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Topic: Scientific Applications
Results
2011 / IEEE / 978-1-4577-1355-2
By: Singh, A.K.; Panda, D.K.; Sur, S.; Kandalla, K.; Hao Wang; Potluri, S.;
By: Singh, A.K.; Panda, D.K.; Sur, S.; Kandalla, K.; Hao Wang; Potluri, S.;
2011 / IEEE / 978-1-4503-0771-0
By: LeFevre, J.; Watkins, N.; Buck, J.B.; Brandt, S.; Polyzotis, N.; Maltzahn, C.; Ioannidou, K.;
By: LeFevre, J.; Watkins, N.; Buck, J.B.; Brandt, S.; Polyzotis, N.; Maltzahn, C.; Ioannidou, K.;
2011 / IEEE / 978-1-4577-1794-9
By: Sedaghati, N.; Sadayappan, P.; Teodorescu, R.; Pouchet, L.-N.; Thomas, R.;
By: Sedaghati, N.; Sadayappan, P.; Teodorescu, R.; Pouchet, L.-N.; Thomas, R.;
A Tool for Scientific Visualization Based on Particle Tracing Algorithm on Graphics Processing Units
2011 / IEEE / 978-0-7695-4614-8By: Kostin, S.; Camargo, E.; Pinto, R.C.G.;
2011 / IEEE / 978-1-4577-0631-8
By: Oshita, D.; Okuda, Y.; Kang, D.K.; Hosseini, S.H.R.; Miyamoto, Y.; Akiyama, H.;
By: Oshita, D.; Okuda, Y.; Kang, D.K.; Hosseini, S.H.R.; Miyamoto, Y.; Akiyama, H.;
2012 / IEEE / 978-1-4673-0974-5
By: Veneziani, Alessandro; Villa, Umberto; Passerini, Tiziano; Slawinski, Jaroslaw; Sunderam, Vaidy;
By: Veneziani, Alessandro; Villa, Umberto; Passerini, Tiziano; Slawinski, Jaroslaw; Sunderam, Vaidy;
2013 / IEEE
By: Bubak, Marian; Kasztelnik, Marek; Malawski, Maciej; Meizner, Jan; Nowakowski, Piotr; Varma, Susheel;
By: Bubak, Marian; Kasztelnik, Marek; Malawski, Maciej; Meizner, Jan; Nowakowski, Piotr; Varma, Susheel;
Optimization Scheduling for Scientific Applications with Different Priorities across Multiple Clouds
2014 / IEEEBy: Guo, Wenzhong; Lin, Bing; Chen, Guolong; Rong, Chunming; Zhang, Hong; Zheng, Xianghan;
2013 / IEEE
By: Yokoyama, Andre M.; Ferro, Mariza; Manfroi, Laion F.; Schulze, Bruno; Mury, Antonio R.;
By: Yokoyama, Andre M.; Ferro, Mariza; Manfroi, Laion F.; Schulze, Bruno; Mury, Antonio R.;
1991 / IEEE / 0-8186-2270-9
By: Takata, H.; Sato, H.; Tsubota, H.; Asai, F.; Seguchi, Y.; Tamura, T.; Terada, H.; Komori, S.; Tokuda, T.;
By: Takata, H.; Sato, H.; Tsubota, H.; Asai, F.; Seguchi, Y.; Tamura, T.; Terada, H.; Komori, S.; Tokuda, T.;
1996 / IEEE / 0-8186-7551-9
By: Deshpande, V.R.; Decker, K.M.; Clemencon, C.; Zimmermann, F.; Wylie, B.J.N.; Sawyer, W.; Endo, A.; Ruhl, R.; Muller, A.; Masuda, N.; Lorenzo, P.A.R.; Fritscher, J.;
By: Deshpande, V.R.; Decker, K.M.; Clemencon, C.; Zimmermann, F.; Wylie, B.J.N.; Sawyer, W.; Endo, A.; Ruhl, R.; Muller, A.; Masuda, N.; Lorenzo, P.A.R.; Fritscher, J.;
1997 / IEEE / 0-7803-3741-7
By: Kogge, P.M.; Likharev, K.K.; Gao, G.; Sterling, T.L.; MacDonald, M.J.;
By: Kogge, P.M.; Likharev, K.K.; Gao, G.; Sterling, T.L.; MacDonald, M.J.;
1997 / IEEE / 0-8186-7952-2
By: Winslett, M.; Kuo, S.; Seamons, K.; Subramaniam, M.; Cho, Y.; Chen, Y.;
By: Winslett, M.; Kuo, S.; Seamons, K.; Subramaniam, M.; Cho, Y.; Chen, Y.;
1999 / IEEE / 0-7695-0004-8
By: Davis, A.; Brunvand, E.; Lixin Zhang; Swanson, M.; Stoller, L.; Hsieh, W.; Chen-Chi Kuo; Tateyama, T.; Schaelicke, L.; Carter, J.; Parker, M.; Kuramkote, R.;
By: Davis, A.; Brunvand, E.; Lixin Zhang; Swanson, M.; Stoller, L.; Hsieh, W.; Chen-Chi Kuo; Tateyama, T.; Schaelicke, L.; Carter, J.; Parker, M.; Kuramkote, R.;