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Topic: Radiofrequency Measurement
Results
2012 / IEEE
By: Hu, C.; Venugopalan, S.; Chauhan, Y.S.; Karim, M.A.; Sachid, A.B.; Niknejad, A.M.; Faynot, O.; Nguyen, B.Y.; Lu, D.D.;
By: Hu, C.; Venugopalan, S.; Chauhan, Y.S.; Karim, M.A.; Sachid, A.B.; Niknejad, A.M.; Faynot, O.; Nguyen, B.Y.; Lu, D.D.;
2011 / IEEE / 978-1-4244-8810-0
By: Nan Bao; Cong Feng; Lei Zhang; Yuqi Jiang; Feifei Yang; Lisheng Xu;
By: Nan Bao; Cong Feng; Lei Zhang; Yuqi Jiang; Feifei Yang; Lisheng Xu;
2011 / IEEE / 978-1-61284-961-4
By: Gaquiere, C.; Tanbakuchi, H.; Theron, D.; Ducatteau, D.; Gloria, D.; Debroucke, R.;
By: Gaquiere, C.; Tanbakuchi, H.; Theron, D.; Ducatteau, D.; Gloria, D.; Debroucke, R.;
2011 / IEEE / 978-1-4244-6051-9
By: Goulet, F.; Tesson, O.; Kelma, C.; Elkassir, B.; Descamps, P.; Wane, S.; Ranaivoniarivo, M.; Gamand, P.;
By: Goulet, F.; Tesson, O.; Kelma, C.; Elkassir, B.; Descamps, P.; Wane, S.; Ranaivoniarivo, M.; Gamand, P.;
Considerations on Interference for Hybrid Mode Digital Radio Broadcast Standards over AM Frequencies
2011 / IEEE / 978-1-4577-1879-3By: Delgado-Hernandez, J.C.; Moumtadi, F.; Tovar-Medina, R.; Flores-Llamas, I.;
2012 / IEEE / 978-1-4577-0920-3
By: Vipiana, F.; Bercigli, M.; Bandinelli, M.; Scialacqua, L.; Giordanengo, G.; Vecchi, G.; Foged, L.J.; Sabbadini, M.;
By: Vipiana, F.; Bercigli, M.; Bandinelli, M.; Scialacqua, L.; Giordanengo, G.; Vecchi, G.; Foged, L.J.; Sabbadini, M.;
2012 / IEEE / 978-1-4577-1557-0
By: Eng Leong Tan; Wibowo, N.A.; Shi Zhao Fan; Weilun Kwek; Wee Jin Koh;
By: Eng Leong Tan; Wibowo, N.A.; Shi Zhao Fan; Weilun Kwek; Wee Jin Koh;
2012 / IEEE / 978-1-4577-1557-0
By: Coenen, T.; de Koning, A.; van Roermund, A.; Gierstberg, T.; Coenen, M.;
By: Coenen, T.; de Koning, A.; van Roermund, A.; Gierstberg, T.; Coenen, M.;
2011 / IEEE
By: Hyun Chul Sagong; Chang Yong Kang; Chang-Woo Sohn; Do-Young Choi; Eui-Young Jeong; Chang-Ki Baek; Jeong-Soo Lee; Yoon-Ha Jeong;
By: Hyun Chul Sagong; Chang Yong Kang; Chang-Woo Sohn; Do-Young Choi; Eui-Young Jeong; Chang-Ki Baek; Jeong-Soo Lee; Yoon-Ha Jeong;
Complex dielectric measurements and analysis of brain tissues in the radio and microwave frequencies
1997 / IEEEBy: Jian-Zhong Bao; Hurt, W.D.; Shin-Tsu Lu;
2003 / IEEE / 0-7803-7779-6
By: Borra, M.; Giliberti, C.; Bedini, A.; Giuliani, L.; Palomba, R.; D'Emilia, E.;
By: Borra, M.; Giliberti, C.; Bedini, A.; Giuliani, L.; Palomba, R.; D'Emilia, E.;
