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Topic: Quantum Well Devices
Results
2011 / IEEE
By: Shih-Cheng Huang; Jen-Hung Tu; Ming-Tsung Hung; Dong-Sing Wuu; Horng, R.-H.; Tsung-Yen Tsai; Li-Wei Tu; Wei-Yang Chiang;
By: Shih-Cheng Huang; Jen-Hung Tu; Ming-Tsung Hung; Dong-Sing Wuu; Horng, R.-H.; Tsung-Yen Tsai; Li-Wei Tu; Wei-Yang Chiang;
2011 / IEEE
By: Eun-Soo Nam; Cheol-Hoi Kim; Jong-In Shim; Han-Youl Ryu; Jin Hyoung Choi; Jong-Moo Lee; Min-Soo Noh; Hyun Min Jung;
By: Eun-Soo Nam; Cheol-Hoi Kim; Jong-In Shim; Han-Youl Ryu; Jin Hyoung Choi; Jong-Moo Lee; Min-Soo Noh; Hyun Min Jung;
2011 / IEEE
By: Kintaka, K.; Nagase, M.; Suda, S.; Shoji, Y.; Kawashima, H.; Ishikawa, H.; Hasama, T.; Kuwatsuka, H.; Akimoto, R.;
By: Kintaka, K.; Nagase, M.; Suda, S.; Shoji, Y.; Kawashima, H.; Ishikawa, H.; Hasama, T.; Kuwatsuka, H.; Akimoto, R.;
2012 / IEEE
By: Coldren, L.A.; Binetti, P.R.A.; Bhardwaj, A.; Norberg, E.J.; Guzzon, R.S.; Parker, J.S.;
By: Coldren, L.A.; Binetti, P.R.A.; Bhardwaj, A.; Norberg, E.J.; Guzzon, R.S.; Parker, J.S.;
2012 / IEEE
By: Su-Ik Park; Jong-In Shim; Han-Youl Ryu; Dong-Soo Shin; Hyun-Sung Kim; Dong-Hyun Jang; Jong-Ik Lee;
By: Su-Ik Park; Jong-In Shim; Han-Youl Ryu; Dong-Soo Shin; Hyun-Sung Kim; Dong-Hyun Jang; Jong-Ik Lee;
2012 / IEEE
By: Corbett, B.; Cleary, C.S.; Daunt, C.L.M.; Peters, F.H.; Manning, R.J.; Pelucchi, E.; Young, R.J.; Thomas, K.;
By: Corbett, B.; Cleary, C.S.; Daunt, C.L.M.; Peters, F.H.; Manning, R.J.; Pelucchi, E.; Young, R.J.; Thomas, K.;
2012 / IEEE
By: Hyun-Gi Hong; Jaekyun Kim; Joosung Kim; Youngjo Tak; Jun-Youn Kim; Moonseung Yang; U-In Chung; Youngsoo Park; Junghoon Park; Suhee Chae;
By: Hyun-Gi Hong; Jaekyun Kim; Joosung Kim; Youngjo Tak; Jun-Youn Kim; Moonseung Yang; U-In Chung; Youngsoo Park; Junghoon Park; Suhee Chae;
2012 / IEEE
By: Tulkki, J.; Oksanen, J.; Kivisaari, P.; Jang, C.H.; Lee, M.L.; Kai-Lun Chi; Jin-Wei Shi; Sheu, J.K.;
By: Tulkki, J.; Oksanen, J.; Kivisaari, P.; Jang, C.H.; Lee, M.L.; Kai-Lun Chi; Jin-Wei Shi; Sheu, J.K.;
2012 / IEEE
By: Guogang Qin; Lingjuan Zhao; Wei Wang; Guangzhao Ran; Chong Wang; Jifang Qiu; Jiaoqing Pan; Song Liang; Weixi Chen; Tao Hong; Yanping Li; Bin Niu;
By: Guogang Qin; Lingjuan Zhao; Wei Wang; Guangzhao Ran; Chong Wang; Jifang Qiu; Jiaoqing Pan; Song Liang; Weixi Chen; Tao Hong; Yanping Li; Bin Niu;
2012 / IEEE
By: Corbett, B.; O'Callaghan, J.; Daunt, C.L.M.; Peters, F.H.; Ko-Hsin Lee; Pelucchi, E.; Thomas, K.; Young, R.J.; Hua Yang;
By: Corbett, B.; O'Callaghan, J.; Daunt, C.L.M.; Peters, F.H.; Ko-Hsin Lee; Pelucchi, E.; Thomas, K.; Young, R.J.; Hua Yang;
