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Topic: Signal Generators
Results
2011 / IEEE
By: Callahan, P.T.; Nanzer, J.A.; Waterhouse, R.B.; Novak, D.; Clark, T.R.; Dennis, M.L.;
By: Callahan, P.T.; Nanzer, J.A.; Waterhouse, R.B.; Novak, D.; Clark, T.R.; Dennis, M.L.;
2011 / IEEE
By: Walton, C.; Contin, A.; Swaffield, D.J.; Hunter, J.A.; Lewin, P.L.; Hao, L.; Michel, M.;
By: Walton, C.; Contin, A.; Swaffield, D.J.; Hunter, J.A.; Lewin, P.L.; Hao, L.; Michel, M.;
2012 / IEEE
By: Dat, P.T.; Kanno, A.; Kitayama, K.; Yasumura, Y.; Kuri, T.; Yoshida, Y.; Kawanishi, T.; Hosako, I.;
By: Dat, P.T.; Kanno, A.; Kitayama, K.; Yasumura, Y.; Kuri, T.; Yoshida, Y.; Kawanishi, T.; Hosako, I.;
2009 / IEEE / 978-1-4577-0493-2
By: Seidleck, C.; Phan, A.; Perez, C.; Friendlich, M.; LaBel, K.; Kim, H.; Buchner, S.; Berg, M.;
By: Seidleck, C.; Phan, A.; Perez, C.; Friendlich, M.; LaBel, K.; Kim, H.; Buchner, S.; Berg, M.;
2011 / IEEE / 978-1-61284-175-5
By: Kenneth, K.O.; Tanner, D.B.; Arenas, D.J.; Koukis, D.; Dongha Shim;
By: Kenneth, K.O.; Tanner, D.B.; Arenas, D.J.; Koukis, D.; Dongha Shim;
2011 / IEEE / 978-1-4577-0378-2
By: Nai-Kuan Chou; Chieh-Hsiung Kuan; Ming-Lun Lee; Chieh-Wei Lee; Kung-Chu Ho;
By: Nai-Kuan Chou; Chieh-Hsiung Kuan; Ming-Lun Lee; Chieh-Wei Lee; Kung-Chu Ho;
Programmable phase/frequency generator for system debug and diagnosis using the IEEE 1149.1 test bus
2011 / IEEE / 978-1-4577-0223-5By: Roberts, G.W.; Tsung-Yen Tsai;
2011 / IEEE / 978-1-4244-9844-4
By: Sanchez-Pacheco, F.J.; Sotorrio-Ruiz, P.J.; Perez-Hidalgo, F.; Heredia-Larrubia, J.R.;
By: Sanchez-Pacheco, F.J.; Sotorrio-Ruiz, P.J.; Perez-Hidalgo, F.; Heredia-Larrubia, J.R.;
2011 / IEEE / 978-1-4244-6051-9
By: Phillips, C.; Edwards, P.; Takeuchi, H.; Jinsong, P.; Sawada, H.; Tomiki, A.; Yoshikawa, M.; Ichikawa, B.; Kurihara, S.; Horiuchi, S.; Yamaguchi, T.; Takefuji, K.; Ichikawa, R.; Dickey, J.; Ellingsen, S.; McCallum, J.;
By: Phillips, C.; Edwards, P.; Takeuchi, H.; Jinsong, P.; Sawada, H.; Tomiki, A.; Yoshikawa, M.; Ichikawa, B.; Kurihara, S.; Horiuchi, S.; Yamaguchi, T.; Takefuji, K.; Ichikawa, R.; Dickey, J.; Ellingsen, S.; McCallum, J.;
2011 / IEEE / 978-1-4577-0509-0
By: Duan, Y.; Kai Hui; Durant, S.; Foley, B.; Crowe, T.W.; Hesler, J.L.;
By: Duan, Y.; Kai Hui; Durant, S.; Foley, B.; Crowe, T.W.; Hesler, J.L.;
2011 / IEEE / 978-1-4577-1470-2
By: Sawan, M.; Delgado-Restituto, M.; Ruiz-Amaya, J.; Rodriguez-Perez, A.; Rodriguez-Vazquez, A.;
By: Sawan, M.; Delgado-Restituto, M.; Ruiz-Amaya, J.; Rodriguez-Perez, A.; Rodriguez-Vazquez, A.;
2011 / IEEE / 978-1-4577-1694-2
By: Bore, F.; Calais, S.; Lambert, C.; Dumaine, E.; Glascott-Jones, A.; Chantier, N.; Wingender, M.;
By: Bore, F.; Calais, S.; Lambert, C.; Dumaine, E.; Glascott-Jones, A.; Chantier, N.; Wingender, M.;
2011 / IEEE / 978-1-4577-1210-4
By: Rigas, A.; Agapiou, G.; Voudouris, K.; Agapiou, S.; Mikroulis, S.;
By: Rigas, A.; Agapiou, G.; Voudouris, K.; Agapiou, S.; Mikroulis, S.;
2011 / IEEE / 978-1-4577-1524-2
By: Jichul Kim; Dong-Ik Cheon; Hwa-Suk Oh; Daegyun Choi; Ilgyu Choi;
By: Jichul Kim; Dong-Ik Cheon; Hwa-Suk Oh; Daegyun Choi; Ilgyu Choi;
2011 / IEEE / 978-1-4577-1879-3
By: Gomez-Quinones, J.; Perez-Gonzalez, V.H.; Moncada-Hernandez, H.; Rossetto, O.; Dieck-Assad, G.; Martinez-Chapa, S.O.;
By: Gomez-Quinones, J.; Perez-Gonzalez, V.H.; Moncada-Hernandez, H.; Rossetto, O.; Dieck-Assad, G.; Martinez-Chapa, S.O.;
2011 / IEEE / 978-1-4577-2149-6
By: Clarke, W.; Ramana, C.V.V.; Murthy, B.R.; Kumar, M.A.; Madhav, K.V.;
By: Clarke, W.; Ramana, C.V.V.; Murthy, B.R.; Kumar, M.A.; Madhav, K.V.;
2011 / IEEE / 978-0-7695-4479-3
By: Asami, K.; Kobayashi, H.; Miyajima, H.; Kurosawa, T.; Tateiwa, T.;
By: Asami, K.; Kobayashi, H.; Miyajima, H.; Kurosawa, T.; Tateiwa, T.;
2011 / IEEE / 978-1-61284-865-5
By: Hsiang-Hui Cheng; Pei-Yuan Chou; Yu-Lung Lo; Wei-Bin Yang; Shu-Fen Tsai;
By: Hsiang-Hui Cheng; Pei-Yuan Chou; Yu-Lung Lo; Wei-Bin Yang; Shu-Fen Tsai;
2011 / IEEE / 978-1-4577-0631-8
By: Hosseini, S.H.R.; Ishizawa, H.; Hashimoto, M.; Akiyama, H.; Katsuki, S.;
By: Hosseini, S.H.R.; Ishizawa, H.; Hashimoto, M.; Akiyama, H.; Katsuki, S.;
2012 / IEEE / 978-1-4577-1238-8
By: Georgiadis, A.; Giuppi, F.; Bozzi, M.; Tentzeris, M.M.; Vyas, R.; Collado, A.; Via, S.;
By: Georgiadis, A.; Giuppi, F.; Bozzi, M.; Tentzeris, M.M.; Vyas, R.; Collado, A.; Via, S.;