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Topic: Refractive Index
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2011 / IEEE
By: Modotto, D.; Couderc, V.; Tonello, A.; Town, G.; De Angelis, C.; Wabnitz, S.; Minoni, U.; Manili, G.;
By: Modotto, D.; Couderc, V.; Tonello, A.; Town, G.; De Angelis, C.; Wabnitz, S.; Minoni, U.; Manili, G.;
2011 / IEEE
By: Gates, J.C.; Sparrow, I.J.G.; Daly, K.R.; Holmes, C.; Smith, P.G.R.; D'Alessandro, G.;
By: Gates, J.C.; Sparrow, I.J.G.; Daly, K.R.; Holmes, C.; Smith, P.G.R.; D'Alessandro, G.;
2011 / IEEE
By: Huitema, L.; Mattei, J.-L.; Thakur, A.; Souriou, D.; Staraj, R.; Ferrero, F.; Jamnier, B.; Sharahia, A.; Minard, P.; Pintos, J.-F.; Queffelec, P.;
By: Huitema, L.; Mattei, J.-L.; Thakur, A.; Souriou, D.; Staraj, R.; Ferrero, F.; Jamnier, B.; Sharahia, A.; Minard, P.; Pintos, J.-F.; Queffelec, P.;
2011 / IEEE
By: Libo Yuan; Jun Yang; Chunying Guan; Yuzhuo Wang; Yanhui Zhang; Guangping Li; Ai Zhou;
By: Libo Yuan; Jun Yang; Chunying Guan; Yuzhuo Wang; Yanhui Zhang; Guangping Li; Ai Zhou;
2011 / IEEE
By: Chang-Ling Zou; Ying-Zhan Yan; Ji-Jun Xiong; Wen-Dong Zhang; Li Wang; Yu-Guang Zhang; Chen-Yang Xue; Jun Liu; Fang-Wen Sun; Shu-Bin Yan;
By: Chang-Ling Zou; Ying-Zhan Yan; Ji-Jun Xiong; Wen-Dong Zhang; Li Wang; Yu-Guang Zhang; Chen-Yang Xue; Jun Liu; Fang-Wen Sun; Shu-Bin Yan;
2012 / IEEE
By: Cheung, M.C.; Ka Yi Yung; Huina Xu; Bright, F.V.; Ke Liu; Chodavarapu, V.P.; Cartwright, A.N.; Kraut, N.D.;
By: Cheung, M.C.; Ka Yi Yung; Huina Xu; Bright, F.V.; Ke Liu; Chodavarapu, V.P.; Cartwright, A.N.; Kraut, N.D.;
2012 / IEEE
By: Childs, P.; Marchelli, R.; Corradini, R.; Veneziano, R.; Pissadakis, S.; Selleri, S.; Cucinotta, A.; Sozzi, M.; Candiani, A.;
By: Childs, P.; Marchelli, R.; Corradini, R.; Veneziano, R.; Pissadakis, S.; Selleri, S.; Cucinotta, A.; Sozzi, M.; Candiani, A.;
2012 / IEEE
By: Trunina, N.A.; Genina, E.A.; Bashkatov, A.N.; Ghosn, M.G.; Larin, K.V.; Tuchin, V.V.;
By: Trunina, N.A.; Genina, E.A.; Bashkatov, A.N.; Ghosn, M.G.; Larin, K.V.; Tuchin, V.V.;
2012 / IEEE
By: Baoxi Xu; Chengwu An; Kaidong Ye; Jing Zhang; Jianming Li; Cheow Wee Chia; Yeow Teck Toh;
By: Baoxi Xu; Chengwu An; Kaidong Ye; Jing Zhang; Jianming Li; Cheow Wee Chia; Yeow Teck Toh;
2012 / IEEE
By: Weijun Tong; Guobin Ren; Xia Yu; Yong, D.; Huiyu Zhang; Huifeng Wei; Chi Chiu Chan; Ying Zhang;
By: Weijun Tong; Guobin Ren; Xia Yu; Yong, D.; Huiyu Zhang; Huifeng Wei; Chi Chiu Chan; Ying Zhang;
2012 / IEEE
By: Changzhi Li; Zhiyu Wang; Tao Jiang; Lixin Ran; Dong Li; Salamin, Y.; Jiangtao Huangfu; Bin Zhang; Jingnan Pan;
By: Changzhi Li; Zhiyu Wang; Tao Jiang; Lixin Ran; Dong Li; Salamin, Y.; Jiangtao Huangfu; Bin Zhang; Jingnan Pan;
2012 / IEEE
By: Mou, C.; Neal, R.; Allsop, T.D.P.; Bennion, I.; Sullivan, J.L.; Kalli, K.; Culverhouse, P.F.; Webb, D.J.; Rehman, S.; Saied, S.;
By: Mou, C.; Neal, R.; Allsop, T.D.P.; Bennion, I.; Sullivan, J.L.; Kalli, K.; Culverhouse, P.F.; Webb, D.J.; Rehman, S.; Saied, S.;
2012 / IEEE
By: Jun Long Lim; Hu, D.J.J.; Wolinski, T.; Shum, P.P.; Yixin Wang; Milenko, K.; Ying Cui;
