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Topic: Q Measurement
Results
2011 / IEEE / 978-1-61284-244-8
By: Mishra, U.K.; Speck, J.S.; Jing Lu; Singisetti, U.; Man Hoi Wong;
By: Mishra, U.K.; Speck, J.S.; Jing Lu; Singisetti, U.; Man Hoi Wong;
2011 / IEEE / 978-1-61284-385-8
By: Shankar, K.; Whittaker, W.; Moidel, J.; Jones, H.; Peterson, K.;
By: Shankar, K.; Whittaker, W.; Moidel, J.; Jones, H.; Peterson, K.;
2011 / IEEE / 978-1-4577-0668-4
By: Benfatto, I.; Mankani, A.D.; Gadeau, B.; Cardoso-Rodrigues, D.; Gascon, J.; Hourtoule, J.; Goff, J.K.; Tao, J.;
By: Benfatto, I.; Mankani, A.D.; Gadeau, B.; Cardoso-Rodrigues, D.; Gascon, J.; Hourtoule, J.; Goff, J.K.; Tao, J.;
2011 / IEEE / 978-1-4577-0668-4
By: Silva, M.; Pagonakis, I.; Tran, M.Q.; Tran, T.M.; Porte, L.; Hogge, J.-P.; Goodman, T.P.; Felici, F.; Alberti, S.;
By: Silva, M.; Pagonakis, I.; Tran, M.Q.; Tran, T.M.; Porte, L.; Hogge, J.-P.; Goodman, T.P.; Felici, F.; Alberti, S.;
2011 / IEEE / 978-1-4577-1617-1
By: Deivasigamani, M.; Jantsch, A.; Shaoteng Liu; Aslam, H.B.; Ijaz, H.; Mustafa, N.; Tabatabaei, S.;
By: Deivasigamani, M.; Jantsch, A.; Shaoteng Liu; Aslam, H.B.; Ijaz, H.; Mustafa, N.; Tabatabaei, S.;
2011 / IEEE / 978-89-93215-03-8
By: Hyung Gyu Park; Kil Soo Lee; Myung Kuk Kim; Dong Jin Kim; Man Hyung Lee;
By: Hyung Gyu Park; Kil Soo Lee; Myung Kuk Kim; Dong Jin Kim; Man Hyung Lee;
2011 / IEEE / 978-1-4577-1931-8
By: Hye-Chung Kum; Xiaoming Jin; Jian-Tao Sun; Xiaochuan Ni; Wei Cheng; Wei Wang; Xiang Zhang;
By: Hye-Chung Kum; Xiaoming Jin; Jian-Tao Sun; Xiaochuan Ni; Wei Cheng; Wei Wang; Xiang Zhang;
2011 / IEEE / 978-1-4673-0120-6
By: Bindley, G.; Priest, A.; Awadalla, S.; Amman, M.; Galloway, M.L.; Zoglauer, A.; Vetter, K.; Taherion, S.; Boggs, S.E.; Negut, V.; Mihailescu, L.; Marthandam, P.; Luke, P.N.; Lee, J.S.; Chivers, D.; Chen, H.;
By: Bindley, G.; Priest, A.; Awadalla, S.; Amman, M.; Galloway, M.L.; Zoglauer, A.; Vetter, K.; Taherion, S.; Boggs, S.E.; Negut, V.; Mihailescu, L.; Marthandam, P.; Luke, P.N.; Lee, J.S.; Chivers, D.; Chen, H.;
2011 / IEEE / 978-1-4673-0120-6
By: Cindro, V.; Mandic, I.; Nicolas, L.; Miyagawa, P.S.; Dawson, I.; Deliyergiyev, M.; Franz, S.; Hartert, J.; Mikuz, M.; Kramberger, G.; Gorisek, A.;
By: Cindro, V.; Mandic, I.; Nicolas, L.; Miyagawa, P.S.; Dawson, I.; Deliyergiyev, M.; Franz, S.; Hartert, J.; Mikuz, M.; Kramberger, G.; Gorisek, A.;
2011 / IEEE / 978-1-4577-1109-1
By: Kotrashetti, A.; Fernandes, F.; John, M.; Gupte, V.; D'Silva, R.; Bonde, S.;
By: Kotrashetti, A.; Fernandes, F.; John, M.; Gupte, V.; D'Silva, R.; Bonde, S.;
2011 / IEEE / 978-1-4673-0120-6
By: Szczesniak, T.; Baszak, J.; Wolski, D.; Szawlowski, M.; Grodzicka, M.; Moszynski, M.;
By: Szczesniak, T.; Baszak, J.; Wolski, D.; Szawlowski, M.; Grodzicka, M.; Moszynski, M.;
2011 / IEEE / 978-0-8194-8961-6
By: Song, Yanrong; Zhang, Xinping; Tian, Jinrong; Li, Qizhi; Wang, Li;
By: Song, Yanrong; Zhang, Xinping; Tian, Jinrong; Li, Qizhi; Wang, Li;
2011 / IEEE / 978-1-4577-0631-8
By: Teranishi, K.; Maetani, M.; Su Zhehong; Nakagawa, R.; Manabe, Y.; Takahashi, A.; Shimomura, N.;
By: Teranishi, K.; Maetani, M.; Su Zhehong; Nakagawa, R.; Manabe, Y.; Takahashi, A.; Shimomura, N.;
2012 / IEEE / 978-1-4673-1780-1
By: Murayama, Y.; Nakano, H.; Fukuda, S.; Fujimaki, K.; Kozakai, O.; Murakami, T.;
By: Murayama, Y.; Nakano, H.; Fukuda, S.; Fujimaki, K.; Kozakai, O.; Murakami, T.;
2012 / IEEE / 978-1-4673-0387-3
By: Ling Pei; Kuusniemi, H.; Kroger, T.; Liang Chen; Ruotsalainen, L.; Ruizhi Chen; Yuwei Chen; Yiwu Wang; Jingbin Liu; Tenhunen, T.;
By: Ling Pei; Kuusniemi, H.; Kroger, T.; Liang Chen; Ruotsalainen, L.; Ruizhi Chen; Yuwei Chen; Yiwu Wang; Jingbin Liu; Tenhunen, T.;
2012 / IEEE / 978-1-4673-0292-0
By: Guinvarc'h, Regis; Jouvie, francois; Picard, Dominique; Serhir, Mohammed; Ribiere-Tharaud, Nicolas;
By: Guinvarc'h, Regis; Jouvie, francois; Picard, Dominique; Serhir, Mohammed; Ribiere-Tharaud, Nicolas;
2012 / IEEE / 978-1-4673-1088-8
By: Matsuzawa, Hirofumi; Akiyama, Tomohiro; Hirano, Yoshihito; Ando, Toshiyuki; Haraguchi, Eisuke;
By: Matsuzawa, Hirofumi; Akiyama, Tomohiro; Hirano, Yoshihito; Ando, Toshiyuki; Haraguchi, Eisuke;
2012 / IEEE / 978-1-4673-1148-9
By: Haghdadi, Navid; Miragha, Fariborz; Iman-Eini, Hossein; Farivar, Ghias;
By: Haghdadi, Navid; Miragha, Fariborz; Iman-Eini, Hossein; Farivar, Ghias;