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Topic: Semiconductor Memory

Results

Low power, low area and high Performance Hybrid Type DYNAMIC CAM design
2011 / IEEE / 978-1-61284-653-8
By: Nagarjuna, V.; Kittur, H.M.;
Random Access Analog Memory (RA2M) for Video Signal Application
2012 / IEEE / 978-1-4673-0438-2
By: Chattaraj, N.; Dhar, A.S.;
Hybrid CMOS-memristor 4T-NVSRAM cell for low power applications
2014 / IEEE
By: Akashe, Shyam; Jadon, Atibhi;
Linear sum codes for random access memories
1988 / IEEE
By: Goodman, R.; Heegard, C.; Fuja, T.;
Disk dual copy methods and their performance
1988 / IEEE / 0-8186-0867-6
By: Dishon, Y.; Liu, T.S.;
An analysis of some problems in managing virtual memory systems with fast secondary storage devices
1988 / IEEE
By: Hartley, S.J.;
Implementation of firmware on SPC switching systems
1988 / IEEE
By: Ali, S.R.;
Advanced cell structures for dynamic RAMs
1989 / IEEE
By: Lu, N.C.C.;
A multi-functional telephone with conversational responses and pause deletion recording
1988 / IEEE
By: Nakamura, F.; Matsui, H.; Nishino, Y.; Gomi, K.;
Likely costs of consumer advanced television (ATV) technology
1989 / IEEE
By: Mackall, M.J.;
Flash memories: the best of two worlds
1989 / IEEE
By: Lai, S.K.; Pashley, R.D.;
Digital still video camera using semiconductor memory card
1990 / IEEE
By: Tagami, Y.; Nakagawa, M.; Yamaguchi, S.; Izawa, F.; Yamauchi, A.; Uetani, Y.; Umeda, M.; Sasaki, M.;
Checkpointing memory-resident databases
1989 / IEEE / 0-8186-1915-5
By: Salem, K.; Garcia-Molina, H.;
t-error correcting/d-error detecting/all unidirectional error detecting codes
1989 / IEEE
By: Venkatesan, R.;
System M: a transaction processing testbed for memory resident data
1990 / IEEE
By: Garcia-Molina, H.; Salem, K.;
A flexible redundancy technique for high-density DRAMs
1991 / IEEE
By: Aoki, M.; Etoh, J.; Horiguchi, M.; Matsumoto, T.; Itoh, K.;
Hardware-assisted polygon antialiasing
1991 / IEEE
By: Barkans, A.C.;
The evolution of instruction sequencing
1991 / IEEE
By: Dollas, A.; Krick, R.F.;
The reliability of semiconductor RAM memories with on-chip error-correction coding
1991 / IEEE
By: Sayano, M.; Goodman, R.M.;
An alternative to the Hamming code in the class of SEC-DED codes in semiconductor memory
1991 / IEEE
By: Davydov, A.A.; Tombak, L.M.;
Circuit techniques for 1.5-3.6-V battery-operated 64-Mb DRAM
1991 / IEEE
By: Itoh, K.; Nakagome, Y.; Aoki, M.; Kawamoto, Y.; Nishida, T.; Kume, E.; Takeuchi, K.; Kaga, T.; Musha, T.; Isoda, M.; Tanaka, H.; Kisu, T.;
MCard/FS: a file manager for memory cards
1989 / IEEE
By: Frenger, P.;
Design of totally self-checking checkers for Bose-Lin, Bose and Blaum codes
1989 / IEEE
By: Jha, N.K.;
Pulse width constraints on RAMs for realizing fault-tolerant ASCs
1989 / IEEE
By: Kalia, A.; Goel, A.K.;
Progress in ferroelectric memory technology
1991 / IEEE
By: Geideman, W.A.;
Integration of the Ampex DCRSi tape system with the NUMERIX array processor and the VisiNET bus
1990 / IEEE
By: Zagorsky, L.;
Choosing the best storage technique for a main memory database system
1990 / IEEE / 0-8186-2078-1
By: Gruenwald, L.; Eich, M.H.;
