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Topic: Radiofrequency Amplifiers
Results
2011 / IEEE
By: Draxler, P.; Yan, J.J.; Anding Zhu; Chin Hsia; Asbeck, P.M.; Lanfranco, S.; Kimball, D.F.;
By: Draxler, P.; Yan, J.J.; Anding Zhu; Chin Hsia; Asbeck, P.M.; Lanfranco, S.; Kimball, D.F.;
2012 / IEEE
By: Youngchang Yoon; Kenney, J.S.; Chang-Ho Lee; Ockgoo Lee; Kyu Hwan An; Hyungwook Kim; Jihwan Kim;
By: Youngchang Yoon; Kenney, J.S.; Chang-Ho Lee; Ockgoo Lee; Kyu Hwan An; Hyungwook Kim; Jihwan Kim;
2012 / IEEE
By: Yu, G.; Wei, C.; Yue, Y.; Ren, Y.; Yang, J.; Dinu, R.; Nuccio, S.R.; Huang, H.; Willner, A.E.; Chang-Hasnain, C.J.; Parekh, D.;
By: Yu, G.; Wei, C.; Yue, Y.; Ren, Y.; Yang, J.; Dinu, R.; Nuccio, S.R.; Huang, H.; Willner, A.E.; Chang-Hasnain, C.J.; Parekh, D.;
2011 / IEEE / 978-1-4577-0811-4
By: Chen, J.-S.; Han-Chang Hsieh; Chun Hsiung Chen; Ming-Shing Lin; Cheng-Nan Chiu; Chi-Hsueh Wang;
By: Chen, J.-S.; Han-Chang Hsieh; Chun Hsiung Chen; Ming-Shing Lin; Cheng-Nan Chiu; Chi-Hsueh Wang;
2011 / IEEE / 978-1-4577-0321-8
By: Taijun Liu; Yan Ye; Ying Zhang; Jun Li; Juan Zhang; Gaoming Xu; Liang Li;
By: Taijun Liu; Yan Ye; Ying Zhang; Jun Li; Juan Zhang; Gaoming Xu; Liang Li;
2011 / IEEE / 978-1-4577-0321-8
By: Juan Zhang; Yi Peng; Gaoming Xu; Yan Ye; Taijun Liu; Hao Lin; Jun Li;
By: Juan Zhang; Yi Peng; Gaoming Xu; Yan Ye; Taijun Liu; Hao Lin; Jun Li;
2011 / IEEE / 978-1-4244-6051-9
By: Abd-Alhameed, R.; Karkhaneh, H.; Sadeghpour, T.; Dama, Y.A.S.; Elfergani, I.T.E.; Ghorbani, A.;
By: Abd-Alhameed, R.; Karkhaneh, H.; Sadeghpour, T.; Dama, Y.A.S.; Elfergani, I.T.E.; Ghorbani, A.;
2011 / IEEE / 978-1-4577-0541-0
By: Cheng, P.M.; Cobos, J.A.; Alou, P.; Oliver, J.A.; Garcia, O.; Vasic, M.;
By: Cheng, P.M.; Cobos, J.A.; Alou, P.; Oliver, J.A.; Garcia, O.; Vasic, M.;
2011 / IEEE / 978-1-4577-0541-0
By: Alou, P.; Oliver, J.A.; Garcia, O.; Vasic, M.; Cucak, D.; Cobos, J.A.;
By: Alou, P.; Oliver, J.A.; Garcia, O.; Vasic, M.; Cucak, D.; Cobos, J.A.;
2011 / IEEE / 978-1-61284-993-5
By: Pascht, A.; Machinal, R.; Luz, G.; Wiegner, D.; Juschke, P.; Quay, R.;
By: Pascht, A.; Machinal, R.; Luz, G.; Wiegner, D.; Juschke, P.; Quay, R.;
2011 / IEEE / 978-1-61284-718-4
By: Luff, B.J.; Toliver, P.; Banwell, T.; Agarwal, A.; Woodward, T.K.; Feng, D.; Feng, N.-N.; Asghari, M.; Lee, D.C.; Dong, P.;
By: Luff, B.J.; Toliver, P.; Banwell, T.; Agarwal, A.; Woodward, T.K.; Feng, D.; Feng, N.-N.; Asghari, M.; Lee, D.C.; Dong, P.;
2011 / IEEE / 978-1-4577-0516-8
By: Sira, D.; Tafuri, F.F.; Larsen, T.; Jensen, O.K.; Nielsen, T.S.;
