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Topic: Semiconductor Diodes
Results
2011 / IEEE
By: VanMil, B.L.; Zhao, J.H.; Xiaobin Xin; Jun Hu; Gaskill, D.K.; Eddy, C.R.; Myers-Ward, R.;
By: VanMil, B.L.; Zhao, J.H.; Xiaobin Xin; Jun Hu; Gaskill, D.K.; Eddy, C.R.; Myers-Ward, R.;
2012 / IEEE
By: Shiba, K.; Iide, Y.; Nashiyama, I.; Sugimoto, K.; Asai, H.; Miyazaki, Y.; Matsuda, M.;
By: Shiba, K.; Iide, Y.; Nashiyama, I.; Sugimoto, K.; Asai, H.; Miyazaki, Y.; Matsuda, M.;
2012 / IEEE
By: King, M.P.; Hooten, N.C.; Schrimpf, R.D.; Reed, R.A.; Mendenhall, M.H.; Weller, R.A.; Auden, E.C.;
By: King, M.P.; Hooten, N.C.; Schrimpf, R.D.; Reed, R.A.; Mendenhall, M.H.; Weller, R.A.; Auden, E.C.;
2012 / IEEE
By: Guogang Qin; Lingjuan Zhao; Wei Wang; Guangzhao Ran; Chong Wang; Jifang Qiu; Jiaoqing Pan; Song Liang; Weixi Chen; Tao Hong; Yanping Li; Bin Niu;
By: Guogang Qin; Lingjuan Zhao; Wei Wang; Guangzhao Ran; Chong Wang; Jifang Qiu; Jiaoqing Pan; Song Liang; Weixi Chen; Tao Hong; Yanping Li; Bin Niu;
2012 / IEEE
By: Srinivasan, V.S.S.; Ganguly, U.; Lodha, S.; Kuppurao, S.; Srinivasan, S.; Kim, Y.; Kumbhare, P.; Lashkare, S.; Bafna, P.; Karkare, P.; Chopra, S.;
By: Srinivasan, V.S.S.; Ganguly, U.; Lodha, S.; Kuppurao, S.; Srinivasan, S.; Kim, Y.; Kumbhare, P.; Lashkare, S.; Bafna, P.; Karkare, P.; Chopra, S.;
2012 / IEEE
By: Veliadis, V.; Hearne, H.; Stewart, E.J.; Snook, M.; Chang, W.; Caldwell, J.D.; Scozzie, C.; El-Hinnawy, N.; Borodulin, P.; Howell, R.S.; Urciuoli, D.; Lelis, A.; Ha, H.C.;
By: Veliadis, V.; Hearne, H.; Stewart, E.J.; Snook, M.; Chang, W.; Caldwell, J.D.; Scozzie, C.; El-Hinnawy, N.; Borodulin, P.; Howell, R.S.; Urciuoli, D.; Lelis, A.; Ha, H.C.;
2012 / IEEE
By: Berkani, M.; Khatir, Z.; Moussodji, J.; Kociniewski, T.; Azzopardi, S.; Lefebvre, S.;
By: Berkani, M.; Khatir, Z.; Moussodji, J.; Kociniewski, T.; Azzopardi, S.; Lefebvre, S.;
2012 / IEEE
By: Kong-Soo Lee; Byoungdeog Choi; Hanwook Jeong; Hyunho Park; Hong-Sik Jeong; Chilhee Chung; Seokwoo Nam; Hanjin Lim; Jae-Jong Han;
By: Kong-Soo Lee; Byoungdeog Choi; Hanwook Jeong; Hyunho Park; Hong-Sik Jeong; Chilhee Chung; Seokwoo Nam; Hanjin Lim; Jae-Jong Han;
2000 / IEEE
By: Mesyats, G.A.; Ponomarev, A.V.; Rukin, S.N.; Slovikovsky, B.G.; Timoshenkov, S.P.; Bushlyakov, A.I.;
By: Mesyats, G.A.; Ponomarev, A.V.; Rukin, S.N.; Slovikovsky, B.G.; Timoshenkov, S.P.; Bushlyakov, A.I.;
2011 / IEEE / 978-3-8007-3356-9
By: Offer, M.; Gutsche, C.; Lysov, A.; Tegude, F.-J.; Prost, W.; Regolin, I.;
By: Offer, M.; Gutsche, C.; Lysov, A.; Tegude, F.-J.; Prost, W.; Regolin, I.;
2011 / IEEE / 978-1-61284-244-8
By: Lee, H.Y.; Chen, Y.-S.; Yang, C.-L.; Kao, C.-Y.; Lee, M.H.; Tsai, M.-J.; Chen, F.;
By: Lee, H.Y.; Chen, Y.-S.; Yang, C.-L.; Kao, C.-Y.; Lee, M.H.; Tsai, M.-J.; Chen, F.;
2011 / IEEE / 978-1-61284-244-8
By: Samuelson, L.; Thelander, C.; Fasth, C.; Wallentin, J.; Borgstrom, M.; Nylund, G.; Storm, K.;
By: Samuelson, L.; Thelander, C.; Fasth, C.; Wallentin, J.; Borgstrom, M.; Nylund, G.; Storm, K.;