Log-driven backups: A recovery scheme for large memory database systems
1990 / IEEE / 0-8186-2078-1
By: Silberschatz, A.; Levy, E.;
A file-based adaptive prefetch caching design
1990 / IEEE / 0-8186-2079-X
By: Ong, S.; Lee, T.-C.; Shih, F.W.;
The free distance of fixed convolutional rate 2/4 codes meets the Costello bound
1992 / IEEE
By: Smeets, B.J.M.; Chepyzhov, V.V.; Zigangirov, K.S.;
Arbitrary function generator for APS injector synchrotron correction magnets
1991 / IEEE / 0-7803-0135-8
By: Despe, O.D.;
The development of a memory card system for a digital still camera using a 4 Mbit NAND-EEPROM
1992 / IEEE
By: Terasaki, S.; Sasaki, M.; Konishi, K.; Yoshioka, S.; Maruyama, K.;
Main memory database systems: an overview
1992 / IEEE
By: Garcia-Molina, H.; Salem, K.;
A DFT using number theoretic logarithms
1988 / IEEE
By: Taylor, F.; Griffin, M.; Sousa, M.;
A new testing acceleration chip for low-cost memory tests
1993 / IEEE
By: Fujiwara, A.; Yamada, T.; Inoue, M.;
Effects of fault tolerance on the reliability of memory array supports
1991 / IEEE / 0-8186-2457-4
By: Aichelmann, F.J., Jr.;
Technology trend of flash-EEPROM-Can flash-EEPROM overcome DRAM?
1992 / IEEE / 0-7803-0698-8
By: Masuoka, F.;
Single event upset in avionics
1993 / IEEE
By: Normand, E.; Taber, A.;
DASD trends: cost, performance, and form factor
1993 / IEEE
By: Hodges, P.; Wood, C.;
Reliability issues of flash memory cells
1993 / IEEE
By: Masuoka, F.; Endoh, T.; Hemink, G.; Shirota, R.; Aritome, S.;
Write-only disk cache experiments on multiple surface disks
1992 / IEEE / 0-8186-2812-X
By: Solworth, J.A.; Orji, C.U.;
Superconductor-semiconductor memories
1993 / IEEE
By: Kroger, H.; Ghoshal, U.; Van Duzer, T.;
An experimental DRAM with a NAND-structured cell
1993 / IEEE
By: Aoki, M.; Yamada, T.; Hamamoto, T.; Shiratake, S.-I.; Ohta, M.; Ogiwara, R.; Ishibashi, S.; Hasegawa, T.; Masuoka, F.; Takashima, D.; Watanabe, S.; Oowaki, Y.;
Algorithms to test PSF and coupling faults in random access memories
1993 / IEEE / 0-8186-4150-9
By: Rajsuman, R.;
Defect inspection system for patterned wafers based on the spatial-frequency filtering
1991 / IEEE / 0-7803-0155-2
By: Kanda, T.; Miyazaki, Y.; Tanaka, H.; Ohshige, T.; Tomoda, T.; Kosaka, N.; Ichimura, H.;
Analysis of reorganization overhead in log-structured file systems
1994 / IEEE / 0-8186-5402-3
By: Franaszek, P.A.; Robinson, J.T.;
Evaluation of closely coupled systems for high performance database processing
1993 / IEEE / 0-8186-3770-6
By: Rahm, E.;
Single event upsets for Space Shuttle flights of new general purpose computer memory devices
1994 / IEEE
By: Badhwar, G.D.; O'Neill, P.M.;
Signature analyzers in built-in self-test circuits: a perspective
1990 / IEEE
By: Rajashekhara, T.N.;
An experimental 256-Mb DRAM with boosted sense-ground scheme
1994 / IEEE
By: Asakura, M.; Yoshihara, T.; Nishimura, T.; Fujishima, K.; Arimoto, K.; Tsukude, M.; Ohno, Y.; Hidaka, H.; Eimori, T.; Tomishima, S.; Ooishi, T.;
A class of error-locating codes for byte-organized memory systems
1994 / IEEE
By: Fujiwara, E.; Kitakami, M.;
A communication channel modeled on contagion
