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Topic: Silicon Compounds
Results
2011 / IEEE
By: Shih-Cheng Huang; Jen-Hung Tu; Ming-Tsung Hung; Dong-Sing Wuu; Horng, R.-H.; Tsung-Yen Tsai; Li-Wei Tu; Wei-Yang Chiang;
By: Shih-Cheng Huang; Jen-Hung Tu; Ming-Tsung Hung; Dong-Sing Wuu; Horng, R.-H.; Tsung-Yen Tsai; Li-Wei Tu; Wei-Yang Chiang;
2011 / IEEE
By: Kudo, H.; Nara, Y.; Kitada, H.; Owada, T.; Sakai, H.; Haneda, M.; Ochimizu, H.; Sunayama, M.; Tabira, T.; Ohtsuka, N.;
By: Kudo, H.; Nara, Y.; Kitada, H.; Owada, T.; Sakai, H.; Haneda, M.; Ochimizu, H.; Sunayama, M.; Tabira, T.; Ohtsuka, N.;
2011 / IEEE
By: Eddy, C.R.; Hobart, K.D.; Kub, F.J.; Imhoff, E.A.; Ancona, M.G.; Myers-Ward, R.L.; Lew, K.; Gaskill, D.K.; VanMil, B.L.;
By: Eddy, C.R.; Hobart, K.D.; Kub, F.J.; Imhoff, E.A.; Ancona, M.G.; Myers-Ward, R.L.; Lew, K.; Gaskill, D.K.; VanMil, B.L.;
2011 / IEEE
By: Satoh, Y.S.; Ueda, M.U.; Matsuda, T.M.; Miura, M.M.; Hara, M.H.; Matsuda, S.M.; Hashimoto, K.H.;
By: Satoh, Y.S.; Ueda, M.U.; Matsuda, T.M.; Miura, M.M.; Hara, M.H.; Matsuda, S.M.; Hashimoto, K.H.;
2011 / IEEE
By: Biro, D.; Hofmann, M.; Saint-Cast, P.; Kimmerle, A.; Mack, S.; Brosinsky, C.; Wolf, A.; Schmeisser, S.;
By: Biro, D.; Hofmann, M.; Saint-Cast, P.; Kimmerle, A.; Mack, S.; Brosinsky, C.; Wolf, A.; Schmeisser, S.;
2011 / IEEE
By: Jong Kyung Park; Byung Jin Cho; Kwon Hong; Moon Sig Joo; Jae Sub Oh; Sung Kyu Im; Seok-Hee Lee; Youngmin Park;
By: Jong Kyung Park; Byung Jin Cho; Kwon Hong; Moon Sig Joo; Jae Sub Oh; Sung Kyu Im; Seok-Hee Lee; Youngmin Park;
2011 / IEEE
By: VanMil, B.L.; Zhao, J.H.; Xiaobin Xin; Jun Hu; Gaskill, D.K.; Eddy, C.R.; Myers-Ward, R.;
By: VanMil, B.L.; Zhao, J.H.; Xiaobin Xin; Jun Hu; Gaskill, D.K.; Eddy, C.R.; Myers-Ward, R.;
2011 / IEEE
By: Jin, X.H.; Ge, H.L.; Jin, D.F.; Hong, B.; Wang, X.Q.; Xu, J.C.; Huang, B.; Chen, M.; Peng, X.L.;
By: Jin, X.H.; Ge, H.L.; Jin, D.F.; Hong, B.; Wang, X.Q.; Xu, J.C.; Huang, B.; Chen, M.; Peng, X.L.;
2011 / IEEE
By: Chenhsin Lien; Wen-Fa Wu; Jr-Jie Tsai; Ruei-Kai Shia; Nguyen Dang Chien; Chun-Hsing Shih; Ji-Ting Liang; Yan-Xiang Luo; Wei Chang; Ming-Kun Huang;
By: Chenhsin Lien; Wen-Fa Wu; Jr-Jie Tsai; Ruei-Kai Shia; Nguyen Dang Chien; Chun-Hsing Shih; Ji-Ting Liang; Yan-Xiang Luo; Wei Chang; Ming-Kun Huang;
2011 / IEEE
By: Newaz, A.K.M.; En Xia Zhang; Weller, R.A.; Reed, R.A.; Weiss, S.M.; Schrimpf, R.D.; Alles, M.L.; Pantelides, S.T.; Bolotin, K.I.; Fleetwood, D.M.; Zhang, C.X.; Bhandaru, S.; Bin Wang;
