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Topic: Sio/sub 2/

Results

The effect of hydrogen on trap generation, positive charge trapping, and time-dependent dielectric breakdown of gate oxides

1988 / IEEE
By: Nissan-Cohen, Y.; Gorczyca, T.;

Radiation resistivity in silica optical fibers

1988 / IEEE
By: Lino, A.; Tamura, J.;

Interlaboratory comparison of radiation-induced attenuation in optical fibers. I. Steady-state exposures

1988 / IEEE
By: Taylor, E.W.; Friebele, E.J.; Barnes, C.E.; Wall, J.A.; Turguet de Beauregard, G.;

Consolidation-atmosphere influence on drawing-induced defects in pure silica optical fibers

1988 / IEEE
By: Hibino, Y.; Hanafusa, H.;

Estimation of long-term transmission loss increase in silica-based optical fibers under hydrogen atmosphere

1988 / IEEE
By: Kuwazuru, M.; Iwamoto, Y.; Mochizuki, K.; Namihira, Y.;

Characterization of soot from multimode vapor-phase axial deposition (VAD) optical fiber performs

1988 / IEEE
By: Kometani, T.Y.; Smyth, I.P.; Clark, H.R.; Potkay, E.; Wood, D.L.;

Large on/off current ratio and low leakage current poly-Si TFTs with multichannel structure

1988 / IEEE
By: Unagami, T.; Kogure, O.;

Equivalent networks for SAW gratings

1988 / IEEE
By: Koshiba, M.; Mitobe, S.;

A normal mode expansion for piezoelectric plates and certain of its applications

1988 / IEEE
By: Peach, R.C.;

Temperature coefficients of the electroelastic constants of quartz

1988 / IEEE
By: Hruska, C.K.;

Simulation of hot-electron trapping and aging of nMOSFETs

1988 / IEEE
By: Bibyk, S.; Samman, A.; Roblin, P.;

High-field-induced degradation in ultra-thin SiO/sub 2/ films

1988 / IEEE
By: Nguyen, T.N.; Olivo, P.; Ricco, B.;

Propagation of boundary acoustic waves along a ZnO layer between two materials

1988 / IEEE
By: Shimizu, Y.; Shirosaki, Y.; Irino, T.;

A simple phenomenological model of tunable SAW devices using magnetostrictive thin films

1988 / IEEE
By: Robbins, W.P.; Hietala, A.;

Synthesis and characterization of high-T/sub c/ superconducting ceramics

1988 / IEEE
By: Ochi, A.; Utsumi, K.;

Recent development of detectors with integrated capacitors and polysilicon resistors

1988 / IEEE
By: Maehlum, G.; Kaukouen, H.; Hubbeling, L.; Horisberger, R.; Hansen, T.E.; Piesert, A.; Zalewska, A.; Evensen, L.; Weilhammer, P.; Tuuva, T.;

gamma -ray and neutron irradiation characteristics of pure silica core single mode fiber and its lifetime estimation

1988 / IEEE
By: Okamoto, S.; Matsubara, T.; Ooe, M.; Kyoto, M.; Yamamoto, T.; Chigusa, Y.; Sumita, K.; Watanabe, M.; Iida, T.;

Fusion neutron damage on optical fibers and optoelectronic devices

1988 / IEEE
By: Matsubara, T.; Sumita, K.; Ire, S.; Iida, T.; Short, D.W.; Heikkinen, D.W.;

Effects of Ti-containing underlayers on planarization and microstructure of magnetron sputtered Al-Cu thin films

1988 / IEEE
By: Ahn, K.Y.; Lin, T.; Chaloux, P.N.; Harper, J.M.E.;

Room temperature copper ULSI metallization by low kinetic-energy particle process

1988 / IEEE
By: Shibata, T.; Saito, T.; Ohmi, T.; Nitta, T.;

Intermetal dielectric deposition by plasma enhanced chemical vapor deposition

1988 / IEEE
By: Olmer, L.J.; Lory, E.R.;

Drawing influence on the lifetime of optical fibres

1989 / IEEE
By: Weichert, D.U.; Jochem, C.M.G.; Hermann, W.; Bouten, P.C.P.;

Planarization of dielectric layers for multilevel metallization

1988 / IEEE
By: Castel, E.D.; Riley, P.E.;

Optimized Stoneley wave device by proper choice of glass overcoat

1989 / IEEE
By: Irino, T.; Shimizu, Y.;

