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Topic: Relay Protection
Results
2012 / IEEE
By: Hansang Lee; Gilsoo Jang; Byeong-Mo Yang; Seung-Ryul Lee; Chong Suk Song; Changho Jung;
By: Hansang Lee; Gilsoo Jang; Byeong-Mo Yang; Seung-Ryul Lee; Chong Suk Song; Changho Jung;
2012 / IEEE
By: Davarpanah, M.; Sanaye-Pasand, M.; Badrkhani Ajaei, F.; Iravani, R.; Rezaei-Zare, A.;
By: Davarpanah, M.; Sanaye-Pasand, M.; Badrkhani Ajaei, F.; Iravani, R.; Rezaei-Zare, A.;
2010 / IEEE / 978-83-921315-8-8
By: Fischer, N.; Benmouyal, G.; Mooney, J.; Guzman, A.; Kasztenny, B.;
By: Fischer, N.; Benmouyal, G.; Mooney, J.; Guzman, A.; Kasztenny, B.;
The calculation of single-phase impedance current on heavily loaded long circuit of double end power
2011 / IEEE / 978-1-4244-9439-2By: Ronghua Li; Zhumei Tan; Xiaofeng Yu;
2011 / IEEE / 978-1-4577-0365-2
By: Ronghua Yang; Guibin Zou; Houlei Gao; Mingjun Wang; Bing Li; Feng Zhu;
By: Ronghua Yang; Guibin Zou; Houlei Gao; Mingjun Wang; Bing Li; Feng Zhu;
2011 / IEEE / 978-1-4577-0365-2
By: Houlei Gao; Yiqing Liu; Chunsheng Zhou; Peng Wei; Xin Wei; Mingjiang Xiang;
By: Houlei Gao; Yiqing Liu; Chunsheng Zhou; Peng Wei; Xin Wei; Mingjiang Xiang;
2011 / IEEE / 978-1-61284-088-8
By: Fu Zhouxing; Chen Haidong; Chen Xuejie; Sun Shangbin; Yu Ran; Lihe; Yun Baoji;
By: Fu Zhouxing; Chen Haidong; Chen Xuejie; Sun Shangbin; Yu Ran; Lihe; Yun Baoji;
2011 / IEEE / 978-1-4577-1002-5
By: Smith, T.; Restrepo, J.; Howard, D.F.; Harley, R.G.; Dang, J.; Starke, M.;
By: Smith, T.; Restrepo, J.; Howard, D.F.; Harley, R.G.; Dang, J.; Starke, M.;
2011 / IEEE / 978-1-4577-0496-3
By: Anderson, M.; Erwin, D.; Turner, R.; Tziouvaras, D.A.; Pineda, R.;
By: Anderson, M.; Erwin, D.; Turner, R.; Tziouvaras, D.A.; Pineda, R.;
2011 / IEEE / 978-1-4244-8418-8
By: Chilard, O.; Caire, R.; Raison, B.; Jecu, C.; Alibert, P.; Deschamps, P.; Grenard, S.;
By: Chilard, O.; Caire, R.; Raison, B.; Jecu, C.; Alibert, P.; Deschamps, P.; Grenard, S.;
2011 / IEEE / 978-1-4577-0496-3
By: Chano, S.R.; Miller, D.; Whittaker, R.; Tziouvaras, D.; Thompson, M.; Tholomier, D.; Tengdin, J.; Sufana, C.; Sessler, G.; Santerre, G.; Sachdev, M.; Plumptre, F.; O'Brien, J.; McCannon, W.; Mackie, B.; Kasztenny, B.; Henriksen, L.; Hedding, R.; Gresko, G.; Fontana, D.; Donahoe, K.; Deronja, A.; Crellin, R.; Best, M.; Balasiu, F.; Allen, M.; Afonso, J.;
By: Chano, S.R.; Miller, D.; Whittaker, R.; Tziouvaras, D.; Thompson, M.; Tholomier, D.; Tengdin, J.; Sufana, C.; Sessler, G.; Santerre, G.; Sachdev, M.; Plumptre, F.; O'Brien, J.; McCannon, W.; Mackie, B.; Kasztenny, B.; Henriksen, L.; Hedding, R.; Gresko, G.; Fontana, D.; Donahoe, K.; Deronja, A.; Crellin, R.; Best, M.; Balasiu, F.; Allen, M.; Afonso, J.;
2011 / IEEE / 978-1-4577-1002-5
By: Sung-Jun Park; Jin-Hwan Kim; Sang-Tae Kim; Tae-Wan Kim; Myeon-Song Choi; Seung-Jae Lee;
By: Sung-Jun Park; Jin-Hwan Kim; Sang-Tae Kim; Tae-Wan Kim; Myeon-Song Choi; Seung-Jae Lee;
2011 / IEEE / 978-1-4244-8165-1
By: YueHua Huang; Guang Li; BoYa Zhang; ZhiPing Yang; Zhao Feng; Jing Wang;
By: YueHua Huang; Guang Li; BoYa Zhang; ZhiPing Yang; Zhao Feng; Jing Wang;