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Topic: Sensor Arrays
Results
2011 / IEEE
By: Friederich, F.; Roskos, H.G.; Bauer, M.; Fanzhen Meng; Thomson, M.D.; Boppel, S.; Lisauskas, A.; Hils, B.; Krozer, V.; Keil, A.; Loffler, T.; Henneberger, R.; Huhn, A.K.; Spickermann, G.; Bolivar, P.H.; von Spiegel, W.;
By: Friederich, F.; Roskos, H.G.; Bauer, M.; Fanzhen Meng; Thomson, M.D.; Boppel, S.; Lisauskas, A.; Hils, B.; Krozer, V.; Keil, A.; Loffler, T.; Henneberger, R.; Huhn, A.K.; Spickermann, G.; Bolivar, P.H.; von Spiegel, W.;
2012 / IEEE
By: Joo-Hyung Kim; Seokjin Kwon; Jongwoo Jun; Myoungki Choi; Jinyi Lee; Minhhuy Le; Jungmin Kim;
By: Joo-Hyung Kim; Seokjin Kwon; Jongwoo Jun; Myoungki Choi; Jinyi Lee; Minhhuy Le; Jungmin Kim;
2012 / IEEE
By: Victora, R.H.; Norby, G.; Cobian, R.; Xiaobo Huang; Liwen Tan; Maqableh, M.M.; Stadler, B.J.H.;
By: Victora, R.H.; Norby, G.; Cobian, R.; Xiaobo Huang; Liwen Tan; Maqableh, M.M.; Stadler, B.J.H.;
2012 / IEEE
By: Retiere, F.; Berg, E.J.; Goertzen, A.L.; Thompson, C.J.; Kozlowski, P.; Sossi, V.; Stortz, G.; Ryner, L.;
By: Retiere, F.; Berg, E.J.; Goertzen, A.L.; Thompson, C.J.; Kozlowski, P.; Sossi, V.; Stortz, G.; Ryner, L.;
2012 / IEEE
By: Pannetier-Lecoeur, M.; Fermon, C.; Parkkonen, L.; Azizi-Rogeau, L.; Campiglio, P.; Paul, E.; Caruso, L.; Demonti, A.;
By: Pannetier-Lecoeur, M.; Fermon, C.; Parkkonen, L.; Azizi-Rogeau, L.; Campiglio, P.; Paul, E.; Caruso, L.; Demonti, A.;
2012 / IEEE
By: Contreras, J.; Ferreira, I.; Martins, R.; Fortunato, E.; Filonovich, S.A.; Pereira, S.; Idzikowski, M.;
By: Contreras, J.; Ferreira, I.; Martins, R.; Fortunato, E.; Filonovich, S.A.; Pereira, S.; Idzikowski, M.;
2012 / IEEE
By: Shimamura, T.; Nakanishi, M.; Machida, K.; Shigematsu, S.; Sakata, T.; Shimoyama, N.; Morimura, H.;
By: Shimamura, T.; Nakanishi, M.; Machida, K.; Shigematsu, S.; Sakata, T.; Shimoyama, N.; Morimura, H.;
2012 / IEEE
By: Pegalajar, M.C.; Cuellar, M.P.; Capel-Cuevas, S.; Capitan-Vallvey, L.F.; de Orbe-Paya, I.;
By: Pegalajar, M.C.; Cuellar, M.P.; Capel-Cuevas, S.; Capitan-Vallvey, L.F.; de Orbe-Paya, I.;
2012 / IEEE
By: Chuan-Jian Zhong; Poliks, M.; Sammakia, B.; Lu, S.; Jin Luo; Alzoubi, K.; Jun Yin; Hao Zhang; Lingyan Wang; Hamasha, M.M.;
By: Chuan-Jian Zhong; Poliks, M.; Sammakia, B.; Lu, S.; Jin Luo; Alzoubi, K.; Jun Yin; Hao Zhang; Lingyan Wang; Hamasha, M.M.;