Perfection of quartz and its connection to crystal growth

1988 / IEEE
By: Barns, R.L.; Laudise, R.A.;

Electrodiffusion (sweeping) of ions in quartz-a review

1988 / IEEE
By: Martin, J.J.;

Investigation of instability in multi-layer dielectric structures

1988 / IEEE
By: Kagami, T.; Murakami, S.; Sugawara, Y.;

Cesium hydroxide (CsOH): a useful etchant for micromachining silicon

1988 / IEEE
By: Clark, L.D., Jr.; Lund, J.L.; Edell, D.J.;

Acceleration insensitivity of thickness frequencies of doubly rotated quartz crystal disks

1988 / IEEE
By: Lee, P.C.Y.; Tang, M.S.H.;

Vibrations of Z-cut resonator-structure by finite element analysis

1988 / IEEE
By: Yong, Y.K.; Chuang, S.S.; Lee, P.C.Y.;

A low cost force sensing crystal resonator applied to weighing

1988 / IEEE
By: Albert, W.C.;

Probe examination of thickness-shear vibrations of AT-cut natural quartz crystals: some new results

1988 / IEEE
By: Parshad, R.; Sharma, A.;

Raman microprobe analysis of temperature profiles in CW laser heated silicon microstructures

1989 / IEEE
By: Herman, I.P.; Tang, H.; Pazionis, G.D.;

Charge storage in dielectrics

1989 / IEEE
By: Sessler, G.M.;

Dispersion measurement on fluoride glasses and fibers

1989 / IEEE
By: Mitachi, S.;

Short-wavelength stimulated Raman scattering in a silica fiber pumped by an XeBr excimer laser

1989 / IEEE
By: Takagi, K.; Mizunami, T.;

Dose rate effect on radiation induced attenuation of pure silica core optical fibres

1989 / IEEE
By: Morita, Y.; Kawakami, W.;

Tensile strain dependence of Brillouin frequency shift in silica optical fibers

1989 / IEEE
By: Horiguchi, T.; Tateda, M.; Kurashima, T.;

Oxidation behavior of AlN in the presence of oxide and glass for thick film applications

1989 / IEEE
By: Kageyama, M.; Yamaguchi, T.;

Splice loss in dispersion-modified single-mode silica fibers: effect of non-Gaussian fields

1989 / IEEE
By: Sunak, H.R.D.; Bastien, S.P.;

Extensions of the effective thickness theory of oxide breakdown

1989 / IEEE
By: Brown, G.A.; Hunter, W.R.; Coleman, D.J., Jr.; Chen, I.-C.;

Electromigration of ionized cluster beam deposited aluminum metallizations

1989 / IEEE
By: Hummel, R.E.;

Charge storage in dielectrics

1988 / IEEE
By: Sessler, G.M.;

Excimer laser patterning of high-T/sub c/ superconducting thin films of YBCO

1989 / IEEE
By: Davis, G.M.; Williams, K.F.; Savva, N.; Gower, M.C.;

Alpha quartz

1989 / IEEE
By: Ramus, R.;

A new self-aligned AlGaAs/GaAs HBT based on refractory emitter and base electrodes

1989 / IEEE
By: Ishibashi, T.; Nakajima, O.; Nagata, K.; Nittono, T.;

Low-index embedded waveguide lenses in GaAs substrates

1989 / IEEE
By: Minot, M.M.; Lee, C.C.;

Technology of superconducting thin films on Si, SiO/sub 2/, and Si/sub 3/N/sub 4/ for vacuum microelectronics

1989 / IEEE
By: Soltis, R.E.; Aslam, M.; Chen, J.T.; Wenger, L.E.; Chase, R.E.; Logothetis, E.M.;

A laser-recrystallization technique for silicon-TFT integrated circuits on quartz substrates and its application to small-size monolithic active-matrix LCD's

1990 / IEEE
By: Fujii, E.; Kano, G.; Uemoto, Y.; Nakamura, A.; Yamamoto, A.; Emoto, F.; Senda, K.;

Studies of diffused phosphorus emitters: saturation current, surface recombination velocity, and quantum efficiency

1990 / IEEE
By: Sinton, R.A.; King, R.R.; Swanson, R.M.;

A distributed fiber optic sensor based on cladding fluorescence

1990 / IEEE
By: Lieberman, R.A.; Cohen, L.G.; Blyler, L.L.;

Silicon SAW devices and electromagnetic feedthrough

1988 / IEEE
By: Visser, J.H.; Venema, A.;