2012 / IEEE
By: Meoung-Whan Cho; Sung Ryong Cho; Seogwoo Lee; Kayo Koike; Yao, T.; Jinsub Park; Hyun-Yong Lee; Soon-Ku Hong; Jun-Seok Ha; Hyojong Lee;
By: Meoung-Whan Cho; Sung Ryong Cho; Seogwoo Lee; Kayo Koike; Yao, T.; Jinsub Park; Hyun-Yong Lee; Soon-Ku Hong; Jun-Seok Ha; Hyojong Lee;
2012 / IEEE
By: Harris, J.S.; Kamins, T.I.; Schaevitz, R.K.; Claussen, S.A.; Yiwen Rong; Shen Ren; Miller, D.A.B.;
By: Harris, J.S.; Kamins, T.I.; Schaevitz, R.K.; Claussen, S.A.; Yiwen Rong; Shen Ren; Miller, D.A.B.;
2012 / IEEE
By: Chien-Hua Chiu; Kuo-Yi Yen; Jyh-Rong Gong; Tai-Yuan Lin; Tzu-Pei Chen; Pei-Shin Lin; Chien-Hua Chou; Chun-Wei Li;
By: Chien-Hua Chiu; Kuo-Yi Yen; Jyh-Rong Gong; Tai-Yuan Lin; Tzu-Pei Chen; Pei-Shin Lin; Chien-Hua Chou; Chun-Wei Li;
2012 / IEEE
By: Airey, R.J.; Browne, B.C.; Connolly, J.P.; Barnham, K.W.J.; Roberts, J.S.; Ekins-Daukes, N.J.; Lee, K.H.; Tibbits, T.N.D.; Fuhrer, M.;
By: Airey, R.J.; Browne, B.C.; Connolly, J.P.; Barnham, K.W.J.; Roberts, J.S.; Ekins-Daukes, N.J.; Lee, K.H.; Tibbits, T.N.D.; Fuhrer, M.;
2012 / IEEE
By: Yugang Zhou; Guowei Xiao; Yian Yin; Hailong Wang; Shuti Li; Taiping Lu; Chao Liu; Lejuan Wu;
By: Yugang Zhou; Guowei Xiao; Yian Yin; Hailong Wang; Shuti Li; Taiping Lu; Chao Liu; Lejuan Wu;
2012 / IEEE
By: Sang-Hyun Hong; Chu-Young Cho; Sang-Jun Lee; Seong-Ju Park; Sung-Tae Kim; Sukho Yoon; Sang-Heon Han;
By: Sang-Hyun Hong; Chu-Young Cho; Sang-Jun Lee; Seong-Ju Park; Sung-Tae Kim; Sukho Yoon; Sang-Heon Han;
2012 / IEEE
By: Hon, S.J.; Tsun-Kai Ko; Shuguang Li; Zhi-Yong Jiao; Liu, C.H.; Shoou-Jinn Chang; Chuang, R.W.; Yu-Yao Lin;
By: Hon, S.J.; Tsun-Kai Ko; Shuguang Li; Zhi-Yong Jiao; Liu, C.H.; Shoou-Jinn Chang; Chuang, R.W.; Yu-Yao Lin;
2012 / IEEE
By: Chang-Ho Chen; Sheng-Po Chang; Tsung-Hsun Chiang; Shuguang Li; Ray-Ming Lin; Sheng-Fu Yu; Shoou-Jinn Chang;
By: Chang-Ho Chen; Sheng-Po Chang; Tsung-Hsun Chiang; Shuguang Li; Ray-Ming Lin; Sheng-Fu Yu; Shoou-Jinn Chang;
2012 / IEEE
By: Jiang-Yong Zhang; Guo-En Weng; Wen-Jie Liu; Xiao-Long Hu; Bao-Ping Zhang; Xue-Qin Lv; Lei-Ying Ying; Hui-Jun Huang; Ming Chen; Ming-Ming Liang;
By: Jiang-Yong Zhang; Guo-En Weng; Wen-Jie Liu; Xiao-Long Hu; Bao-Ping Zhang; Xue-Qin Lv; Lei-Ying Ying; Hui-Jun Huang; Ming Chen; Ming-Ming Liang;
2012 / IEEE
By: Faria, F.; Yuanzheng Yue; Zongyang Hu; Verma, J.; Jia Guo; Ronghua Wang; Yu Cao; Jena, D.; Huili Xing; Guowang Li; Kosel, T.; Kelly, M.;
By: Faria, F.; Yuanzheng Yue; Zongyang Hu; Verma, J.; Jia Guo; Ronghua Wang; Yu Cao; Jena, D.; Huili Xing; Guowang Li; Kosel, T.; Kelly, M.;
