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Topic: Plasma Waves
Results
2011 / IEEE
By: Labate, L.; Koester, P.; Giulietti, D.; Giulietti, A.; Levato, T.; Gizzi, L.A.; Cecchetti, C.A.; Pathak, N.;
By: Labate, L.; Koester, P.; Giulietti, D.; Giulietti, A.; Levato, T.; Gizzi, L.A.; Cecchetti, C.A.; Pathak, N.;
2011 / IEEE
By: Wu, X.M.; Ge, S.B.; Zhuge, L.J.; Hu, J.S.; Ye, C.; Ji, H.T.; Zhao, Y.; Yu, T.; Jin, C.G.; Bo, Y.; Li, J.G.;
By: Wu, X.M.; Ge, S.B.; Zhuge, L.J.; Hu, J.S.; Ye, C.; Ji, H.T.; Zhao, Y.; Yu, T.; Jin, C.G.; Bo, Y.; Li, J.G.;
2012 / IEEE
By: Penarier, A.; Coquillat, D.; Nouvel, P.; Arakawa, K.; Hisatake, S.; Tohme, L.; Torres, J.; Blin, S.; Nagatsuma, T.; Teppe, F.; Knap, W.; Varani, L.;
By: Penarier, A.; Coquillat, D.; Nouvel, P.; Arakawa, K.; Hisatake, S.; Tohme, L.; Torres, J.; Blin, S.; Nagatsuma, T.; Teppe, F.; Knap, W.; Varani, L.;
2011 / IEEE / 978-1-61284-329-2
By: Delchie, J.-M.; Lample, R.; Ritter, S.; d'Almeida, T.; Lassalle, F.; Zucchini, F.;
By: Delchie, J.-M.; Lample, R.; Ritter, S.; d'Almeida, T.; Lassalle, F.; Zucchini, F.;
2011 / IEEE / 978-1-4577-0192-4
By: Palermo, C.; Marinchio, H.; Gruzinskis, V.; Starikov, E.; Shiktorov, P.; Varani, L.;
By: Palermo, C.; Marinchio, H.; Gruzinskis, V.; Starikov, E.; Shiktorov, P.; Varani, L.;
2011 / IEEE / 978-1-61284-329-2
By: Zhdanov, S.; Harvey, P.; Durniak, C.; Samsonov, D.; Morfill, G.;
By: Zhdanov, S.; Harvey, P.; Durniak, C.; Samsonov, D.; Morfill, G.;
2011 / IEEE / 978-1-4577-0321-8
By: Yu-Si Jheng; Hung-Tze Wu; Jyun-Ming Lan; Tian-Fu Wu; Cheng-Min Lee; Pei-Wen Chou; Shun-Wen Liu; Chia-Hao Chang;
By: Yu-Si Jheng; Hung-Tze Wu; Jyun-Ming Lan; Tian-Fu Wu; Cheng-Min Lee; Pei-Wen Chou; Shun-Wen Liu; Chia-Hao Chang;
2011 / IEEE / 978-1-4244-6051-9
By: Hikishima, M.; Yagitani, S.; Ishizaka, K.; Mori, S.; Kojima, H.;
By: Hikishima, M.; Yagitani, S.; Ishizaka, K.; Mori, S.; Kojima, H.;
2011 / IEEE / 978-1-4244-6051-9
By: Titova, E.; Pickett, J.; Gurnett, D.; Trotignon, J.G.; Demekhov, A.; Rauch, J.; Macusova, E.; Santolik, O.; Kozelov, B.;
By: Titova, E.; Pickett, J.; Gurnett, D.; Trotignon, J.G.; Demekhov, A.; Rauch, J.; Macusova, E.; Santolik, O.; Kozelov, B.;
2011 / IEEE / 978-1-4244-6051-9
By: Tsunakawa, H.; Saito, Y.; Nishino, M.N.; Ono, T.; Kojima, H.; Kasahara, Y.; Omura, Y.; Hashimoto, K.; Goto, Y.; Kitaguchi, S.;
By: Tsunakawa, H.; Saito, Y.; Nishino, M.N.; Ono, T.; Kojima, H.; Kasahara, Y.; Omura, Y.; Hashimoto, K.; Goto, Y.; Kitaguchi, S.;
2012 / IEEE / 978-1-4673-2185-3
By: Shuai Ding; Mu-Sheng Liang; Guang-Ding Ge; Bing-Zhong Wang; Zhi-Min Zhang;
By: Shuai Ding; Mu-Sheng Liang; Guang-Ding Ge; Bing-Zhong Wang; Zhi-Min Zhang;