Temperature and angular variations of piezoelectric coupling in quartz

1988 / IEEE
By: Kosinski, J.; Lukaszek, T.; Ballato, A.;

An analysis of the normal acceleration sensitivity of contoured quartz resonators rigidly supported along the edges

1988 / IEEE
By: Shick, D.V.; Tiersten, H.F.;

Nonlinear behavior of sound and its application to soliton formation

1988 / IEEE
By: Nakamura, A.;

Nature of 1/f phase noise in quartz crystal resonators

1988 / IEEE
By: Planat, M.;

Frequency fluctuations in thickness shear resonators induced by absorption and desorption of surface molecules

1988 / IEEE
By: Yong, Y.K.; Vig, J.R.;

GHz acousto-optical tunable filter configurations in uniaxial crystals

1988 / IEEE
By: Adler, E.L.; Jen, C.-K.; Oliveira, J.E.B.;

Dependence of orientation and electrical properties in sputtered ZnO upon deposition conditions and substrate

1988 / IEEE
By: Albrecht, T.R.; Akamine, S.; Hadimioglu, B.; LaComb, L.J., Jr.; Khuri-Yakub, B.T.; Howell, M.D.; Carver, T.E.; Goddard, L.C.;

Elastic waves excited into a thick anisotropic plate by interdigital transducers

1988 / IEEE
By: Planat, M.; Bonjour, C.; Coquerel, R.; Hoummady, M.; Zhang, Y.;

Strength and fatigue of silica optical fibers

1989 / IEEE
By: Kurkjian, C.R.; Matthewson, M.J.; Krause, J.T.;

Control of mode profiles in proton-diffused LiNbO/sub 3/ waveguides using self-aligned SiO/sub 2/ cladding

1990 / IEEE
By: Sang-Yung Shin; Hyung-Jae Lee; Yung-Sung Son;

Defect-free silicon film on SiO/sub 2/ formed by zone melting recrystallization with high scanning speed

1990 / IEEE
By: Lianjun Liu; Zhijian Li; Pei-Hsin Tsien;

Enhanced moisture protection of electronic devices by ultra-thin polyimide films

1990 / IEEE
By: Lin, A.W.; LeGrange, J.D.; Burack, J.J.;

Nitridation and post-nitridation anneals of SiO/sub 2/ for ultrathin dielectrics

1990 / IEEE
By: Wright, P.J.; Saraswat, K.C.; Kermani, A.;

A novel compact threshold Cerenkov detector

1990 / IEEE
By: de Vries, R.; van Eijk, C.W.E.; Okx, W.J.C.;

Silica-based integrated optic Mach-Zehnder multi/demultiplexer family with channel spacing of 0.01-250 nm

1990 / IEEE
By: Takato, N.; Kawachi, M.; Toba, H.; Jinguji, K.; Sugita, A.; Kominato, T.;

Laser-trimming adjustment of waveguide birefringence in optical FDM components

1990 / IEEE
By: Kawachi, M.; Takato, N.; Jinguji, K.; Sugita, A.;

A 16-channel frequency selection switch for optical FDM distribution systems

1990 / IEEE
By: Kominato, T.; Takato, N.; Oda, K.; Toba, H.;

A patterned and passivated organic-inorganic semiconductor heterojunction diode

1990 / IEEE
By: Vaccaro, K.; Lorenzo, J.P.; Forrest, S.R.; Prabhakar, V.;

Boiling incipience and nucleate boiling heat transfer of highly wetting dielectric fluids from electronic materials

1990 / IEEE
By: Bar-Cohen, A.; You, S.M.; Simon, T.W.;

A new guided-wave lens structure

1990 / IEEE
By: Lee, C.C.; Minot, M.M.;

Infrared and laser spectroscopic characterization of aluminium defects in cultured quartz

1990 / IEEE
By: Lipson, H.G.;

Modeling resonator frequency fluctuations induced by adsorbing and desorbing surface molecules

1990 / IEEE
By: Vig, J.R.; Yong, Y.K.;

Distortions of thickness shear mode shapes in plano-convex quartz resonators with mass perturbations

1990 / IEEE
By: Clayton, L.D.; EerNisse, E.P.; Watts, M.H.;

First-order sensitivity analysis of quartz crystal resonator model parameters

1990 / IEEE
By: Malocha, D.C.; Belkerdid, M.A.;

A new technique for imaging the logic state of passivated conductors: biased resistive contrast imaging (CMOS devices)

