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Topic: Pulse Measurements
Results
2011 / IEEE
By: Singh, A.; Roy, F.A.; Perk Lin Chong; Abdou, A.E.; Talebitaher, A.; Wong, D.; Rawat, R.S.; Saw, S.H.; Sing Lee; Lee, P.; Devi, K.;
By: Singh, A.; Roy, F.A.; Perk Lin Chong; Abdou, A.E.; Talebitaher, A.; Wong, D.; Rawat, R.S.; Saw, S.H.; Sing Lee; Lee, P.; Devi, K.;
2011 / IEEE
By: Massengill, L.W.; Chen, L.; Zhang, E.X.; Loveless, T.D.; Ahlbin, J.R.; Gaspard, N.J.; Gadlage, M.J.; Atkinson, N.M.; Bhuva, B.L.;
By: Massengill, L.W.; Chen, L.; Zhang, E.X.; Loveless, T.D.; Ahlbin, J.R.; Gaspard, N.J.; Gadlage, M.J.; Atkinson, N.M.; Bhuva, B.L.;
2011 / IEEE
By: Gaspard, N.J.; Witulski, A.F.; Ahlbin, J.R.; Atkinson, N.M.; Holman, W.T.; Li Chen; Massengill, L.W.; Zhang, E.X.; Bhuva, B.L.;
By: Gaspard, N.J.; Witulski, A.F.; Ahlbin, J.R.; Atkinson, N.M.; Holman, W.T.; Li Chen; Massengill, L.W.; Zhang, E.X.; Bhuva, B.L.;
2012 / IEEE
By: Beebe, S.J.; Yu Jing; Kolb, J.F.; Jie Zhuang; Jiahui Song; Camp, J.T.; Schoenbach, K.H.; Shu Xiao; Joshi, R.P.;
By: Beebe, S.J.; Yu Jing; Kolb, J.F.; Jie Zhuang; Jiahui Song; Camp, J.T.; Schoenbach, K.H.; Shu Xiao; Joshi, R.P.;
2012 / IEEE
By: Chen Shuming; He Yibai; Huang Pengcheng; Du Yankang; Qin Junrui; Liu Biwei; Liang Bin; Chi Yaqing; Chen Jianjun;
By: Chen Shuming; He Yibai; Huang Pengcheng; Du Yankang; Qin Junrui; Liu Biwei; Liang Bin; Chi Yaqing; Chen Jianjun;
CdTe Linear Pixel X-Ray Detector With Enhanced Spectrometric Performance for High Flux X-Ray Imaging
2012 / IEEEBy: Rinkel, J.; Ouvrier-Buffet, P.; Brambilla, A.; Verger, L.; Boudou, C.; Gonon, G.;
2012 / IEEE
By: Pin, P.; Kondrasovs, V.; Normand, S.; Tondut, L.; Corre, G.; Woo, R.; Bourbotte, J.-M.; Blanc de Lanaute, N.; Boudergui, K.;
By: Pin, P.; Kondrasovs, V.; Normand, S.; Tondut, L.; Corre, G.; Woo, R.; Bourbotte, J.-M.; Blanc de Lanaute, N.; Boudergui, K.;
2012 / IEEE
By: Yong-Hoon Kim; Kwang-Uk Chu; Kyung-Hoon Lee; Up Namgoong; Ui-Jung Kim; Seung-Kab Ryu;
By: Yong-Hoon Kim; Kwang-Uk Chu; Kyung-Hoon Lee; Up Namgoong; Ui-Jung Kim; Seung-Kab Ryu;
2012 / IEEE
By: Omarsson, B.; Hanson, T.L.; Nicolelis, M.A.L.; Lebedev, M.A.; Peikon, I.D.; O'Doherty, J.E.;
By: Omarsson, B.; Hanson, T.L.; Nicolelis, M.A.L.; Lebedev, M.A.; Peikon, I.D.; O'Doherty, J.E.;
2012 / IEEE
By: Bo Zhang; Liang Li; Zhongyu Zhou; Quanliang Cao; Yuying Wu; Ziyu Chen; Zhengcai Xia;
By: Bo Zhang; Liang Li; Zhongyu Zhou; Quanliang Cao; Yuying Wu; Ziyu Chen; Zhengcai Xia;
2002 / IEEE / 978-0-7354-0107-5
