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Topic: Spatial Filters
Results
Experimental Measurements of Path Length Sensitivity in Coherent Beam Combining by Spatial Filtering
2012 / IEEEBy: Chenhao Wan; Leger, J.R.;
2011 / IEEE / 978-1-4577-1226-5
By: Minguez-Vega, G.; Weiner, A.M.; Supradeepa, V.R.; Mendoza-Yero, O.;
By: Minguez-Vega, G.; Weiner, A.M.; Supradeepa, V.R.; Mendoza-Yero, O.;
2011 / IEEE / 978-1-4244-7317-5
By: Creelman, J.; Urfer, A.; Naidu, D.S.; Bosworth, K.; Chiu, S.; Yi Tang; Jensen, A.; Yihun, Y.; Fassih, A.; Potluri, C.; Anugolu, M.; Sebastian, A.; Chen, C.H.; Kumar, P.; Schoen, M.P.;
By: Creelman, J.; Urfer, A.; Naidu, D.S.; Bosworth, K.; Chiu, S.; Yi Tang; Jensen, A.; Yihun, Y.; Fassih, A.; Potluri, C.; Anugolu, M.; Sebastian, A.; Chen, C.H.; Kumar, P.; Schoen, M.P.;
2011 / IEEE / 978-1-4577-1005-6
By: Fujun Sun; Meng-Lung Lin; Tzu-How Chu; Yi-Shiang Shiu; Cheng-Wu Chen; Qiubing Wang;
By: Fujun Sun; Meng-Lung Lin; Tzu-How Chu; Yi-Shiang Shiu; Cheng-Wu Chen; Qiubing Wang;
2011 / IEEE / 978-1-4577-1425-2
By: Robben, A.; Combaz, A.; Manyakov, N.V.; Chumerin, N.; Van Hulle, M.M.; van Vliet, M.;
By: Robben, A.; Combaz, A.; Manyakov, N.V.; Chumerin, N.; Van Hulle, M.M.; van Vliet, M.;
2011 / IEEE / 978-1-4577-0894-7
By: Chao Lin; Said, L.; Besson, O.; Tourneret, J.-Y.; Tassart, S.; Grand, A.;
By: Chao Lin; Said, L.; Besson, O.; Tourneret, J.-Y.; Tassart, S.; Grand, A.;
2011 / IEEE / 978-1-4577-1846-5
By: Silva, M.F.; Rocha, R.P.; Carmo, J.P.; Correia, J.H.; Ribeiro, J.F.; Ferreira, D.S.;
By: Silva, M.F.; Rocha, R.P.; Carmo, J.P.; Correia, J.H.; Ribeiro, J.F.; Ferreira, D.S.;
2011 / IEEE / 978-1-4577-0723-0
By: Shuzhi Sam Ge; Xinyang Li; Xiaosu Hu; Zhengchen Zhang; Keum-Shik Hong; Yaozhang Pan;
By: Shuzhi Sam Ge; Xinyang Li; Xiaosu Hu; Zhengchen Zhang; Keum-Shik Hong; Yaozhang Pan;
2011 / IEEE / 978-1-4244-8443-0
By: Prathyusha, V.; Venkatanarasimhan, S.; Rangarao, K.V.; Pavani, T.N.;
By: Prathyusha, V.; Venkatanarasimhan, S.; Rangarao, K.V.; Pavani, T.N.;
2012 / IEEE / 978-1-4673-1490-9
By: Kai Keng Ang; Cuntai Guan; Dong Huang; Yaozhang Pan; Haihong Zhang;
By: Kai Keng Ang; Cuntai Guan; Dong Huang; Yaozhang Pan; Haihong Zhang;
2012 / IEEE / 978-1-4673-1490-9
By: Cheron, G.; Petieau, M.; Castermans, T.; Duvinage, M.; Dutoit, T.;
By: Cheron, G.; Petieau, M.; Castermans, T.; Duvinage, M.; Dutoit, T.;
2012 / IEEE / 978-1-4673-1071-0
By: Lucarelli, D.; Wang, I.-J.; Nanzer, J.; Pekala, M.; Sharp, M.; Lauritzen, K.;
By: Lucarelli, D.; Wang, I.-J.; Nanzer, J.; Pekala, M.; Sharp, M.; Lauritzen, K.;