1990 / IEEE
By: Cole, E.I., Jr.;

Applications of laser-trimming for all-quartz package, surface acoustic wave devices

1989 / IEEE
By: Greer, J.A.; Parker, T.E.; Montress, G.K.;

The temperature dependency of power leakage in LST-cut quartz surface acoustic wave filters

1989 / IEEE
By: Hashimoto, K.; Holt, D.E.; Lam, C.S.;

Positioning of GPS antennas in time-keeping laboratories of North America

1989 / IEEE
By: Weiss, M.A.; Suter, J.; Strange, W.; Klepczynski, W.J.; Douglas, R.J.; Lewandowski, W.;

Characterization methods for the sensitivity of quartz oscillators to the environment

1989 / IEEE
By: Gagnepain, J.-J.;

Specification and measurement of the frequency versus temperature characteristics of crystal oscillators

1989 / IEEE
By: Filler, R.L.; Vig, J.R.; Schodowski, S.S.; Rosati, V.J.;

Fundamental lattice vibrations in quartz

1989 / IEEE
By: Murray, R.A.; Gualtieri, J.G.;

Defect distribution mapping in quartz

1989 / IEEE
By: Lipson, H.G.; Zecchini, P.;

Study of quartz sweeping in alpha and beta phases

1989 / IEEE
By: Dolino, G.; Balchheimer, J.P.;

A spread stacked capacitor (SSC) cell for 64 Mbit DRAMs

1989 / IEEE / 0-7803-0817-4
By: Hieda, K.; Inoue, S.; Masuoka, F.; Horiguchi, F.; Nitayama, A.;

Novel high performance self-aligned 0.15 micron long T-gate AlInAs-GaInAs HEMTs

1989 / IEEE / 0-7803-0817-4
By: Mishra, U.K.; Rosenbaum, S.E.; Nguyen, L.D.; Thompson, M.; Jelloian, L.M.; Brown, A.S.;

Characteristics of CMOS devices fabricated using high quality thin PECVD gate oxide

1989 / IEEE / 0-7803-0817-4
By: Wen, D.S.; Wang, L.K.; Chang, W.; Nguyen, T.N.; Bright, A.A.;

Influence of localized latent defects on electrical breakdown of thin insulators

1991 / IEEE
By: Nguyen, T.N.; Olivo, P.; Ricco, B.;

Real-time monitoring and control in plasma etching

1991 / IEEE
By: Trachtenberg, I.; Edgar, T.F.; McLaughlin, K.J.;

Principles of wet chemical processing in ULSI microfabrication

1991 / IEEE
By: Takano, J.; Saka, K.; Miki, N.; Kikyuama, H.; Ohmi, T.; Miyashita, M.; Kawanabe, I.;

Water in interlevel dielectrics: detection and effect on the performance of the MOS IC

1989 / IEEE
By: Lifshitz, N.; Smolinsky, G.;

High impact bonding to improve reliability of VLSI die in plastic packages

1989 / IEEE
By: Mahle, R.L.; McKenna, R.G.;

Miniature crystalline quartz electronical structure

1989 / IEEE
By: Wiggins, R.B.; Ward, R.W.; EerNisse, E.P.; Clayton, L.D.;

High performance multilevel interconnection system with stacked interlayer dielectrics by plasma CVD and bias sputtering

1989 / IEEE
By: Katsura, T.; Mase, Y.; Abe, M.; Koguchi, S.; Yamamoto, T.; Hirata, O.;

Step coverage prediction in plasma-enhanced deposition of silicon dioxide from TEOS

1989 / IEEE
By: Raupp, G.B.; Hey, H.P.W.; Cale, T.S.;

Millimeter-wave components and subsystems built using microstrip technology

1991 / IEEE
By: Williams, D.A.;

Motional capacitance of layered piezoelectric thickness-mode resonators

1991 / IEEE
By: Benes, E.; Schmid, M.; Kravchenko, V.; Burger, W.;

Performance tests of angled fiber 3 dB couplers made with drawn silica substrates

1991 / IEEE
By: Feldblum, A.Y.; Read, P.J.; Harvey, G.T.; Watkins, L.S.; Watros, T.L.; Clark, H.R.; Fanucci, R.E.;

Integrated optic adiabatic devices on silicon

1991 / IEEE
By: Kistler, R.C.; Henry, C.H.; Shani, Y.; Orlowsky, K.J.; Kazarinov, R.F.;

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Topic: Sio/sub 2/

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