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Topic: Solid Lasers
Results
2011 / IEEE
By: Modotto, D.; Couderc, V.; Tonello, A.; Town, G.; De Angelis, C.; Wabnitz, S.; Minoni, U.; Manili, G.;
By: Modotto, D.; Couderc, V.; Tonello, A.; Town, G.; De Angelis, C.; Wabnitz, S.; Minoni, U.; Manili, G.;
2011 / IEEE
By: Malcolm, G.; Maker, G.; Robertson, G.; Butkus, M.; Rafailov, E.U.; Hamilton, C.; Yang Qiu; Walther, T.; Hogg, R.A.; Stevens, B.J.; Krysa, A.B.;
By: Malcolm, G.; Maker, G.; Robertson, G.; Butkus, M.; Rafailov, E.U.; Hamilton, C.; Yang Qiu; Walther, T.; Hogg, R.A.; Stevens, B.J.; Krysa, A.B.;
2012 / IEEE
By: Jianzhou Wang; Yi Xu; Yanyan Li; Yansui Huang; Xiaoming Lu; Zhizhan Xu; Ruxin Li; Yuxin Leng;
By: Jianzhou Wang; Yi Xu; Yanyan Li; Yansui Huang; Xiaoming Lu; Zhizhan Xu; Ruxin Li; Yuxin Leng;
Investigation on Back-Reflected Pumping Light in High-Power Quasi-End-Pumped Yb:YAG Thin-Disk Lasers
2012 / IEEEBy: Radmard, S.; Kazemi, S.; Shayganmanesh, M.; Arabgari, S.;
Experimental Measurements of Path Length Sensitivity in Coherent Beam Combining by Spatial Filtering
2012 / IEEEBy: Chenhao Wan; Leger, J.R.;
2012 / IEEE
By: Weixia Lan; Xuebin Wan; Zhaojun Liu; Xingyu Zhang; Guofan Jin; Qingpu Wang; Fen Bai; Huaijin Zhang;
By: Weixia Lan; Xuebin Wan; Zhaojun Liu; Xingyu Zhang; Guofan Jin; Qingpu Wang; Fen Bai; Huaijin Zhang;
2012 / IEEE
By: Costanzo, G.A.; Pizzocaro, M.; Calonico, D.; Zoppi, M.; Mura, A.; Levi, F.; Godone, A.;
By: Costanzo, G.A.; Pizzocaro, M.; Calonico, D.; Zoppi, M.; Mura, A.; Levi, F.; Godone, A.;
2012 / IEEE
By: Yuen Tsang; Xue Chun Lin; Jin Min Li; Wei Hou; Yan Qu; Ling Zhang; Ying Ying Yang; Wei Sun; Hai Juan Yu; Yong Gang Wang; Ze Hua Han;
By: Yuen Tsang; Xue Chun Lin; Jin Min Li; Wei Hou; Yan Qu; Ling Zhang; Ying Ying Yang; Wei Sun; Hai Juan Yu; Yong Gang Wang; Ze Hua Han;
1992 / IEEE / 000-0-0000-0000-0
By: Ni, A.L.; Lomonosov, I.V.; Kostin, V.V.; Vorobjev, O.Yu.; Hofmann, I.; Skvortsov, V.A.; Fortov, V.E.; Goel, B.P.;
By: Ni, A.L.; Lomonosov, I.V.; Kostin, V.V.; Vorobjev, O.Yu.; Hofmann, I.; Skvortsov, V.A.; Fortov, V.E.; Goel, B.P.;
2004 / IEEE / 978-5-87911-088-3
By: Weidong Qin; Yujuan Wang; Hongtao Li; Bonan Ding; Shen Ding; Zhen Fu; Jianjun Deng;
By: Weidong Qin; Yujuan Wang; Hongtao Li; Bonan Ding; Shen Ding; Zhen Fu; Jianjun Deng;
2010 / IEEE / 978-1-4244-8701-1
By: Banerjee, S.; Ertel, K.; Collier, J.L.; Hernandez-Gomez, C.; Phillips, P.J.; Mason, P.D.;
By: Banerjee, S.; Ertel, K.; Collier, J.L.; Hernandez-Gomez, C.; Phillips, P.J.; Mason, P.D.;
2011 / IEEE / 978-1-61284-329-2