2011 / IEEE / 978-3-8007-3356-9
By: Sigmund, A.; Bornholdt, C.; Przyrembel, G.; Moehrle, M.; Klein, H.; Molzow, W.-D.;
By: Sigmund, A.; Bornholdt, C.; Przyrembel, G.; Moehrle, M.; Klein, H.; Molzow, W.-D.;
2011 / IEEE / 978-3-8007-3356-9
By: Corbett, B.; Peters, F.H.; O'Callaghan, J.; Roycroft, B.; Manning, R.J.; Webb, R.P.; Lee, K.;
By: Corbett, B.; Peters, F.H.; O'Callaghan, J.; Roycroft, B.; Manning, R.J.; Webb, R.P.; Lee, K.;
2011 / IEEE / 978-3-8007-3356-9
By: Sugiyama, M.; Watanabe, K.; Ma, S.J.; Sodabanlu, H.; Nakano, Y.;
By: Sugiyama, M.; Watanabe, K.; Ma, S.J.; Sodabanlu, H.; Nakano, Y.;
2011 / IEEE / 978-1-4244-9949-6
By: Mitard, J.; Witters, L.; Hoffmann, T.; Horiguchi, N.; Absil, P.; Biesemans, S.; De Meyer, K.; Vandervorst, W.; Hong, S.-H.; Wang, W.-E.; Van Dal, M.J.H.; Yamaguchi, S.; Takeoka, S.; Eyben, P.; Vanhaeren, D.; Vanderheyden, A.; Altamirano Sanchez, E.; Dekkers, H.; Favia, P.; Loo, R.; Vincent, B.; Hikavyy, A.; Eneman, G.; Hellings, G.; Krom, R.; Franco, J.;
By: Mitard, J.; Witters, L.; Hoffmann, T.; Horiguchi, N.; Absil, P.; Biesemans, S.; De Meyer, K.; Vandervorst, W.; Hong, S.-H.; Wang, W.-E.; Van Dal, M.J.H.; Yamaguchi, S.; Takeoka, S.; Eyben, P.; Vanhaeren, D.; Vanderheyden, A.; Altamirano Sanchez, E.; Dekkers, H.; Favia, P.; Loo, R.; Vincent, B.; Hikavyy, A.; Eneman, G.; Hellings, G.; Krom, R.; Franco, J.;
2011 / IEEE / 978-3-8007-3356-9
By: Mocuta, C.; Lagay, N.; Guillamet, R.; Decobert, J.; Lagree, P.; Carbone, G.;
By: Mocuta, C.; Lagay, N.; Guillamet, R.; Decobert, J.; Lagree, P.; Carbone, G.;
2011 / IEEE / 978-3-8007-3356-9
By: Okumura, S.; Uetake, A.; Matsuda, M.; Tanaka, S.; Ekawa, M.; Yamamoto, T.; Simoyama, T.; Morito, K.;
By: Okumura, S.; Uetake, A.; Matsuda, M.; Tanaka, S.; Ekawa, M.; Yamamoto, T.; Simoyama, T.; Morito, K.;
2011 / IEEE / 978-986-02-8974-9
By: Shih-Cheng Huang; Chun-Yen Chang; Po-Min Tu; Ching-Hsueh Chiu; Jet-Rung Chang; Chih-Peng Hsu; Hao-Chung Kuo; Hsiao-Wen Zan;
By: Shih-Cheng Huang; Chun-Yen Chang; Po-Min Tu; Ching-Hsueh Chiu; Jet-Rung Chang; Chih-Peng Hsu; Hao-Chung Kuo; Hsiao-Wen Zan;
2011 / IEEE / 978-1-4244-8340-2
By: Harris, J.S.; Kamins, T.I.; Schaevitz, R.; Claussen, S.; Yiwen Rong; Shen Ren; Miller, D.A.B.;
By: Harris, J.S.; Kamins, T.I.; Schaevitz, R.; Claussen, S.; Yiwen Rong; Shen Ren; Miller, D.A.B.;
2011 / IEEE / 978-1-4244-8340-2
By: Qiming Wang; Buwen Cheng; Chunlai Xue; Weixuan Hu; Hongwei Zhao;
By: Qiming Wang; Buwen Cheng; Chunlai Xue; Weixuan Hu; Hongwei Zhao;