2008 / IEEE / 978-1-4244-2423-8
By: Darbari, F.; Sasloglou, K.; Stewart, R.W.; Andonovic, I.; Glover, I.A.;
By: Darbari, F.; Sasloglou, K.; Stewart, R.W.; Andonovic, I.; Glover, I.A.;
2008 / IEEE / 978-1-4244-3364-3
By: Airikkala, K.; Tuominen, A.; Maaspuro, M.; Pykari, L.; Monkare, I.; Sippola, J.;
By: Airikkala, K.; Tuominen, A.; Maaspuro, M.; Pykari, L.; Monkare, I.; Sippola, J.;
2008 / IEEE / 978-2-87487-006-4
By: Forma, G.; Ristorcelli, I.; Villa, F.; Sandri, M.; Marti-Canales, J.; Tauber, J.; Crone, G.; Paquay, M.; Dubruel, D.;
By: Forma, G.; Ristorcelli, I.; Villa, F.; Sandri, M.; Marti-Canales, J.; Tauber, J.; Crone, G.; Paquay, M.; Dubruel, D.;
2009 / IEEE / 978-1-4244-3704-7
By: Bousquet, A.; Connor, S.; Hakim, M.; Tan, L.; Hall, S.; Ashburn, P.; Redman-White, W.;
By: Bousquet, A.; Connor, S.; Hakim, M.; Tan, L.; Hall, S.; Ashburn, P.; Redman-White, W.;
2009 / IEEE / 978-1-4244-3915-7
By: Kristiansen, H.O.; Stewart, B.G.; Nesbitt, A.; Krakenes, S.; McMeekin, S.G.; Liebech-Lien, K.; Gamio, J.C.; Conner, S.;
By: Kristiansen, H.O.; Stewart, B.G.; Nesbitt, A.; Krakenes, S.; McMeekin, S.G.; Liebech-Lien, K.; Gamio, J.C.; Conner, S.;
2009 / IEEE / 978-1-4244-3352-0
By: Keskitalo, N.; Condo, E.; Bjorsell, N.; Andersen, O.; Altahir, H.; Nader, C.; de la Rosa, H.;
By: Keskitalo, N.; Condo, E.; Bjorsell, N.; Andersen, O.; Altahir, H.; Nader, C.; de la Rosa, H.;
2009 / IEEE / 978-1-4244-3647-7
By: Perdereau, J.; Pouyet, M.; Tedjini, S.; Vuong, T.P.; Pouzin, A.; Dreux, L.;
By: Perdereau, J.; Pouyet, M.; Tedjini, S.; Vuong, T.P.; Pouzin, A.; Dreux, L.;
2009 / IEEE / 978-1-4244-3442-8
By: Quere, R.; Verspecht, J.; De Groote, F.; Callet, G.; Faraj, J.; Teyssier, J.-P.;
By: Quere, R.; Verspecht, J.; De Groote, F.; Callet, G.; Faraj, J.; Teyssier, J.-P.;
2009 / IEEE / 978-1-4244-3584-5
By: Smaoui, L.; Nossek, J.A.; Mellein, H.; Baltar, L.G.; Mezghani, A.;
By: Smaoui, L.; Nossek, J.A.; Mellein, H.; Baltar, L.G.; Mezghani, A.;
2009 / IEEE / 978-1-4244-4748-0
By: Nauwelaers, B.; Bossche, M.V.; Schreurs, D.; Pailloncy, G.; Avolio, G.;
By: Nauwelaers, B.; Bossche, M.V.; Schreurs, D.; Pailloncy, G.; Avolio, G.;
2009 / IEEE / 978-1-4244-3385-8
By: Mantovan, M.; Anglesio, L.; Adda, S.; Trinchero, S.; d'Amore, G.;
By: Mantovan, M.; Anglesio, L.; Adda, S.; Trinchero, S.; d'Amore, G.;
2009 / IEEE / 978-1-4244-2720-8
By: Kobayashi, T.; Toda, T.; Tomiki, A.; Ichikawa, T.; Matsubara, A.;
By: Kobayashi, T.; Toda, T.; Tomiki, A.; Ichikawa, T.; Matsubara, A.;