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Topic: Reflectivity
Results
2011 / IEEE
By: Kapoor, A.; Upadhyaya, V.; Tate, K.; Das, A.; Chia-Wei Chen; Upadhyaya, A.; Jiun-Hong Lai; Ramanathan, S.; Rohatgi, A.;
By: Kapoor, A.; Upadhyaya, V.; Tate, K.; Das, A.; Chia-Wei Chen; Upadhyaya, A.; Jiun-Hong Lai; Ramanathan, S.; Rohatgi, A.;
Enhancement in Light Extraction of GaN-Based Light-Emitting Diodes With High Reflectivity Electrodes
2011 / IEEEBy: Yan-Kuin Su; Hsiao-Chiu Hsu; Chun-Liang Lin; Kuan Chun Chen;
2012 / IEEE
By: Cheung, M.C.; Ka Yi Yung; Huina Xu; Bright, F.V.; Ke Liu; Chodavarapu, V.P.; Cartwright, A.N.; Kraut, N.D.;
By: Cheung, M.C.; Ka Yi Yung; Huina Xu; Bright, F.V.; Ke Liu; Chodavarapu, V.P.; Cartwright, A.N.; Kraut, N.D.;
2011 / IEEE
By: de la Rosa, J.M.; Fabila, D.A.; Soto, J.L.; Mercado, R.; Arellano, A.; Moreno, E.; Alvarez, M.; Lopez, T.; Mercado, S.M.; Dominguez, J.; Stolik, S.;
By: de la Rosa, J.M.; Fabila, D.A.; Soto, J.L.; Mercado, R.; Arellano, A.; Moreno, E.; Alvarez, M.; Lopez, T.; Mercado, S.M.; Dominguez, J.; Stolik, S.;
2012 / IEEE
By: Hamacher, M.; Syvridis, D.; Mesaritakis, C.; Stamataki, I.; Kapsalis, A.; Heidrich, H.;
By: Hamacher, M.; Syvridis, D.; Mesaritakis, C.; Stamataki, I.; Kapsalis, A.; Heidrich, H.;
2012 / IEEE
By: Cobo, A.; Garcia-Allende, P.B.; Rodriguez-Cobo, L.; Conde, O.M.; Lopez-Higuera, J.M.;
By: Cobo, A.; Garcia-Allende, P.B.; Rodriguez-Cobo, L.; Conde, O.M.; Lopez-Higuera, J.M.;
2012 / IEEE
By: Willner, A.E.; Chang-Hasnain, C.J.; Tur, M.; Chase, C.; Karagodsky, V.; Yang Yue; Weijian Yang; Hao Huang; Xue Wang; Lin Zhang; Ferrara, J.;
By: Willner, A.E.; Chang-Hasnain, C.J.; Tur, M.; Chase, C.; Karagodsky, V.; Yang Yue; Weijian Yang; Hao Huang; Xue Wang; Lin Zhang; Ferrara, J.;
2012 / IEEE
By: Beaudin, G.; Veerasubramanian, V.; Kirk, A.G.; Aimez, V.; Le Drogoff, B.; Giguere, A.;
By: Beaudin, G.; Veerasubramanian, V.; Kirk, A.G.; Aimez, V.; Le Drogoff, B.; Giguere, A.;
2012 / IEEE
By: Bosman, E.; Van Hoe, B.; Van Steenberge, G.; Van Daele, P.; Godier, G.; De Geyter, T.; Melpignano, G.; Kalathimekkad, S.; Missinne, J.;
By: Bosman, E.; Van Hoe, B.; Van Steenberge, G.; Van Daele, P.; Godier, G.; De Geyter, T.; Melpignano, G.; Kalathimekkad, S.; Missinne, J.;
2012 / IEEE
By: Chang-yu Shen; Chuan Zhong; Jian-feng Wang; Yong-xing Jin; Ke Li; Xin Zou; Jin-lei Chu;
By: Chang-yu Shen; Chuan Zhong; Jian-feng Wang; Yong-xing Jin; Ke Li; Xin Zou; Jin-lei Chu;
2012 / IEEE
By: Nadalin, E.Z.; Takahata, A.K.; Tygel, M.; Romano, J.M.T.; Ferrari, R.; Lopes, R.R.; Suyama, R.; Duarte, L.T.;
By: Nadalin, E.Z.; Takahata, A.K.; Tygel, M.; Romano, J.M.T.; Ferrari, R.; Lopes, R.R.; Suyama, R.; Duarte, L.T.;