2011 / IEEE / 978-1-61284-418-3
By: Grasser, T.; Kaczer, B.; Franco, J.; Baumgartner, O.; Goes, W.; Hehenberger, P.;
By: Grasser, T.; Kaczer, B.; Franco, J.; Baumgartner, O.; Goes, W.; Hehenberger, P.;
2011 / IEEE / 978-1-4577-0430-7
By: Romer, F.; Deppner, M.; Strassburg, M.; Bergbauer, W.; Witzigmann, B.; Waag, A.; Neumann, R.; Ledig, J.;
By: Romer, F.; Deppner, M.; Strassburg, M.; Bergbauer, W.; Witzigmann, B.; Waag, A.; Neumann, R.; Ledig, J.;
Uncooled, polarization-insensitive AlGalnAs MQW-SOA module operable up to 75�C with constant current
2011 / IEEE / 978-1-55752-932-9By: Okumura, S.; Uetake, A.; Tanaka, S.; Morito, K.; Nakagawa, G.; Ekawa, M.;
2011 / IEEE / 978-1-4244-8340-2
By: Schaevitz, R.K.; Miller, D.A.B.; Harris, J.S.; Roth, J.E.; Tasyurek, E.; Ren, S.; Claussen, S.A.; Yiwen Rong; Audet, R.M.; Ly-Gagnon, D.S.; Edwards, E.H.;
By: Schaevitz, R.K.; Miller, D.A.B.; Harris, J.S.; Roth, J.E.; Tasyurek, E.; Ren, S.; Claussen, S.A.; Yiwen Rong; Audet, R.M.; Ly-Gagnon, D.S.; Edwards, E.H.;
2011 / IEEE / 978-1-4577-1295-1
By: Dutkiewicz, E.; Gengfa Fang; Yihuai Yang; Vesilo, R.; Huq, M.A.;
By: Dutkiewicz, E.; Gengfa Fang; Yihuai Yang; Vesilo, R.; Huq, M.A.;
2011 / IEEE / 978-4-8634-8182-4
By: Yamada, H.; Ueyama, Y.; Kaneshige, H.; Kokubun, Y.; Arakawa, T.;
By: Yamada, H.; Ueyama, Y.; Kaneshige, H.; Kokubun, Y.; Arakawa, T.;
2011 / IEEE / 978-1-4244-9965-6
By: Yunpeng Wang; Nakano, Y.; Sugiyama, M.; Watanabe, K.; Sodabanlu, H.; Yu Wen;
By: Yunpeng Wang; Nakano, Y.; Sugiyama, M.; Watanabe, K.; Sodabanlu, H.; Yu Wen;
2011 / IEEE / 978-1-4244-9965-6
By: Lumb, M.; Dobbin, A.L.; Fuhrer, M.; Ekins-Daukes, N.J.; Rees, V.; Airey, R.J.; Adams, J.G.J.; Connolly, J.P.; Browne, B.C.; Barnham, K.W.J.; Kan-Hua Lee; Tibbits, T.N.D.; Roberts, J.S.; Mazzer, M.;
By: Lumb, M.; Dobbin, A.L.; Fuhrer, M.; Ekins-Daukes, N.J.; Rees, V.; Airey, R.J.; Adams, J.G.J.; Connolly, J.P.; Browne, B.C.; Barnham, K.W.J.; Kan-Hua Lee; Tibbits, T.N.D.; Roberts, J.S.; Mazzer, M.;
2011 / IEEE / 978-0-8194-8961-6
By: Zhang, Hui; Li, Yicen; Mei, Ting; Teng, Jinghua; Zhang, Dao Hua; Zhu, Ning;
By: Zhang, Hui; Li, Yicen; Mei, Ting; Teng, Jinghua; Zhang, Dao Hua; Zhu, Ning;
2012 / IEEE / 978-1-4673-0192-3
By: Boeuf, F.; Pananakakis, G.; Monfray, S.; Lacord, J.; Ghibaudo, G.; Rafhay, Q.; Dutta, T.; Clerc, R.;
By: Boeuf, F.; Pananakakis, G.; Monfray, S.; Lacord, J.; Ghibaudo, G.; Rafhay, Q.; Dutta, T.; Clerc, R.;
2011 / IEEE / 978-0-8194-8961-6
By: Zhao, Lingjuan; Shao, Yongbo; Wang, Wei; Zhu, Hongliang; Wang, Baojun; Pan, Jiaoqing; Yu, Hongyan;