By: Sira, D.; Tafuri, F.F.; Larsen, T.; Jensen, O.K.; Nielsen, T.S.;
2011 / IEEE / 978-2-87487-023-1
By: Thornton, T.; Boumaiza, S.; Bakkaloglu, B.; Wilk, S.; Lepkowski, W.; Ghajar, M.R.;
By: Thornton, T.; Boumaiza, S.; Bakkaloglu, B.; Wilk, S.; Lepkowski, W.; Ghajar, M.R.;
2011 / IEEE / 978-2-87487-023-1
By: Bang-Hua Zhou; Tao Cao; Rong Zeng; You-Jiang Liu; Yi-Nong Liu; Jie Zhou;
By: Bang-Hua Zhou; Tao Cao; Rong Zeng; You-Jiang Liu; Yi-Nong Liu; Jie Zhou;
2011 / IEEE / 978-2-87487-023-1
By: Ngoya, E.; Mons, S.; Sommet, R.; Mancuso, Y.; Martinaud, J.P.; Mazeau, J.; Besombes, F.;
By: Ngoya, E.; Mons, S.; Sommet, R.; Mancuso, Y.; Martinaud, J.P.; Mazeau, J.; Besombes, F.;
2012 / IEEE / 978-1-4673-1036-9
By: Chatterjee, A.; Swaminathan, M.; Goyal, A.; Cressler, J.D.; Howard, D.;
By: Chatterjee, A.; Swaminathan, M.; Goyal, A.; Cressler, J.D.; Howard, D.;
2012 / IEEE / 978-1-4577-1121-3
By: Wimpenny, G.; Hildersley, J.; Vlasits, T.; Cummins, S.; Padfield, N.;
By: Wimpenny, G.; Hildersley, J.; Vlasits, T.; Cummins, S.; Padfield, N.;
2012 / IEEE / 978-1-4577-1121-3
By: Thornton, T.J.; Bakkaloglu, B.; Lepkowski, W.; Wilk, S.J.; Ghajar, M.R.;
By: Thornton, T.J.; Bakkaloglu, B.; Lepkowski, W.; Wilk, S.J.; Ghajar, M.R.;
2012 / IEEE / 978-1-4577-1121-3
By: Masood, M.; Kenney, J.S.; Bokatius, M.; Wood, J.; Staudinger, J.;
By: Masood, M.; Kenney, J.S.; Bokatius, M.; Wood, J.; Staudinger, J.;
2012 / IEEE / 978-3-8007-3414-6
By: Alou, P.; Oliver, J.A.; Garcia, O.; Vasic, M.; Cucak, D.; Cobos, J.A.;
By: Alou, P.; Oliver, J.A.; Garcia, O.; Vasic, M.; Cucak, D.; Cobos, J.A.;
Measurement technique to assess the impact of RF power amplifier memory effects on radar performance
2012 / IEEE / 978-1-4673-0658-4By: Tua, C.G.;
2012 / IEEE / 978-1-4577-1772-7
By: Sy-Haur Su; Shuw-Guann Lin; Hsu-Feng Hsiao; Hwann-Kaeo Chiou; Ying-Zong Juang; Da-Chiang Chang; Chih-Ho Tu;
By: Sy-Haur Su; Shuw-Guann Lin; Hsu-Feng Hsiao; Hwann-Kaeo Chiou; Ying-Zong Juang; Da-Chiang Chang; Chih-Ho Tu;
2012 / IEEE / 978-1-4673-2713-8
By: Zayani, R.; Belkacem, O.B.; Roviras, D.; Bouallegue, R.; Ammari, M.L.;
By: Zayani, R.; Belkacem, O.B.; Roviras, D.; Bouallegue, R.; Ammari, M.L.;
2015 / IEEE
By: Ramírez-Angulo, J.; G. Carvajal, R.; López-Martín, A.J.; Pedro, M.; Galán, J.A.; Sánchez-Rodríguez, T.;
By: Ramírez-Angulo, J.; G. Carvajal, R.; López-Martín, A.J.; Pedro, M.; Galán, J.A.; Sánchez-Rodríguez, T.;
2014 / IEEE
By: Sebastian, J.; Rodriguez, M.; Patino, M.; Ortega-Gonzalez, F. J.; Fernandez-Miaja, P.;
By: Sebastian, J.; Rodriguez, M.; Patino, M.; Ortega-Gonzalez, F. J.; Fernandez-Miaja, P.;