By: Jun Long Lim; Hu, D.J.J.; Wolinski, T.; Shum, P.P.; Yixin Wang; Milenko, K.; Ying Cui;
2012 / IEEE
By: Nievinski, F.G.; Santos, M.C.; Urquhart, L.; Nafisi, V.; Gegout, P.; Wickert, J.; Bohm, J.; Ichikawa, R.; Zus, F.; Hobiger, T.; Ardalan, A.A.; Schuh, H.; Wijaya, D.D.;
By: Nievinski, F.G.; Santos, M.C.; Urquhart, L.; Nafisi, V.; Gegout, P.; Wickert, J.; Bohm, J.; Ichikawa, R.; Zus, F.; Hobiger, T.; Ardalan, A.A.; Schuh, H.; Wijaya, D.D.;
2012 / IEEE
By: Jaehyun Moon; Jin Woo Huh; Hye Yong Chu; Jeong-Ik Lee; Doo-Hee Cho; Joo Won Lee; Joohyun Hwang; Jun-Han Han; Jin-Wook Shin; Chul Woong Joo;
By: Jaehyun Moon; Jin Woo Huh; Hye Yong Chu; Jeong-Ik Lee; Doo-Hee Cho; Joo Won Lee; Joohyun Hwang; Jun-Han Han; Jin-Wook Shin; Chul Woong Joo;
2012 / IEEE
By: Cui, Y.; Jun Long Lim; Shum, P.P.; Hu, D.J.J.; Wolinski, T.; Yixin Wang; Milenko, K.;
By: Cui, Y.; Jun Long Lim; Shum, P.P.; Hu, D.J.J.; Wolinski, T.; Yixin Wang; Milenko, K.;
2012 / IEEE
By: Wei Chang Wong; Li Han Chen; Hwi Fen Liew; Yongxing Jin; Xinyong Dong; Wen Siang Lew; Chi Chiu Chan; Peng Zu; Limin Hu;
By: Wei Chang Wong; Li Han Chen; Hwi Fen Liew; Yongxing Jin; Xinyong Dong; Wen Siang Lew; Chi Chiu Chan; Peng Zu; Limin Hu;
2012 / IEEE
By: Schuster, K.; Kobelke, J.; Schwuchow, A.; Rothhardt, M.; Bartelt, H.; Spittel, R.; Balakrishnan, M.; Becker, M.;
By: Schuster, K.; Kobelke, J.; Schwuchow, A.; Rothhardt, M.; Bartelt, H.; Spittel, R.; Balakrishnan, M.; Becker, M.;
2012 / IEEE
By: Cucinotta, A.; Poli, F.; Coscelli, E.; Selleri, S.; Alkeskjold, T.T.; Broeng, J.; Leick, L.; Salin, F.;
By: Cucinotta, A.; Poli, F.; Coscelli, E.; Selleri, S.; Alkeskjold, T.T.; Broeng, J.; Leick, L.; Salin, F.;
Holographic Offset Launch for Dynamic Optimization and Characterization of Multimode Fiber Bandwidth
2012 / IEEEBy: Wilkinson, T.D.; Carpenter, J.;
2012 / IEEE
By: Davies, E.; Koutsides, C.; Zhang, L.; Webb, D.J.; Allsop, T.; Komodromos, M.; Kalli, K.;
By: Davies, E.; Koutsides, C.; Zhang, L.; Webb, D.J.; Allsop, T.; Komodromos, M.; Kalli, K.;
2012 / IEEE
By: Chychlowski, M.S.; Tefelska, M.M.; Rodriaguez, A.H.; Ertman, S.; Pysz, D.; Dabrowski, R.; Wolinski, T.R.; Nowinowski-Kruszelnicki, E.; Buczynaski, R.;
By: Chychlowski, M.S.; Tefelska, M.M.; Rodriaguez, A.H.; Ertman, S.; Pysz, D.; Dabrowski, R.; Wolinski, T.R.; Nowinowski-Kruszelnicki, E.; Buczynaski, R.;
Sensitivity enhancement of RI sensor based on SMS fiber structure with high refractive index overlay
2012 / IEEEBy: Lin-Lin Xue; Li Yang;
2012 / IEEE
By: Korakakis, D.; Timperman, A.; Lim, M.S.; Dawson, J.M.; Hornak, L.A.; Duperre, J.A.; Nightingale, J.R.; Goswami, R.;
By: Korakakis, D.; Timperman, A.; Lim, M.S.; Dawson, J.M.; Hornak, L.A.; Duperre, J.A.; Nightingale, J.R.; Goswami, R.;
2012 / IEEE
By: Nasirabad, R.R.; Babazadeh, A.; Roohforouz, A.; Golshan, A.H.; Norouzy, A.; Jafari, N.T.; Amidian, A.; Alavian, A.; Poozesh, R.; Hejaz, K.; Heidariazar, A.;
By: Nasirabad, R.R.; Babazadeh, A.; Roohforouz, A.; Golshan, A.H.; Norouzy, A.; Jafari, N.T.; Amidian, A.; Alavian, A.; Poozesh, R.; Hejaz, K.; Heidariazar, A.;