By: Zucchini, F.; Calamy, H.; Sol, D.; d'Almeida, T.; Plouhinec, D.;
By: Zucchini, F.; Calamy, H.; Sol, D.; d'Almeida, T.; Plouhinec, D.;
2011 / IEEE / 978-1-61284-329-2
By: Hornstein, M.; Jones, T.G.; Helle, M.H.; Gordon, D.F.; Ting, A.;
By: Hornstein, M.; Jones, T.G.; Helle, M.H.; Gordon, D.F.; Ting, A.;
2011 / IEEE / 978-1-61284-329-2
By: Graham, W.; Nedanovska, E.; Huwel, L.; Morgan, T.; Riley, D.; Nersisyan, G.;
By: Graham, W.; Nedanovska, E.; Huwel, L.; Morgan, T.; Riley, D.; Nersisyan, G.;
2011 / IEEE / 978-986-02-8974-9
By: Hongtao Zhou; Ying Huang; Ming Tang; Eng Leong Tan; Feng Luan; Songnian Fu; Shum, P.P.;
By: Hongtao Zhou; Ying Huang; Ming Tang; Eng Leong Tan; Feng Luan; Songnian Fu; Shum, P.P.;
2011 / IEEE / 978-986-02-8974-9
By: Hsin-Chia Su; Chih-Lin Wang; Hong-Xi Tsao; Tzong-Yow Tsai; Chien-Ming Huang; Chih-Li Chen; Shih-Ting Lin; Chieh Hu; Yao-Wun Jhang;
By: Hsin-Chia Su; Chih-Lin Wang; Hong-Xi Tsao; Tzong-Yow Tsai; Chien-Ming Huang; Chih-Li Chen; Shih-Ting Lin; Chieh Hu; Yao-Wun Jhang;
2011 / IEEE / 978-986-02-8974-9
By: Cheng, W.-H.; Yung Sing Tseng; Wang, J.; Wei-Lun Wang; Yu-Hang Juang;
By: Cheng, W.-H.; Yung Sing Tseng; Wang, J.; Wei-Lun Wang; Yu-Hang Juang;
2011 / IEEE / 978-1-4244-6051-9
By: Benedick, A.; Chao, D.; Ippen, E.; Kartner, F.; Sander, M.; Kolodziejski, L.; Petrich, G.; Chang, G.; Morse, J.;
By: Benedick, A.; Chao, D.; Ippen, E.; Kartner, F.; Sander, M.; Kolodziejski, L.; Petrich, G.; Chang, G.; Morse, J.;
2011 / IEEE / 978-1-4577-1589-1
By: Lueth, T.C.; Deppe, H.; Hohlweg-Majert, B.; Poitzsch, L.; Weitz, J.; Wolff, R.;
By: Lueth, T.C.; Deppe, H.; Hohlweg-Majert, B.; Poitzsch, L.; Weitz, J.; Wolff, R.;
2011 / IEEE / 978-1-4577-0509-0
By: Kawabe, S.; Kaneko, R.; Tonouchi, M.; Mori, Y.; Kawase, K.; Kawayama, I.; Suizu, K.; Yoshimura, M.; Shibuya, T.; Takahashi, Y.; Murakami, H.;
By: Kawabe, S.; Kaneko, R.; Tonouchi, M.; Mori, Y.; Kawase, K.; Kawayama, I.; Suizu, K.; Yoshimura, M.; Shibuya, T.; Takahashi, Y.; Murakami, H.;
2011 / IEEE / 978-4-8634-8182-4
By: Wienhold, T.; Beck, T.; Hauser, M.; Klinkhammer, S.; Grossmann, T.; Christiansen, M.B.; Mappes, T.; Lemmer, U.; Vannahme, C.; Kalt, H.; Kristensen, A.;
By: Wienhold, T.; Beck, T.; Hauser, M.; Klinkhammer, S.; Grossmann, T.; Christiansen, M.B.; Mappes, T.; Lemmer, U.; Vannahme, C.; Kalt, H.; Kristensen, A.;
2011 / IEEE / 978-1-4244-8939-8
By: Fourmaux, S.; Popovici, C.A.; Ozaki, T.; Marjoribanks, R.; Lecherbourg, L.; Kieffer, J.; Vidal, F.; Gnedyuk, S.; Buffechoux, S.;
