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Topic: Piezoelectric Materials
Results
2012 / IEEE
By: Costecalde, J.; Mazenq, L.; Saya, D.; Guillon, S.; Nicu, L.; Soyer, C.; Remiens, D.;
By: Costecalde, J.; Mazenq, L.; Saya, D.; Guillon, S.; Nicu, L.; Soyer, C.; Remiens, D.;
2012 / IEEE
By: Onodera, K.; Tota, K.; Futami, Y.; Sato, M.; Yokota, Y.; Yoshikawa, A.; Yanagida, T.;
By: Onodera, K.; Tota, K.; Futami, Y.; Sato, M.; Yokota, Y.; Yoshikawa, A.; Yanagida, T.;
2012 / IEEE
By: Tota, K.; Sato, M.; Futami, Y.; Yoshikawa, A.; Yokota, Y.; Yanagida, T.; Onodera, K.;
By: Tota, K.; Sato, M.; Futami, Y.; Yoshikawa, A.; Yokota, Y.; Yanagida, T.; Onodera, K.;
2012 / IEEE
By: Rhoads, J.F.; Xianfan Xu; Byunghoo Jung; Srisungsitthisunti, P.; Berdy, D.F.; Peroulis, D.;
By: Rhoads, J.F.; Xianfan Xu; Byunghoo Jung; Srisungsitthisunti, P.; Berdy, D.F.; Peroulis, D.;
2012 / IEEE
By: Pedros, J.; Iriarte, G.F.; Rodriguez-Madrid, J.G.; Calle, F.; Brink, D.; Williams, O.A.;
By: Pedros, J.; Iriarte, G.F.; Rodriguez-Madrid, J.G.; Calle, F.; Brink, D.; Williams, O.A.;
2011 / IEEE / 978-1-4577-1163-3
By: Pechrach, K.; Komoljindakul, K.; Phontip, J.; Hatti, N.; Tungpimolrut, K.; Manooonpong, P.;
By: Pechrach, K.; Komoljindakul, K.; Phontip, J.; Hatti, N.; Tungpimolrut, K.; Manooonpong, P.;
2011 / IEEE / 978-1-61284-777-1
By: Dong Wang; Li, W.J.; Lei Zhou; Shuai Yuan; Niandong Jiao; Zaili Dong;
By: Dong Wang; Li, W.J.; Lei Zhou; Shuai Yuan; Niandong Jiao; Zaili Dong;
2011 / IEEE / 978-1-4577-1163-3
By: Takagi, H.; Konoike, T.; Ogiso, K.; Hayashi, H.; Kimura, M.; Kawada, S.;
By: Takagi, H.; Konoike, T.; Ogiso, K.; Hayashi, H.; Kimura, M.; Kawada, S.;
2011 / IEEE / 978-1-4577-1163-3
By: Sato, M.; Futami, Y.; Yoshikawa, A.; Yokota, Y.; Yanagida, T.; Onodera, K.; Tota, K.;
By: Sato, M.; Futami, Y.; Yoshikawa, A.; Yokota, Y.; Yanagida, T.; Onodera, K.; Tota, K.;
2011 / IEEE / 978-1-4577-1025-4
By: Gerhard, R.; Wirges, W.; Qiu, X.; Altafim, R.A.C.; Basso, H.C.; Altafim, R.A.P.;
By: Gerhard, R.; Wirges, W.; Qiu, X.; Altafim, R.A.C.; Basso, H.C.; Altafim, R.A.P.;
2011 / IEEE / 978-1-61284-172-4
By: Chaillet, N.; Lutz, P.; Rakotondrabe, M.; Agnus, J.; Ivan, I.A.;
By: Chaillet, N.; Lutz, P.; Rakotondrabe, M.; Agnus, J.; Ivan, I.A.;
2011 / IEEE / 978-2-35500-015-7
By: Hackworth, R.; Ayon, A.A.; Kotha, R.; Maxwell, R.; Moriera, J.R.;
By: Hackworth, R.; Ayon, A.A.; Kotha, R.; Maxwell, R.; Moriera, J.R.;
2011 / IEEE / 978-1-4244-9289-3
By: Greve, D.W.; Malone, V.; Oppenheim, I.J.; Chin, T.-L.; Peng Zheng;
By: Greve, D.W.; Malone, V.; Oppenheim, I.J.; Chin, T.-L.; Peng Zheng;
2011 / IEEE / 978-1-4244-9289-3
By: Masson, S.; Roland, I.; Bosseboeuf, A.; Isac, N.; Le Traon, O.; Ducloux, O.;
By: Masson, S.; Roland, I.; Bosseboeuf, A.; Isac, N.; Le Traon, O.; Ducloux, O.;