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Topic: Propagation Losses
Results
Measurements and Simulations of Wave Propagation for Wireless Sensor Networks in Jet Engine Turbines
2011 / IEEEBy: Gruden, M.; Rydberg, A.; Jobs, M.;
Millimeter-Sized Microfiber Coil Resonators With Enhanced Quality Factors by Increasing Coil Numbers
2012 / IEEEBy: Wang, L.A.; Tz-Shiuan Peng; Yi-Chang Hsieh;
2012 / IEEE
By: Giannoulis, G.; Pleros, N.; Apostolopoulos, D.; Papaioannou, S.; Kumar, A.; Bozhevolnyi, S.; Markey, L.; Hassan, K.; Weeber, J.-C.; Dereux, A.; Baus, M.; Karl, M.; Tekin, T.; Tsilipakos, O.; Pitilakis, A.K.; Kriezis, E.E.; Vyrsokinos, K.; Avramopoulos, H.; Kalavrouziotis, D.;
By: Giannoulis, G.; Pleros, N.; Apostolopoulos, D.; Papaioannou, S.; Kumar, A.; Bozhevolnyi, S.; Markey, L.; Hassan, K.; Weeber, J.-C.; Dereux, A.; Baus, M.; Karl, M.; Tekin, T.; Tsilipakos, O.; Pitilakis, A.K.; Kriezis, E.E.; Vyrsokinos, K.; Avramopoulos, H.; Kalavrouziotis, D.;
2012 / IEEE
By: Heck, M.J.R.; John, D.D.; Blumenthal, D.J.; Bowers, J.E.; Barton, J.S.; Moreira, R.; Bauters, J.F.;
By: Heck, M.J.R.; John, D.D.; Blumenthal, D.J.; Bowers, J.E.; Barton, J.S.; Moreira, R.; Bauters, J.F.;
2012 / IEEE
By: Willner, A.E.; Chang-Hasnain, C.J.; Tur, M.; Chase, C.; Karagodsky, V.; Yang Yue; Weijian Yang; Hao Huang; Xue Wang; Lin Zhang; Ferrara, J.;
By: Willner, A.E.; Chang-Hasnain, C.J.; Tur, M.; Chase, C.; Karagodsky, V.; Yang Yue; Weijian Yang; Hao Huang; Xue Wang; Lin Zhang; Ferrara, J.;
2012 / IEEE
By: Krauss, T. F.; Romanato, F.; Schulz, S. A.; Scullion, M. G.; Massari, M.; Di Falco, A.;
By: Krauss, T. F.; Romanato, F.; Schulz, S. A.; Scullion, M. G.; Massari, M.; Di Falco, A.;
2012 / IEEE
By: Karvonen, L.; Honkanen, S.; Guo-Qiang Lo; Hiltunen, M.; Ya Chen; Hiltunen, J.; Tsung-Yang Liow; Xiaoguang Tu; Saynatjoki, A.;
By: Karvonen, L.; Honkanen, S.; Guo-Qiang Lo; Hiltunen, M.; Ya Chen; Hiltunen, J.; Tsung-Yang Liow; Xiaoguang Tu; Saynatjoki, A.;
2012 / IEEE
By: Logan, J.E.; Leong, K.M.K.H.; Jacob, M.; Sarkozy, S.; Gorospe, B.S.; Britz, D.M.; Priebe, S.; Kurner, T.;
By: Logan, J.E.; Leong, K.M.K.H.; Jacob, M.; Sarkozy, S.; Gorospe, B.S.; Britz, D.M.; Priebe, S.; Kurner, T.;
2012 / IEEE
By: Honkanen, S.; Karvonen, L.; Erdmanis, M.; Tittonen, I.; Saleem, M.R.; Tervonen, A.; Pale, V.; Ruoho, M.;
By: Honkanen, S.; Karvonen, L.; Erdmanis, M.; Tittonen, I.; Saleem, M.R.; Tervonen, A.; Pale, V.; Ruoho, M.;
2012 / IEEE
By: Adikan, F.R.M.; Carpenter, L.G.; Webb, A.S.; Gates, J.C.; Smith, P.G.R.; Ambran, S.; Holmes, C.; Sahu, J.K.;
By: Adikan, F.R.M.; Carpenter, L.G.; Webb, A.S.; Gates, J.C.; Smith, P.G.R.; Ambran, S.; Holmes, C.; Sahu, J.K.;
2011 / IEEE / 978-1-4577-0088-0
By: Alvarez, F.J.; Aparicio, J.; Diego, C.; Urena, J.; De Marziani, C.; Jimenez, A.;
By: Alvarez, F.J.; Aparicio, J.; Diego, C.; Urena, J.; De Marziani, C.; Jimenez, A.;
2011 / IEEE / 978-1-4244-5731-1
By: Duvall, S.G.; Read, A.; Moghe, Y.; Madden, S.; Grillet, C.; Atanackovic, P.; Magi, E.; Jackson, S.; Li, F.; Moss, D.J.; Eggleton, B.J.;
By: Duvall, S.G.; Read, A.; Moghe, Y.; Madden, S.; Grillet, C.; Atanackovic, P.; Magi, E.; Jackson, S.; Li, F.; Moss, D.J.; Eggleton, B.J.;
2011 / IEEE / 978-1-4577-0274-7
By: Deligiannis, N.; Satti, S.M.; Cornelis, J.; Schelkens, P.; Munteanu, A.;
By: Deligiannis, N.; Satti, S.M.; Cornelis, J.; Schelkens, P.; Munteanu, A.;
2011 / IEEE / 978-1-4244-9538-2
By: Shen Tat Goh; Huaqun Guo; Wai-Choong Wong; Qian Zhang; Foo, N.C.S.;
By: Shen Tat Goh; Huaqun Guo; Wai-Choong Wong; Qian Zhang; Foo, N.C.S.;
2011 / IEEE / 978-1-4244-9563-4
By: Joseph, W.; Plets, D.; Moerman, I.; Jooris, B.; De Poorter, E.; Martens, L.; Vanhecke, K.;
By: Joseph, W.; Plets, D.; Moerman, I.; Jooris, B.; De Poorter, E.; Martens, L.; Vanhecke, K.;
2011 / IEEE / 978-1-4577-1228-9
By: Cuiping Jing; Xiaoshe Dong; Huali Cui; Yifei Sun; Xingjun Zhang;
By: Cuiping Jing; Xiaoshe Dong; Huali Cui; Yifei Sun; Xingjun Zhang;