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Topic: Power Management
Results
2011 / IEEE
By: Su, M.Y.; Shuenn-Yuh Lee; Qiang Fang; Jou-Wei Lin; Hsin-Yi Lai; Chung-Min Yang; Cheng-Han Hsieh; You-Yin Chen; Ming-Chun Liang;
By: Su, M.Y.; Shuenn-Yuh Lee; Qiang Fang; Jou-Wei Lin; Hsin-Yi Lai; Chung-Min Yang; Cheng-Han Hsieh; You-Yin Chen; Ming-Chun Liang;
2011 / IEEE
By: Beigne, E.; Christmann, J.-F.; Piguet, C.; Leblond, N.; Willemin, J.; Vivet, P.; Condemine, C.;
By: Beigne, E.; Christmann, J.-F.; Piguet, C.; Leblond, N.; Willemin, J.; Vivet, P.; Condemine, C.;
Electrical Characterization of a Magnetic Tunnel Junction Current Sensor for Industrial Applications
2012 / IEEEBy: Ramirez, D.; Sanchez, J.; Freitas, P.P.; Ferreira, R.; Cardoso, S.; Lopes, A.; Ravelo, S.I.;
2012 / IEEE
By: Chao-Cheng Lee; Ying-Hsi Lin; Ke-Horng Chen; Shen-Yu Peng; Chen-Chih Huang; Yu-Huei Lee; Chao-Chang Chiu; Tsung-Yen Tsai;
By: Chao-Cheng Lee; Ying-Hsi Lin; Ke-Horng Chen; Shen-Yu Peng; Chen-Chih Huang; Yu-Huei Lee; Chao-Chang Chiu; Tsung-Yen Tsai;
2011 / IEEE / 978-1-61284-175-5
By: Takagahara, K.; Shimamura, T.; Kuwabara, K.; Ugajin, M.; Suzuki, K.; Mutoh, S.; Harada, M.; Morimura, H.;
By: Takagahara, K.; Shimamura, T.; Kuwabara, K.; Ugajin, M.; Suzuki, K.; Mutoh, S.; Harada, M.; Morimura, H.;
2011 / IEEE / 978-1-61284-660-6
By: Kochte, M.A.; Wunderlich, H.; Enokimoto, K.; Yamato, Y.; Kajihara, S.; Wen, X.; Miyase, K.;
By: Kochte, M.A.; Wunderlich, H.; Enokimoto, K.; Yamato, Y.; Kajihara, S.; Wen, X.; Miyase, K.;
2011 / IEEE / 978-1-4577-0088-0
By: Joon Young Yang; Ui-seok Jeong; Dong-ho Lee; Kyung Woon Lee; Jung Ho Park; Ho Kyung Jun;
By: Joon Young Yang; Ui-seok Jeong; Dong-ho Lee; Kyung Woon Lee; Jung Ho Park; Ho Kyung Jun;
2011 / IEEE / 978-1-4577-0081-1
By: Pekarek, S.; Doktorcik, C.; Meckl, P.H.; DeCarlo, R.A.; Meyer, R.;
By: Pekarek, S.; Doktorcik, C.; Meckl, P.H.; DeCarlo, R.A.; Meyer, R.;
2011 / IEEE / 978-1-61284-486-2
By: Quader, N.; Fadlullah, M.M.; Forhad, M.S.; Kadir, K.M.; Dhali, M.A.; Al-Arif, M.M.R.;
By: Quader, N.; Fadlullah, M.M.; Forhad, M.S.; Kadir, K.M.; Dhali, M.A.; Al-Arif, M.M.R.;
2011 / IEEE / 978-1-4577-0536-6
By: Shanliang Guan; Binbin Hao; Qisheng Zhang; Ming Deng; Hongmei Duan;
By: Shanliang Guan; Binbin Hao; Qisheng Zhang; Ming Deng; Hongmei Duan;
2011 / IEEE / 978-1-61284-857-0
By: Chun Zhang; Fule Li; Liwei Deng; Jigang Shao; Zhihua Wang; Hanjun Jiang; Binjie Zhu; Liyuan Liu;
By: Chun Zhang; Fule Li; Liwei Deng; Jigang Shao; Zhihua Wang; Hanjun Jiang; Binjie Zhu; Liyuan Liu;
2011 / IEEE / 978-1-4577-0419-2
By: Gamage, T.T.; Xin Qiu; McMillin, B.M.; Elmore, A.C.; Crow, M.L.; Nguyen, T.A.;
By: Gamage, T.T.; Xin Qiu; McMillin, B.M.; Elmore, A.C.; Crow, M.L.; Nguyen, T.A.;
2011 / IEEE / 978-1-4577-1043-8
By: Bordignon, P.; Ziyong Guo; Haitao Zhang; Kuang Li; Wei Shi; Torre, G.; Borghetti, G.; Postiglione, G.;
By: Bordignon, P.; Ziyong Guo; Haitao Zhang; Kuang Li; Wei Shi; Torre, G.; Borghetti, G.; Postiglione, G.;
2011 / IEEE / 978-1-55752-932-9
By: Rival, O.; Spadaro, S.; Morea, A.; Verchere, D.; Agraz, F.; Perello, J.;
By: Rival, O.; Spadaro, S.; Morea, A.; Verchere, D.; Agraz, F.; Perello, J.;
2011 / IEEE / 978-1-61284-319-3
By: Kupper, A.; Gondor, S.; Uzun, A.; Roos, A.; Einsiedler, H.J.; Sivchenko, D.; Bayer, N.;
By: Kupper, A.; Gondor, S.; Uzun, A.; Roos, A.; Einsiedler, H.J.; Sivchenko, D.; Bayer, N.;