2011 / IEEE / 978-1-4577-0061-3
By: Tae-Sung Kwon; Sung-Il Yong; Ho-Hyun Kim; Young-Chul Kim; Kyeong-Seok Park; Jong-Mu Lee;
By: Tae-Sung Kwon; Sung-Il Yong; Ho-Hyun Kim; Young-Chul Kim; Kyeong-Seok Park; Jong-Mu Lee;
2011 / IEEE / 978-1-4244-9312-8
By: Butterbach, S.; De Bernardinis, A.; Aubin, P.; Coquery, G.; Jeunesse, A.; Lallemand, R.;
By: Butterbach, S.; De Bernardinis, A.; Aubin, P.; Coquery, G.; Jeunesse, A.; Lallemand, R.;
2011 / IEEE / 978-1-4577-0192-4
By: Agarwal, A.K.; Palmour, J.W.; Shur, M.S.; Levinshtein, M.E.; Rumyantsev, S.L.; Das, M.K.;
By: Agarwal, A.K.; Palmour, J.W.; Shur, M.S.; Levinshtein, M.E.; Rumyantsev, S.L.; Das, M.K.;
2011 / IEEE / 978-1-61284-244-8
By: Huili Xing; Zimmermann, T.; Guowang Li; Verma, J.; Ganguly, S.; Jena, D.;
By: Huili Xing; Zimmermann, T.; Guowang Li; Verma, J.; Ganguly, S.; Jena, D.;
2011 / IEEE / 978-1-4244-9949-6
By: Pey, K.L.; Fang, Z.; Wang, Z.R.; Wu, L.; Kang, J.F.; Gao, B.; Yeo, Y.C.; Yu, H.Y.; Li, M.F.; Tran, X.A.; Nguyen, B.Y.; Du, A.Y.;
By: Pey, K.L.; Fang, Z.; Wang, Z.R.; Wu, L.; Kang, J.F.; Gao, B.; Yeo, Y.C.; Yu, H.Y.; Li, M.F.; Tran, X.A.; Nguyen, B.Y.; Du, A.Y.;
2011 / IEEE / 978-1-61284-329-2
By: Shpak, V.G.; Yalandin, M.I.; Sharypov, K.A.; Rukin, S.N.; Shunailov, S.A.; Klimov, A.I.; Rostov, V.V.; Ul'masculov, M.R.;
By: Shpak, V.G.; Yalandin, M.I.; Sharypov, K.A.; Rukin, S.N.; Shunailov, S.A.; Klimov, A.I.; Rostov, V.V.; Ul'masculov, M.R.;
2011 / IEEE / 978-1-4577-0975-3
By: Teo, K.T.K.; Soo Siang Yang; Hou Pin Yoong; Neelakantan, P.; Chia Seet Chin;
By: Teo, K.T.K.; Soo Siang Yang; Hou Pin Yoong; Neelakantan, P.; Chia Seet Chin;
2011 / IEEE / 978-90-75815-14-6
By: Schnell, R.; Geissmann, S.; Rahimo, M.; Vobecky, J.; Kopta, A.; Corvasce, C.;
By: Schnell, R.; Geissmann, S.; Rahimo, M.; Vobecky, J.; Kopta, A.; Corvasce, C.;
2011 / IEEE / 978-90-75815-14-6
By: Rodriguez, J.; Bernet, S.; Weber, J.; Alvarez, R.; Hauk, E.; Andler, D.;
By: Rodriguez, J.; Bernet, S.; Weber, J.; Alvarez, R.; Hauk, E.; Andler, D.;
2011 / IEEE / 978-1-61284-777-1
By: Shulin Yao; Zaijun Cheng; Zhiwen Zhao; Haisheng San; Yanfei Li; Zhiqiang Deng;
By: Shulin Yao; Zaijun Cheng; Zhiwen Zhao; Haisheng San; Yanfei Li; Zhiqiang Deng;
2011 / IEEE / 978-90-75815-14-6
By: Ibanez, P.; Apinaniz, S.; Pujana, A.; Gabiola, I.; Sierra, M.T.;
By: Ibanez, P.; Apinaniz, S.; Pujana, A.; Gabiola, I.; Sierra, M.T.;
2011 / IEEE / 978-1-58537-193-8
By: Stockinger, M.; Ruth, S.; Ngo, S.; Kearney, M.; Whitney, V.; Miller, J.W.;
By: Stockinger, M.; Ruth, S.; Ngo, S.; Kearney, M.; Whitney, V.; Miller, J.W.;
2011 / IEEE / 978-1-58537-193-8
By: Griffoni, A.; Thijs, S.; Groeseneken, G.; Hoffmann, T.; Shih-Hung Chen; Linten, D.;
By: Griffoni, A.; Thijs, S.; Groeseneken, G.; Hoffmann, T.; Shih-Hung Chen; Linten, D.;
2011 / IEEE / 978-1-4577-0811-4
By: Chundru, R.; Steinfeld, R.; Centola, F.; Cheung-Wei Lam; Keong Kam; Pommerenke, D.; Zhen Li;
By: Chundru, R.; Steinfeld, R.; Centola, F.; Cheung-Wei Lam; Keong Kam; Pommerenke, D.; Zhen Li;