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Topic: Pump Lasers
Results
2011 / IEEE
By: Lujian Chen; Duanduan Wu; Min Zhou; Zhengqian Luo; Chenchun Ye; Zhiping Cai; Huiying Xu; Jun Dong; Jian Weng;
By: Lujian Chen; Duanduan Wu; Min Zhou; Zhengqian Luo; Chenchun Ye; Zhiping Cai; Huiying Xu; Jun Dong; Jian Weng;
2011 / IEEE
By: Bingham, R.; Silva, L.O.; Fonseca, R.A.; Fiuza, F.; Trines, R.M.G.M.; Norreys, P.A.; Cairns, R.A.;
By: Bingham, R.; Silva, L.O.; Fonseca, R.A.; Fiuza, F.; Trines, R.M.G.M.; Norreys, P.A.; Cairns, R.A.;
2011 / IEEE
By: Malcolm, G.; Maker, G.; Robertson, G.; Butkus, M.; Rafailov, E.U.; Hamilton, C.; Yang Qiu; Walther, T.; Hogg, R.A.; Stevens, B.J.; Krysa, A.B.;
By: Malcolm, G.; Maker, G.; Robertson, G.; Butkus, M.; Rafailov, E.U.; Hamilton, C.; Yang Qiu; Walther, T.; Hogg, R.A.; Stevens, B.J.; Krysa, A.B.;
2012 / IEEE
By: Shambat, G.; Ellis, B.; Petykiewicz, J.; Mayer, M.A.; Vuckovic, J.; Sarmiento, T.; Harris, J.S.; Haller, E.E.; Majumdar, A.;
By: Shambat, G.; Ellis, B.; Petykiewicz, J.; Mayer, M.A.; Vuckovic, J.; Sarmiento, T.; Harris, J.S.; Haller, E.E.; Majumdar, A.;
Investigation on Back-Reflected Pumping Light in High-Power Quasi-End-Pumped Yb:YAG Thin-Disk Lasers
2012 / IEEEBy: Radmard, S.; Kazemi, S.; Shayganmanesh, M.; Arabgari, S.;
2012 / IEEE
By: Weixia Lan; Xuebin Wan; Zhaojun Liu; Xingyu Zhang; Guofan Jin; Qingpu Wang; Fen Bai; Huaijin Zhang;
By: Weixia Lan; Xuebin Wan; Zhaojun Liu; Xingyu Zhang; Guofan Jin; Qingpu Wang; Fen Bai; Huaijin Zhang;
2012 / IEEE
By: Gaomeng Wang; Li Zhan; Qishun Shen; Pingping Xiao; Zhijing Wu; Jinmei Liu; Liang Zhang; Xuesong Liu;
By: Gaomeng Wang; Li Zhan; Qishun Shen; Pingping Xiao; Zhijing Wu; Jinmei Liu; Liang Zhang; Xuesong Liu;
2012 / IEEE
By: Dong-Yo Jheng; Kuang-Yu Hsu; Sheng-Lung Huang; Chien-Chih Lai; Tuan-Shu Ho; Yi-Han Liao;
By: Dong-Yo Jheng; Kuang-Yu Hsu; Sheng-Lung Huang; Chien-Chih Lai; Tuan-Shu Ho; Yi-Han Liao;
2012 / IEEE
By: Quarterman, A.H.; Kbashi, H.J.; Wilcox, K.G.; Tropper, A.C.; Henini, M.; Apostolopoulos, V.; Morris, O.J.;
By: Quarterman, A.H.; Kbashi, H.J.; Wilcox, K.G.; Tropper, A.C.; Henini, M.; Apostolopoulos, V.; Morris, O.J.;
2012 / IEEE
By: Koch, S.W.; Moloney, J.V.; Yarborough, M.J.; Hader, J.; Kunert, B.; Tsuei-Lian Wang; Laurain, A.; Stolz, W.;
By: Koch, S.W.; Moloney, J.V.; Yarborough, M.J.; Hader, J.; Kunert, B.; Tsuei-Lian Wang; Laurain, A.; Stolz, W.;
2012 / IEEE
By: Ebendorff-Heidepriem, H.; Oermann, M.R.; Monro, T.M.; Veitch, P.J.; Lancaster, D.G.; Ottaway, D.J.;
By: Ebendorff-Heidepriem, H.; Oermann, M.R.; Monro, T.M.; Veitch, P.J.; Lancaster, D.G.; Ottaway, D.J.;
2012 / IEEE
By: Modotto, D.; Tonello, A.; Bettenzana, M.; Krupa, K.; Manili, G.; Wabnitz, S.; Barthelemy, A.; Di Bin, P.; Couderc, V.;
By: Modotto, D.; Tonello, A.; Bettenzana, M.; Krupa, K.; Manili, G.; Wabnitz, S.; Barthelemy, A.; Di Bin, P.; Couderc, V.;
2012 / IEEE
By: Haiwen Cai; Fei Yang; Zhengqing Pan; Qing Ye; Ronghui Qu; Yunqi Hao; Zhongmin Yang; Qinyuan Zhang;