By: Fourmaux, S.; Popovici, C.A.; Ozaki, T.; Marjoribanks, R.; Lecherbourg, L.; Kieffer, J.; Vidal, F.; Gnedyuk, S.; Buffechoux, S.;
2011 / IEEE / 978-1-4244-8939-8
By: Yang Wang; Qi Zhang; Xiaowei Wang; Kun Zhao; Chini, M.; Khan, S.; Yi Wu; Zenghu Chang; Baozhen Zhao; Yan Cheng;
By: Yang Wang; Qi Zhang; Xiaowei Wang; Kun Zhao; Chini, M.; Khan, S.; Yi Wu; Zenghu Chang; Baozhen Zhao; Yan Cheng;
2011 / IEEE / 978-4-8634-8182-4
By: Eun-Hwa Her; Tai Hyun Yoon; Minsoo Song; Gwang Hoon Jang; Duseong Yoon;
By: Eun-Hwa Her; Tai Hyun Yoon; Minsoo Song; Gwang Hoon Jang; Duseong Yoon;
2011 / IEEE / 978-1-4244-9306-7
By: Xu Zhang; Qiumei Peng; Muhua Liu; Mingyin Yao; Zejian Lei; Yuan Xu; Tianbing Chen;
By: Xu Zhang; Qiumei Peng; Muhua Liu; Mingyin Yao; Zejian Lei; Yuan Xu; Tianbing Chen;
2011 / IEEE / 978-1-4577-0077-4
By: Yanbo Shi; Jinjiang Cui; Chenyu Jiang; Huiming Tan; Fan Wang; Ningning Dong;
By: Yanbo Shi; Jinjiang Cui; Chenyu Jiang; Huiming Tan; Fan Wang; Ningning Dong;
2011 / IEEE / 978-1-4577-1516-7
By: Gu, E.; Skabara, P.J.; Kanibolotsky, A.L.; Zhang, Y.; Laurand, N.; Herrnsdorf, J.; Chen, Y.; Guilhabert, B.; Dawson, M.D.;
By: Gu, E.; Skabara, P.J.; Kanibolotsky, A.L.; Zhang, Y.; Laurand, N.; Herrnsdorf, J.; Chen, Y.; Guilhabert, B.; Dawson, M.D.;
2011 / IEEE / 978-606-544-078-4
By: Radu, M.; Petcu, I.; Mustaciosu, C.; Buruiana, T.; Buruiana, E.; Kiss, A.; Radu, C.; Zamfirescu, M.; Matei, A.; Dinescu, M.;
By: Radu, M.; Petcu, I.; Mustaciosu, C.; Buruiana, T.; Buruiana, E.; Kiss, A.; Radu, C.; Zamfirescu, M.; Matei, A.; Dinescu, M.;
2011 / IEEE / 978-1-4577-0796-4
By: Xu Jialin; Bo Yong; Peng Qinjun; Xu Zuyan; Cui Dafu; Xie Shiyong; Wang Pengyuan; Wang Zhichao; Xu Yiting; Wang Baoshan; Zuo Junwei;
By: Xu Jialin; Bo Yong; Peng Qinjun; Xu Zuyan; Cui Dafu; Xie Shiyong; Wang Pengyuan; Wang Zhichao; Xu Yiting; Wang Baoshan; Zuo Junwei;
2011 / IEEE / 978-0-9775657-8-8
By: Huaijin Zhang; Bonner, G.M.; Pask, H.M.; Kemp, A.J.; Jiyang Wang;
By: Huaijin Zhang; Bonner, G.M.; Pask, H.M.; Kemp, A.J.; Jiyang Wang;
2011 / IEEE / 978-0-9775657-8-8
By: Xu, W.; Tang, D.Y.; Xu, X.D.; Zheng, L.H.; Xu, J.; Tan, W.D.; Li, D.Z.; Su, B.L.; Zhang, J.;
By: Xu, W.; Tang, D.Y.; Xu, X.D.; Zheng, L.H.; Xu, J.; Tan, W.D.; Li, D.Z.; Su, B.L.; Zhang, J.;
2011 / IEEE / 978-0-9775657-8-8
By: Midorikawa, K.; Takahashi, E.J.; Ishikawa, K.L.; Eilanlou, A.A.; Furukawa, Y.; Nabekawa, Y.;
By: Midorikawa, K.; Takahashi, E.J.; Ishikawa, K.L.; Eilanlou, A.A.; Furukawa, Y.; Nabekawa, Y.;
2011 / IEEE / 978-0-9775657-8-8
By: Kaskow, M.; Gorajek, L.; Swiderski, J.; Zendzian, W.; Jabczynski, J.K.; Kwiatkowski, J.;