By: Newaz, A.K.M.; En Xia Zhang; Weller, R.A.; Reed, R.A.; Weiss, S.M.; Schrimpf, R.D.; Alles, M.L.; Pantelides, S.T.; Bolotin, K.I.; Fleetwood, D.M.; Zhang, C.X.; Bhandaru, S.; Bin Wang;
2011 / IEEE
By: En Xia Zhang; Cher Xuan Zhang; Xiao Shen; Pantelides, S.T.; Fleetwood, D.M.; Sei-Hyung Ryu; Dhar, S.; Schrimpf, R.D.;
By: En Xia Zhang; Cher Xuan Zhang; Xiao Shen; Pantelides, S.T.; Fleetwood, D.M.; Sei-Hyung Ryu; Dhar, S.; Schrimpf, R.D.;
2011 / IEEE
By: Hjalmarson, H.P.; Rax, B.G.; Adell, P.C.; Barnaby, H.J.; Esqueda, I.S.; Pease, R.L.; McLain, M.L.;
By: Hjalmarson, H.P.; Rax, B.G.; Adell, P.C.; Barnaby, H.J.; Esqueda, I.S.; Pease, R.L.; McLain, M.L.;
2011 / IEEE
By: Chengyong Hu; Taverne, M.P.C.; Ivanov, P.S.; Nicol, M.F.J.; Engin, E.; Cryan, M.J.; Ho, Y.D.; Rarity, J.G.; Railton, C.J.; Craddock, I.J.;
By: Chengyong Hu; Taverne, M.P.C.; Ivanov, P.S.; Nicol, M.F.J.; Engin, E.; Cryan, M.J.; Ho, Y.D.; Rarity, J.G.; Railton, C.J.; Craddock, I.J.;
2011 / IEEE
By: Cihan Kuru; Chulmin Choi; Young Oh; Kunbae Noh; Daehoon Hong; Sungho Jin; Tae-Yeon Seong; Sy-Hwang Liou; Li-Han Chen;
By: Cihan Kuru; Chulmin Choi; Young Oh; Kunbae Noh; Daehoon Hong; Sungho Jin; Tae-Yeon Seong; Sy-Hwang Liou; Li-Han Chen;
2011 / IEEE
By: Nguyen Duc Tho; Schwob, C.; Avoine, A.; Hoang Nam Nhat; Pham Thu Nga; Phan Tien Dung;
By: Nguyen Duc Tho; Schwob, C.; Avoine, A.; Hoang Nam Nhat; Pham Thu Nga; Phan Tien Dung;
2011 / IEEE
By: Gaskill, D.K.; Eddy, C.R.; Myers-Ward, R.L.; Tedesco, J.L.; Yanqing Wu; Dimitrakopoulos, C.; Farmer, D.B.; Yu-Ming Lin; Jenkins, K.A.; Avouris, P.;
By: Gaskill, D.K.; Eddy, C.R.; Myers-Ward, R.L.; Tedesco, J.L.; Yanqing Wu; Dimitrakopoulos, C.; Farmer, D.B.; Yu-Ming Lin; Jenkins, K.A.; Avouris, P.;
2011 / IEEE
By: Wei-Cheng Lien; Jr-Hau He; Pisano, A.P.; Maboudian, R.; Senesky, D.G.; Shu-Hsien Chiu; Dung-Sheng Tsai;
By: Wei-Cheng Lien; Jr-Hau He; Pisano, A.P.; Maboudian, R.; Senesky, D.G.; Shu-Hsien Chiu; Dung-Sheng Tsai;
2011 / IEEE
By: Jenkins, M.; Keeley, J.; Shuo Liu; Holmes, M.R.; Hawkins, A.R.; Schmidt, H.; Leake, K.;
By: Jenkins, M.; Keeley, J.; Shuo Liu; Holmes, M.R.; Hawkins, A.R.; Schmidt, H.; Leake, K.;
2011 / IEEE
By: Salvia, J.C.; Hopcroft, M.A.; Bongsang Kim; Melamud, R.; Hyung Kyu Lee; Kenny, T.W.;
By: Salvia, J.C.; Hopcroft, M.A.; Bongsang Kim; Melamud, R.; Hyung Kyu Lee; Kenny, T.W.;
2012 / IEEE
By: Zimmer, T.; Happy, H.; Meng, N.; Maneux, C.; Grandchamp, B.; Majek, C.; Fregonese, S.; Hainaut, C.;
By: Zimmer, T.; Happy, H.; Meng, N.; Maneux, C.; Grandchamp, B.; Majek, C.; Fregonese, S.; Hainaut, C.;
2011 / IEEE