By: Lauer, E. J.; Caporaso, G. J.; Weir, J.; Sampayan, S.; Richardson, R.; McCarrick, J.; Chambers, F. W.; Chen, Y-J; Falabella, S.; Guethlein, G.;
By: Lauer, E. J.; Caporaso, G. J.; Weir, J.; Sampayan, S.; Richardson, R.; McCarrick, J.; Chambers, F. W.; Chen, Y-J; Falabella, S.; Guethlein, G.;
2002 / IEEE / 978-0-7354-0107-5
By: Scholz, Marek; Bienkowska, Barbara; Vitulli, Silvia; Romanova, Vera; Kravarik, Josef; Kubes, Pavel; Schmidt, Hellmut; Banaszak, Aneta; Ivanova-Stanik, Irena; Karpinski, Leslaw; Miklaszewski, Ryszard; Paduch, Marian; Tomaszewski, Krzysztof; Zielinska, Ewa; Sadowski, Marek J.; Jakubowski, Lech; Szydlowski, Adam;
By: Scholz, Marek; Bienkowska, Barbara; Vitulli, Silvia; Romanova, Vera; Kravarik, Josef; Kubes, Pavel; Schmidt, Hellmut; Banaszak, Aneta; Ivanova-Stanik, Irena; Karpinski, Leslaw; Miklaszewski, Ryszard; Paduch, Marian; Tomaszewski, Krzysztof; Zielinska, Ewa; Sadowski, Marek J.; Jakubowski, Lech; Szydlowski, Adam;
2004 / IEEE / 978-5-87911-088-3
By: Ning Ding; Cun Guo; Jianlun Yang; Zeping Xu; Jianjun Deng; Yuanchao Gu; Cheng Ning; Zhenghong Li; Xinsheng Hua; Xianjue Peng; Rongkun Xu; Yongjian Tang;
By: Ning Ding; Cun Guo; Jianlun Yang; Zeping Xu; Jianjun Deng; Yuanchao Gu; Cheng Ning; Zhenghong Li; Xinsheng Hua; Xianjue Peng; Rongkun Xu; Yongjian Tang;
2006 / IEEE / 978-3-9805741-8-1
By: Eikema, K.S.E.; Zinkstok, R.T.; Witte, S.; Hogervorst, W.; Ubachs, W.;
By: Eikema, K.S.E.; Zinkstok, R.T.; Witte, S.; Hogervorst, W.; Ubachs, W.;
2011 / IEEE / 978-1-4577-1226-5
By: Cormier, E.; Petit, S.; Hazera, C.; Lhermite, J.; Mansuryan, T.; Barthelemy, A.; Louradour, F.; Kalashyan, M.; Martinez-Leon, L.;
By: Cormier, E.; Petit, S.; Hazera, C.; Lhermite, J.; Mansuryan, T.; Barthelemy, A.; Louradour, F.; Kalashyan, M.; Martinez-Leon, L.;
2011 / IEEE / 978-1-61284-329-2
By: Tan, T.L.; Verma, R.; Rawat, R.S.; Shyam, A.; Springham, S.V.; Shariff, H.B.M.; Talebitaher, A.; Lee, P.;
By: Tan, T.L.; Verma, R.; Rawat, R.S.; Shyam, A.; Springham, S.V.; Shariff, H.B.M.; Talebitaher, A.; Lee, P.;
2011 / IEEE / 978-1-61284-175-5
By: Takamiya, M.; Sakurai, T.; Watanabe, K.; Chen, P.; Zhang, X.; Ryu, Y.; Ishida, K.; Pu, Y.; Okuma, Y.;
By: Takamiya, M.; Sakurai, T.; Watanabe, K.; Chen, P.; Zhang, X.; Ryu, Y.; Ishida, K.; Pu, Y.; Okuma, Y.;
2011 / IEEE / 978-1-4577-1043-8
By: Liang Wang; Mintang Li; Fengzhong Wang; Chong Ren; Dapeng Zhang; Ruzheng Pan;
By: Liang Wang; Mintang Li; Fengzhong Wang; Chong Ren; Dapeng Zhang; Ruzheng Pan;
2011 / IEEE / 978-1-4577-1589-1
