; Belot, A.; Deschard, J.; Ader, G.; Gentine, P.; Boyat, P.; Lefevre, M.J.;
By: Gascon, F.; Martin, E.; Gastellu-Etchegorry, J.P.; Torruella, P.; Chourak, K.; Belot, A.; Deschard, J.; Ader, G.; Gentine, P.; Boyat, P.; Lefevre, M.J.;
2003 / IEEE / 4-9901816-0-3
By: Bombace, M.; Graditi, G.; Wang, A.; Zhao, J.; Schioppo, R.; Parretta, A.;
By: Bombace, M.; Graditi, G.; Wang, A.; Zhao, J.; Schioppo, R.; Parretta, A.;
2004 / IEEE / 0-7803-8742-2
By: Zhao Chunjiang; Wang Zhijie; Li Cunjun; Song Xiaoyu; Huang Wenjiang; Wang Jihua; Liu Liangyun;
By: Zhao Chunjiang; Wang Zhijie; Li Cunjun; Song Xiaoyu; Huang Wenjiang; Wang Jihua; Liu Liangyun;
2004 / IEEE / 0-7803-8742-2
By: Muyi Huang; Liangyun Liu; Huawei Wan; Jindi Wang; Wenjiang Huang; Jihua Wang;
By: Muyi Huang; Liangyun Liu; Huawei Wan; Jindi Wang; Wenjiang Huang; Jihua Wang;
2004 / IEEE / 0-7803-8742-2
By: Yan Fuli; Zhang Pei; Wang Litao; Chen Shirong; Du Xiao; Zhu Lingya; Zhou Weiqi; Zhao Qing; Zhou Yi; Wang Shixin;
By: Yan Fuli; Zhang Pei; Wang Litao; Chen Shirong; Du Xiao; Zhu Lingya; Zhou Weiqi; Zhao Qing; Zhou Yi; Wang Shixin;
2007 / IEEE / 978-1-4244-0634-0
By: Seielstad, G.; Xiaodong Zhang; Lijian Shi; Ming-Xia He; Chaofang Zhao;
By: Seielstad, G.; Xiaodong Zhang; Lijian Shi; Ming-Xia He; Chaofang Zhao;
2007 / IEEE / 978-1-4244-1630-1
By: Grossberg, Michael D.; Lee, Moon-Hyun; Park, Jong-Il; Nayar, Shree K.;
By: Grossberg, Michael D.; Lee, Moon-Hyun; Park, Jong-Il; Nayar, Shree K.;
Spectral reflectance measurement of two-dimensional photonic nanocavities with embedded quantum dots
2008 / IEEE / 978-1-4244-1917-3By: Tanaka, Y.; Fujita, M.; Kojima, T.; Asano, T.; Stumpf, W.C.; Noda, S.;