2012 / IEEE / 978-1-4577-1438-2
By: Sakowicz, M.; Teppe, F.; But, D.; Klimenko, O.; Lusakowski, J.; Dyakonova, N.; Coquillat, D.; Knap, W.; Otsuji, T.;
By: Sakowicz, M.; Teppe, F.; But, D.; Klimenko, O.; Lusakowski, J.; Dyakonova, N.; Coquillat, D.; Knap, W.; Otsuji, T.;
1992 / IEEE / 000-0-0000-0000-0
By: Santoru, J.; Butler, J.M.; Hyman, J.; Schumacher, R.W.; Goebel, D.M.; Watkins, R.M.; Schneider, A.J.; Eisenhart, R.L.; Dolezal, F.A.; Harvey, R.J.;
By: Santoru, J.; Butler, J.M.; Hyman, J.; Schumacher, R.W.; Goebel, D.M.; Watkins, R.M.; Schneider, A.J.; Eisenhart, R.L.; Dolezal, F.A.; Harvey, R.J.;
2007 / American Institute of Physics
By: Baifei Shen; Yuelin Li; Karoly Nemeth; Hairong Shang; Yong-chul Chae; Robert Soliday; Robert Crowell; Edward Frank; William Gropp; John Cary;
By: Baifei Shen; Yuelin Li; Karoly Nemeth; Hairong Shang; Yong-chul Chae; Robert Soliday; Robert Crowell; Edward Frank; William Gropp; John Cary;
2010 / American Institute of Physics
By: Saeed Mirzanejhad; Farshad Sohbatzadeh; Maede Ghasemi; Zeinab Sedaghat; Zeinab Mahdian;
By: Saeed Mirzanejhad; Farshad Sohbatzadeh; Maede Ghasemi; Zeinab Sedaghat; Zeinab Mahdian;
1988 / IEEE
By: Simonen, T.C.; Wood, R.D.; Barter, J.D.; Casper, T.A.; Correll, D.L.; Carter, M.R.; Clauser, J.F.; Dimonte, G.; Foote, J.H.; Futch, A.H.; Goodman, R.K.; Grubb, D.P.; Hill, D.N.; Hooper, E.B.; Hornady, R.S.; James, R.A.; Molvik, A.W.; Nexsen, W.E.; Porter, G.D.; Rognlien, T.D.; Silver, E.H.; Stallard, B.W.; Turner, W.C.; Allen, S.L.;
By: Simonen, T.C.; Wood, R.D.; Barter, J.D.; Casper, T.A.; Correll, D.L.; Carter, M.R.; Clauser, J.F.; Dimonte, G.; Foote, J.H.; Futch, A.H.; Goodman, R.K.; Grubb, D.P.; Hill, D.N.; Hooper, E.B.; Hornady, R.S.; James, R.A.; Molvik, A.W.; Nexsen, W.E.; Porter, G.D.; Rognlien, T.D.; Silver, E.H.; Stallard, B.W.; Turner, W.C.; Allen, S.L.;
1988 / IEEE
By: Alping, A.; Coldren, L.A.; Mendoza-Alvarez, J.G.; Pedrotti, K.; Lee, K.; Hausken, T.; Yan, R.H.;
By: Alping, A.; Coldren, L.A.; Mendoza-Alvarez, J.G.; Pedrotti, K.; Lee, K.; Hausken, T.; Yan, R.H.;
1988 / IEEE
By: Gauthe, B.; Jaegle, P.; Gadi, F.; Carillon, A.; Guennou, H.; Jamelot, G.; Sureau, A.; Moller, C.; Klisnick, A.;
By: Gauthe, B.; Jaegle, P.; Gadi, F.; Carillon, A.; Guennou, H.; Jamelot, G.; Sureau, A.; Moller, C.; Klisnick, A.;
1989 / IEEE
By: Pepin, H.; Audebert, P.; Matte, J.-P.; Chaker, M.; Belair, S.; Maine, P.; Kieffer, J.-C.; Mourou, G.; Bado, P.; Strickland, D.;
By: Pepin, H.; Audebert, P.; Matte, J.-P.; Chaker, M.; Belair, S.; Maine, P.; Kieffer, J.-C.; Mourou, G.; Bado, P.; Strickland, D.;