2010 / IEEE / 978-1-4244-5261-3
By: Wieczorek, L.; Nan Zeng; Glenn, A.M.; Baxter, G.R.; Myers, J.; Raguse, B.; Murphy, A.B.;
By: Wieczorek, L.; Nan Zeng; Glenn, A.M.; Baxter, G.R.; Myers, J.; Raguse, B.; Murphy, A.B.;
2011 / IEEE / 978-1-4577-1203-6
By: King, R.L.; Durbha, S.S.; Palacharla, P.K.; Lawrence, G.W.; Gokaraju, B.;
By: King, R.L.; Durbha, S.S.; Palacharla, P.K.; Lawrence, G.W.; Gokaraju, B.;
2011 / IEEE / 978-1-4244-9563-4
By: Aubin, J.; Soerens, R.; Miller, J.J.; Foged, L.J.; Winebrand, M.;
By: Aubin, J.; Soerens, R.; Miller, J.J.; Foged, L.J.; Winebrand, M.;
2011 / IEEE / 978-3-8007-3356-9
By: Moller, K.; Doscher, H.; Hannappel, T.; Kleinschmidt, P.; Vogt, P.;
By: Moller, K.; Doscher, H.; Hannappel, T.; Kleinschmidt, P.; Vogt, P.;
2011 / IEEE / 978-1-4577-0378-2
By: Hsiao, C.H.; Kuo, P.C.; Ou, S.L.; Lee, C.T.; Tsai, T.L.; Chang, H.F.; Yeh, C.Y.; Chen, S.C.;
By: Hsiao, C.H.; Kuo, P.C.; Ou, S.L.; Lee, C.T.; Tsai, T.L.; Chang, H.F.; Yeh, C.Y.; Chen, S.C.;
2011 / IEEE / 978-1-61284-848-8
By: Wenji Zhao; Xiaoyu Guo; Jingmeng Wang; Ke Liu; Juan Long; Zhaoning Gong;
By: Wenji Zhao; Xiaoyu Guo; Jingmeng Wang; Ke Liu; Juan Long; Zhaoning Gong;
2011 / IEEE / 978-1-4577-0378-2
By: Kuo, P.C.; Ou, S.L.; Chiang, D.; Lee, C.T.; Chang, H.F.; Yeh, C.Y.; Cheng, C.P.; Shen, C.L.; Tsai, T.L.;
By: Kuo, P.C.; Ou, S.L.; Chiang, D.; Lee, C.T.; Chang, H.F.; Yeh, C.Y.; Cheng, C.P.; Shen, C.L.; Tsai, T.L.;
2011 / IEEE / 978-1-4577-0378-2
By: Chang, E.Y.; Sahoo, K.C.; Zheng-Liang Lu; Hui-Wen Cheng; Ming-Yi Lee; Yiming Li;
By: Chang, E.Y.; Sahoo, K.C.; Zheng-Liang Lu; Hui-Wen Cheng; Ming-Yi Lee; Yiming Li;
2011 / IEEE / 978-1-61284-848-8
By: Wenji Zhao; Qian Miao; Zhiheng Wang; Jie Han; Ke Liu; Xiaoyu Guo;
By: Wenji Zhao; Qian Miao; Zhiheng Wang; Jie Han; Ke Liu; Xiaoyu Guo;
2011 / IEEE / 978-986-02-8974-9
By: Silalahi, S.T.H.; Tan, Y.T.; Ogawa, K.; Guan, N.; Sakuma, K.; Lim, H.W.; Goi, K.; Lo, G.Q.; Yu, M.B.; Teo, S.H.G.;
By: Silalahi, S.T.H.; Tan, Y.T.; Ogawa, K.; Guan, N.; Sakuma, K.; Lim, H.W.; Goi, K.; Lo, G.Q.; Yu, M.B.; Teo, S.H.G.;
2011 / IEEE / 978-986-02-8974-9
By: Ming-Chun Tseng; Ray-Hua Horng; Min-De Yang; Chih-Hung Wu; Dong-Sing Wuu; Fan-Lei Wu;
By: Ming-Chun Tseng; Ray-Hua Horng; Min-De Yang; Chih-Hung Wu; Dong-Sing Wuu; Fan-Lei Wu;
2011 / IEEE / 978-1-4577-0536-6
By: Jiaguo Li; Erwei Qi; Jie Han; Huifang Li; Zhanliang Yuan; Xiaofei Mi; Qiyue Liu;
By: Jiaguo Li; Erwei Qi; Jie Han; Huifang Li; Zhanliang Yuan; Xiaofei Mi; Qiyue Liu;
2011 / IEEE / 978-1-61284-777-1
By: Aimez, V.; Grondin, E.; Chabot, V.; Renaudin, A.; Charette, P.G.;
By: Aimez, V.; Grondin, E.; Chabot, V.; Renaudin, A.; Charette, P.G.;