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Topic: Physics
Results
2011 / IEEE
By: Hamann, B.; Hlawitschka, M.; Ahrens, J.; Pascucci, V.; Williams, S.; Bremer, P.-T.; Petersen, M.; Hecht, M.;
By: Hamann, B.; Hlawitschka, M.; Ahrens, J.; Pascucci, V.; Williams, S.; Bremer, P.-T.; Petersen, M.; Hecht, M.;
2011 / IEEE
By: Kuschel, T.; Petrovic, Z.L.; Winter, J.; Malovic, G.; Maric, D.; Skoro, N.; Stefanovic, I.;
By: Kuschel, T.; Petrovic, Z.L.; Winter, J.; Malovic, G.; Maric, D.; Skoro, N.; Stefanovic, I.;
2012 / IEEE
By: Jianzhou Wang; Yi Xu; Yanyan Li; Yansui Huang; Xiaoming Lu; Zhizhan Xu; Ruxin Li; Yuxin Leng;
By: Jianzhou Wang; Yi Xu; Yanyan Li; Yansui Huang; Xiaoming Lu; Zhizhan Xu; Ruxin Li; Yuxin Leng;
2012 / IEEE
By: Vyalykh, D.V.; Selemir, V.D.; Sadovoy, S.A.; L'vov, I.L.; Dubinov, A.E.; Zhdanov, V.S.;
By: Vyalykh, D.V.; Selemir, V.D.; Sadovoy, S.A.; L'vov, I.L.; Dubinov, A.E.; Zhdanov, V.S.;
2012 / IEEE
By: Welch, D.R.; Brockington, S.; Awe, T.J.; Hsu, S.C.; Witherspoon, F.D.; Case, A.; Tang, X.; Stanic, M.; Messer, S.J.; Kagan, G.; Cassibry, J.T.;
By: Welch, D.R.; Brockington, S.; Awe, T.J.; Hsu, S.C.; Witherspoon, F.D.; Case, A.; Tang, X.; Stanic, M.; Messer, S.J.; Kagan, G.; Cassibry, J.T.;
2012 / IEEE
By: Beg, F.N.; Giuliani, J.L.; Presura, R.; Ivanov, V.V.; Kusse, B.R.; Kantsyrev, V.L.; Gilgenbach, R.M.;
By: Beg, F.N.; Giuliani, J.L.; Presura, R.; Ivanov, V.V.; Kusse, B.R.; Kantsyrev, V.L.; Gilgenbach, R.M.;
2012 / IEEE
By: Heifetz, A.; Elmer, T.W.; Koehl, E.R.; Gopalsami, N.; Shaolin Liao; Raptis, A.C.; Chien, H.;
By: Heifetz, A.; Elmer, T.W.; Koehl, E.R.; Gopalsami, N.; Shaolin Liao; Raptis, A.C.; Chien, H.;
2012 / IEEE
By: Floch, E.; Xiang, Y.; Leibrock, H.; Yuan, P.; Yao, Q.G.; Ma, L.Z.; Wu, W.; Ni, D.S.; Zhang, X.Y.; Han, S.F.;
By: Floch, E.; Xiang, Y.; Leibrock, H.; Yuan, P.; Yao, Q.G.; Ma, L.Z.; Wu, W.; Ni, D.S.; Zhang, X.Y.; Han, S.F.;
2012 / IEEE
By: Bin Wei; Bisong Cao; Xubo Guo; Ying Zhang; Xiaoping Zhang; Guoyong Zhang; Guannan Suo; Xiaoke Song;
By: Bin Wei; Bisong Cao; Xubo Guo; Ying Zhang; Xiaoping Zhang; Guoyong Zhang; Guannan Suo; Xiaoke Song;
2012 / IEEE
By: Weichao Yao; Wenbin Ma; Meifen Wang; Zhiyong Liu; Zhilong Hou; Guoqing Zhang; Zian Zhu; Ling Zhao; Kai Zhang; Feipeng Ning;
By: Weichao Yao; Wenbin Ma; Meifen Wang; Zhiyong Liu; Zhilong Hou; Guoqing Zhang; Zian Zhu; Ling Zhao; Kai Zhang; Feipeng Ning;
2012 / IEEE