By: Balaram, Sandhya K.; Luo, Jianwen; Li, Ronny X.; Konofagou, Elisa E.; Shahmirzadi, Danial; Lantis, John C.; Chaudhry, Farooq A.;
By: Balaram, Sandhya K.; Luo, Jianwen; Li, Ronny X.; Konofagou, Elisa E.; Shahmirzadi, Danial; Lantis, John C.; Chaudhry, Farooq A.;
2011 / IEEE / 978-1-55752-932-9
By: Kalashyan, M.; Zeytunyan, A.; Barthelemy, A.; Louradour, F.; Mouradian, L.; Yesayan, G.;
By: Kalashyan, M.; Zeytunyan, A.; Barthelemy, A.; Louradour, F.; Mouradian, L.; Yesayan, G.;
2011 / IEEE / 978-2-35500-016-4
By: Van Der Plas, G.; Kang, X.; Geens, K.; Marcon, D.; Stoffels, S.; Decoutere, S.; Van Hove, M.;
By: Van Der Plas, G.; Kang, X.; Geens, K.; Marcon, D.; Stoffels, S.; Decoutere, S.; Van Hove, M.;
2011 / IEEE / 978-1-4577-0509-0
By: Lievin, C.; Kern, S.; Gantenbein, G.; Illy, S.; Samartsev, A.; Choudhury, A.R.; Schlaich, A.; Thumm, M.;
By: Lievin, C.; Kern, S.; Gantenbein, G.; Illy, S.; Samartsev, A.; Choudhury, A.R.; Schlaich, A.; Thumm, M.;
2011 / IEEE / 978-1-4577-0509-0
By: Antonsen, T.M.; Shapiro, M.A.; Nusinovich, G.S.; Mastovsky, I.; Temkin, R.J.; Guss, W.C.; Sinitsyn, O.V.; Tax, D.S.;
By: Antonsen, T.M.; Shapiro, M.A.; Nusinovich, G.S.; Mastovsky, I.; Temkin, R.J.; Guss, W.C.; Sinitsyn, O.V.; Tax, D.S.;
2011 / IEEE / 978-1-4577-0653-0
By: Hasegawa-Ohira, M.; Nomura, S.; Ogawa, H.; Ishiguro, T.; Hanasaka, Y.;
By: Hasegawa-Ohira, M.; Nomura, S.; Ogawa, H.; Ishiguro, T.; Hanasaka, Y.;
2011 / IEEE / 978-1-4577-0509-0
By: Hsieh, Y.; Yasui, T.; Araki, T.; Minoshima, K.; Inaba, H.; Yokoyama, S.; Nose, M.;
By: Hsieh, Y.; Yasui, T.; Araki, T.; Minoshima, K.; Inaba, H.; Yokoyama, S.; Nose, M.;
2011 / IEEE / 978-89-93215-03-8
By: Kongkauroptham, J.; Petchmaneelumka, W.; Rerkratn, A.; Kaewpoonsuk, A.; Kraisoda, K.;
By: Kongkauroptham, J.; Petchmaneelumka, W.; Rerkratn, A.; Kaewpoonsuk, A.; Kraisoda, K.;
2011 / IEEE / 978-1-4577-1448-1
By: Sakanushi, K.; Tanaka, H.; Higashino, T.; Imai, M.; Hieda, T.; Takeuchi, Y.; Ode, Y.; Shiraishi, T.;
By: Sakanushi, K.; Tanaka, H.; Higashino, T.; Imai, M.; Hieda, T.; Takeuchi, Y.; Ode, Y.; Shiraishi, T.;
2011 / IEEE / 978-1-4577-1466-5
By: Zhou, H.; Mair, M.; Pichler, H.; Thottappillil, R.; Diendorfer, G.;
By: Zhou, H.; Mair, M.; Pichler, H.; Thottappillil, R.; Diendorfer, G.;
2011 / IEEE / 978-2-87487-023-1
By: Niessen, Daniel; Cignani, Rafael; Santarelli, Alberto; Filicori, Fabio; Traverso, Pier Andrea; D'Angelo, Sara;
By: Niessen, Daniel; Cignani, Rafael; Santarelli, Alberto; Filicori, Fabio; Traverso, Pier Andrea; D'Angelo, Sara;