2010 / IEEE / 978-1-4244-5261-3
By: Wieczorek, L.; Raguse, B.; Muller, K.-H.; Hubble, L.; Chow, E.; Cooper, J.S.;
By: Wieczorek, L.; Raguse, B.; Muller, K.-H.; Hubble, L.; Chow, E.; Cooper, J.S.;
2011 / IEEE / 978-1-4577-1226-5
By: Montilla, I.; Femenia, B.; Rodriguez-Ramos, L.F.; Militello, C.; Quintero, H.; Guadalupe, V.; Rosa, F.; Lopez, R.; Sanluis, J.C.; Dominguez-Conde, C.; Fernandez-Valdivia, J.J.; Lopez, M.; Puga, M.; Trujillo-Sevilla, J.; Luke, J.P.; Marichal-Hernandez, J.G.; Rodriguez-Ramos, J.M.;
By: Montilla, I.; Femenia, B.; Rodriguez-Ramos, L.F.; Militello, C.; Quintero, H.; Guadalupe, V.; Rosa, F.; Lopez, R.; Sanluis, J.C.; Dominguez-Conde, C.; Fernandez-Valdivia, J.J.; Lopez, M.; Puga, M.; Trujillo-Sevilla, J.; Luke, J.P.; Marichal-Hernandez, J.G.; Rodriguez-Ramos, J.M.;
2011 / IEEE / 978-1-61284-175-5
By: Murmann, B.; Wang, S.X.; Makinwa, K.; Osterfeld, S.J.; Gaster, R.S.; Hall, D.A.;
By: Murmann, B.; Wang, S.X.; Makinwa, K.; Osterfeld, S.J.; Gaster, R.S.; Hall, D.A.;
2011 / IEEE / 978-1-4577-0378-2
By: Ming-Yang Hsieh; Woei-Tyng Lin; Wei-Chun Chen; Fang-I Lai; Shou-Yi Kuo;
By: Ming-Yang Hsieh; Woei-Tyng Lin; Wei-Chun Chen; Fang-I Lai; Shou-Yi Kuo;
2011 / IEEE / 978-1-4577-0274-7
By: Thiagarajan, J.J.; Ramamurthy, K.N.; Sattigeri, P.S.; Thornton, T.; Spanias, A.; Goryll, M.;
By: Thiagarajan, J.J.; Ramamurthy, K.N.; Sattigeri, P.S.; Thornton, T.; Spanias, A.; Goryll, M.;
2011 / IEEE / 978-1-4577-1236-4
By: Moretti, F.N.; Luna, M.C.; Pivetta, O.H.; Battaglia, G.A.; Cabrera, J.L.;
By: Moretti, F.N.; Luna, M.C.; Pivetta, O.H.; Battaglia, G.A.; Cabrera, J.L.;
2011 / IEEE / 978-1-61284-777-1
By: Takiya, T.; Min Han; Guanghou Wang; Fengqi Song; Mengyang Zheng; Bo Xie; Xing Peng; Yue Zhang; Linlin Liu; Qian Xu;
By: Takiya, T.; Min Han; Guanghou Wang; Fengqi Song; Mengyang Zheng; Bo Xie; Xing Peng; Yue Zhang; Linlin Liu; Qian Xu;
2011 / IEEE / 978-1-61284-777-1
By: Hsu-Chao Hao; Yi-Tian Li; Da-Jeng Yao; Kea-Tiong Tang; Chia-Min Yang; Pei-Hsin Ku; Tai-Hsuan Lin; Mei-Ching Chen;
By: Hsu-Chao Hao; Yi-Tian Li; Da-Jeng Yao; Kea-Tiong Tang; Chia-Min Yang; Pei-Hsin Ku; Tai-Hsuan Lin; Mei-Ching Chen;
2011 / IEEE / 978-1-4577-0336-2
By: Ericsson, P.; Niklaus, F.; Roxhed, N.; Stemme, G.; Fischer, A.C.; Forsberg, F.; Samel, B.;
By: Ericsson, P.; Niklaus, F.; Roxhed, N.; Stemme, G.; Fischer, A.C.; Forsberg, F.; Samel, B.;