By: Liang Sun; Jin Guo; Yusheng He; Changzhi Gu; Xu Wang; Qiang Zhang; Hong Li; Xueqiang Zhang; Chunguang Li; Bin Cui; Jia Wang; Yongbo Bian; Shuyu Zhou;
By: Liang Sun; Jin Guo; Yusheng He; Changzhi Gu; Xu Wang; Qiang Zhang; Hong Li; Xueqiang Zhang; Chunguang Li; Bin Cui; Jia Wang; Yongbo Bian; Shuyu Zhou;
2012 / IEEE
By: Bertness, K.A.; Blanchard, P.T.; Seghete, D.; George, S.M.; Sanford, N.A.; Sanders, A.W.; Harvey, T.E.;
By: Bertness, K.A.; Blanchard, P.T.; Seghete, D.; George, S.M.; Sanford, N.A.; Sanders, A.W.; Harvey, T.E.;
1992 / IEEE / 000-0-0000-0000-0
By: Alef, M.; Westermann, T.; Stein, E.; Seldner, D.; Feher, L.; Astrelin, V.; Schmidt, W.; Kuntz, M.; Llly, S.; Schuldt, R.;
By: Alef, M.; Westermann, T.; Stein, E.; Seldner, D.; Feher, L.; Astrelin, V.; Schmidt, W.; Kuntz, M.; Llly, S.; Schuldt, R.;
1992 / IEEE / 000-0-0000-0000-0
By: Krejci, A.; Renner, O.; Krousky, E.; Platonov, Y.Y.; Golubev, A.V.; Piffl, V.; Raus, J.;
By: Krejci, A.; Renner, O.; Krousky, E.; Platonov, Y.Y.; Golubev, A.V.; Piffl, V.; Raus, J.;
2004 / IEEE / 978-5-87911-088-3
By: Gafarov, A.M.; Panikovskaya, V.N.; Vagina, N.M.; Komissarov, A.V.; Safronov, A.A.; Ostashev, V.I.;
By: Gafarov, A.M.; Panikovskaya, V.N.; Vagina, N.M.; Komissarov, A.V.; Safronov, A.A.; Ostashev, V.I.;
2009 / IEEE / 978-1-4577-0493-2
By: Messenger, S.R.; Warner, J.H.; Brenner, M.R.; Ringel, S.A.; Walters, R.J.;
By: Messenger, S.R.; Warner, J.H.; Brenner, M.R.; Ringel, S.A.; Walters, R.J.;
2010 / IEEE / 978-1-4244-5261-3
By: Gauja, E.; Rahman, H.U.; Johnson, B.C.; McCallum, J.C.; Ramer, R.;
By: Gauja, E.; Rahman, H.U.; Johnson, B.C.; McCallum, J.C.; Ramer, R.;
2011 / IEEE / 978-1-61284-774-0
By: Karan, D.; Paikaray, R.; Sahoo, G.; Sanyasi, A.K.; Sasini, N.; Ghosh, J.; Patra, D.C.; Samantaray, S.;
By: Karan, D.; Paikaray, R.; Sahoo, G.; Sanyasi, A.K.; Sasini, N.; Ghosh, J.; Patra, D.C.; Samantaray, S.;
2011 / IEEE / 978-1-86135-373-3
By: Troska, J.; Vasey, F.; Papakonstantinou, I.; Papadopoulos, S.; Darwazeh, I.;
By: Troska, J.; Vasey, F.; Papakonstantinou, I.; Papadopoulos, S.; Darwazeh, I.;
2011 / IEEE / 978-1-4577-0192-4
By: Chida, K.; Gossard, A.C.; Hashisaka, M.; Yamauchi, Y.; Nakamura, S.; Kobayashi, K.; Utsumi, Y.; Saito, K.; Ensslin, K.; Leturcq, R.; Ono, T.;
By: Chida, K.; Gossard, A.C.; Hashisaka, M.; Yamauchi, Y.; Nakamura, S.; Kobayashi, K.; Utsumi, Y.; Saito, K.; Ensslin, K.; Leturcq, R.; Ono, T.;