1994 / IEEE
By: Alajaji, F.; Fuja, T.;
Two parameter model for predicting SEU rate [memory devices]
1994 / IEEE
By: Tverskoy, M.G.; Miroshkin, V.V.;
The Silicon Audio an audio-data compression and storage system with a semiconductor memory card
1995 / IEEE
By: Iwadare, M.; Sugiyama, A.; Hirao, E.; Kitabatake, O.; Takano, H.; Manabe, T.; Ohdate, N.;
Managing a socially constructed technology: the case of CT scanning
1995 / IEEE / 0-8186-6930-6
By: Spender, J.-C.;
Data storage in NOS: lifetime and carrier-to-noise measurements
1995 / IEEE
By: Barrett, R.C.; Terris, B.D.;
Goal-oriented dynamic buffer pool management for data base systems
1995 / IEEE / 0-8186-7123-8
By: Teng, J.; Nikolaou, C.; Wang, G.; Ferguson, D.; Jen-Yao Chwng;
A distributed globally replaceable redundancy scheme for sub-half-micron ULSI memories and beyond
1996 / IEEE
By: Nishimura, Y.; Fujita, K.; Sato, H.; Yamagata, T.; Anami, K.;
Towards a uniform notation for memory tests
1996 / IEEE / 0-8186-7424-5
By: Schanstra, I.; Offerman, A.; van de Goor, Ad.J.;
Flash memories, their status and trends
1995 / IEEE / 0-7803-3062-5
By: Endoh, T.; Masuoka, F.;
Different strokes: how to cascade and parallel FIFOs of various architectures
1993 / IEEE / 0-7803-9972-2
By: Hastings, C.;
March LR: a test for realistic linked faults
1996 / IEEE / 0-8186-7304-4
By: van de Goor, A.J.; Gaydadjiev, G.N.; Yarmolik, V.N.; Mikitjuk, V.G.;
A low voltage SONOS nonvolatile semiconductor memory technology
1996 / IEEE / 0-7803-3510-4
By: French, M.L.; Purwar, A.; Yang, Y.L.; White, M.H.;
Projected applications, status and plans for Honeywell high density, high performance, nonvolatile memory
1996 / IEEE / 0-7803-3510-4
By: Granley, G.B.; Hurst, A.T.;
Use of multi-port memories in programmable structures for architectural synthesis
1996 / IEEE / 0-7803-3639-9
By: Zimmer, R.M.; Mandal, C.;
Realistic linked memory cell array faults
1996 / IEEE / 0-8186-7478-4
By: van de Goer, A.J.; Gaydadjiev, G.N.;
PRISM-a tool for modelling proton energy deposition in semi-conductor materials
1996 / IEEE
By: Oldfield, M.K.; Underwood, C.I.;
A class of error control codes for byte organized memory systems-SbEC-(Sb+S)ED codes
1997 / IEEE
By: Hamada, M.; Fujiwara, E.;
A new implementation of the Silicon Audio Player based on an MPEG/audio decoder LSI
1997 / IEEE
By: Ohdate, N.; Manabe, T.; Iwadare, M.; Sugiyama, A.; Hirao, E.; Kitabatake, O.; Takano, H.;
A low voltage SONOS nonvolatile semiconductor memory technology
1997 / IEEE
By: Yang Yang; White, M.H.; French, M.L.; Ansha Purwar;
A high speed Reed-Solomon encoder-decoder for fault tolerant solid state disks
1993 / IEEE / 0-8186-3502-9
By: Pistilli, P.; Di Zenzo, M.; Cardarilli, G.; Salsano, A.;
Disturb neighborhood pattern sensitive fault
1997 / IEEE / 0-8186-7810-0
By: Tlili, I.B.S.; van de Goor, A.J.;
Error correction for semiconductor memories
1997 / IEEE / 0-7803-3956-8
By: Tolhuizen, L.; Baggen, S.;
Metrics of error locating codes
1997 / IEEE / 0-7803-3956-8
By: Fujiwara, E.; Shuxin Jiang; Kitakami, M.;
Synaptic SONOS nonvolatile analog memories for artifical neural networks
1997 / IEEE / 0-7803-2651-2
