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Topic: Self-assembly
Results
2011 / IEEE
By: Koyanagi, M.; Ohara, Y.; Iwata, E.; Fukushima, T.; Murugesan, M.; Tanaka, T.; Kangwook Lee; Jichoel Bea;
By: Koyanagi, M.; Ohara, Y.; Iwata, E.; Fukushima, T.; Murugesan, M.; Tanaka, T.; Kangwook Lee; Jichoel Bea;
2011 / IEEE
By: Li-Han Chen; Daehoon Hong; Young Oh; Jin-Yeol Kim; Sungho Jin; Hyunsu Kim; Chulmin Choi; Kunbae Noh;
By: Li-Han Chen; Daehoon Hong; Young Oh; Jin-Yeol Kim; Sungho Jin; Hyunsu Kim; Chulmin Choi; Kunbae Noh;
2011 / IEEE
By: Nguyen Duc Tho; Schwob, C.; Avoine, A.; Hoang Nam Nhat; Pham Thu Nga; Phan Tien Dung;
By: Nguyen Duc Tho; Schwob, C.; Avoine, A.; Hoang Nam Nhat; Pham Thu Nga; Phan Tien Dung;
2011 / IEEE
By: Hongwei Zhu; Wei Zhang; Xiaosheng Xiao; Xiao Li; Kunlin Wang; Lili Gui; Changxi Yang; Dehai Wu;
By: Hongwei Zhu; Wei Zhang; Xiaosheng Xiao; Xiao Li; Kunlin Wang; Lili Gui; Changxi Yang; Dehai Wu;
2012 / IEEE
By: Xuejun Xu; Narusawa, S.; Chiba, T.; Shiraki, Y.; Jinsong Xia; Usami, N.; Maruizumi, T.; Tsuboi, T.;
By: Xuejun Xu; Narusawa, S.; Chiba, T.; Shiraki, Y.; Jinsong Xia; Usami, N.; Maruizumi, T.; Tsuboi, T.;
2012 / IEEE
By: Khaderbad, M.A.; Pandharipande, R.; Ramgopal Rao, V.; Madhu, S.; Ravikanth, M.; Singh, V.;
By: Khaderbad, M.A.; Pandharipande, R.; Ramgopal Rao, V.; Madhu, S.; Ravikanth, M.; Singh, V.;
2012 / IEEE
By: Takamiya, M.; Tsung-Ching Huang; Takimiya, K.; Zschieschang, U.; Klauk, H.; Sakurai, T.; Take, N.; Tokuhara, T.; Sekitani, T.; Yokota, T.; Someya, T.;
By: Takamiya, M.; Tsung-Ching Huang; Takimiya, K.; Zschieschang, U.; Klauk, H.; Sakurai, T.; Take, N.; Tokuhara, T.; Sekitani, T.; Yokota, T.; Someya, T.;
2012 / IEEE
By: Tang, Y.; Patel, K.; Arnoldussen, T.; Zeltzer, G.; Dhanda, A.; Kercher, D.; Wan, L.; Ruiz, R.; Lille, J.; Gao, H.; Albrecht, T.R.;
By: Tang, Y.; Patel, K.; Arnoldussen, T.; Zeltzer, G.; Dhanda, A.; Kercher, D.; Wan, L.; Ruiz, R.; Lille, J.; Gao, H.; Albrecht, T.R.;
2012 / IEEE
By: Murugesan, M.; Fukushima, T.; Ohara, Y.; Iwata, E.; Bea, J.; Koyanagi, M.; Tanaka, T.; Lee, K.;
By: Murugesan, M.; Fukushima, T.; Ohara, Y.; Iwata, E.; Bea, J.; Koyanagi, M.; Tanaka, T.; Lee, K.;
Programmable Construction of Nanostructures: Assembly of Nanostructures with Various Nanocomponents.
2012 / IEEEBy: Deaton, R.; Jeong-Hwan Kim; Jin-Woo Kim;
2012 / IEEE
By: Hung-Tai Chang; Ching-Chi Wang; Wei-Ting Lai; Inn-Hao Chen; Kuan-Hung Chen; Wen-Yen Chen; Pei-Wen Li; Ming-Tsung Hung; Tzu-Min Hsu; Shen-Wei Lee; Jung-Chao Hsu;
By: Hung-Tai Chang; Ching-Chi Wang; Wei-Ting Lai; Inn-Hao Chen; Kuan-Hung Chen; Wen-Yen Chen; Pei-Wen Li; Ming-Tsung Hung; Tzu-Min Hsu; Shen-Wei Lee; Jung-Chao Hsu;
2012 / IEEE
By: Ya-Hong Xie; Wei Zhang; Jae Young Lee; Biyun Li; Schroeder, T.; Ke Sun; Russell, T.P.; Xinyu Wei; Katzer, J.;
By: Ya-Hong Xie; Wei Zhang; Jae Young Lee; Biyun Li; Schroeder, T.; Ke Sun; Russell, T.P.; Xinyu Wei; Katzer, J.;
2012 / IEEE
By: Jang-Yeon Kwon; Hyang-Shik Kong; Kang-Moon Jo; Bo Sung Kim; Min-Koo Han; Jeong-Soo Lee; Yong-Uk Lee; Seung-Hwan Cho;
By: Jang-Yeon Kwon; Hyang-Shik Kong; Kang-Moon Jo; Bo Sung Kim; Min-Koo Han; Jeong-Soo Lee; Yong-Uk Lee; Seung-Hwan Cho;