By: Zhao, Lingjuan; Shao, Yongbo; Wang, Wei; Zhu, Hongliang; Wang, Baojun; Pan, Jiaoqing; Yu, Hongyan;
2012 / IEEE / 978-1-4673-1257-8
By: Witters, L.; Eneman, G.; Hellings, G.; Togo, M.; Mitard, J.; Douhard, B.; Kambham, A.K.; Sasaki, Y.; Zschaetzsch, G.; Horiguchi, N.; Thean, A.; Vandervorst, W.; Collaert, N.; Noda, T.;
By: Witters, L.; Eneman, G.; Hellings, G.; Togo, M.; Mitard, J.; Douhard, B.; Kambham, A.K.; Sasaki, Y.; Zschaetzsch, G.; Horiguchi, N.; Thean, A.; Vandervorst, W.; Collaert, N.; Noda, T.;
2012 / IEEE / 978-1-4577-1619-5
By: Isella, G.; Marris-Morini, D.; Chaisakul, P.; Vivien, L.; Coudevylle, J.-R.; Chrastina, D.; Edmond, S.; Le Roux, X.; Izard, N.; Rouifed, M.-S.; Frigerio, J.;
By: Isella, G.; Marris-Morini, D.; Chaisakul, P.; Vivien, L.; Coudevylle, J.-R.; Chrastina, D.; Edmond, S.; Le Roux, X.; Izard, N.; Rouifed, M.-S.; Frigerio, J.;
2012 / IEEE / 978-1-4577-1619-5
By: Chaisakul, P.; Vivien, L.; Coudevylle, J.; Edmond, S.; Rouifed, M.; Marris-Morini, D.; Frigerio, J.; Chrastina, D.; Isella, G.; Le Roux, X.;
By: Chaisakul, P.; Vivien, L.; Coudevylle, J.; Edmond, S.; Rouifed, M.; Marris-Morini, D.; Frigerio, J.; Chrastina, D.; Isella, G.; Le Roux, X.;
2012 / IEEE / 978-1-4577-1865-6
By: Chaisakul, P.; Le Roux, X.; Vivien, L.; Coudevylle, J.; Edmond, S.; Marris-Morini, D.; Frigerio, J.; Chrastina, D.; Isella, G.; Rouifed, M.;
By: Chaisakul, P.; Le Roux, X.; Vivien, L.; Coudevylle, J.; Edmond, S.; Marris-Morini, D.; Frigerio, J.; Chrastina, D.; Isella, G.; Rouifed, M.;
2012 / IEEE / 978-1-4577-1865-6
By: Horiguchi, N.; Thean, A.; Caymax, M.; Eneman, G.; Hellings, G.; Winderickx, G.; Meuris, M.; Ong, P.; Brammertz, G.; Merckling, C.; Orzali, T.; Ngoc Duy Nguyen; Gang Wang; Waldron, N.;
By: Horiguchi, N.; Thean, A.; Caymax, M.; Eneman, G.; Hellings, G.; Winderickx, G.; Meuris, M.; Ong, P.; Brammertz, G.; Merckling, C.; Orzali, T.; Ngoc Duy Nguyen; Gang Wang; Waldron, N.;
2012 / IEEE / 978-1-4673-1164-9
By: Nguyen, N.V.; Gundlach, D.; Richter, C.A.; Kang Wang; Kun Xu; Peide Ye; Qin Zhang; Caifu Zeng;
By: Nguyen, N.V.; Gundlach, D.; Richter, C.A.; Kang Wang; Kun Xu; Peide Ye; Qin Zhang; Caifu Zeng;
Comparative study of LEDs conformally overgrown on multi-facet GaN NWs vs. conventional c-plane LEDs
2012 / IEEE / 978-1-4673-1164-9By: Paskova, T.; Van Den Broeck, D.M.; Frajtag, P.; Hosalli, A.M.; Bedair, S.M.; El-Masry, N.A.;
2012 / IEEE / 978-1-4673-1957-7
By: Bhowmick, T.K.; Hossain, G.M.I.; Soumitra, R.J.; Mohammedy, F.M.;
By: Bhowmick, T.K.; Hossain, G.M.I.; Soumitra, R.J.; Mohammedy, F.M.;