By: Haixia Wang; Bhushan, B.; Papaioannou, G.J.; Zaghloul, U.; Plana, R.; Pons, P.; Coccetti, F.;
By: Haixia Wang; Bhushan, B.; Papaioannou, G.J.; Zaghloul, U.; Plana, R.; Pons, P.; Coccetti, F.;
2011 / IEEE
By: Lambros, J.; Chasiotis, I.; Yagnamurthy, S.; Dubey, M.; Pulskamp, J.S.; Polcawich, R.G.;
By: Lambros, J.; Chasiotis, I.; Yagnamurthy, S.; Dubey, M.; Pulskamp, J.S.; Polcawich, R.G.;
2011 / IEEE
By: Frechette, M.; Gubanski, S.; Bulinski, A.; Tanaka, T.; Han, S.J.; Sutton, S.; Reed, C.W.; Ohki, Y.; Vaughan, A.; Castellon, J.; Pelissou, S.; Tanaka, Y.; Morshuis, P.; Nagao, M.; Montanari, G.C.; Kindersberger, J.;
By: Frechette, M.; Gubanski, S.; Bulinski, A.; Tanaka, T.; Han, S.J.; Sutton, S.; Reed, C.W.; Ohki, Y.; Vaughan, A.; Castellon, J.; Pelissou, S.; Tanaka, Y.; Morshuis, P.; Nagao, M.; Montanari, G.C.; Kindersberger, J.;
2012 / IEEE
By: Angelov, I.; Hirano, Y.; Nakayama, M.; Otsuka, H.; Kuwata, E.; Fager, C.; Gustafsson, D.; Andersson, C.M.; Yamanaka, K.; Rorsman, N.;
By: Angelov, I.; Hirano, Y.; Nakayama, M.; Otsuka, H.; Kuwata, E.; Fager, C.; Gustafsson, D.; Andersson, C.M.; Yamanaka, K.; Rorsman, N.;
2012 / IEEE
By: Weijun Tong; Guobin Ren; Xia Yu; Yong, D.; Huiyu Zhang; Huifeng Wei; Chi Chiu Chan; Ying Zhang;
By: Weijun Tong; Guobin Ren; Xia Yu; Yong, D.; Huiyu Zhang; Huifeng Wei; Chi Chiu Chan; Ying Zhang;
2012 / IEEE
By: Vaccaro, L.; Marcandella, C.; Girard, S.; Alessi, A.; Ouerdane, Y.; Boukenter, A.; Cannas, M.;
By: Vaccaro, L.; Marcandella, C.; Girard, S.; Alessi, A.; Ouerdane, Y.; Boukenter, A.; Cannas, M.;
2012 / IEEE
By: Marcandella, C.; Girard, S.; Raine, M.; Gaillardin, M.; Paillet, P.; Richard, N.; Ouerdane, Y.; Boukenter, A.; Alessi, A.;
By: Marcandella, C.; Girard, S.; Raine, M.; Gaillardin, M.; Paillet, P.; Richard, N.; Ouerdane, Y.; Boukenter, A.; Alessi, A.;
2012 / IEEE
By: Shibata, H.; Sakata, A.; Watanabe, K.; Nakao, S.; Wada, M.; Matsunaga, N.; Hayashi, Y.;
By: Shibata, H.; Sakata, A.; Watanabe, K.; Nakao, S.; Wada, M.; Matsunaga, N.; Hayashi, Y.;
2012 / IEEE
By: Andres, M. V.; Sanchez-Martin, J. A.; Diez, A.; Rebolledo, M. A.; Berdejo, V.; Valles, J. A.;
By: Andres, M. V.; Sanchez-Martin, J. A.; Diez, A.; Rebolledo, M. A.; Berdejo, V.; Valles, J. A.;
2012 / IEEE
By: Casse, M.; Coquand, R.; Barraud, S.; Poiroux, T.; Faynot, O.; Koyama, M.; Aussenac, F.; Vizioz, C.; Comboroure, C.; Maffini-Alvaro, V.; Hartmann, J.-M.;
By: Casse, M.; Coquand, R.; Barraud, S.; Poiroux, T.; Faynot, O.; Koyama, M.; Aussenac, F.; Vizioz, C.; Comboroure, C.; Maffini-Alvaro, V.; Hartmann, J.-M.;