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Topic: Sensitivity Analysis
Results
2011 / IEEE
By: Phan, A.; Carts, M.; Forney, J.; Kruckmeyer, K.; Pease, R.; Dakai Chen; LaBel, K.; Buchner, S.; Ouellet, A.; Duperray, H.; Chaumont, G.; Salzman, J.; Little, B.; Holcombe, B.; Albarian, R.; Burns, S.; Cox, S.;
By: Phan, A.; Carts, M.; Forney, J.; Kruckmeyer, K.; Pease, R.; Dakai Chen; LaBel, K.; Buchner, S.; Ouellet, A.; Duperray, H.; Chaumont, G.; Salzman, J.; Little, B.; Holcombe, B.; Albarian, R.; Burns, S.; Cox, S.;
2011 / IEEE
By: Dusseau, L.; Deneau, C.; Vaille, J.; Saigne, F.; Perez, S.; Roche, N.J.; Lorfevre, E.; Boch, J.; Gonzalez-Velo, Y.; Platteter, D.G.; Legoulven, E.; Chatry, C.; Schrimpf, R.D.;
By: Dusseau, L.; Deneau, C.; Vaille, J.; Saigne, F.; Perez, S.; Roche, N.J.; Lorfevre, E.; Boch, J.; Gonzalez-Velo, Y.; Platteter, D.G.; Legoulven, E.; Chatry, C.; Schrimpf, R.D.;
2011 / IEEE
By: Roche, N.J.-H.; Saigne, F.; Gonzalez Velo, Y.; Boch, J.; Ecoffet, R.; Perez, S.; Mekki, J.; Lorfevre, E.; Dusseau, L.; Vaille, J.-R.; Schrimpf, R.D.;
By: Roche, N.J.-H.; Saigne, F.; Gonzalez Velo, Y.; Boch, J.; Ecoffet, R.; Perez, S.; Mekki, J.; Lorfevre, E.; Dusseau, L.; Vaille, J.-R.; Schrimpf, R.D.;
2011 / IEEE
By: No-Cheol Park; Young Jun Hur; Jun-Ho Yoon; Jung-Hyun Woo; Kyoung-Su Park; Young-Pil Park;
By: No-Cheol Park; Young Jun Hur; Jun-Ho Yoon; Jung-Hyun Woo; Kyoung-Su Park; Young-Pil Park;
2012 / IEEE
By: Liberti, M.; Apollonio, F.; d'Inzeo, G.; Casciola, M.; Paffi, A.; Denzi, A.; Merla, C.;
By: Liberti, M.; Apollonio, F.; d'Inzeo, G.; Casciola, M.; Paffi, A.; Denzi, A.; Merla, C.;
2012 / IEEE
By: Giwoo Jeung; Sang Sik Jung; Chang-Seob Yang; Hyun-Ju Chung; Dong-Hun Kim; Nak-Sun Choi;
By: Giwoo Jeung; Sang Sik Jung; Chang-Seob Yang; Hyun-Ju Chung; Dong-Hun Kim; Nak-Sun Choi;
2012 / IEEE
By: Satter, M.M.; Yoder, P.D.; Dupuis, R.D.; Shyh-Chiang Shen; Jae-Hyun Ryou; Lochner, Z.;
By: Satter, M.M.; Yoder, P.D.; Dupuis, R.D.; Shyh-Chiang Shen; Jae-Hyun Ryou; Lochner, Z.;
2012 / IEEE
By: Guang-Bin Huang; Tongtong Zhang; Zhixiong Koh; Jiuwen Cao; Wee Ser; Nan Liu; Zhiping Lin; Ong, M.E.H.;
By: Guang-Bin Huang; Tongtong Zhang; Zhixiong Koh; Jiuwen Cao; Wee Ser; Nan Liu; Zhiping Lin; Ong, M.E.H.;
2010 / IEEE / 978-1-4244-8598-7
By: Jianxun Sun; Jihong Liu; Liansheng Li; Liangxian Gu; Jianjiang Chen;
By: Jianxun Sun; Jihong Liu; Liansheng Li; Liangxian Gu; Jianjiang Chen;