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Topic: Sio/sub 2/
Results
1988 / IEEE
By: Maehlum, G.; Kaukouen, H.; Hubbeling, L.; Horisberger, R.; Hansen, T.E.; Piesert, A.; Zalewska, A.; Evensen, L.; Weilhammer, P.; Tuuva, T.;
By: Maehlum, G.; Kaukouen, H.; Hubbeling, L.; Horisberger, R.; Hansen, T.E.; Piesert, A.; Zalewska, A.; Evensen, L.; Weilhammer, P.; Tuuva, T.;
1988 / IEEE
By: Okamoto, S.; Matsubara, T.; Ooe, M.; Kyoto, M.; Yamamoto, T.; Chigusa, Y.; Sumita, K.; Watanabe, M.; Iida, T.;
By: Okamoto, S.; Matsubara, T.; Ooe, M.; Kyoto, M.; Yamamoto, T.; Chigusa, Y.; Sumita, K.; Watanabe, M.; Iida, T.;
1988 / IEEE
By: Albrecht, T.R.; Akamine, S.; Hadimioglu, B.; LaComb, L.J., Jr.; Khuri-Yakub, B.T.; Howell, M.D.; Carver, T.E.; Goddard, L.C.;
By: Albrecht, T.R.; Akamine, S.; Hadimioglu, B.; LaComb, L.J., Jr.; Khuri-Yakub, B.T.; Howell, M.D.; Carver, T.E.; Goddard, L.C.;
Distortions of thickness shear mode shapes in plano-convex quartz resonators with mass perturbations
1990 / IEEEBy: Clayton, L.D.; EerNisse, E.P.; Watts, M.H.;
1989 / IEEE
By: Weiss, M.A.; Suter, J.; Strange, W.; Klepczynski, W.J.; Douglas, R.J.; Lewandowski, W.;
By: Weiss, M.A.; Suter, J.; Strange, W.; Klepczynski, W.J.; Douglas, R.J.; Lewandowski, W.;
1989 / IEEE / 0-7803-0817-4
By: Mishra, U.K.; Rosenbaum, S.E.; Nguyen, L.D.; Thompson, M.; Jelloian, L.M.; Brown, A.S.;
By: Mishra, U.K.; Rosenbaum, S.E.; Nguyen, L.D.; Thompson, M.; Jelloian, L.M.; Brown, A.S.;
1991 / IEEE
By: Takano, J.; Saka, K.; Miki, N.; Kikyuama, H.; Ohmi, T.; Miyashita, M.; Kawanabe, I.;
By: Takano, J.; Saka, K.; Miki, N.; Kikyuama, H.; Ohmi, T.; Miyashita, M.; Kawanabe, I.;
1991 / IEEE
By: Feldblum, A.Y.; Read, P.J.; Harvey, G.T.; Watkins, L.S.; Watros, T.L.; Clark, H.R.; Fanucci, R.E.;
By: Feldblum, A.Y.; Read, P.J.; Harvey, G.T.; Watkins, L.S.; Watros, T.L.; Clark, H.R.; Fanucci, R.E.;