Your Search Results
Use materials about this topic in your textbook!
AcademicPub holds over eight million pieces of educational content - such as case studies and journal articles - for you to mix-and-match your way.
Experience the freedom of customizing your course pack with AcademicPub!

Topic: Registers
Results
Standard cell approach for generating custom CMOS/SOS devices using a fully automatic layout program
1981 / IEEEBy: Smith, Allan M.; Noto, Richard; Feller, Albert;
2011 / IEEE
By: Usami, K.; Nakamura, H.; Amano, H.; Kimura, M.; Ikebuchi, D.; Namiki, M.; Yasuda, Y.; Ozaki, N.; Saito, Y.; Kondo, M.;
By: Usami, K.; Nakamura, H.; Amano, H.; Kimura, M.; Ikebuchi, D.; Namiki, M.; Yasuda, Y.; Ozaki, N.; Saito, Y.; Kondo, M.;
2011 / IEEE
By: Maurya, S.; Holbert, K.E.; Guertin, S.M.; Hindman, N.D.; Patterson, D.W.; Clark, L.T.;
By: Maurya, S.; Holbert, K.E.; Guertin, S.M.; Hindman, N.D.; Patterson, D.W.; Clark, L.T.;
2011 / IEEE
By: Athanasiou, G.S.; Kelefouras, V.I.; Goutis, C.E.; Kritikakou, A.S.; Michail, H.E.; Alachiotis, N.;
By: Athanasiou, G.S.; Kelefouras, V.I.; Goutis, C.E.; Kritikakou, A.S.; Michail, H.E.; Alachiotis, N.;
2011 / IEEE
By: Yao-Jen Hsieh; Fong-Shou Lin; Wei-Te Chang; Yi-Liang Shih; Guan-Fan Wu; Wen-Chung Kao;
By: Yao-Jen Hsieh; Fong-Shou Lin; Wei-Te Chang; Yi-Liang Shih; Guan-Fan Wu; Wen-Chung Kao;
2012 / IEEE
By: Osipenko, P. N.; Pechenkin, A. A.; Antonov, A. A.; Vasilegin, B. V.; Gorbunov, M. S.; Yanenko, A. V.; Zebrev, G. I.; Chumakov, A. I.; Useinov, R. G.; Ozerov, A. I.; Emeliyanov, V. V.; Anashin, V. S.;
By: Osipenko, P. N.; Pechenkin, A. A.; Antonov, A. A.; Vasilegin, B. V.; Gorbunov, M. S.; Yanenko, A. V.; Zebrev, G. I.; Chumakov, A. I.; Useinov, R. G.; Ozerov, A. I.; Emeliyanov, V. V.; Anashin, V. S.;
2012 / IEEE
By: Restrepo-Calle, F.; Martinez-Alvarez, A.; Cuenca-Asensi, S.; Millan, E. S.; Entrena, L.; Lindoso, A.;
By: Restrepo-Calle, F.; Martinez-Alvarez, A.; Cuenca-Asensi, S.; Millan, E. S.; Entrena, L.; Lindoso, A.;
2012 / IEEE
By: Chen-Yi Lee; Shyh-Jye Jou; Hsie-Chia Chang; Chih-Lung Chen; Shiang-Yu Hung; Shao-Wei Yen;
By: Chen-Yi Lee; Shyh-Jye Jou; Hsie-Chia Chang; Chih-Lung Chen; Shiang-Yu Hung; Shao-Wei Yen;
2012 / IEEE
By: Sai-Weng Sin; U-Fat Chio; Chi-Hang Chan; Hegong Wei; Maloberti, F.; Martins, R.P.; Seng-Pan U;
By: Sai-Weng Sin; U-Fat Chio; Chi-Hang Chan; Hegong Wei; Maloberti, F.; Martins, R.P.; Seng-Pan U;
2012 / IEEE
By: Haring, R.A.; Wisniewski, R.W.; Changhoan Kim; Chist, N.H.; Boyle, P.A.; Chiu, G.L.-T.; Gara, A.; Ohmacht, M.; Blumrich, M.A.; Heidelberger, P.; Coteus, P.W.; Sugavanam, K.; Satterfield, D.L.; Gschwind, M.K.; Fox, T.W.;
By: Haring, R.A.; Wisniewski, R.W.; Changhoan Kim; Chist, N.H.; Boyle, P.A.; Chiu, G.L.-T.; Gara, A.; Ohmacht, M.; Blumrich, M.A.; Heidelberger, P.; Coteus, P.W.; Sugavanam, K.; Satterfield, D.L.; Gschwind, M.K.; Fox, T.W.;
2012 / IEEE
By: Kastensmidt, F. L.; Azambuja, J. R.; Altieri, M.; Pagliarini, S.; Hubner, M.; Velazco, R.; Foucard, G.; Becker, J.;
By: Kastensmidt, F. L.; Azambuja, J. R.; Altieri, M.; Pagliarini, S.; Hubner, M.; Velazco, R.; Foucard, G.; Becker, J.;
2012 / IEEE
By: Xiaochun Ye; Da Wang; Hao Zhang; Dongrui Fan; Ninghui Sun; Guojie Li; Fenglong Song;
By: Xiaochun Ye; Da Wang; Hao Zhang; Dongrui Fan; Ninghui Sun; Guojie Li; Fenglong Song;
2012 / IEEE
By: Salcudean, S.E.; Fichtinger, G.; Morris, W.J.; Dehghan, E.; Chng, N.; Moradi, M.; Lobo, J.R.;
By: Salcudean, S.E.; Fichtinger, G.; Morris, W.J.; Dehghan, E.; Chng, N.; Moradi, M.; Lobo, J.R.;
2012 / IEEE
By: Riedlinger, R.; Stefaniw, M.W.; Biro, L.; Bowhill, B.; Crop, J.; Duda, K.; Fetzer, E.S.; Franza, O.; Grutkowski, T.; Little, C.; Morganti, C.; Moyer, G.; Munch, A.; Nagarajan, M.; Parks, C.; Poirier, C.; Repasky, B.; Roytman, E.; Singh, T.; Arnold, R.;
By: Riedlinger, R.; Stefaniw, M.W.; Biro, L.; Bowhill, B.; Crop, J.; Duda, K.; Fetzer, E.S.; Franza, O.; Grutkowski, T.; Little, C.; Morganti, C.; Moyer, G.; Munch, A.; Nagarajan, M.; Parks, C.; Poirier, C.; Repasky, B.; Roytman, E.; Singh, T.; Arnold, R.;
2012 / IEEE
By: Summers, R.M.; Zhuoshi Wei; Periaswamy, S.; Van Uitert, R.L.; Petrick, N.; Shijun Wang;
By: Summers, R.M.; Zhuoshi Wei; Periaswamy, S.; Van Uitert, R.L.; Petrick, N.; Shijun Wang;