By: Kaskow, M.; Gorajek, L.; Swiderski, J.; Zendzian, W.; Jabczynski, J.K.; Kwiatkowski, J.;
2011 / IEEE / 978-0-9775657-8-8
By: Chang, W.K.; Huang, Y.C.; Lin, Y.Y.; Lin, S.T.; Yen-Hung Chen; Chang, J.W.; Chang, H.H.;
By: Chang, W.K.; Huang, Y.C.; Lin, Y.Y.; Lin, S.T.; Yen-Hung Chen; Chang, J.W.; Chang, H.H.;
2011 / IEEE / 978-0-9775657-8-8
By: Judge, A.C.; Dekker, S.A.; Eggleton, B.J.; de Sterke, C.M.; Knight, J.C.; Gris-Sanchez, I.; Pant, R.;
By: Judge, A.C.; Dekker, S.A.; Eggleton, B.J.; de Sterke, C.M.; Knight, J.C.; Gris-Sanchez, I.; Pant, R.;
2011 / IEEE / 978-0-9775657-8-8
By: Cheng Wang; Fei Chen; Deying Chen; Xin Yu; Renpeng Yan; Junhua Yu; Xudong Li;
By: Cheng Wang; Fei Chen; Deying Chen; Xin Yu; Renpeng Yan; Junhua Yu; Xudong Li;
2011 / IEEE / 978-0-9775657-8-8
By: Lei Li; Zhenhua Zhang; Xiaojin Cheng; Jianlei Wang; Weibiao Chen; Xiaolei Zhu; Xiangchun Shi;
By: Lei Li; Zhenhua Zhang; Xiaojin Cheng; Jianlei Wang; Weibiao Chen; Xiaolei Zhu; Xiangchun Shi;
2011 / IEEE / 978-0-9775657-8-8
By: Bernhardi, E.H.; Pollnau, M.; de Ridder, R.M.; Worhoff, K.; van Wolferen, H.A.G.M.;
By: Bernhardi, E.H.; Pollnau, M.; de Ridder, R.M.; Worhoff, K.; van Wolferen, H.A.G.M.;
2011 / IEEE / 978-0-9775657-8-8
By: de Ridder, R.M.; Worhoff, K.; van Wolferen, H.A.G.M.; Bernhardi, E.H.; Pollnau, M.;
By: de Ridder, R.M.; Worhoff, K.; van Wolferen, H.A.G.M.; Bernhardi, E.H.; Pollnau, M.;
2011 / IEEE / 978-0-9775657-8-8
By: Winkelmann, L.; Puncken, O.; Basil, C.; Kracht, D.; Frede, M.; Neumann, J.; Wessels, P.; Schulz, B.;
By: Winkelmann, L.; Puncken, O.; Basil, C.; Kracht, D.; Frede, M.; Neumann, J.; Wessels, P.; Schulz, B.;
2011 / IEEE / 978-0-9775657-8-8
By: Yan Qi; Ying Zhang; Hua Cheng; Bin Wang; Yu Wang; Yong Bi; Yanwei Wang; Tao Fang; Boxia Yan; Guang Zheng;
By: Yan Qi; Ying Zhang; Hua Cheng; Bin Wang; Yu Wang; Yong Bi; Yanwei Wang; Tao Fang; Boxia Yan; Guang Zheng;
2011 / IEEE / 978-0-9775657-8-8
By: Jelinkova, H.; Nemec, M.; Sulc, J.; Lukasiewicz, T.; Ryba-Romanowski, W.;
By: Jelinkova, H.; Nemec, M.; Sulc, J.; Lukasiewicz, T.; Ryba-Romanowski, W.;
2011 / IEEE / 978-0-9775657-8-8
By: Jun Zhou; Xiaopeng Zhu; Jiqiao Liu; Weibiao Chen; Dan Liu; Yan He; Huaguo Zang;
By: Jun Zhou; Xiaopeng Zhu; Jiqiao Liu; Weibiao Chen; Dan Liu; Yan He; Huaguo Zang;
2011 / IEEE / 978-0-9775657-8-8
By: Hong, B.H.; Kim, K.; Yeom, D.; Pasiskevicius, V.; Agnesi, A.; Rotermund, F.; Petrov, V.; Cho, W.B.; Lee, H.W.; Choi, S.Y.; Baek, I.H.;
By: Hong, B.H.; Kim, K.; Yeom, D.; Pasiskevicius, V.; Agnesi, A.; Rotermund, F.; Petrov, V.; Cho, W.B.; Lee, H.W.; Choi, S.Y.; Baek, I.H.;