2010 / IEEE / 978-1-4244-5261-3
By: Darwish, N.A.; Gooding, J.J.; Paddon-Row, M.N.; Yang, W.; Eggers, P.K.;
By: Darwish, N.A.; Gooding, J.J.; Paddon-Row, M.N.; Yang, W.; Eggers, P.K.;
2010 / IEEE / 978-1-4244-5261-3
By: Guillaume, F.; Velleman, L.; Shapter, J.G.; Losic, D.; Bruneel, J.L.;
By: Guillaume, F.; Velleman, L.; Shapter, J.G.; Losic, D.; Bruneel, J.L.;
2011 / IEEE / 978-1-61284-795-5
By: Preobrazhenskii, V.V.; Semyagin, B.R.; Zaichenko, A.A.; Bert, N.A.; Chaldyshev, V.V.; Nevedomskii, V.N.; Putyato, M.A.;
By: Preobrazhenskii, V.V.; Semyagin, B.R.; Zaichenko, A.A.; Bert, N.A.; Chaldyshev, V.V.; Nevedomskii, V.N.; Putyato, M.A.;
2011 / IEEE / 978-1-4577-0378-2
By: Ming-Yang Hsieh; Woei-Tyng Lin; Wei-Chun Chen; Fang-I Lai; Shou-Yi Kuo;
By: Ming-Yang Hsieh; Woei-Tyng Lin; Wei-Chun Chen; Fang-I Lai; Shou-Yi Kuo;
2011 / IEEE / 978-1-4577-0860-2
By: Chenping Lv; Shichao Xu; Lidan Sun; Juan Chen; Hainan Wang; Jimei Zhang; Yueqian Yang; Heng Miao; Jiangli Lou;
By: Chenping Lv; Shichao Xu; Lidan Sun; Juan Chen; Hainan Wang; Jimei Zhang; Yueqian Yang; Heng Miao; Jiangli Lou;
2011 / IEEE / 978-1-61284-777-1
By: Jian Chen; Peitao Dong; Di Di; Shengyi Li; Xuezhong Wu; Zelong Zhou; Jiao Chen;
By: Jian Chen; Peitao Dong; Di Di; Shengyi Li; Xuezhong Wu; Zelong Zhou; Jiao Chen;
2011 / IEEE / 978-1-61284-777-1
By: Sheng-Yu Chou; Kuo-Chi Chiu; Jenq-Nan Yih; Nai-Jen Cheng; Shu-Jen Chen; Yung-Sung Lan; Chih-Ming Lin;
By: Sheng-Yu Chou; Kuo-Chi Chiu; Jenq-Nan Yih; Nai-Jen Cheng; Shu-Jen Chen; Yung-Sung Lan; Chih-Ming Lin;
2011 / IEEE / 978-1-61284-777-1
By: Chunmei Huang; Tabata, O.; Tsuchiya, T.; Sugano, K.; Endo, M.; Gwo-Bin Lee; Chen-Hsun Weng; Sugiyama, H.; Saeki, T.;
By: Chunmei Huang; Tabata, O.; Tsuchiya, T.; Sugano, K.; Endo, M.; Gwo-Bin Lee; Chen-Hsun Weng; Sugiyama, H.; Saeki, T.;
2011 / IEEE / 978-1-61284-172-4
By: Savin, M.; Stan, D.; Baciu, I.; Mihailescu, C.; Moldovan, C.; Purica, M.; Dinescu, A.; Iosub, R.;
By: Savin, M.; Stan, D.; Baciu, I.; Mihailescu, C.; Moldovan, C.; Purica, M.; Dinescu, A.; Iosub, R.;
2011 / IEEE / 978-1-4577-0509-0
By: Ercolani, D.; Viti, L.; Teppe, F.; Coquillat, D.; Sorba, L.; Pitanti, A.; Vitiello, M.S.; Tredicucci, A.; Knap, W.;
By: Ercolani, D.; Viti, L.; Teppe, F.; Coquillat, D.; Sorba, L.; Pitanti, A.; Vitiello, M.S.; Tredicucci, A.; Knap, W.;
2011 / IEEE / 978-1-4244-8939-8
By: Mokkapati, S.; Lu, H.F.; Fu, L.; Jagadish, C.; Tan, H.H.; Jolley, G.;
By: Mokkapati, S.; Lu, H.F.; Fu, L.; Jagadish, C.; Tan, H.H.; Jolley, G.;
2011 / IEEE / 978-1-61284-172-4
By: Stoian, R.; Radu, C.; Craciunoiu, F.; Dinescu, A.; Zamfirescu, M.;
By: Stoian, R.; Radu, C.; Craciunoiu, F.; Dinescu, A.; Zamfirescu, M.;
2011 / IEEE / 978-1-4577-1516-7
By: Cummins, Z.; Ropp, C.; Waks, E.; Shapiro, B.; Raghavan, S.R.; Fourkas, J.T.; Sijia Qin; Kumar, R.; Probst, R.;
By: Cummins, Z.; Ropp, C.; Waks, E.; Shapiro, B.; Raghavan, S.R.; Fourkas, J.T.; Sijia Qin; Kumar, R.; Probst, R.;
2011 / IEEE / 978-1-4673-0102-2
By: Kian Sheng Lim; Khalid, N.K.; Ibrahim, Z.; Mukred, J.A.A.; Buyamin, S.;
By: Kian Sheng Lim; Khalid, N.K.; Ibrahim, Z.; Mukred, J.A.A.; Buyamin, S.;