By: Kwang-Yell Seo; Sang-Bae Yi; Seon-Ju Kim; Sung-Bae Lee;
An open notation for memory tests
1997 / IEEE / 0-8186-8099-7
By: van de Goor, A.J.; Offerman, A.;
Flash memory cells-an overview
1997 / IEEE
By: Olivo, P.; Bez, R.; Pavan, P.; Zanoni, E.;
A class of error locating codes for byte-organized memory systems
1993 / IEEE / 0-8186-3680-7
By: Kitakami, M.; Fujiwara, E.;
Some results on improving the code length of SbEC-DED codes
1994 / IEEE / 0-8186-6307-3
By: Xiaofa Shi; Sihai Xiao; Rao, T.R.N.; Feng, G.L.;
Fail Bit Analysis System For Semiconductor Memory Wafers
1993 / IEEE / 0-7803-1432-8
By: Miyamot, Y.; Ishihara, K.; Ishikawa, S.; Sato, M.; Ohshikk, T.; Miyazki, I.;
SLDRAM: high-performance, open-standard memory
1997 / IEEE
By: Gillingham, P.; Vogley, B.;
Integrated memory/logic architecture for image processing
1998 / IEEE / 0-8186-8224-8
By: Sodini, C.G.; Masaki, I.; Talib, Z.A.; Gealow, J.C.;
Organizational and managerial correlates of radical technological innovation
1997 / IEEE / 0-7803-3574-0
By: Leifer, R.P.;
A review of multiple-valued memory technology
1998 / IEEE / 0-8186-8371-6
By: Gulak, G.;
Status Of Semiconductor Memory In Japan
1977 / IEEE
By: Kurosawa, T.;
"Static Or Dynamic", The Selection Process For A Memory System
1977 / IEEE
By: Blackie, J.C.;
Advantages Of Ccd Systems In Future Machine Architectures
1977 / IEEE
By: Miller, J.;
Fault Detection Coverage Of Memory Sum Check
1977 / IEEE
By: Berg, R.O.; Kinney, L.L.; Jack, L.A.;
Single Byte Error Correcting - Double Bit Error Detecting (Sbec-ded) Codes
1991 / IEEE / 0-7803-0056-4
By: Fujiwara, E.; Gohya, T.;
Large-scale Holographic Memory: Experiment Results
1993 / IEEE / 0-7803-1286-4
By: Psaltis, D.; Fai H. Mok; Burr, G.W.;
Tutorial on DRAM fault modeling and test pattern design
1998 / IEEE / 0-8186-8494-1
By: Cockburn, B.F.;
Fault models and test strategies for a two-bit per cell DRAM
1998 / IEEE / 0-8186-8494-1
By: Elliott, D.G.; Cockburn, B.F.; Redekert, M.;
Lateral Sweep Algorithm for Moving Arm Disks Under Stationary Request Arrival Process
1992 / IEEE / 0-8186-2665-8
By: Gibson, A.; Nassim-Sobhan, N.; Borah, B.N.;
Research and education opportunities in memory technology at the National Science Foundation
1998 / IEEE / 0-7803-4518-5
By: Varshney, U.;
Hybrid-TH: a hybrid access mechanism for real-time memory-resident database systems
1998 / IEEE / 0-8186-9209-X
By: Eunmi Song; Chanho Ryu; Seongil Jin; Young-Kuk Kim; Booseon Jun;
A Microcomputer Based Educational System With Dual Display
1979 / IEEE
By: Ichikawa, R.; Oshino, T.; Watanabe, K.; Hirasawa, S.; Goto, T.;
Room temperature self-organized quantum dot transistors
1998 / IEEE / 0-7803-4995-4
By: Bhattacharya, P.; Brock, K.T.; Kamath, K.; Phillips, J.;
A simple approach to SEU cross section evaluation [semiconductor memories]
1998 / IEEE
By: Tverskoy, M.G.; Miroshkin, V.V.;
On integer-valued rational polynomials and depth distributions of binary codes
1998 / IEEE
By: Mitchell, C.J.;
Voice compression of low complicated decompression
1998 / IEEE / 7-80090-827-5
By: Zhou Zucheng; Huang Defeng;

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