By: Haiwen Cai; Fei Yang; Zhengqing Pan; Qing Ye; Ronghui Qu; Yunqi Hao; Zhongmin Yang; Qinyuan Zhang;
2012 / IEEE
By: Hongwei Qu; Bin Jiang; Yufei Wang; Jianxin Zhang; Lei Liu; Wanhua Zheng; Yejin Zhang;
By: Hongwei Qu; Bin Jiang; Yufei Wang; Jianxin Zhang; Lei Liu; Wanhua Zheng; Yejin Zhang;
2012 / IEEE
By: Shori, R.K.; Poutous, M.K.; Pung, A.J.; Woodward, R.H.; Srimathi, I.R.; Yuan Li; Johnson, E.G.;
By: Shori, R.K.; Poutous, M.K.; Pung, A.J.; Woodward, R.H.; Srimathi, I.R.; Yuan Li; Johnson, E.G.;
2012 / IEEE
By: Gilfert, C.; Krakowski, M.; Michel, N.; Traub, M.; Westphalen, T.; Reithmaier, J.P.; Pavelescu, E.-M.;
By: Gilfert, C.; Krakowski, M.; Michel, N.; Traub, M.; Westphalen, T.; Reithmaier, J.P.; Pavelescu, E.-M.;
2012 / IEEE
By: Chavez-Pirson, A.; Petersen, E.; Wei Shi; Renjie Zhou; Peyghambarian, N.; Stephen, M.;
By: Chavez-Pirson, A.; Petersen, E.; Wei Shi; Renjie Zhou; Peyghambarian, N.; Stephen, M.;
2012 / IEEE
By: Yuen Tsang; Xue Chun Lin; Jin Min Li; Wei Hou; Yan Qu; Ling Zhang; Ying Ying Yang; Wei Sun; Hai Juan Yu; Yong Gang Wang; Ze Hua Han;
By: Yuen Tsang; Xue Chun Lin; Jin Min Li; Wei Hou; Yan Qu; Ling Zhang; Ying Ying Yang; Wei Sun; Hai Juan Yu; Yong Gang Wang; Ze Hua Han;
1992 / IEEE / 000-0-0000-0000-0
By: Kasuya, K.; Ohshita, E.; Kawakita, Y.; Miyai, Y.; Nakata, K.; Miyoshi, T.; Matsuura, N.; Hushiki, T.; Horioka, K.;
By: Kasuya, K.; Ohshita, E.; Kawakita, Y.; Miyai, Y.; Nakata, K.; Miyoshi, T.; Matsuura, N.; Hushiki, T.; Horioka, K.;
1992 / IEEE / 000-0-0000-0000-0
By: Kuznetsov, V.E.; Ovsyannikov, V.A.; Jeremkin, V.V.; Vodovosov, V.M.; Vasilevsky, M.A.; Burtsev, V.A.; Bolshakov, E.P.; Streltsov, A.P.; Baranov, V.Y.; Chetvertkov, V.L.; Cheraobrovin, V.I.; Finkelstein, K.I.; Pidelskaya, R.F.; Prokopenko, V.F.; Peohersky, O.P.;
By: Kuznetsov, V.E.; Ovsyannikov, V.A.; Jeremkin, V.V.; Vodovosov, V.M.; Vasilevsky, M.A.; Burtsev, V.A.; Bolshakov, E.P.; Streltsov, A.P.; Baranov, V.Y.; Chetvertkov, V.L.; Cheraobrovin, V.I.; Finkelstein, K.I.; Pidelskaya, R.F.; Prokopenko, V.F.; Peohersky, O.P.;
2002 / IEEE / 978-0-7354-0107-5
By: Kasuya, Koichi; Kamiya, Takahiro; Nakai, Sadao; Yamanaka, Tatsuhiko; Okihara, Sin-ichiro; Shimizu, Seiji; Sakabe, Shuhji; Mroz, Waldemar; Sugimoto, Takehisa;
By: Kasuya, Koichi; Kamiya, Takahiro; Nakai, Sadao; Yamanaka, Tatsuhiko; Okihara, Sin-ichiro; Shimizu, Seiji; Sakabe, Shuhji; Mroz, Waldemar; Sugimoto, Takehisa;
2006 / IEEE / 978-3-9805741-8-1
By: Kopylov, L.N.; Novoselov, A.V.; Elkin, G.A.; Domnin, Y.S.; Pal'chikov, V.G.; Malychev, Y.M.; Baryshev, V.N.;
By: Kopylov, L.N.; Novoselov, A.V.; Elkin, G.A.; Domnin, Y.S.; Pal'chikov, V.G.; Malychev, Y.M.; Baryshev, V.N.;
2011 / IEEE / 978-3-8007-3356-9
By: Takeda, K.; Matsuo, S.; Notomi, M.; Taniyama, H.; Kawaguchi, Y.; Chin-Hui Chen; Nozaki, K.; Shinya, A.; Sato, T.;
By: Takeda, K.; Matsuo, S.; Notomi, M.; Taniyama, H.; Kawaguchi, Y.; Chin-Hui Chen; Nozaki, K.; Shinya, A.; Sato, T.;
2011 / IEEE / 978-3-8007-3356-9
