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Topic: Pulse Repetition Frequency
Results
2011 / IEEE
By: Kai Wang; Kandulski, W.; Calver, J.; Rygate, J.; Zakariyah, S.S.; Selviah, D.R.; Hutt, D.A.; Conway, P.P.;
By: Kai Wang; Kandulski, W.; Calver, J.; Rygate, J.; Zakariyah, S.S.; Selviah, D.R.; Hutt, D.A.; Conway, P.P.;
2012 / IEEE
By: Bassani, R.A.; Buiochi, F.; Hartman, E.; Miller, R.J.; Buiochi, E.B.; O'Brien, W.D.; Costa, E.T.;
By: Bassani, R.A.; Buiochi, F.; Hartman, E.; Miller, R.J.; Buiochi, E.B.; O'Brien, W.D.; Costa, E.T.;
2011 / IEEE / 978-0-9541146-3-3
By: Clemens, P.; Braun, C.; Adami, C.; Taenzer, A.; Schmidt, H.U.; Suhrke, M.;
By: Clemens, P.; Braun, C.; Adami, C.; Taenzer, A.; Schmidt, H.U.; Suhrke, M.;
2012 / IEEE / 978-0-7695-4647-6
By: Xu Chunguang; Xiao Dingguo; Zhang Xiaoli; Lian Xiaoqin; Wang Jingrui;
By: Xu Chunguang; Xiao Dingguo; Zhang Xiaoli; Lian Xiaoqin; Wang Jingrui;
2011 / IEEE / 978-1-4577-0631-8
By: Mayes, J.R.; Lara, M.; Nunnally, C.; Kohlenberg, D.; Nunnally, W.C.;
By: Mayes, J.R.; Lara, M.; Nunnally, C.; Kohlenberg, D.; Nunnally, W.C.;
A vertical beamforming design approach for increased area coverage rate for synthetic aperture sonar
1989 / IEEEBy: Nelander, J.C.; Wright, J.A.; Kenton, A.C.;
1993 / IEEE
By: Jensen, J.R.; Marth, P.C.; Koblinsky, C.J.; Rossi, L.C.; Purdy, C.L.; Hayne, G.S.; Hancock, D.W.; MacArthur, J.L.; Perschy, J.A.; Kilgus, C.C.;
By: Jensen, J.R.; Marth, P.C.; Koblinsky, C.J.; Rossi, L.C.; Purdy, C.L.; Hayne, G.S.; Hancock, D.W.; MacArthur, J.L.; Perschy, J.A.; Kilgus, C.C.;
1993 / IEEE / 0-7803-1360-7
By: Boulais, K.; Choe, J.Y.; Chun, S.T.; Brown, M.; Engles, R.; Irwin, K.;
By: Boulais, K.; Choe, J.Y.; Chun, S.T.; Brown, M.; Engles, R.; Irwin, K.;
1998 / IEEE / 0-7803-4095-7
By: Chang, P.P.; Crum, L.A.; Poliachik, S.L.; Mourad, P.D.; Wen-Shing Chen;
By: Chang, P.P.; Crum, L.A.; Poliachik, S.L.; Mourad, P.D.; Wen-Shing Chen;
1999 / IEEE / 0-7803-5498-2
By: Gaudreau, M.P.J.; Mulvaney, J.M.; Kempkes, M.A.; Hawkey, T.J.; Casey, J.;
By: Gaudreau, M.P.J.; Mulvaney, J.M.; Kempkes, M.A.; Hawkey, T.J.; Casey, J.;
1999 / IEEE / 0-7803-5722-1
By: Leue, W.M.; Daft, C.M.W.; Odegaard, L.A.; Macdonald, M.C.; Thomenius, K.E.;
By: Leue, W.M.; Daft, C.M.W.; Odegaard, L.A.; Macdonald, M.C.; Thomenius, K.E.;