Your Search Results
Use materials about this topic in your textbook!
AcademicPub holds over eight million pieces of educational content - such as case studies and journal articles - for you to mix-and-match your way.
Experience the freedom of customizing your course pack with AcademicPub!

Topic: Public Domain Software
Results
2012 / IEEE
By: McGraw, R.C.; Pinter, C.; Lasso, A.; Moult, E.; Sargent, D.; Ungi, T.; Fichtinger, G.;
By: McGraw, R.C.; Pinter, C.; Lasso, A.; Moult, E.; Sargent, D.; Ungi, T.; Fichtinger, G.;
2012 / IEEE
By: Hughes, J.S.; Ramirez, P.; Goodale, C.E.; Kelly, S.C.; Downs, R.R.; Hart, A.F.; Crichton, D.J.; Mattmann, C.A.; Lindsay, F.;
By: Hughes, J.S.; Ramirez, P.; Goodale, C.E.; Kelly, S.C.; Downs, R.R.; Hart, A.F.; Crichton, D.J.; Mattmann, C.A.; Lindsay, F.;
2010 / IEEE / 978-1-61284-986-7
By: Mark, E.; Hoffman, B.; Kirk, K.; Vines, J.; Clarke, J.; Angelini, R.; Leiter, K.; Martin, J.; Waisbrot, N.; Spear, C.;
By: Mark, E.; Hoffman, B.; Kirk, K.; Vines, J.; Clarke, J.; Angelini, R.; Leiter, K.; Martin, J.; Waisbrot, N.; Spear, C.;
2010 / IEEE / 978-1-4244-8598-7
By: Gow, G.; Waidyanatha, N.; Kaluarachchi, M.; Pradeeper, D.; Sampath, C.; Careem, M.; Janakiraman, N.; Ganesan, M.;
By: Gow, G.; Waidyanatha, N.; Kaluarachchi, M.; Pradeeper, D.; Sampath, C.; Careem, M.; Janakiraman, N.; Ganesan, M.;
2010 / IEEE / 978-1-60558-719-6
By: Pham, N.H.; Hoan Anh Nguyen; Tung Thanh Nguyen; Al-Kofahi, J.; Nguyen, T.N.;
By: Pham, N.H.; Hoan Anh Nguyen; Tung Thanh Nguyen; Al-Kofahi, J.; Nguyen, T.N.;
2011 / IEEE / 978-1-4577-1235-7
By: Halcu, I.; Sandulescu, V.; Neculoiu, G.; Grigoriu, O.; Marinescu, V.; Marinescu, M.; Barbulescu, M.;
By: Halcu, I.; Sandulescu, V.; Neculoiu, G.; Grigoriu, O.; Marinescu, V.; Marinescu, M.; Barbulescu, M.;
2011 / IEEE / 978-1-61284-709-2
By: Sanchez, F.; Houtgast, E.; Isaza, S.; Gaydadjiev, G.; Ramirez, A.;
By: Sanchez, F.; Houtgast, E.; Isaza, S.; Gaydadjiev, G.; Ramirez, A.;
2011 / IEEE / 978-1-4577-0513-7
By: des Roziers, C.B.; Vandaele, J.; Valentin, E.; Noel, T.; Ducrocq, T.; Chelius, G.; Gallais, A.; Fraboulet, A.; Fleury, E.; Mitton, N.;
By: des Roziers, C.B.; Vandaele, J.; Valentin, E.; Noel, T.; Ducrocq, T.; Chelius, G.; Gallais, A.; Fraboulet, A.; Fleury, E.; Mitton, N.;
2011 / IEEE / 978-1-4577-0513-7
By: Ghaddab, R.; Camara, D.; Bonnet, C.; Yilmaz, E.; Zayen, B.; Iacobelli, L.; Nussbaum, D.; Nikaein, N.; Mercier, B.; Knopp, R.; Kaltenberger, F.;
By: Ghaddab, R.; Camara, D.; Bonnet, C.; Yilmaz, E.; Zayen, B.; Iacobelli, L.; Nussbaum, D.; Nikaein, N.; Mercier, B.; Knopp, R.; Kaltenberger, F.;
2011 / IEEE / 978-1-61284-372-8
By: Jiahua He; Frumkin, M.A.; Van der Wijngaart, R.F.; Snavely, A.E.;
By: Jiahua He; Frumkin, M.A.; Van der Wijngaart, R.F.; Snavely, A.E.;
2011 / IEEE / 978-1-4577-0879-4
By: Keqing He; Xiuwei Zhang; Jianxiao Liu; Bo Hu; Jian Wang; Dunhui Yu; Liang-Jie Zhang;
By: Keqing He; Xiuwei Zhang; Jianxiao Liu; Bo Hu; Jian Wang; Dunhui Yu; Liang-Jie Zhang;
2011 / IEEE / 978-0-7695-4534-9
By: Ramanathan, C.; Prabhu, S.S.; Madishetty, B.; Prakash, P.V.S.K.;
By: Ramanathan, C.; Prabhu, S.S.; Madishetty, B.; Prakash, P.V.S.K.;