By: Osabe, R.; Shindo, T.; Futami, M.; Okumura, T.; Ito, H.; Arai, S.; Nishiyama, N.; Amemiya, T.; Koguchi, T.;
By: Osabe, R.; Shindo, T.; Futami, M.; Okumura, T.; Ito, H.; Arai, S.; Nishiyama, N.; Amemiya, T.; Koguchi, T.;
2011 / IEEE / 978-1-4244-5731-1
By: Villeneuve, A.; Dubois, J.; Chateauneuf, M.; Theberge, F.; Burgoyne, B.; Salhany, J.;
By: Villeneuve, A.; Dubois, J.; Chateauneuf, M.; Theberge, F.; Burgoyne, B.; Salhany, J.;
2011 / IEEE / 978-986-02-8974-9
By: Hongtao Zhou; Ying Huang; Ming Tang; Eng Leong Tan; Feng Luan; Songnian Fu; Shum, P.P.;
By: Hongtao Zhou; Ying Huang; Ming Tang; Eng Leong Tan; Feng Luan; Songnian Fu; Shum, P.P.;
2011 / IEEE / 978-986-02-8974-9
By: Hsin-Chia Su; Chih-Lin Wang; Hong-Xi Tsao; Tzong-Yow Tsai; Chien-Ming Huang; Chih-Li Chen; Shih-Ting Lin; Chieh Hu; Yao-Wun Jhang;
By: Hsin-Chia Su; Chih-Lin Wang; Hong-Xi Tsao; Tzong-Yow Tsai; Chien-Ming Huang; Chih-Li Chen; Shih-Ting Lin; Chieh Hu; Yao-Wun Jhang;
2011 / IEEE / 978-986-02-8974-9
By: Chien-Ming Huang; Chieh Hu; Shih-Ting Lin; Hsin-Chia Su; Yao-Wun Jhang;
By: Chien-Ming Huang; Chieh Hu; Shih-Ting Lin; Hsin-Chia Su; Yao-Wun Jhang;
2011 / IEEE / 978-1-61284-878-5
By: Seddon, A.; Furniss, D.; Jaworski, P.; Gora, W.; Benson, T.M.; Beres-Pawlik, E.; Sojka, L.; Sujecki, S.; Mergo, P.;
By: Seddon, A.; Furniss, D.; Jaworski, P.; Gora, W.; Benson, T.M.; Beres-Pawlik, E.; Sojka, L.; Sujecki, S.; Mergo, P.;
2011 / IEEE / 978-1-55752-932-9
By: Khopin, V.F.; Melkumov, M.A.; Firstov, S.V.; Medvedkov, O.I.; Guryanov, A.N.; Shubin, A.V.; Bufetov, I.A.; Dianov, E.M.;
By: Khopin, V.F.; Melkumov, M.A.; Firstov, S.V.; Medvedkov, O.I.; Guryanov, A.N.; Shubin, A.V.; Bufetov, I.A.; Dianov, E.M.;
Bidirectional, Raman extended GPON with 50 km reach and 1:64 split using wavelength stabilised pumps
2011 / IEEE / 978-1-55752-932-9By: Wright, P.; Farrow, K.; Nesset, D.;
2011 / IEEE / 978-1-4577-0509-0
By: Scheller, M.; Walker, C.; d'Aubigny, C.; Koch, S.W.; Young, A.; Koch, M.; Moloney, J.V.; Fallahi, M.; Yarborough, J.M.;
By: Scheller, M.; Walker, C.; d'Aubigny, C.; Koch, S.W.; Young, A.; Koch, M.; Moloney, J.V.; Fallahi, M.; Yarborough, J.M.;
2011 / IEEE / 978-1-4577-0509-0
By: Katz, S.; Grasse, C.; Vizbaras, A.; Adams, R.W.; Belkin, M.A.; Boehm, G.; Amann, M.C.; Belyanin, A.A.; Cho, Y.; Jang, M.; Vijayraghavan, K.;
By: Katz, S.; Grasse, C.; Vizbaras, A.; Adams, R.W.; Belkin, M.A.; Boehm, G.; Amann, M.C.; Belyanin, A.A.; Cho, Y.; Jang, M.; Vijayraghavan, K.;
2011 / IEEE / 978-1-4577-0509-0
By: Kawabe, S.; Kaneko, R.; Tonouchi, M.; Mori, Y.; Kawase, K.; Kawayama, I.; Suizu, K.; Yoshimura, M.; Shibuya, T.; Takahashi, Y.; Murakami, H.;
By: Kawabe, S.; Kaneko, R.; Tonouchi, M.; Mori, Y.; Kawase, K.; Kawayama, I.; Suizu, K.; Yoshimura, M.; Shibuya, T.; Takahashi, Y.; Murakami, H.;
2011 / IEEE / 978-1-4577-0509-0
By: Murakami, H.; Kawayama, I.; Kawabe, S.; Kaneko, R.; Tonouchi, M.;
By: Murakami, H.; Kawayama, I.; Kawabe, S.; Kaneko, R.; Tonouchi, M.;